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G01N2021/6473
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/6473
In-line geometry
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Swept frequency fluorometer
Patent number
12,061,149
Issue date
Aug 13, 2024
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Extended solid angle turbidity sensor
Patent number
11,860,096
Issue date
Jan 2, 2024
YSI, Inc.
Kevin Flanagan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spatial gradient-based fluorometer
Patent number
11,604,143
Issue date
Mar 14, 2023
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Laminated fluorescent sensor comprising a sealable sensor housing a...
Patent number
11,255,787
Issue date
Feb 22, 2022
SHAANXI NORMAL UNIVERSITY
Yu Fang
G01 - MEASURING TESTING
Information
Patent Grant
Gas phase cooling and mixture analysis
Patent number
8,907,286
Issue date
Dec 9, 2014
President and Fellows of Harvard College
John M. Doyle
G01 - MEASURING TESTING
Information
Patent Grant
Sensitive emission light gathering and flow through detection system
Patent number
8,351,741
Issue date
Jan 8, 2013
Creatv MicroTech, Inc.
Cha-Mei Tang
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional weak radiation detector with a detection means base...
Patent number
7,326,900
Issue date
Feb 5, 2008
Mitsui Engineering & Shipbuilding Co., Ltd.
Noriaki Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement and use of a slit diaphragm
Patent number
7,123,398
Issue date
Oct 17, 2006
Tecan Trading AG
Lutz Niggl
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence based liquid core waveguide
Patent number
6,813,427
Issue date
Nov 2, 2004
University of South Florida
Eric Kaltenbacher
G01 - MEASURING TESTING
Information
Patent Grant
Mirror fluorometer
Patent number
6,670,617
Issue date
Dec 30, 2003
Ondeo Nalco Company
Rodney H. Banks
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for analyzing particle images
Patent number
5,428,441
Issue date
Jun 27, 1995
Toa Medical Electronics Co., Ltd.
Shinichi Ogino
G01 - MEASURING TESTING
Information
Patent Grant
Remote optical measurement probe
Patent number
5,377,004
Issue date
Dec 27, 1994
Kaiser Optical Systems
Harry Owen
G02 - OPTICS
Information
Patent Grant
Low aberration diffraction grating system
Patent number
5,371,586
Issue date
Dec 6, 1994
Instruments SA, Inc.
Chiu Chau
G01 - MEASURING TESTING
Information
Patent Grant
Liquid/liquid fiber-optic fluorescence detector and absorbance anal...
Patent number
4,867,559
Issue date
Sep 19, 1989
Amoco Corporation
David T. Bach
G02 - OPTICS
Information
Patent Grant
Optical arrangement for photometrical analysis measuring devices
Patent number
4,707,131
Issue date
Nov 17, 1987
Oswald Schiek
G01 - MEASURING TESTING
Information
Patent Grant
Automatic recording fluorometer/densitometer
Patent number
4,117,338
Issue date
Sep 26, 1978
Corning Glass Works
Robert F. Adrion
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring two different fluorescences of a sample
Patent number
3,971,951
Issue date
Jul 27, 1976
Nippon Kogaku K.K.
Katsuji Rikukawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPATIAL GRADIENT-BASED FLUOROMETER
Publication number
20210364438
Publication date
Nov 25, 2021
YSI, Inc.
Kevin FLANAGAN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR FORMING AN ALIGNMENT CELL
Publication number
20200064263
Publication date
Feb 27, 2020
Honeywell International Inc.
Matthew Edward Lewis Jungwirth
G01 - MEASURING TESTING
Information
Patent Application
Laminated fluorescent sensor
Publication number
20200011794
Publication date
Jan 9, 2020
SHAANXI NORMAL UNIVERSITY
Yu Fang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR GENERATING FLUORESCENCE
Publication number
20130146786
Publication date
Jun 13, 2013
Ping-Hua TENG
G01 - MEASURING TESTING
Information
Patent Application
GAS PHASE COOLING AND MIXTURE ANALYSIS
Publication number
20130107244
Publication date
May 2, 2013
President and Fellows of Harvard College
John M. Doyle
G01 - MEASURING TESTING
Information
Patent Application
Sensitive Emission Light Gathering and Flow Through Detection System
Publication number
20100002981
Publication date
Jan 7, 2010
Cha-Mei Tang
G01 - MEASURING TESTING
Information
Patent Application
Two-dimensional weak radiation detector
Publication number
20060043307
Publication date
Mar 2, 2006
MITSUI ENGINEERING & SHIPBUILDING CO., LTD.
Noriaki Kimura
G01 - MEASURING TESTING
Information
Patent Application
Arrangement and use of a slit diaphragm
Publication number
20050030607
Publication date
Feb 10, 2005
Lutz Niggl
G01 - MEASURING TESTING
Information
Patent Application
Mirror fluorometer
Publication number
20030006385
Publication date
Jan 9, 2003
Rodney H. Banks
G01 - MEASURING TESTING