In-process and post-process measurement combined

Industry

CPC
G05B2219/37577

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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/37577In-process and post-process measurement combined

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device and specimen inspection automation system
- Patent number 10,768,187
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus, structure manufacturing system, stage ap...
- Patent number 9,733,070
- Issue date Aug 15, 2017
- Nikon Corporation
- Toru Aramaki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Monitoring system and method for the in-process monitoring of machi...
- Patent number 7,328,081
- Issue date Feb 5, 2008
- Werner Kluft
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus and method for feedback-adjusting working condition for i...
- Patent number 6,999,846
- Issue date Feb 14, 2006
- Toyota Jidosha Kabushiki Kaisha
- Chisato Kato
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus and method for feedback-adjusting working condition for i...
- Patent number 6,415,200
- Issue date Jul 2, 2002
- Toyota Jidosha Kabushiki Kaisha
- Chisato Kato
- G05 - CONTROLLING REGULATING
Information Patent Grant
Machine tools
- Patent number 6,038,489
- Issue date Mar 14, 2000
- Unova U.K. Limited
- John David Pickles
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for control of polishing pad conditioning for...
- Patent number 5,664,987
- Issue date Sep 9, 1997
- National Semiconductor Corporation
- Peter Henry Renteln
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE MEASURING APPARATUS, STRUCTURE MANUFACTURING SYSTEM, STAGE AP...
- Publication number 20150260507
- Publication date Sep 17, 2015
- Nikon Corporation
- TORU ARAMAKI
- G01 - MEASURING TESTING
Information Patent Application
Monitoring system and method for the in-process monitoring of machi...
- Publication number 20060178771
- Publication date Aug 10, 2006
- Werner Kluft
- G05 - CONTROLLING REGULATING
Information Patent Application
Apparatus and method for feedback-adjusting working condition for i...
- Publication number 20020133268
- Publication date Sep 19, 2002
- Toyota Jidosha Kabushiki Kaisha
- Chisato Kato
- G05 - CONTROLLING REGULATING

In-process and post-process measurement combined

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automatic analysis device and specimen inspection automation system

Shape measuring apparatus, structure manufacturing system, stage ap...

Monitoring system and method for the in-process monitoring of machi...

Apparatus and method for feedback-adjusting working condition for i...

Apparatus and method for feedback-adjusting working condition for i...

Machine tools

Methods and apparatus for control of polishing pad conditioning for...

Patents Applicationslast 30 patents

SHAPE MEASURING APPARATUS, STRUCTURE MANUFACTURING SYSTEM, STAGE AP...

Monitoring system and method for the in-process monitoring of machi...

Apparatus and method for feedback-adjusting working condition for i...