Interface to device under test

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G11C2029/5602

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Current Industry

G11C2029/5602Interface to device under test

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,174,717
- Issue date Dec 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for dynamic random access memory module of AMD system
- Patent number 12,148,499
- Issue date Nov 19, 2024
- SQ Technology (Shanghai) Corporation
- Wei-Guo Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent memory device test rack
- Patent number 12,142,336
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan test in a single-wire bus circuit
- Patent number 12,092,689
- Issue date Sep 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
- Patent number 11,933,844
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
- Patent number 11,879,940
- Issue date Jan 23, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for verifying and analyzing memory for high perfo...
- Patent number 11,862,275
- Issue date Jan 2, 2024
- KingTiger Technology (Canada) Inc.
- Bosco Chun Sang Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test systems and memory test methods
- Patent number 11,862,278
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Grant
Impedance calibration via a number of calibration circuits, and ass...
- Patent number 11,848,065
- Issue date Dec 19, 2023
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,742,055
- Issue date Aug 29, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,719,742
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing semiconductor device and method of testing th...
- Patent number 11,626,184
- Issue date Apr 11, 2023
- NANYA TECHNOLOGY CORPORATION
- Chen-Yen Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 11,624,780
- Issue date Apr 11, 2023
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,587,640
- Issue date Feb 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Combined ECC and transparent memory test for memory fault detection
- Patent number 11,557,365
- Issue date Jan 17, 2023
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing a digital electronic circuit to be tested, corre...
- Patent number 11,531,064
- Issue date Dec 20, 2022
- STMicroelectronics S.r.l.
- Matteo Brivio
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,506,706
- Issue date Nov 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device, method of testing the same and test sy...
- Patent number 11,501,846
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Sanglok Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage medium-assisted system interface training scheme
- Patent number 11,398,288
- Issue date Jul 26, 2022
- SanDisk Technologies LLC
- Phil Reusswig
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent memory device test rack
- Patent number 11,328,789
- Issue date May 10, 2022
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacked semiconductor device and semiconductor system including the...
- Patent number 11,289,174
- Issue date Mar 29, 2022
- SK Hynix Inc.
- Yo-Sep Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data verifying method, chip, and verifying apparatus
- Patent number 11,183,262
- Issue date Nov 23, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Mao-Ruei Li
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 11,156,658
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Chiaki Dono
- G01 - MEASURING TESTING
Information Patent Grant
Transmitting data and power to a memory sub-system for memory devic...
- Patent number 11,152,077
- Issue date Oct 19, 2021
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Impedance calibration via a number of calibration circuits, and ass...
- Patent number 11,145,383
- Issue date Oct 12, 2021
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING
- Publication number 20250006290
- Publication date Jan 2, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE
- Publication number 20240395355
- Publication date Nov 28, 2024
- ETRON TECHNOLOGY, INC.
- Chun Shiah
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20240395354
- Publication date Nov 28, 2024
- Sony Semiconductor Solutions Corporation
- DAISHI ISOGAI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM
- Publication number 20240386987
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING
- Publication number 20240371460
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Smruti Subhash Jhaveri
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT
- Publication number 20240345162
- Publication date Oct 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER
- Publication number 20240331797
- Publication date Oct 3, 2024
- ETRON TECHNOLOGY, INC.
- Ho-Yin Chen
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...
- Publication number 20240233857
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Kuihan Ko
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT
- Publication number 20240221859
- Publication date Jul 4, 2024
- Yangtze Memory Technologies Co., Ltd.
- Teng CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...
- Publication number 20240212784
- Publication date Jun 27, 2024
- Intel NDTM US LLC
- Ashish SHUKLA
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
- Publication number 20240193058
- Publication date Jun 13, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
- Publication number 20240071556
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES
- Publication number 20240055068
- Publication date Feb 15, 2024
- Rambus Inc.
- Srinivas Satish Babu Bamdhamravuri
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...
- Publication number 20240021265
- Publication date Jan 18, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaolei LI
- G11 - INFORMATION STORAGE
Information Patent Application
Burst Indicator Systems and Methods
- Publication number 20230343407
- Publication date Oct 26, 2023
- Micron Technology, Inc.
- Kai Wang
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20230324457
- Publication date Oct 12, 2023
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICE, TEST METHOD, AND TEST MACHINE
- Publication number 20230215510
- Publication date Jul 6, 2023
- Yangtze Memory Technologies Co., Ltd.
- Xiao TONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230197185
- Publication date Jun 22, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230062440
- Publication date Mar 2, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST SYSTEMS AND MEMORY TEST METHODS
- Publication number 20230055639
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20220284982
- Publication date Sep 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
INTELLIGENT MEMORY DEVICE TEST RACK
- Publication number 20220230700
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS
- Publication number 20220178997
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Ungjin JANG
- G11 - INFORMATION STORAGE
Information Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A PLUARLITY OF COMMUNICATION IN...
- Publication number 20220157399
- Publication date May 19, 2022
- Advantest Corporation
- Frank HENSEL
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...
- Publication number 20220076778
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- SANGLOK KIM
- G11 - INFORMATION STORAGE
Information Patent Application
IMPEDANCE CALIBRATION VIA A NUMBER OF CALIBRATION CIRCUITS, AND ASS...
- Publication number 20210391028
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING TH...
- Publication number 20210343360
- Publication date Nov 4, 2021
- NANYA TECHNOLOGY CORPORATION
- Chen-Yen TSAI
- G11 - INFORMATION STORAGE
Information Patent Application
DATA VERIFYING METHOD, CHIP, AND VERIFYING APPARATUS
- Publication number 20210327528
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mao-Ruei Li
- G11 - INFORMATION STORAGE

Interface to device under test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus, systems, and methods for dynamically reconfigured semico...

Automated test equipment comprising a plurality of communication in...

Test system for dynamic random access memory module of AMD system

Intelligent memory device test rack

Test devices, test systems, and operating methods of test systems

Apparatus, systems, and methods for dynamically reconfigured semico...

Scan test in a single-wire bus circuit

System and method for receiver equalization and stressed eye testin...

Path based controls for ATE mode testing of multicell memory circuit

Dynamic generation of ATPG mode signals for testing multipath memor...

Test method for control chip and related device

System and method for verifying and analyzing memory for high perfo...

Memory test systems and memory test methods

Impedance calibration via a number of calibration circuits, and ass...

Carrier based high volume system level testing of devices with pop...

Semiconductor wafer testing system and related method for improving...

Apparatus for testing semiconductor device and method of testing th...

System and method for receiver equalization and stressed eye testin...

Carrier based high volume system level testing of devices with pop...

Combined ECC and transparent memory test for memory fault detection

Method for testing a digital electronic circuit to be tested, corre...

Semiconductor wafer testing system and related method for improving...

Semiconductor memory device, method of testing the same and test sy...

Storage medium-assisted system interface training scheme

Intelligent memory device test rack

Stacked semiconductor device and semiconductor system including the...

Data verifying method, chip, and verifying apparatus

Semiconductor memory device

Transmitting data and power to a memory sub-system for memory devic...

Impedance calibration via a number of calibration circuits, and ass...

Patents Applicationslast 30 patents

HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING

MEMORY DEVICE

SEMICONDUCTOR STORAGE DEVICE

TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM

SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING

SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT

MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER

SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...

MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...

DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT

CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...

APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...

MEMORY WITH PARALLEL MAIN AND TEST INTERFACES

SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES

MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...

Burst Indicator Systems and Methods

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

System and Method for Receiver Equalization and Stressed Eye Testin...

TEST DEVICE, TEST METHOD, AND TEST MACHINE

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

MEMORY TEST SYSTEMS AND MEMORY TEST METHODS

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

INTELLIGENT MEMORY DEVICE TEST RACK

TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS

AUTOMATED TEST EQUIPMENT COMPRISING A PLUARLITY OF COMMUNICATION IN...

SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...

IMPEDANCE CALIBRATION VIA A NUMBER OF CALIBRATION CIRCUITS, AND ASS...

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING TH...

DATA VERIFYING METHOD, CHIP, AND VERIFYING APPARATUS