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Investigating a scatter or diffraction pattern
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G01N15/0211
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N15/00
Investigating characteristics of particles Investigating permeability, pore-volume, or surface-area of porous materials
Current Industry
G01N15/0211
Investigating a scatter or diffraction pattern
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Patents Grants
last 30 patents
Information
Patent Grant
Water impurity measurements with dynamic light scattering
Patent number
12,287,267
Issue date
Apr 29, 2025
Nanosized Sweden AB
Harald Näslund
G01 - MEASURING TESTING
Information
Patent Grant
FPGA-based multi-channel dynamic light scattering autocorrelation s...
Patent number
12,287,268
Issue date
Apr 29, 2025
National Institute of Metrology, China
Lu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Method of evaluating and optionally selecting a suitable chemistry...
Patent number
12,281,032
Issue date
Apr 22, 2025
Kemira Oyj
Outi Gronfors
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
Particle detection via scattered light combined with incident light
Patent number
12,276,592
Issue date
Apr 15, 2025
Particle Measuring Systems, Inc.
Daniel Rodier
G01 - MEASURING TESTING
Information
Patent Grant
Air measurement device
Patent number
12,265,007
Issue date
Apr 1, 2025
QuantAQ, Inc.
David Hagan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for particle testing
Patent number
12,235,200
Issue date
Feb 25, 2025
Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
Philip Russell
G01 - MEASURING TESTING
Information
Patent Grant
Multispectral sensor based alert condition detector
Patent number
12,216,037
Issue date
Feb 4, 2025
Viavi Solutions Inc.
William D. Houck
G08 - SIGNALLING
Information
Patent Grant
Adjustable cross-sectional area sample container
Patent number
12,216,038
Issue date
Feb 4, 2025
Kuwait University
Naser Alsayegh
G01 - MEASURING TESTING
Information
Patent Grant
Optical particulate detection for an aircraft
Patent number
12,196,658
Issue date
Jan 14, 2025
RTX Corporation
David L. Lincoln
G01 - MEASURING TESTING
Information
Patent Grant
Light-scattering detection device
Patent number
12,181,399
Issue date
Dec 31, 2024
Shimadzu Corporation
Toru Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering measuring apparatus and measuring jig
Patent number
12,174,103
Issue date
Dec 24, 2024
Otsuka Electronics Co., Ltd.
Yusuke Izutani
G01 - MEASURING TESTING
Information
Patent Grant
Fine bubble supply device, and fine bubble analyzing system
Patent number
12,161,980
Issue date
Dec 10, 2024
Shimadzu Corporation
Seika Ohuchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Device for producing fluorine gas and light scattering detector
Patent number
12,163,235
Issue date
Dec 10, 2024
Resonac Corporation
Katsumi Mikami
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method for determining the particle size distribution of an aerosol...
Patent number
12,152,974
Issue date
Nov 26, 2024
Palas GmbH Partikel- und Lasermesstechnik
Maximilian Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Optical particle detector
Patent number
12,152,976
Issue date
Nov 26, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Gabriel Jobert
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measurement device, particle analysis un...
Patent number
12,140,519
Issue date
Nov 12, 2024
Horiba, Ltd.
Tetsuya Mori
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for measuring refractive index of particle sample...
Patent number
12,111,240
Issue date
Oct 8, 2024
LINKOPTIK INSTRUMENTS CO., LTD.
Fugen Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Device for detecting the presence of pollen in the air, and corresp...
Patent number
12,105,001
Issue date
Oct 1, 2024
LIFY AIR
Jérôme Richard
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for detecting and identifying extracellular vesic...
Patent number
12,044,606
Issue date
Jul 23, 2024
INESC TEC—INSTITUTO DE ENGENHARIA DE SISTEMAS E COMPUTADORES, TECNOLOGIA E CI...
Joana Isabel Dos Santos Paiva
G01 - MEASURING TESTING
Information
Patent Grant
Detection device and method for tiny particles in liquid
Patent number
12,038,366
Issue date
Jul 16, 2024
JIANGSU SUJING GROUP CO., LTD.
Jiyong Sun
G01 - MEASURING TESTING
Information
Patent Grant
Optical particle sensor
Patent number
12,038,365
Issue date
Jul 16, 2024
ams Sensors Germany GmbH
Alex Lollio
G08 - SIGNALLING
Information
Patent Grant
Device and method for measuring turbidity of fine particles
Patent number
12,031,893
Issue date
Jul 9, 2024
Young Bok Choi
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam experiment data analysis device
Patent number
11,994,454
Issue date
May 28, 2024
Hitachi, Ltd.
Akinori Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Multi-fibre optical probe
Patent number
11,988,588
Issue date
May 21, 2024
COLVISTEC AG
Andreas Berghaus
G01 - MEASURING TESTING
Information
Patent Grant
Remote control system for gas detection and purification
Patent number
11,986,763
Issue date
May 21, 2024
Microjet Technology Co., Ltd.
Hao-Jan Mou
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for extended dynamic range detection of light
Patent number
11,959,847
Issue date
Apr 16, 2024
CYTONOME/ST, LLC
Johnathan Charles Sharpe
G01 - MEASURING TESTING
Information
Patent Grant
Quadrature phase analysis light scattering for electrophoresis and...
Patent number
11,953,412
Issue date
Apr 9, 2024
Robert Dickerman
G01 - MEASURING TESTING
Information
Patent Grant
Gas detection and cleaning system for vehicle
Patent number
11,945,282
Issue date
Apr 2, 2024
Microjet Technology Co., Ltd.
Hao-Jan Mou
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Slurry monitoring device, CMP system and method of in-line monitori...
Patent number
11,938,586
Issue date
Mar 26, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Chwen Yu
G01 - MEASURING TESTING
Information
Patent Grant
Particle characterisation
Patent number
11,906,412
Issue date
Feb 20, 2024
Malvern Panalytical Limited
Jason Corbett
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT SCATTERING DETECTORS AND METHODS FOR THE SAME
Publication number
20250137899
Publication date
May 1, 2025
Tosoh Bioscience LLC
Sébastien ROUZEAU
G01 - MEASURING TESTING
Information
Patent Application
CORROSION ESTIMATION METHOD AND DEVICE
Publication number
20250130151
Publication date
Apr 24, 2025
Nippon Telegraph and Telephone Corporation
Shota Oki
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS TO MEASURE ELECTROPHORETIC MOBILITY
Publication number
20250110035
Publication date
Apr 3, 2025
Wyatt Technology, LLC
Grzegorz M. Dmochowski
G01 - MEASURING TESTING
Information
Patent Application
Inline particle size analyzing device for continuous measurement of...
Publication number
20250102412
Publication date
Mar 27, 2025
TIETJEN VERFAHRENSTECHNIK GMBH
MARKUS ECKERT
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE TIME LIGHT SCATTERING AND ELECTROPHORETIC MOBILITY DATA CO...
Publication number
20250093247
Publication date
Mar 20, 2025
Wyatt Technology, LLC
Steven P. Trainoff
G01 - MEASURING TESTING
Information
Patent Application
Method of Utilizing Optical Path Difference in Two-phase Flow for A...
Publication number
20250076173
Publication date
Mar 6, 2025
Dandong Bettersize Instruments Ltd.
Jilai FAN
G01 - MEASURING TESTING
Information
Patent Application
AIR MEASUREMENT DEVICE
Publication number
20250067650
Publication date
Feb 27, 2025
QuantAQ, Inc.
David Hagan
G01 - MEASURING TESTING
Information
Patent Application
SELF-MIXING INTERFEROMETRY
Publication number
20250067554
Publication date
Feb 27, 2025
Dyson Technology Limited
David James GRAHAM
G01 - MEASURING TESTING
Information
Patent Application
SINGLE PARTICLE ANALYSIS METHOD FOR VIRAL NUCLEIC ACID VECTOR
Publication number
20250052753
Publication date
Feb 13, 2025
NANOFCM ASIA PTE.LTD.
Shaobin ZHU
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHODS AND RELATED ASPECTS OF RAPID MICROBIAL DETECTION USING INTR...
Publication number
20250012697
Publication date
Jan 9, 2025
Arizona Board of Regents on behalf of Arizona State University
Shaopeng WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NEGATIVE ELECTRODE SHEET AND SCREENING METHOD THEREOF, BATTERY AND...
Publication number
20250003854
Publication date
Jan 2, 2025
Xiamen Hithium Energy Storage Technology Co., Ltd.
Shun LEI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and Method for Determining Particulate Size Distribution and...
Publication number
20240426729
Publication date
Dec 26, 2024
AirPhoton, LLC
Jose Vanderlei Martins
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRIC LIGHT FIELD IMAGING SYSTEM FOR AN AEROSOL PLUME
Publication number
20240418619
Publication date
Dec 19, 2024
ACME Atronomatic, LLC
Sarvesh GARIMELLA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARAC...
Publication number
20240393221
Publication date
Nov 28, 2024
Malvern Panalytical Limited
David SPRIGGS
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS WITH DYNAMIC LIGHT SCATTERING ASSEMBLY
Publication number
20240385097
Publication date
Nov 21, 2024
Nutcracker Therapeutics, Inc.
Babak Sanii
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD
Publication number
20240385098
Publication date
Nov 21, 2024
Hitachi, Ltd
Tomonari MISAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD, DEVICE AND USE THEREOF FOR MEASURING THE SIZE AND/OR CONCEN...
Publication number
20240377305
Publication date
Nov 14, 2024
TOPAS GMBH TECHNOLOGIE-ORIENTIERTE PARTIKEL-, ANALYSEN- UND SENSORTECHNIK
Lukas OESER
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL ESTIMATION DEVICE, MATERIAL ESTIMATION SYSTEM, AND MATERIA...
Publication number
20240377306
Publication date
Nov 14, 2024
NEC Corporation
Kan KIMURA
G01 - MEASURING TESTING
Information
Patent Application
ULTRASENSITIVE SPECTROMETER
Publication number
20240377304
Publication date
Nov 14, 2024
Korea Advanced Institute of Science and Technology
Mooseok Jang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME ANALYSIS OF INHALED PARTICLES
Publication number
20240369464
Publication date
Nov 7, 2024
PNEUMAX, LLC
Kambez Hajipouran Benam
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DETECTING AND IDENTIFYING EXTRACELLULAR VESIC...
Publication number
20240369463
Publication date
Nov 7, 2024
INESC TEC - INSTITUTO DE ENGENHARIA DE SISTEMAS E COMPUTADORES, TECNOLOGIA E...
Joana Isabel DOS SANTOS PAIVA
G01 - MEASURING TESTING
Information
Patent Application
DROPLET DETECTION METROLOGY UTILIZING METROLOGY BEAM SCATTERING
Publication number
20240361222
Publication date
Oct 31, 2024
ASML NETHERLANDS B.V.
Dustin Michael Urone
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PARTICLE CHARACTERISATION METHOD AND APPARATUS
Publication number
20240319061
Publication date
Sep 26, 2024
Malvern Panalytical Limited
Daniel MARWICK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRI...
Publication number
20240310264
Publication date
Sep 19, 2024
HORIBA, LTD.
Tetsuji YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING FINE BUBBLE DISPERSION LIQUID
Publication number
20240295483
Publication date
Sep 5, 2024
OHDAIRA LABORATORY COMPANY
Takeshi OHDAIRA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS APPARATUS, PARTICLE IMAGE ANALYSIS SYSTEM,...
Publication number
20240290116
Publication date
Aug 29, 2024
HORIBA, LTD.
Yasuhiro TATEWAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
Publication number
20240280459
Publication date
Aug 22, 2024
KIOXIA Corporation
Yusuke OSHIMA
G01 - MEASURING TESTING
Information
Patent Application
SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...
Publication number
20240189961
Publication date
Jun 13, 2024
Taiwan Semiconductor Manufacturing company Ltd.
CHWEN YU
G01 - MEASURING TESTING
Information
Patent Application
DEALING WITH FOG AND CONTAMINATIONS IN ENVIRONMENTAL SENSOR DEVICES
Publication number
20240192121
Publication date
Jun 13, 2024
SENSIRION AG
Dominik NIEDERBERGER
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE CHARACTERISATION
Publication number
20240192108
Publication date
Jun 13, 2024
Malvern Panalytical Limited
Jason CORBETT
G01 - MEASURING TESTING