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Investigating a scatter or diffraction pattern
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G01N15/0211
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N15/00
Investigating characteristics of particles Investigating permeability, pore-volume, or surface-area of porous materials
Current Industry
G01N15/0211
Investigating a scatter or diffraction pattern
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Light-scattering detection device
Patent number
12,181,399
Issue date
Dec 31, 2024
Shimadzu Corporation
Toru Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering measuring apparatus and measuring jig
Patent number
12,174,103
Issue date
Dec 24, 2024
Otsuka Electronics Co., Ltd.
Yusuke Izutani
G01 - MEASURING TESTING
Information
Patent Grant
Fine bubble supply device, and fine bubble analyzing system
Patent number
12,161,980
Issue date
Dec 10, 2024
Shimadzu Corporation
Seika Ohuchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Device for producing fluorine gas and light scattering detector
Patent number
12,163,235
Issue date
Dec 10, 2024
Resonac Corporation
Katsumi Mikami
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method for determining the particle size distribution of an aerosol...
Patent number
12,152,974
Issue date
Nov 26, 2024
Palas GmbH Partikel- und Lasermesstechnik
Maximilian Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Optical particle detector
Patent number
12,152,976
Issue date
Nov 26, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Gabriel Jobert
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measurement device, particle analysis un...
Patent number
12,140,519
Issue date
Nov 12, 2024
Horiba, Ltd.
Tetsuya Mori
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for measuring refractive index of particle sample...
Patent number
12,111,240
Issue date
Oct 8, 2024
LINKOPTIK INSTRUMENTS CO., LTD.
Fugen Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Device for detecting the presence of pollen in the air, and corresp...
Patent number
12,105,001
Issue date
Oct 1, 2024
LIFY AIR
Jérôme Richard
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for detecting and identifying extracellular vesic...
Patent number
12,044,606
Issue date
Jul 23, 2024
INESC TEC—INSTITUTO DE ENGENHARIA DE SISTEMAS E COMPUTADORES, TECNOLOGIA E CI...
Joana Isabel Dos Santos Paiva
G01 - MEASURING TESTING
Information
Patent Grant
Detection device and method for tiny particles in liquid
Patent number
12,038,366
Issue date
Jul 16, 2024
JIANGSU SUJING GROUP CO., LTD.
Jiyong Sun
G01 - MEASURING TESTING
Information
Patent Grant
Optical particle sensor
Patent number
12,038,365
Issue date
Jul 16, 2024
ams Sensors Germany GmbH
Alex Lollio
G08 - SIGNALLING
Information
Patent Grant
Device and method for measuring turbidity of fine particles
Patent number
12,031,893
Issue date
Jul 9, 2024
Young Bok Choi
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam experiment data analysis device
Patent number
11,994,454
Issue date
May 28, 2024
Hitachi, Ltd.
Akinori Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Multi-fibre optical probe
Patent number
11,988,588
Issue date
May 21, 2024
COLVISTEC AG
Andreas Berghaus
G01 - MEASURING TESTING
Information
Patent Grant
Remote control system for gas detection and purification
Patent number
11,986,763
Issue date
May 21, 2024
Microjet Technology Co., Ltd.
Hao-Jan Mou
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for extended dynamic range detection of light
Patent number
11,959,847
Issue date
Apr 16, 2024
CYTONOME/ST, LLC
Johnathan Charles Sharpe
G01 - MEASURING TESTING
Information
Patent Grant
Quadrature phase analysis light scattering for electrophoresis and...
Patent number
11,953,412
Issue date
Apr 9, 2024
Robert Dickerman
G01 - MEASURING TESTING
Information
Patent Grant
Gas detection and cleaning system for vehicle
Patent number
11,945,282
Issue date
Apr 2, 2024
Microjet Technology Co., Ltd.
Hao-Jan Mou
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Slurry monitoring device, CMP system and method of in-line monitori...
Patent number
11,938,586
Issue date
Mar 26, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Chwen Yu
G01 - MEASURING TESTING
Information
Patent Grant
Particle characterisation
Patent number
11,906,412
Issue date
Feb 20, 2024
Malvern Panalytical Limited
Jason Corbett
G01 - MEASURING TESTING
Information
Patent Grant
Suction particle detection system with light guide system
Patent number
11,887,452
Issue date
Jan 30, 2024
Wagner Group GmbH
Jonas Hartwig
G08 - SIGNALLING
Information
Patent Grant
Particulate matter sensor
Patent number
11,885,726
Issue date
Jan 30, 2024
ams AG
Harald Etschmaier
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measuring device and program for particl...
Patent number
11,879,822
Issue date
Jan 23, 2024
Horiba, Ltd.
Hisashi Akiyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of optical characterisation of liquids
Patent number
11,867,601
Issue date
Jan 9, 2024
Copenhagen Nanosystems ApS
Emil Højlund-Nielsen
G01 - MEASURING TESTING
Information
Patent Grant
Glittery ink and image forming device
Patent number
11,845,875
Issue date
Dec 19, 2023
Ricoh Company, Ltd.
Juichi Furukawa
G01 - MEASURING TESTING
Information
Patent Grant
Methods of testing liquid samples
Patent number
11,815,442
Issue date
Nov 14, 2023
BIONTER AG
Tobias Werk
G01 - MEASURING TESTING
Information
Patent Grant
Image pickup apparatus with rotation unit
Patent number
11,808,931
Issue date
Nov 7, 2023
EVIDENT CORPORATION
Satoshi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Pulse counting coincidence correction based on count rate and measu...
Patent number
11,789,166
Issue date
Oct 17, 2023
Aerosol Dynamics Inc.
Susanne Vera Hering
G01 - MEASURING TESTING
Information
Patent Grant
Miniature gas detection and purification device
Patent number
11,772,030
Issue date
Oct 3, 2023
Microjet Technology Co., Ltd.
Hao-Jan Mou
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
NEGATIVE ELECTRODE SHEET AND SCREENING METHOD THEREOF, BATTERY AND...
Publication number
20250003854
Publication date
Jan 2, 2025
Xiamen Hithium Energy Storage Technology Co., Ltd.
Shun LEI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and Method for Determining Particulate Size Distribution and...
Publication number
20240426729
Publication date
Dec 26, 2024
AirPhoton, LLC
Jose Vanderlei Martins
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRIC LIGHT FIELD IMAGING SYSTEM FOR AN AEROSOL PLUME
Publication number
20240418619
Publication date
Dec 19, 2024
ACME Atronomatic, LLC
Sarvesh GARIMELLA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR CHARACTERIZING PARTICLES AND METHOD FOR USE IN CHARAC...
Publication number
20240393221
Publication date
Nov 28, 2024
Malvern Panalytical Limited
David SPRIGGS
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS WITH DYNAMIC LIGHT SCATTERING ASSEMBLY
Publication number
20240385097
Publication date
Nov 21, 2024
Nutcracker Therapeutics, Inc.
Babak Sanii
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD
Publication number
20240385098
Publication date
Nov 21, 2024
Hitachi, Ltd
Tomonari MISAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD, DEVICE AND USE THEREOF FOR MEASURING THE SIZE AND/OR CONCEN...
Publication number
20240377305
Publication date
Nov 14, 2024
TOPAS GMBH TECHNOLOGIE-ORIENTIERTE PARTIKEL-, ANALYSEN- UND SENSORTECHNIK
Lukas OESER
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL ESTIMATION DEVICE, MATERIAL ESTIMATION SYSTEM, AND MATERIA...
Publication number
20240377306
Publication date
Nov 14, 2024
NEC Corporation
Kan KIMURA
G01 - MEASURING TESTING
Information
Patent Application
ULTRASENSITIVE SPECTROMETER
Publication number
20240377304
Publication date
Nov 14, 2024
Korea Advanced Institute of Science and Technology
Mooseok Jang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME ANALYSIS OF INHALED PARTICLES
Publication number
20240369464
Publication date
Nov 7, 2024
PNEUMAX, LLC
Kambez Hajipouran Benam
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DETECTING AND IDENTIFYING EXTRACELLULAR VESIC...
Publication number
20240369463
Publication date
Nov 7, 2024
INESC TEC - INSTITUTO DE ENGENHARIA DE SISTEMAS E COMPUTADORES, TECNOLOGIA E...
Joana Isabel DOS SANTOS PAIVA
G01 - MEASURING TESTING
Information
Patent Application
DROPLET DETECTION METROLOGY UTILIZING METROLOGY BEAM SCATTERING
Publication number
20240361222
Publication date
Oct 31, 2024
ASML NETHERLANDS B.V.
Dustin Michael Urone
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PARTICLE CHARACTERISATION METHOD AND APPARATUS
Publication number
20240319061
Publication date
Sep 26, 2024
Malvern Panalytical Limited
Daniel MARWICK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRI...
Publication number
20240310264
Publication date
Sep 19, 2024
HORIBA, LTD.
Tetsuji YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING FINE BUBBLE DISPERSION LIQUID
Publication number
20240295483
Publication date
Sep 5, 2024
OHDAIRA LABORATORY COMPANY
Takeshi OHDAIRA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS APPARATUS, PARTICLE IMAGE ANALYSIS SYSTEM,...
Publication number
20240290116
Publication date
Aug 29, 2024
HORIBA, LTD.
Yasuhiro TATEWAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
Publication number
20240280459
Publication date
Aug 22, 2024
KIOXIA Corporation
Yusuke OSHIMA
G01 - MEASURING TESTING
Information
Patent Application
SLURRY MONITORING DEVICE, CMP SYSTEM AND METHOD OF IN-LINE MONITORI...
Publication number
20240189961
Publication date
Jun 13, 2024
Taiwan Semiconductor Manufacturing company Ltd.
CHWEN YU
G01 - MEASURING TESTING
Information
Patent Application
DEALING WITH FOG AND CONTAMINATIONS IN ENVIRONMENTAL SENSOR DEVICES
Publication number
20240192121
Publication date
Jun 13, 2024
SENSIRION AG
Dominik NIEDERBERGER
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE CHARACTERISATION
Publication number
20240192108
Publication date
Jun 13, 2024
Malvern Panalytical Limited
Jason CORBETT
G01 - MEASURING TESTING
Information
Patent Application
EXCITATION-EMISSION MATRIX FLOW CYTOMETRY SYSTEMS AND USES THEREOF
Publication number
20240167934
Publication date
May 23, 2024
SCINTILLON INSTITUTE FOR BIOMEDICAL AND BIOENERGY RESEARCH
John P. NOLAN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PARTICLE CHARACTERIZATION APPARATUS
Publication number
20240151624
Publication date
May 9, 2024
The United States of America, as represented by the Secretary of Commerce
Daniel M. Murphy
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING PARTICLES OF INTEREST USING MULTI...
Publication number
20240142359
Publication date
May 2, 2024
Hyperspectral Corp.
Sarah Rachel Hernandez
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE GROUP CHARACTERISTIC MEASUREMENT DEVICE, PARTICLE GROUP CH...
Publication number
20240102907
Publication date
Mar 28, 2024
HORIBA, LTD.
Yasuhiro TATEWAKI
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASUREMENT DEVICE AND PARTICLE MEASUREMENT METHOD
Publication number
20240085298
Publication date
Mar 14, 2024
FUJIFILM CORPORATION
Sohichiro NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MONITORING SYSTEM, PARTICLE MONITORING METHOD, AND MONITOR...
Publication number
20240068921
Publication date
Feb 29, 2024
TOKYO ELECTRON LIMITED
Satoru TERUUCHI
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC 3D LIGHT SCATTERING PARTICLE SIZE DISTRIBUTION MEASURING DE...
Publication number
20240019350
Publication date
Jan 18, 2024
SYMPATEC GMBH
Daniel WERNER
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU APPARATUS FOR DETECTING ABNORMALITY IN PROCESS TUBE
Publication number
20230384211
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Yu-Jen YANG
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC LIGHT SCATTERING MEASUREMENT METHOD AND DYNAMIC LIGHT SCATT...
Publication number
20230375455
Publication date
Nov 23, 2023
FUJIFILM CORPORATION
Kenichi HAMADA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE INFORMATION ACQUISITION DEVICE
Publication number
20230349805
Publication date
Nov 2, 2023
THE WAVE TALK, INC.
Young Dug KIM
G01 - MEASURING TESTING