Investigating or analysing materials by the use of microwaves

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Patents Grantslast 30 patents

Information Patent Grant
Specimen radiography system comprising a cabinet and a specimen dra...
- Patent number 12,364,443
- Issue date Jul 22, 2025
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Bending test facility and bending test method for metal sheet mater...
- Patent number 12,366,510
- Issue date Jul 22, 2025
- JFE Steel Corporation
- Tomohiro Sakaidani
- G01 - MEASURING TESTING
Information Patent Grant
Organic plant material microbial test kit devices and processing me...
- Patent number 12,366,529
- Issue date Jul 22, 2025
- Craig Ellins
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection system
- Patent number 12,366,542
- Issue date Jul 22, 2025
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Gaseous bubble system and method to measure gelation time
- Patent number 12,366,554
- Issue date Jul 22, 2025
- Saudi Arabian Oil Company
- Mohanad M. Fahmi
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing method and ultrasonic testing device
- Patent number 12,366,556
- Issue date Jul 22, 2025
- KANADEVIA CORPORATION
- Kaoru Shinoda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection robots and methods for inspection of curved surfaces wit...
- Patent number 12,365,199
- Issue date Jul 22, 2025
- Gecko Robotics, Inc.
- Edward A. Bryner
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Estimating soil properties within a field using hyperspectral remot...
- Patent number 12,366,678
- Issue date Jul 22, 2025
- CLIMATE LLC
- Nick Cisek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface-enhanced Raman scattering substrate for fuel oil analysis
- Patent number 12,366,534
- Issue date Jul 22, 2025
- King Fahd University of Petroleum & Minerals
- Abdulaziz Abdulrahman Al-Saadi
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Optical transmission sample holder and analysis, particularly for h...
- Patent number 12,366,520
- Issue date Jul 22, 2025
- ESSENLIX CORPORATION
- Stephen Y. Chou
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Fruit maturity and quality scanning
- Patent number 12,366,524
- Issue date Jul 22, 2025
- Colorado State University Research Foundation
- Ioannis Minas
- G01 - MEASURING TESTING
Information Patent Grant
Phase retrieval
- Patent number 12,366,525
- Issue date Jul 22, 2025
- Applied Materials Israel Ltd.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Grant
System including a fiber laser module
- Patent number 12,366,532
- Issue date Jul 22, 2025
- Atonarp Inc.
- Mateusz Plewicki
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,366,538
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, methods, and apparatus for ultra-sonic inspection of a sur...
- Patent number 12,366,557
- Issue date Jul 22, 2025
- Gecko Robotics, Inc.
- Chase David
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for live projection imaging for fluorescence mi...
- Patent number 12,366,740
- Issue date Jul 22, 2025
- The Board of Regents of the University of Texas System
- Reto Fiolka
- G01 - MEASURING TESTING
Information Patent Grant
Methods for preparing magnetostrictive powder and magnetostrictive...
- Patent number 12,367,995
- Issue date Jul 22, 2025
- CHINA SPECIAL EQUIPMENT INSPECTION AND RESEARCH INSTITUTE
- Gongtian Shen
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method and apparatus for determining optical density of a solution
- Patent number 12,366,528
- Issue date Jul 22, 2025
- Cytiva Sweden AB
- Hanno Ehring
- G01 - MEASURING TESTING
Information Patent Grant
Use of vibrational spectroscopy for microfluidic liquid measurement
- Patent number 12,364,984
- Issue date Jul 22, 2025
- 1087 Systems, Inc.
- Matthias Wagner
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Colorimeter optical measurement interference mitigation
- Patent number 12,366,522
- Issue date Jul 22, 2025
- Hach Company
- Russell Paul Gorham
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection device
- Patent number 12,366,539
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Katsuhiko Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Welding assessment during welding process
- Patent number 12,366,555
- Issue date Jul 22, 2025
- Georg Fischer Rohrleitungssysteme AG
- Riccardo Barbone
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic transmission device and wave control method
- Patent number 12,366,558
- Issue date Jul 22, 2025
- Seoul National University R&DB Foundation
- Yoon Young Kim
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
- Patent number 12,366,445
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Alexander Von Finck
- G01 - MEASURING TESTING
Information Patent Grant
System and method for soil characterization
- Patent number 12,360,099
- Issue date Jul 15, 2025
- X-Centric Sciences Inc.
- Roozbeh Ravansari
- G01 - MEASURING TESTING
Information Patent Grant
Laser shearography end effector for industrial robot system
- Patent number 12,360,057
- Issue date Jul 15, 2025
- Wichita State University
- John Tomblin
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Backscatter imaging system
- Patent number 12,360,065
- Issue date Jul 15, 2025
- Varex Imaging Corporation
- Daniel Shedlock
- G01 - MEASURING TESTING
Information Patent Grant
Biosensor for coagulation testing
- Patent number 12,360,125
- Issue date Jul 15, 2025
- Zomedica Biotechnologies LLC
- Florian Bell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring a sample by x-ray reflectance scatt...
- Patent number 12,360,063
- Issue date Jul 15, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for capture of small-angle scatter over wide fields of view
- Patent number 12,360,064
- Issue date Jul 15, 2025
- Quadridox, Inc.
- Joel Alter Greenberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20250237615
- Publication date Jul 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
CONVEYING SYSTEM FOR INSPECTION DEVICE
- Publication number 20250237617
- Publication date Jul 24, 2025
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
INDENTATION PLASTOMETY
- Publication number 20250237588
- Publication date Jul 24, 2025
- PLASTOMETREX LTD
- Trevor William CLYNE
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
POLARIZER ASSEMBLY AND SPECTROSCOPIC ELLIPSOMETER INCLUDING THE SAME
- Publication number 20250237861
- Publication date Jul 24, 2025
- Samsung Electronics Co., Ltd.
- Jiyong Shin
- G02 - OPTICS
Information Patent Application
FLEXURAL CORROSION MACHINE ADVANCE MODEL
- Publication number 20250237597
- Publication date Jul 24, 2025
- The Boeing Company
- Bruno Zamorano SENDEROS
- G01 - MEASURING TESTING
Information Patent Application
DEVICES, SYSTEMS AND METHODS FOR DETECTING MICROBIAL ACTIVITY
- Publication number 20250237610
- Publication date Jul 24, 2025
- The Procter & Gamble Company
- Lucia MENDEZ-MATA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND METHOD
- Publication number 20250237620
- Publication date Jul 24, 2025
- Purdue Research Foundation
- Aaron James Specht
- G01 - MEASURING TESTING
Information Patent Application
HIGH-DEFINITION EMISSION TOMOGRAPHY IMAGE ACQUISITION DEVICE FOR HI...
- Publication number 20250239377
- Publication date Jul 24, 2025
- UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS
- Chul Hee MIN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Programmable Multi-Wavelength RF Spectrometry Networks
- Publication number 20250237616
- Publication date Jul 24, 2025
- The Regents of the University of California
- Peter Tseng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICES FOR BIOLOGICAL ANALYSIS
- Publication number 20250237602
- Publication date Jul 24, 2025
- CELLSBIN, INC.
- Ali KABIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE
- Publication number 20250237607
- Publication date Jul 24, 2025
- Cerillo, Inc.
- Kevin Seitter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING RHEOLOGICAL CHARACTERISTICS OF...
- Publication number 20250237587
- Publication date Jul 24, 2025
- Shandong University
- Shucai LI
- G01 - MEASURING TESTING
Information Patent Application
TEST OBJECT ANALYSIS METHOD
- Publication number 20250237608
- Publication date Jul 24, 2025
- HAMAMTSU PHOTONICS K.K.
- Kazuhiko FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
FLUID SAFETY DEVICE FOR DETECTING AND MONITORING SPOILAGE OF PERISH...
- Publication number 20250237612
- Publication date Jul 24, 2025
- MOHAMMED AL-MANA COLLEGE FOR MEDICAL SCIENCES
- Fardus Abdullah ALJUNIBI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250237618
- Publication date Jul 24, 2025
- Nuctech Company Limited
- Zhiqiang CHEN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING COLOR MATCH FOR SURFACE COATINGS
- Publication number 20250237638
- Publication date Jul 24, 2025
- SWIMC LLC
- Klaas DE HAAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION BEAM TIME OF ARRIVAL (TOA) GAUGE
- Publication number 20250237546
- Publication date Jul 24, 2025
- Analex Corporation
- Todd Evan Vande Brake
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING THE MEDIAN RADIUS OF BUBBLES IN A FOAMED PLAST...
- Publication number 20250231096
- Publication date Jul 17, 2025
- SAINT-GOBAIN PLACO
- Valentin LEROY
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL LOCALIZED SURFACE PLASMON RESONANCE SENSOR USING BUNDLE OF...
- Publication number 20250231107
- Publication date Jul 17, 2025
- INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY
- Seung Ki LEE
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTION DEVICE
- Publication number 20250231111
- Publication date Jul 17, 2025
- Japan Display Inc.
- Yasuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS
- Publication number 20250231127
- Publication date Jul 17, 2025
- FEI Company
- Marek Vanatka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NUCLEAR POWER PLANT DIAGNOSTICS
- Publication number 20250231148
- Publication date Jul 17, 2025
- Rolls-Royce Corporation
- Scott Nelson
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...
- Publication number 20250228509
- Publication date Jul 17, 2025
- Siemens Healthineers International AG
- Mathieu PLAMONDON
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS
- Publication number 20250231113
- Publication date Jul 17, 2025
- RTX Corporation
- David U. Furrer
- G01 - MEASURING TESTING
Information Patent Application
System for Measuring Microplastics in an Aquatic Environment
- Publication number 20250231115
- Publication date Jul 17, 2025
- Ely Oser
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY
- Publication number 20250231126
- Publication date Jul 17, 2025
- Gold Standard Radiation Detection, Inc.
- Mark DERZON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLUID TRANSPORT DIAGNOSTICS
- Publication number 20250231146
- Publication date Jul 17, 2025
- Rolls-Royce Corporation
- Benjamin W. Lagow
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF CORROSION RESISTANCE ALLOY WITH MANUAL WELD OVERLAY U...
- Publication number 20250231149
- Publication date Jul 17, 2025
- Saudi Arabian Oil Company
- Hani Akl
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Investigating or analysing materials by the use of microwaves

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Specimen radiography system comprising a cabinet and a specimen dra...

Bending test facility and bending test method for metal sheet mater...

Organic plant material microbial test kit devices and processing me...

Nondestructive inspection system

Gaseous bubble system and method to measure gelation time

Ultrasonic testing method and ultrasonic testing device

Inspection robots and methods for inspection of curved surfaces wit...

Estimating soil properties within a field using hyperspectral remot...

Surface-enhanced Raman scattering substrate for fuel oil analysis

Optical transmission sample holder and analysis, particularly for h...

Fruit maturity and quality scanning

Phase retrieval

System including a fiber laser module

Defect inspection apparatus and defect inspection method

Systems, methods, and apparatus for ultra-sonic inspection of a sur...

Systems and methods for live projection imaging for fluorescence mi...

Methods for preparing magnetostrictive powder and magnetostrictive...

Method and apparatus for determining optical density of a solution

Use of vibrational spectroscopy for microfluidic liquid measurement

Colorimeter optical measurement interference mitigation

Surface inspection device

Welding assessment during welding process

Ultrasonic transmission device and wave control method

Measuring apparatus and method for roughness and/or defect measurem...

System and method for soil characterization

Laser shearography end effector for industrial robot system

Backscatter imaging system

Biosensor for coagulation testing

System and method for measuring a sample by x-ray reflectance scatt...

Method for capture of small-angle scatter over wide fields of view

Patents Applicationslast 30 patents

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

CONVEYING SYSTEM FOR INSPECTION DEVICE

INDENTATION PLASTOMETY

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

POLARIZER ASSEMBLY AND SPECTROSCOPIC ELLIPSOMETER INCLUDING THE SAME

FLEXURAL CORROSION MACHINE ADVANCE MODEL

DEVICES, SYSTEMS AND METHODS FOR DETECTING MICROBIAL ACTIVITY

DETECTION SYSTEM AND METHOD

HIGH-DEFINITION EMISSION TOMOGRAPHY IMAGE ACQUISITION DEVICE FOR HI...

Programmable Multi-Wavelength RF Spectrometry Networks

DEVICES FOR BIOLOGICAL ANALYSIS

AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE

METHOD AND SYSTEM FOR CHARACTERIZING RHEOLOGICAL CHARACTERISTICS OF...

TEST OBJECT ANALYSIS METHOD

FLUID SAFETY DEVICE FOR DETECTING AND MONITORING SPOILAGE OF PERISH...

INSPECTION DEVICE AND INSPECTION METHOD

METHOD AND SYSTEM FOR DETERMINING COLOR MATCH FOR SURFACE COATINGS

ION BEAM TIME OF ARRIVAL (TOA) GAUGE

DEVICE FOR MEASURING THE MEDIAN RADIUS OF BUBBLES IN A FOAMED PLAST...

DIGITAL LOCALIZED SURFACE PLASMON RESONANCE SENSOR USING BUNDLE OF...

FLUORESCENCE DETECTION DEVICE

ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS

NUCLEAR POWER PLANT DIAGNOSTICS

ESTIMATING SCATTER IN X-RAY IMAGES CAUSED BY IMAGING SYSTEM COMPONE...

METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS

System for Measuring Microplastics in an Aquatic Environment

WAFER INSPECTION METHOD

COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY

FLUID TRANSPORT DIAGNOSTICS

INSPECTION OF CORROSION RESISTANCE ALLOY WITH MANUAL WELD OVERLAY U...