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Investigating or analysing materials by the use of microwaves
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N22/00
Investigating or analysing materials by the use of microwaves
Sub Industries
G01N22/005
and using Stark effect modulation
G01N22/02
Investigating the presence of flaws
G01N22/04
Investigating moisture content
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for in vivo detection of clots within circulatory...
Patent number
12,213,730
Issue date
Feb 4, 2025
BIOVENTURES, LLC
Vladimir Pavlovich Zharov
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method of preparing an organic material sample for LIBS analysis an...
Patent number
12,216,035
Issue date
Feb 4, 2025
Foss Analytical A/S
Ahmed Fadil
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensors
Patent number
12,216,049
Issue date
Feb 4, 2025
Drager Safety AG & Co. KGaA
Håkon Sagberg
G01 - MEASURING TESTING
Information
Patent Grant
Microscope image capturing methods
Patent number
12,216,055
Issue date
Feb 4, 2025
President and Fellows of Harvard College
Adam Ezra Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for wavefront analysis and microscopic imaging systems compr...
Patent number
12,216,056
Issue date
Feb 4, 2025
Imagine Optic
Fabrice Harms
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
Patent number
12,216,066
Issue date
Feb 4, 2025
Science Applications International Corporation
Theodore W. Eastes
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Processing system for processing specimens using acoustic energy
Patent number
12,216,089
Issue date
Feb 4, 2025
Ventana Medical Systems, Inc.
David Chafin
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic testing probe, couplant delivery system, and ultrasonic...
Patent number
12,216,092
Issue date
Feb 4, 2025
Westinghouse Electric Company LLC
Jacques L. Brignac
G01 - MEASURING TESTING
Information
Patent Grant
Material testing systems including improved component cooling
Patent number
12,216,094
Issue date
Feb 4, 2025
Illinois Tool Works Inc.
Nicholas H. Bradshaw
G01 - MEASURING TESTING
Information
Patent Grant
Bifocal electron microscope
Patent number
12,216,068
Issue date
Feb 4, 2025
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Material testing system having improved hydraulic wedge grips
Patent number
12,216,093
Issue date
Feb 4, 2025
United States of America as represented by the Secretary of the Air Force
James M Greer
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method for oxygen sensor, medical ventilation system, a...
Patent number
12,214,127
Issue date
Feb 4, 2025
Shenzhen Mindray Bio-Medical Electronics Co., Ltd.
Congying Wan
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Measurement of dissolved oxygen using optical radiation induced lum...
Patent number
12,216,046
Issue date
Feb 4, 2025
Yokogawa Electric Corporation
Anatoliy A. Kosterev
G01 - MEASURING TESTING
Information
Patent Grant
Quantifying color changes in chemical test pads induced by differen...
Patent number
12,216,060
Issue date
Feb 4, 2025
HEALTHY.IO LTD.
Bernard Burg
G01 - MEASURING TESTING
Information
Patent Grant
Insulating device
Patent number
12,216,070
Issue date
Feb 4, 2025
Kabushiki Kaisha Toshiba
Takuo Kikuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging of elastic wave guides interconnected by a junction
Patent number
12,216,088
Issue date
Feb 4, 2025
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Arnaud Recoquillay
G01 - MEASURING TESTING
Information
Patent Grant
Phase-based approach for ultrasonic inspection
Patent number
12,216,091
Issue date
Feb 4, 2025
Evident Canada, Inc.
Guillaume Painchaud-April
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus
Patent number
12,216,045
Issue date
Feb 4, 2025
Shimadzu Corporation
Tatsuya Ikehara
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform spectrometer and method of Fourier transform spec...
Patent number
12,216,047
Issue date
Feb 4, 2025
The University of Manchester
Nawapong Unsuree
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus
Patent number
12,216,048
Issue date
Feb 4, 2025
Ricoh Company, Ltd.
Ryosuke Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic phase-shift interferometer utilizing a synchronous optical...
Patent number
12,216,051
Issue date
Feb 4, 2025
Onto Innovation Inc.
James Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting cans
Patent number
12,216,062
Issue date
Feb 4, 2025
Krones AG
Stefan Piana
G01 - MEASURING TESTING
Information
Patent Grant
Assisting device for blade detection
Patent number
12,216,090
Issue date
Feb 4, 2025
Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan,...
Yu-Chu Lin
F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information
Patent Grant
Drop test device and drop test method using the same
Patent number
12,216,095
Issue date
Feb 4, 2025
Samsung Display Co., Ltd.
Gabtae Kim
G01 - MEASURING TESTING
Information
Patent Grant
MEMS resonator sensor substrate for plasma, temperature, stress, or...
Patent number
12,216,015
Issue date
Feb 4, 2025
Applied Materials, Inc.
Chuang-Chia Lin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System for measuring thickness and physical properties of thin film...
Patent number
12,216,044
Issue date
Feb 4, 2025
Seoul National University R&DB Foundation
Heui Jae Pahk
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional fluorescence imaging system comprising single-obj...
Patent number
12,210,144
Issue date
Jan 28, 2025
WUHAN SMARTVIEW BIOTECHNOLOGY CO., LTD.
Yuxuan Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Filterless non-dispersive infrared sensing devices and methods
Patent number
12,209,949
Issue date
Jan 28, 2025
Vanderbilt University
Joshua D. Caldwell
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for spectral imaging of density, anisotropy, and...
Patent number
12,209,951
Issue date
Jan 28, 2025
CZ Biohub SF, LLC.
Shalin Mehta
G01 - MEASURING TESTING
Information
Patent Grant
Foreign substance/defect inspection device, image generation device...
Patent number
12,209,971
Issue date
Jan 28, 2025
VIENEX CORPORATION
Osamu Iwasaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR QUANTIFYING COMPONENT IN RUBBER COMPOSITION
Publication number
20250044203
Publication date
Feb 6, 2025
TOYO TIRE CORPORATION
Yohsuke Kobiki
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION STANDARD, SENSOR ARRANGEMENT AND USE
Publication number
20250044229
Publication date
Feb 6, 2025
Endress + Hauser Conducta GmbH + Co. KG
Andreas Bayer
G01 - MEASURING TESTING
Information
Patent Application
Substrates and Optical Systems and Methods of Use Thereof
Publication number
20250043345
Publication date
Feb 6, 2025
Pacific Biosciences of California, Inc.
Cheng Frank Zhong
G01 - MEASURING TESTING
Information
Patent Application
SUPER-RESOLUTION THERMOREFLECTANCE THERMAL MEASUREMENT SYSTEM
Publication number
20250044218
Publication date
Feb 6, 2025
The Penn State Research Foundation
Brian M. Foley
G01 - MEASURING TESTING
Information
Patent Application
SUBSTANCE COMPONENT DETECTION APPARATUS AND METHOD
Publication number
20250044224
Publication date
Feb 6, 2025
Huawei Technologies Co., Ltd
Li Zheng
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR WITH REDUCED FLUORESCENCE RANGE NOISE
Publication number
20250044228
Publication date
Feb 6, 2025
Illumina, Inc.
Tracy H. FUNG
G01 - MEASURING TESTING
Information
Patent Application
Modular Optical Analytic Systems and Methods
Publication number
20250044234
Publication date
Feb 6, 2025
Illumina, Inc.
Wenyi Feng
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR NON-INVASIVE GLUCOSE MONITORING
Publication number
20250044242
Publication date
Feb 6, 2025
KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
Yaqub Alhussain MAHNASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD, SYSTEM AND SENSOR FOR DETERMINING PHYSICAL PROPERTIES OF CO...
Publication number
20250044259
Publication date
Feb 6, 2025
FILUMSENSE INC.
Aleksander SCHILLER
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
Publication number
20250045984
Publication date
Feb 6, 2025
Nuctech Company Limited
Li ZHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPLEX LABELING OF MOLECULES BY SEQUENTIAL HYBRIDIZATION BARCODING
Publication number
20250043340
Publication date
Feb 6, 2025
California Institute of Technology
Long Cai
G01 - MEASURING TESTING
Information
Patent Application
NOVEL METHOD FOR ESTIMATING WATER SATURATION IN GAS RESERVOIRS USIN...
Publication number
20250044474
Publication date
Feb 6, 2025
Goshey Energy Services LLC
Sheyore John Omovie
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE
Publication number
20250044216
Publication date
Feb 6, 2025
Japan Display Inc.
Tomoyuki ISHIHARA
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...
Publication number
20250044219
Publication date
Feb 6, 2025
SCHLUMBERGER TECHNOLOGY CORPORATION
Sebastien Catheline
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Off-Axis Bubble Detection
Publication number
20250044225
Publication date
Feb 6, 2025
Life Technologies Corporation
Daniel Quigley
G01 - MEASURING TESTING
Information
Patent Application
STATE ESTIMATION SYSTEM AND METHOD
Publication number
20250044260
Publication date
Feb 6, 2025
Nippon Telegraph and Telephone Corporation
Arinobu NIIJIMA
G01 - MEASURING TESTING
Information
Patent Application
PIPELINE INSPECTION SYSTEM
Publication number
20250043899
Publication date
Feb 6, 2025
CATHOLIC KWANDONG UNIVERSITY INDUSTRY FOUNDATION
Ung-Kyun Lee
G01 - MEASURING TESTING
Information
Patent Application
WAFER DEFECT INSPECTION SYSTEM
Publication number
20250044241
Publication date
Feb 6, 2025
SYNTEC RESOURCES CO., LTD.
KANG-FENG FAN
G01 - MEASURING TESTING
Information
Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
Publication number
20250044476
Publication date
Feb 6, 2025
SCHLUMBERGER TECHNOLOGY CORPORATION
Shikha Prasad
G01 - MEASURING TESTING
Information
Patent Application
SELF-ADAPTIVE ALL-FIBER LASER ULTRASONIC MEASURING INSTRUMENT
Publication number
20250044217
Publication date
Feb 6, 2025
ZHEJIANG UNIVERSITY
Jian CHEN
G01 - MEASURING TESTING
Information
Patent Application
MID-INFRARED WAVEGUIDE SENSORS FOR VOLATILE ORGANIC COMPOUNDS
Publication number
20250044226
Publication date
Feb 6, 2025
THE TEXAS A&M UNIVERSITY SYSTEM
Pao Tai Lin
G01 - MEASURING TESTING
Information
Patent Application
BIOSENSORS FOR BIOLOGICAL OR CHEMICAL ANALYSIS AND METHODS OF MANUF...
Publication number
20250044230
Publication date
Feb 6, 2025
Illumina, Inc.
Cheng Frank Zhong
G01 - MEASURING TESTING
Information
Patent Application
Surface Inspection Device
Publication number
20250044240
Publication date
Feb 6, 2025
Hitachi High-Tech Corporation
Ayumi TOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING ABRASION RESISTANCE OF RUBBER COMPOSITION AND...
Publication number
20250043117
Publication date
Feb 6, 2025
Sumitomo Rubber Industries, Ltd.
Ryo MASHITA
B60 - VEHICLES IN GENERAL
Information
Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
Publication number
20250033212
Publication date
Jan 30, 2025
Gecko Robotics, Inc.
Alberto Pinero
B60 - VEHICLES IN GENERAL
Information
Patent Application
MATCHING LAYER FOR ACOUSTIC TRANSDUCER
Publication number
20250037690
Publication date
Jan 30, 2025
The Penn State Research Foundation
Sri-Rajasekhar Kothapalli
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
CHIRP MODULATION SIMULATED RAMAN SCATTERING MICROSCOPY
Publication number
20250035487
Publication date
Jan 30, 2025
National Research Council of Canada
Adrian PEGORARO
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL TESTING SYSTEMS WITH SENSOR STATUS TESTS
Publication number
20250035522
Publication date
Jan 30, 2025
Illinois Tool Works Inc.
Daniel Vincent Caesar
G01 - MEASURING TESTING
Information
Patent Application
WEAR TEST METHOD AND DEVICE FOR END MILLING CUTTER
Publication number
20250035525
Publication date
Jan 30, 2025
Zhejiang Xizi Spirit Aviation Industry Co., Ltd,
Yun Fu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR PREDICTING RELIABILITY OF CROSS-LINKED POLYETHYLENE CABL...
Publication number
20250035573
Publication date
Jan 30, 2025
ELECTRIC PWR. RES. INST., CHINA SOUTH. PWR. GRID
Shuai HOU
G01 - MEASURING TESTING