Investigating or analysing materials by the use of microwaves

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Patents Grantslast 30 patents

Information Patent Grant
Joint for a scan window formed to a cylinder
- Patent number 12,324,692
- Issue date Jun 10, 2025
- GE Precision Healthcare LLC
- Michael Eric Smith
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Measuring device for measuring the absorption of gases
- Patent number 12,326,400
- Issue date Jun 10, 2025
- Drager Safety AG & Co. KGaA
- Arne Tröllsch
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Mounting arrangement with a vibronic sensor
- Patent number 12,326,420
- Issue date Jun 10, 2025
- ENDRESS+HAUSER SE+CO.KG
- Thomas Vogt
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a film comprising cavities with determinat...
- Patent number 12,325,171
- Issue date Jun 10, 2025
- ALEPH SAS
- Jan Gaudaen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Detection method, apparatus and system
- Patent number 12,326,408
- Issue date Jun 10, 2025
- Nuctech Company Limited
- Zhi Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving sound quality of sound reproductions or sound...
- Patent number 12,328,554
- Issue date Jun 10, 2025
- Bang & Olufsen A/S
- Lasse Zinck Thomasberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for making and using sensors, probes, and other...
- Patent number 12,324,663
- Issue date Jun 10, 2025
- President and Fellows of Harvard College
- Qimin Quan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Degradable microsphere and use thereof
- Patent number 12,325,767
- Issue date Jun 10, 2025
- Tsinghua University
- Jianbin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Refractive index distribution standard
- Patent number 12,326,401
- Issue date Jun 10, 2025
- Politechnika Warszawska
- Michal Ziemczonok
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for detecting air in a fluid line usi...
- Patent number 12,326,421
- Issue date Jun 10, 2025
- Deka Products Limited Partnership
- Michael J. Wilt
- G01 - MEASURING TESTING
Information Patent Grant
Lift loop assembly test process and apparatus
- Patent number 12,325,580
- Issue date Jun 10, 2025
- Ameriglobe, LLC
- Clifford Dunlap
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and system for inspecting quality of tire member
- Patent number 12,325,202
- Issue date Jun 10, 2025
- The Yokohama Rubber Co., Ltd.
- Mitsuo Tsuji
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Optical transmission sample holder and analysis, particularly for h...
- Patent number 12,326,396
- Issue date Jun 10, 2025
- ESSENLIX CORPORATION
- Stephen Y. Chou
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Transformer DC magnetization detection and mitigation through vibra...
- Patent number 12,327,675
- Issue date Jun 10, 2025
- HITACHI ENERGY LTD
- Daniel Siemaszko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging system, radiation imaging apparatus, control meth...
- Patent number 12,324,698
- Issue date Jun 10, 2025
- Canon Kabushiki Kaisha
- Yutaka Ishinari
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,326,407
- Issue date Jun 10, 2025
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Sample component determination method, sample component determinati...
- Patent number 12,326,409
- Issue date Jun 10, 2025
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Device with a fluid component assessment feature
- Patent number 12,326,442
- Issue date Jun 10, 2025
- Siemens Healthcare Diagnostics Inc.
- Jennifer Samproni
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Divided-aperture infra-red spectral imaging system
- Patent number 12,326,371
- Issue date Jun 10, 2025
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tool stabilization mechanism and related methods
- Patent number 12,326,553
- Issue date Jun 10, 2025
- General Electric Company
- Kirti Arvind Petkar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Blood glucose measurement based on raman spectroscopy
- Patent number 12,318,195
- Issue date Jun 3, 2025
- Apollon Inc.
- Miyeon Jue
- G01 - MEASURING TESTING
Information Patent Grant
Joined body testing method, joined body testing device, and joined...
- Patent number 12,320,781
- Issue date Jun 3, 2025
- Kobe Steel, Ltd.
- Ryusuke Hioki
- G01 - MEASURING TESTING
Information Patent Grant
Device for detecting SAR, method for reducing SAR, and mobile terminal
- Patent number 12,320,760
- Issue date Jun 3, 2025
- ZTE Corporation
- Ruibin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Large die wafer, large die and method of forming the same
- Patent number 12,322,707
- Issue date Jun 3, 2025
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Sheng Hu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PORTABLE IMAGING DEVICES, METHODS, AND SYSTEMS FOR WOUND IMAGING AN...
- Publication number 20250185914
- Publication date Jun 12, 2025
- University Health Network
- Ralph S. DaCosta
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD
- Publication number 20250189439
- Publication date Jun 12, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Risa Hara
- G01 - MEASURING TESTING
Information Patent Application
MICROPLATE READER
- Publication number 20250189450
- Publication date Jun 12, 2025
- Molecular Devices, LLC
- Zhiqiang ZHANG
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20250189491
- Publication date Jun 12, 2025
- Fujitsu Limited
- Suguru YASUTOMI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
- Publication number 20250191221
- Publication date Jun 12, 2025
- SONY GROUP CORPORATION
- Kayoko TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICE APPLIED TO COUPLED ENVIRONMENT OF STRESS, WEAR, AND COR...
- Publication number 20250189431
- Publication date Jun 12, 2025
- OCEAN UNIVERSITY OF CHINA
- Hongzhi CUI
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES
- Publication number 20250189435
- Publication date Jun 12, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Application
Device, system and method for optical gas analysis
- Publication number 20250189441
- Publication date Jun 12, 2025
- AXETRIS AG
- Paolo Antonio Losio
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- Davide Giassi
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
- Publication number 20250189469
- Publication date Jun 12, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microscopic Object Condensation Method, Microscopic Object Condensa...
- Publication number 20250189417
- Publication date Jun 12, 2025
- University Public Corporation Osaka
- Takuya Iida
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MULTIPASS ABSORPTION CELL
- Publication number 20250189433
- Publication date Jun 12, 2025
- Alpes Lasers SA
- Richard MAULINI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING A COMPONENT
- Publication number 20250189463
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250189468
- Publication date Jun 12, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC MODULES
- Publication number 20250192721
- Publication date Jun 12, 2025
- NewSouth Innovations Pty Limited
- Oliver KUNZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- Karthickraj Muthuramalingam
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION FLOW DETERMINATION DEVICE, CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20250189462
- Publication date Jun 12, 2025
- HITACHI HIGH-TECH CORPORATION
- Norifumi KAMESHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250189465
- Publication date Jun 12, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS
- Publication number 20250189467
- Publication date Jun 12, 2025
- IXRF, Inc.
- Robert Clayton Tisdale
- G01 - MEASURING TESTING
Information Patent Application
SENSORS INCORPORATED INTO ADHESIVE MATERIAL
- Publication number 20250189490
- Publication date Jun 12, 2025
- Lyten, Inc.
- Daniel Jardine
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD FOR EVALUATING SUSCEPTIBILITY TO LIQUID METAL EMBRITTLEMENT...
- Publication number 20250189505
- Publication date Jun 12, 2025
- JFE STEEL CORPORATION
- Koichi YASUDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SILICA IN ROCK SAMPLES
- Publication number 20250189508
- Publication date Jun 12, 2025
- Chevron U.S.A. Inc.
- Eliza MATHIA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE, AND PROGRAM FOR PREDICTING DELAYED FRACTURE IN PRES...
- Publication number 20250190644
- Publication date Jun 12, 2025
- JFE STEEL CORPORATION
- Koji TATSUKAWA
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Multi-Pulse Flash X-ray for Pulsed X-ray Cineradiography
- Publication number 20250193990
- Publication date Jun 12, 2025
- U.S. Army DEVCOM, Army Research Laboratory
- Michael B. Zellner
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR CABINET RADIOGRAPHY INCORPORATING A GAMMA OR...
- Publication number 20250191586
- Publication date Jun 12, 2025
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLOATING PLATFORM SYSTEM FOR MECHANICAL TESTING OF GELS AND TISSUES
- Publication number 20250189419
- Publication date Jun 12, 2025
- The Regents of the University of Colorado, a Body Corporate
- Tyler TUTTLE
- G01 - MEASURING TESTING
Information Patent Application
PULSE LASER SPECTROMETER
- Publication number 20250189440
- Publication date Jun 12, 2025
- EMERSON PROCESS MANAGEMENT LIMITED
- David LOGIE
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...
- Publication number 20250189445
- Publication date Jun 12, 2025
- TSINGHUA UNIVERSITY
- Ziran ZHAO
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC PLANT MATERIAL MICROBIAL TEST KIT DEVICES AND PROCESSING ME...
- Publication number 20250189447
- Publication date Jun 12, 2025
- Craig Ellins
- G01 - MEASURING TESTING

Investigating or analysing materials by the use of microwaves

Industry

Parent Industries

Current Industry

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Patents Grantslast 30 patents

Joint for a scan window formed to a cylinder

Measuring device for measuring the absorption of gases

Electron spectroscopy based techniques for determining various chem...

Mounting arrangement with a vibronic sensor

Method for manufacturing a film comprising cavities with determinat...

Detection method, apparatus and system

Method for improving sound quality of sound reproductions or sound...

Automatic particle beam focusing

Systems and methods for making and using sensors, probes, and other...

Degradable microsphere and use thereof

Refractive index distribution standard

Inspection system for manufactured components

System, method, and apparatus for detecting air in a fluid line usi...

Lift loop assembly test process and apparatus

Method and system for inspecting quality of tire member

Optical transmission sample holder and analysis, particularly for h...

Transformer DC magnetization detection and mitigation through vibra...

Radiation imaging system, radiation imaging apparatus, control meth...

Inspection apparatus and inspection method

Sample component determination method, sample component determinati...

Method for quantitatively characterizing dendrite segregation and d...

Device with a fluid component assessment feature

Divided-aperture infra-red spectral imaging system

Tool stabilization mechanism and related methods

Systems and methods for analyzing core using x-ray fluorescence

Blood glucose measurement based on raman spectroscopy

Joined body testing method, joined body testing device, and joined...

Device for detecting SAR, method for reducing SAR, and mobile terminal

Quality control evaluation method of cyanate ester matrix resin mat...

Large die wafer, large die and method of forming the same

Patents Applicationslast 30 patents

PORTABLE IMAGING DEVICES, METHODS, AND SYSTEMS FOR WOUND IMAGING AN...

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

MICROPLATE READER

MEASUREMENT APPARATUS

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...

TEST DEVICE APPLIED TO COUPLED ENVIRONMENT OF STRESS, WEAR, AND COR...

ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES

Device, system and method for optical gas analysis

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

Microscopic Object Condensation Method, Microscopic Object Condensa...

MULTIPASS ABSORPTION CELL

METHOD FOR SCANNING A COMPONENT

Analysis System, Analysis Method, and Analysis Program

OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC MODULES

RADIATION EMITTER AND MEASUREMENT SYSTEM

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

INSPECTION FLOW DETERMINATION DEVICE, CHARGED PARTICLE BEAM DEVICE,...

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS

SENSORS INCORPORATED INTO ADHESIVE MATERIAL

METHOD FOR EVALUATING SUSCEPTIBILITY TO LIQUID METAL EMBRITTLEMENT...

SILICA IN ROCK SAMPLES

METHOD, DEVICE, AND PROGRAM FOR PREDICTING DELAYED FRACTURE IN PRES...

Multi-Pulse Flash X-ray for Pulsed X-ray Cineradiography

SYSTEM AND METHOD FOR CABINET RADIOGRAPHY INCORPORATING A GAMMA OR...

FLOATING PLATFORM SYSTEM FOR MECHANICAL TESTING OF GELS AND TISSUES

PULSE LASER SPECTROMETER

TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...

ORGANIC PLANT MATERIAL MICROBIAL TEST KIT DEVICES AND PROCESSING ME...