Membership
Tour
Register
Log in
involving scanning means
Follow
Industry
CPC
G01C11/18
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C11/00
Photogrammetry or videogrammetry
Current Industry
G01C11/18
involving scanning means
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Method and device for the non-contact determination of color and in...
Patent number
12,053,267
Issue date
Aug 6, 2024
Friedrich Schiller Universität Jena
Jan Sperrhake
G01 - MEASURING TESTING
Information
Patent Grant
Survey system
Patent number
11,333,764
Issue date
May 17, 2022
Topcon Corporation
Nobuyuki Nishita
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Survey system and method for identifying target
Patent number
11,035,670
Issue date
Jun 15, 2021
Topcon Corporation
Nobuyuki Nishita
G01 - MEASURING TESTING
Information
Patent Grant
Computing device and method of image matching
Patent number
9,172,880
Issue date
Oct 27, 2015
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
Xin-Yuan Wu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
LASER SCANNER WITH STEREO CAMERA VISION FOR IMPROVED SELECTIVE FEAT...
Publication number
20240077310
Publication date
Mar 7, 2024
Leica Geosystems AG
Marcel RÜEGG
G01 - MEASURING TESTING
Information
Patent Application
SURVEY SYSTEM AND METHOD FOR IDENTIFYING TARGET
Publication number
20200003558
Publication date
Jan 2, 2020
TOPCON CORPORATION
Nobuyuki NISHITA
G01 - MEASURING TESTING
Information
Patent Application
SURVEY SYSTEM
Publication number
20190234733
Publication date
Aug 1, 2019
TOPCON CORPORATION
Nobuyuki NISHITA
G01 - MEASURING TESTING
Information
Patent Application
COMPUTING DEVICE AND METHOD OF IMAGE MATCHING
Publication number
20140293081
Publication date
Oct 2, 2014
HON HAI PRECISION INDUSTRY CO., LTD.
XIN-YUAN WU
G01 - MEASURING TESTING