involving the calculation of gauges, generating models

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CPC
G01N2021/8883

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8883involving the calculation of gauges, generating models

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for defect inspection, system, and computer-readable medium
- Patent number 12,235,223
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically reconstituting the reinforcing architectur...
- Patent number 12,159,396
- Issue date Dec 3, 2024
- SAFRAN AIRCRAFT ENGINES
- Yanneck Wielhorski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for simulating the optical power of a laminated glass
- Patent number 12,026,439
- Issue date Jul 2, 2024
- Saint-Gobain Glass France
- Yolande Sikali Mamden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
- Patent number 12,019,030
- Issue date Jun 25, 2024
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying raw meat and high-quality fake meat based on...
- Patent number 11,940,435
- Issue date Mar 26, 2024
- JIANGSU UNIVERSITY
- Jiyong Shi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying chemical and structural variations through t...
- Patent number 11,906,424
- Issue date Feb 20, 2024
- The Regents of the University of California
- Mona Jarrahi
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry system and method
- Patent number 11,900,028
- Issue date Feb 13, 2024
- Nova Ltd.
- Ruslan Berdichevsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying 3D objects
- Patent number 11,898,963
- Issue date Feb 13, 2024
- Fundacio Institut de Ciencies Fotoniques
- Valerio Pruneri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterising samples using neural networks
- Patent number 11,828,652
- Issue date Nov 28, 2023
- Universite de Reims Champagne-Ardenne
- Valeriu Vrabie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring status of target
- Patent number 11,519,864
- Issue date Dec 6, 2022
- Technion Research & Development Foundation Limited
- Boris Simkhovich
- G01 - MEASURING TESTING
Information Patent Grant
Method and electronic apparatus for displaying inspection result of...
- Patent number 11,428,644
- Issue date Aug 30, 2022
- Koh Young Technology Inc.
- Jong Myoung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistical learning-based mode selection for multi-mode inspection
- Patent number 11,415,531
- Issue date Aug 16, 2022
- KLA Corp.
- Vaibhav Gaind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,378,451
- Issue date Jul 5, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
System, method and non-transitory computer readable medium for tuni...
- Patent number 11,139,216
- Issue date Oct 5, 2021
- KLA-Tencor Corporation
- David Craig Oram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect discovery and recipe optimization for inspection of three-di...
- Patent number 11,047,806
- Issue date Jun 29, 2021
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device, defect inspection method, and program
- Patent number 10,989,672
- Issue date Apr 27, 2021
- FUJIFILM Corporation
- Yasuhiko Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatterometry system and method
- Patent number 10,970,435
- Issue date Apr 6, 2021
- Nova Measuring Instruments Ltd.
- Ruslan Berdichevsky
- G01 - MEASURING TESTING
Information Patent Grant
Overlay error and process window metrology
- Patent number 10,879,135
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shang-Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection system
- Patent number 10,809,635
- Issue date Oct 20, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement support apparatus and measurement support method
- Patent number 10,740,892
- Issue date Aug 11, 2020
- FUJIFILM Corporation
- Shunichiro Nonaka
- G01 - MEASURING TESTING
Information Patent Grant
System, method and non-transitory computer readable medium for tuni...
- Patent number 10,679,909
- Issue date Jun 9, 2020
- KLA-Tencor Corporation
- David Craig Oram
- G01 - MEASURING TESTING
Information Patent Grant
Automated pattern fidelity measurement plan generation
- Patent number 10,670,535
- Issue date Jun 2, 2020
- KLA-Tencor Corp.
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for measurement of a parameter of a feature...
- Patent number 10,649,345
- Issue date May 12, 2020
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of identifying defect regions in wafer
- Patent number 10,634,622
- Issue date Apr 28, 2020
- SK SILTRON CO., LTD.
- Jae Hyeong Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing method, information processing apparatus, an...
- Patent number 10,634,621
- Issue date Apr 28, 2020
- JTEKT Corporation
- Masaaki Kano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for wafer inspection with a noise boundary threshold
- Patent number 10,533,953
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Overlay error and process window metrology
- Patent number 10,510,623
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shang-Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Line displacement evaluation method, line displacement evaluation d...
- Patent number 10,508,909
- Issue date Dec 17, 2019
- Nippon Steel Corporation
- Masahiro Saito
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Self directed metrology and pattern classification
- Patent number 10,483,081
- Issue date Nov 19, 2019
- KLA-Tencor Corp.
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE
- Publication number 20250123555
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Lin SYU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES
- Publication number 20250060318
- Publication date Feb 20, 2025
- TEXAS TECH UNIVERSITY SYSTEM
- Aniruddha Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...
- Publication number 20240385121
- Publication date Nov 21, 2024
- Musashi AI North America Inc.
- Saeed Bakhshmand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR PREDICTING THE EVOLUTION OF A DEFECT OF A BEARING, ASSOC...
- Publication number 20240377283
- Publication date Nov 14, 2024
- Aktiebolaget SKF
- Mourad CHENNAOUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING DESIGN SUPPORT APPARATUS, MONITORING DESIGN SUPPORT METH...
- Publication number 20240019379
- Publication date Jan 18, 2024
- FUJIFILM CORPORATION
- Shuhei HORITA
- G01 - MEASURING TESTING
Information Patent Application
Identifying 3D Objects
- Publication number 20230393078
- Publication date Dec 7, 2023
- Fundació Institut de Ciències Fotòniques
- Valerio PRUNERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN A COMPONENT, METHOD FOR TRAINING A...
- Publication number 20230258574
- Publication date Aug 17, 2023
- MTU Aero Engines AG
- Marius BONHAGE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...
- Publication number 20230204517
- Publication date Jun 29, 2023
- HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
- TIAN-TIAN FAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING CONTAINERS
- Publication number 20230175976
- Publication date Jun 8, 2023
- KRONES AG
- Herbert KOLB
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS, NON-TRANSITORY COMPUTER READABLE MEDI...
- Publication number 20230089064
- Publication date Mar 23, 2023
- FUJIFILM Business Innovation Corp.
- Kiyofumi AIKAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230036062
- Publication date Feb 2, 2023
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro MATSUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Identifying Chemical and Structural Variations Through T...
- Publication number 20230016600
- Publication date Jan 19, 2023
- The Regents of the University of California
- Mona Jarrahi
- G01 - MEASURING TESTING
Information Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
- Publication number 20220349752
- Publication date Nov 3, 2022
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Method for Training a Data Structure for Use i...
- Publication number 20220309645
- Publication date Sep 29, 2022
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPROVED DETERMINATION OF TEXTILE FIBER COMPOSITION
- Publication number 20220214273
- Publication date Jul 7, 2022
- VALVAN BALING SYSTEMS NV
- Frank VANDEPUTTE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...
- Publication number 20210404973
- Publication date Dec 30, 2021
- KOH YOUNG TECHNOLOGY INC.
- Jong Myoung LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SIMULATING THE OPTICAL POWER OF A LAMINATED GLASS
- Publication number 20210089690
- Publication date Mar 25, 2021
- SAINT-GOBAIN GLASS FRANCE
- Yolande SIKALI MAMDEN
- B32 - LAYERED PRODUCTS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING STATUS OF TARGET
- Publication number 20210072163
- Publication date Mar 11, 2021
- Technion Research & Development Foundation Limited
- Boris SIMKHOVICH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERISING SAMPLES USING NEURAL NETWORKS
- Publication number 20200333185
- Publication date Oct 22, 2020
- Universite De Reims Champagne-Ardenne
- Valeriu VRABIE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...
- Publication number 20200258792
- Publication date Aug 13, 2020
- KLA-Tencor Corporation
- David Craig Oram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY ERROR AND PROCESS WINDOW METROLOGY
- Publication number 20200118893
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shang-Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS, AN...
- Publication number 20190360942
- Publication date Nov 28, 2019
- JTEKT Corporation
- Masaaki KANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Pattern Fidelity Measurement Plan Generation
- Publication number 20190204237
- Publication date Jul 4, 2019
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY ERROR AND PROCESS WINDOW METROLOGY
- Publication number 20190198403
- Publication date Jun 27, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shang-Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SUPPORT APPARATUS AND MEASUREMENT SUPPORT METHOD
- Publication number 20180300867
- Publication date Oct 18, 2018
- FUJIFILM CORPORATION
- Shunichiro NONAKA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFORMATION PROCESSING DEVICE AND INFORMATION PROCESSING METHOD
- Publication number 20180292328
- Publication date Oct 11, 2018
- FUJIFILM CORPORATION
- Mikihiko KARUBE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFYING A PATHWAY FOR CONDITION OF ASSEMBLY VALIDATION
- Publication number 20180240227
- Publication date Aug 23, 2018
- The Boeing Company
- Martin Szarski
- G05 - CONTROLLING REGULATING

involving the calculation of gauges, generating models

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for defect inspection, system, and computer-readable medium

Method for automatically reconstituting the reinforcing architectur...

Method for simulating the optical power of a laminated glass

Methods and systems for targeted monitoring of semiconductor measur...

Method for identifying raw meat and high-quality fake meat based on...

Method for identifying chemical and structural variations through t...

Scatterometry system and method

Identifying 3D objects

Method for characterising samples using neural networks

Bandgap measurements of patterned film stacks using spectroscopic m...

System and method for monitoring status of target

Method and electronic apparatus for displaying inspection result of...

Statistical learning-based mode selection for multi-mode inspection

Bandgap measurements of patterned film stacks using spectroscopic m...

System, method and non-transitory computer readable medium for tuni...

Defect discovery and recipe optimization for inspection of three-di...

Defect inspection device, defect inspection method, and program

Scatterometry system and method

Overlay error and process window metrology

Defect inspection method and defect inspection system

Measurement support apparatus and measurement support method

System, method and non-transitory computer readable medium for tuni...

Automated pattern fidelity measurement plan generation

Methods and apparatuses for measurement of a parameter of a feature...

Method of identifying defect regions in wafer

Information processing method, information processing apparatus, an...

System and method for wafer inspection with a noise boundary threshold

Overlay error and process window metrology

Line displacement evaluation method, line displacement evaluation d...

Self directed metrology and pattern classification

Patents Applicationslast 30 patents

METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE

METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

APPARATUS AND METHOD FOR MEASURING WAFERS

SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...

DEVICE FOR PREDICTING THE EVOLUTION OF A DEFECT OF A BEARING, ASSOC...

MONITORING DESIGN SUPPORT APPARATUS, MONITORING DESIGN SUPPORT METH...

Identifying 3D Objects

METHOD FOR DETECTING DEFECTS IN A COMPONENT, METHOD FOR TRAINING A...

OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...

METHOD AND DEVICE FOR INSPECTING CONTAINERS

SURFACE INSPECTION APPARATUS, NON-TRANSITORY COMPUTER READABLE MEDI...

INSPECTION DEVICE AND INSPECTION METHOD

Method for Identifying Chemical and Structural Variations Through T...

Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...

Metrology Method and Method for Training a Data Structure for Use i...

IMPROVED DETERMINATION OF TEXTILE FIBER COMPOSITION

METHOD AND ELECTRONIC APPARATUS FOR DISPLAYING INSPECTION RESULT OF...

METHOD FOR SIMULATING THE OPTICAL POWER OF A LAMINATED GLASS

SYSTEM AND METHOD FOR MONITORING STATUS OF TARGET

METHOD FOR CHARACTERISING SAMPLES USING NEURAL NETWORKS

SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNI...

OVERLAY ERROR AND PROCESS WINDOW METROLOGY

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS, AN...

Automated Pattern Fidelity Measurement Plan Generation

OVERLAY ERROR AND PROCESS WINDOW METROLOGY

MEASUREMENT SUPPORT APPARATUS AND MEASUREMENT SUPPORT METHOD

INFORMATION PROCESSING DEVICE AND INFORMATION PROCESSING METHOD

IDENTIFYING A PATHWAY FOR CONDITION OF ASSEMBLY VALIDATION