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CPC
H01J2203/04
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Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2203/00
Electron or ion optical arrangements common to discharge tubes or lamps
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H01J2203/04
Ion guns
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Patents Grants
last 30 patents
Information
Patent Grant
Secondary ion mass spectroscopic method, mass spectrometer and uses...
Patent number
10,215,719
Issue date
Feb 26, 2019
Ion-Tof Technologies GmbH
Sven Kayser
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SECONDARY ION MASS SPECTROSCOPIC METHOD, MASS SPECTROMETER AND USES...
Publication number
20180067062
Publication date
Mar 8, 2018
ION-TOF TECHNOLOGIES GMBH
Sven Kayser
G01 - MEASURING TESTING