Jittering, dithering, optical path modulation

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CPC
G01N2021/1759

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/1759Jittering, dithering, optical path modulation

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Patents Grantslast 30 patents

Information Patent Grant
Methods of and apparatus for measurement using acousto-optic devices
- Patent number 5,583,643
- Issue date Dec 10, 1996
- British Technology Group Ltd.
- Paul A. Gass
- G01 - MEASURING TESTING
Information Patent Grant
Solid-phase binding assay system for interferometrically measuring...
- Patent number 5,413,939
- Issue date May 9, 1995
- First Medical, Inc.
- Eric K. Gustafson
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing and analyzing systems with variable zener-diode...
- Patent number 5,352,963
- Issue date Oct 4, 1994
- Baxter Diagnostics Inc.
- Steven A. Garand
- G01 - MEASURING TESTING
Information Patent Grant
Multidimensional imaging using a single point detector for a phase...
- Patent number 5,309,912
- Issue date May 10, 1994
- The United States of America as represented by the Secretary of the Departmen...
- Alexander Knuttel
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a radiation signal
- Patent number 5,292,483
- Issue date Mar 8, 1994
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic coherent light detector
- Patent number 5,245,408
- Issue date Sep 14, 1993
- The United States of America as represented by the Director, National Securit...
- Jonathan D. Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging a physical parameter in turbid med...
- Patent number 5,203,339
- Issue date Apr 20, 1993
- The Government of the United States of America as represented by the Secretar...
- Alexander Knuttel
- G01 - MEASURING TESTING
Information Patent Grant
Particle path determination system
- Patent number 5,133,602
- Issue date Jul 28, 1992
- International Business Machines Corporation
- John S. Batchelder
- G01 - MEASURING TESTING
Information Patent Grant
Particle concentration measuring method and device
- Patent number 4,981,362
- Issue date Jan 1, 1991
- Xerox Corporation
- Joannes N. M. deJong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for particle analysis
- Patent number 4,871,251
- Issue date Oct 3, 1989
- Fritz K. Preikschat
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing by laser scanning
- Patent number 4,824,250
- Issue date Apr 25, 1989
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring specific binding reaction with the aid of polar...
- Patent number 4,725,140
- Issue date Feb 16, 1988
- Olympus Optical Co., Ltd.
- Toshimitsu Musha
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a photometric characteristic of...
- Patent number 4,705,403
- Issue date Nov 10, 1987
- Canon Kabushiki Kaisha
- Ken Eguchi
- G01 - MEASURING TESTING

Jittering, dithering, optical path modulation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods of and apparatus for measurement using acousto-optic devices

Solid-phase binding assay system for interferometrically measuring...

Specimen processing and analyzing systems with variable zener-diode...

Multidimensional imaging using a single point detector for a phase...

Detecting a radiation signal

Electro-optic coherent light detector

Method and apparatus for imaging a physical parameter in turbid med...

Particle path determination system

Particle concentration measuring method and device

Apparatus and method for particle analysis

Non-destructive testing by laser scanning

Method of measuring specific binding reaction with the aid of polar...

Apparatus and method for measuring a photometric characteristic of...

Patents Applicationslast 30 patents