Liquid crystal panels

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CPC
G01N2021/9513

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/9513Liquid crystal panels

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detection method of crease degree of screen and visual detection de...
- Patent number 12,025,570
- Issue date Jul 2, 2024
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device for optical performance test of display d...
- Patent number 12,025,571
- Issue date Jul 2, 2024
- Samsung Display Co., Ltd.
- Gil Yeong Park
- G02 - OPTICS
Information Patent Grant
System and method for detection of mobile device fault conditions
- Patent number 12,013,346
- Issue date Jun 18, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system of measuring display panel, and display device
- Patent number 11,990,105
- Issue date May 21, 2024
- HKC CORPORATION LIMITED
- Zhenli Song
- G01 - MEASURING TESTING
Information Patent Grant
Flexible display inspection system
- Patent number 11,815,466
- Issue date Nov 14, 2023
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Qi Lang
- G02 - OPTICS
Information Patent Grant
Jig for inspection of display panel
- Patent number 11,815,544
- Issue date Nov 14, 2023
- Samsung Display Co., Ltd.
- Hansu Cho
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Optical device allowing the angular and spectral emission of an obj...
- Patent number 11,525,734
- Issue date Dec 13, 2022
- ELDIM
- Thierry Leroux
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting defects on a specular surface with...
- Patent number 11,493,454
- Issue date Nov 8, 2022
- Cognex Corporation
- Fariborz Rostami
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting defect of optical film
- Patent number 11,391,678
- Issue date Jul 19, 2022
- SHANJIN OPTOELECTRONICS (SUZHOU) CO., LTD.
- Ho Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Array substrate and display panel
- Patent number 11,222,828
- Issue date Jan 11, 2022
- Baoqin Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detection of mobile device fault conditions
- Patent number 11,210,777
- Issue date Dec 28, 2021
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus, inspection system, and inspection method
- Patent number 11,209,313
- Issue date Dec 28, 2021
- Seiko Epson Corporation
- Satoshi Oguchi
- G01 - MEASURING TESTING
Information Patent Grant
Image acceleration processing device for automatic optical inspecti...
- Patent number 11,073,484
- Issue date Jul 27, 2021
- WUHAN JINGCE ELECTRONIC GROUP CO., LTD.
- Changdong Ou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical film attachment system
- Patent number 10,946,589
- Issue date Mar 16, 2021
- LG Chem, Ltd.
- Beom Seok Lee
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Display defect detection method, apparatus, and device for display...
- Patent number 10,928,331
- Issue date Feb 23, 2021
- Huawei Technologies Co., Ltd.
- Huiqiang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, inspection system, and inspection method
- Patent number 10,837,831
- Issue date Nov 17, 2020
- Seiko Epson Corporation
- Satoshi Oguchi
- G01 - MEASURING TESTING
Information Patent Grant
Air pipe joint and measurement system for substrate inspection
- Patent number 10,690,598
- Issue date Jun 23, 2020
- Wuhan China Star Optoelectronics Technology Co., Ltd.
- Kai Shi
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring method and monitoring apparatus of thimble bases
- Patent number 10,656,099
- Issue date May 19, 2020
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Ping Chen
- G02 - OPTICS
Information Patent Grant
Device and method for inspecting display
- Patent number 10,634,619
- Issue date Apr 28, 2020
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Zhe Liu
- G02 - OPTICS
Information Patent Grant
Patterning apparatus and operating method thereof
- Patent number 10,620,136
- Issue date Apr 14, 2020
- Samsung Display Co., Ltd.
- Alexander Voronov
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fixture for display module inspection
- Patent number 10,534,207
- Issue date Jan 14, 2020
- BOE Technology Group Co., Ltd.
- Ping Zhang
- G02 - OPTICS
Information Patent Grant
Detection method, detection system, and detection device for flexib...
- Patent number 10,530,992
- Issue date Jan 7, 2020
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Chun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection system and operating method thereof
- Patent number 10,438,340
- Issue date Oct 8, 2019
- Test Research, Inc.
- Kuang-Pu Wen
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 10,417,757
- Issue date Sep 17, 2019
- Daihen Corporation
- Takumi Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lighting-on device and method for cell test
- Patent number 10,366,645
- Issue date Jul 30, 2019
- BOE Technology Group Co., Ltd.
- Yong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for detecting degree of particulate contamination on flat...
- Patent number 10,345,247
- Issue date Jul 9, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Yongqiang Shen
- G01 - MEASURING TESTING
Information Patent Grant
Lighting jig of display panel and lighting test method
- Patent number 10,290,247
- Issue date May 14, 2019
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Liang Ma
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Detecting system
- Patent number 10,215,709
- Issue date Feb 26, 2019
- BOE Technology Group Co., Ltd.
- Kui Liang
- G01 - MEASURING TESTING
Information Patent Grant
Substrate surface information detection device and substrate surfac...
- Patent number 10,184,902
- Issue date Jan 22, 2019
- BOE Technology Group Co., Ltd.
- Yuguang Fan
- G02 - OPTICS
Information Patent Grant
Measurement method for liquid crystal azimuthal angle of liquid cry...
- Patent number 10,146,073
- Issue date Dec 4, 2018
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Bo Hai
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20240319110
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION AP...
- Publication number 20240310295
- Publication date Sep 19, 2024
- Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Yali LIU
- G01 - MEASURING TESTING
Information Patent Application
SPARKLE CONTRAST CORRECTING METHOD, COMPARING METHOD, COMPARING APP...
- Publication number 20240027357
- Publication date Jan 25, 2024
- DAI NIPPON PRINTING CO., LTD.
- Makio KURASHIGE
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION DE...
- Publication number 20240027366
- Publication date Jan 25, 2024
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION DEVICE, MANUFACTURING METHOD, AND MAN...
- Publication number 20240019724
- Publication date Jan 18, 2024
- FUJIFILM CORPORATION
- Takashi SUGANUMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING DISPLAY SUBSTRATE
- Publication number 20230280606
- Publication date Sep 7, 2023
- SAMSUNG DISPLAY CO., LTD.
- Kwang Taek HONG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS FOR PERFORMING THE SAME
- Publication number 20230194437
- Publication date Jun 22, 2023
- SAMSUNG DISPLAY CO., LTD.
- Alexander Voronov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLEXIBLE DISPLAY INSPECTION SYSTEM
- Publication number 20230015878
- Publication date Jan 19, 2023
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Qi LANG
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS
- Publication number 20220122243
- Publication date Apr 21, 2022
- Blancco Technology Group IP Oy
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and Method for Detecting Display Panel Defects and Micros...
- Publication number 20210209789
- Publication date Jul 8, 2021
- BOE TechnologyGroup Co., Ltd.
- Tienan LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DEVICE ALLOWING THE ANGULAR AND SPECTRAL EMISSION OF AN OBJ...
- Publication number 20210172802
- Publication date Jun 10, 2021
- ELDIM
- Thierry Leroux
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD
- Publication number 20210018367
- Publication date Jan 21, 2021
- SEIKO EPSON CORPORATION
- Satoshi OGUCHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILM ATTACHMENT SYSTEM
- Publication number 20200307117
- Publication date Oct 1, 2020
- LG CHEM, LTD.
- Beom Seok Lee
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
IMAGE ACCELERATION PROCESSING DEVICE FOR AUTOMATIC OPTICAL INSPECTI...
- Publication number 20200300780
- Publication date Sep 24, 2020
- Wuhan Jingce Electronic Group Co., Ltd.
- Changdong OU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AIR PIPE JOINT AND MEASUREMENT SYSTEM FOR SUBSTRATE INSPECTION
- Publication number 20190383752
- Publication date Dec 19, 2019
- Kai SHI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND METHOD OF INSPECTING SURFACE USING...
- Publication number 20190137407
- Publication date May 9, 2019
- Samsung Electronics Co., Ltd.
- WON GUK SEO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INSPECTING DISPLAY
- Publication number 20190137408
- Publication date May 9, 2019
- Wuhan China Star Optoelectronics Technology Co., Ltd.
- Zhe LIU
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING JIG OF DISPLAY PANEL AND LIGHTING TEST METHOD
- Publication number 20180308402
- Publication date Oct 25, 2018
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO. LTD.
- Liang MA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
DISPLAY DEFECT DETECTION METHOD, APPARATUS, AND DEVICE FOR DISPLAY...
- Publication number 20180246044
- Publication date Aug 30, 2018
- Huawei Technologies Co., Ltd
- Huiqiang ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING RUBBING CLOTH
- Publication number 20180046036
- Publication date Feb 15, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Jian LI
- G02 - OPTICS
Information Patent Application
FLAT-PANEL PRODUCT INSPECTION DEVICE
- Publication number 20170255037
- Publication date Sep 7, 2017
- BOE TECHNOLOGY GROUP CO., LTD.
- Hongtao MA
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR DETECTING DEFECTS ON A SPECULAR SURFACE WITH...
- Publication number 20170236266
- Publication date Aug 17, 2017
- COGNEX CORPORATION
- Fariborz Rostami
- G02 - OPTICS
Information Patent Application
PARTICULATE MATTER DETECTION APPARATUS
- Publication number 20170184510
- Publication date Jun 29, 2017
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Hui CHEN
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE AND METHOD
- Publication number 20160363791
- Publication date Dec 15, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Yongjin LEE
- G02 - OPTICS
Information Patent Application
DETECTING SYSTEM
- Publication number 20160266048
- Publication date Sep 15, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Kui LIANG
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20150369752
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Method and Defect Inspection Device
- Publication number 20150276623
- Publication date Oct 1, 2015
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING PANEL-BONDING SEMI-FINISHED PRODUCT
- Publication number 20150268175
- Publication date Sep 24, 2015
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Fangfu Chen
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD
- Publication number 20140362208
- Publication date Dec 11, 2014
- CAMTEK LTD
- Shimon Koren
- G01 - MEASURING TESTING

Liquid crystal panels

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection method of crease degree of screen and visual detection de...

Optical inspection device for optical performance test of display d...

System and method for detection of mobile device fault conditions

Method and system of measuring display panel, and display device

Flexible display inspection system

Jig for inspection of display panel

Optical device allowing the angular and spectral emission of an obj...

System and method for detecting defects on a specular surface with...

Device and method for detecting defect of optical film

Array substrate and display panel

System and method for detection of mobile device fault conditions

Inspection apparatus, inspection system, and inspection method

Image acceleration processing device for automatic optical inspecti...

Optical film attachment system

Display defect detection method, apparatus, and device for display...

Inspection apparatus, inspection system, and inspection method

Air pipe joint and measurement system for substrate inspection

Monitoring method and monitoring apparatus of thimble bases

Device and method for inspecting display

Patterning apparatus and operating method thereof

Fixture for display module inspection

Detection method, detection system, and detection device for flexib...

Automatic optical inspection system and operating method thereof

Image inspection apparatus and image inspection method

Lighting-on device and method for cell test

Apparatus for detecting degree of particulate contamination on flat...

Lighting jig of display panel and lighting test method

Detecting system

Substrate surface information detection device and substrate surfac...

Measurement method for liquid crystal azimuthal angle of liquid cry...

Patents Applicationslast 30 patents

AUTOMATED OPTICAL INSPECTION TOOL

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...

DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION AP...

SPARKLE CONTRAST CORRECTING METHOD, COMPARING METHOD, COMPARING APP...

DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION DE...

INSPECTION METHOD, INSPECTION DEVICE, MANUFACTURING METHOD, AND MAN...

METHOD OF INSPECTING DISPLAY SUBSTRATE

INSPECTION METHOD AND INSPECTION APPARATUS FOR PERFORMING THE SAME

FLEXIBLE DISPLAY INSPECTION SYSTEM

SYSTEM AND METHOD FOR DETECTION OF MOBILE DEVICE FAULT CONDITIONS

Apparatus and Method for Detecting Display Panel Defects and Micros...

OPTICAL DEVICE ALLOWING THE ANGULAR AND SPECTRAL EMISSION OF AN OBJ...

INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD

OPTICAL FILM ATTACHMENT SYSTEM

IMAGE ACCELERATION PROCESSING DEVICE FOR AUTOMATIC OPTICAL INSPECTI...

AIR PIPE JOINT AND MEASUREMENT SYSTEM FOR SUBSTRATE INSPECTION

SURFACE INSPECTION APPARATUS AND METHOD OF INSPECTING SURFACE USING...

DEVICE AND METHOD FOR INSPECTING DISPLAY

LIGHTING JIG OF DISPLAY PANEL AND LIGHTING TEST METHOD

DISPLAY DEFECT DETECTION METHOD, APPARATUS, AND DEVICE FOR DISPLAY...

METHOD AND DEVICE FOR DETECTING RUBBING CLOTH

FLAT-PANEL PRODUCT INSPECTION DEVICE

SYSTEM AND METHOD FOR DETECTING DEFECTS ON A SPECULAR SURFACE WITH...

PARTICULATE MATTER DETECTION APPARATUS

SUBSTRATE INSPECTION DEVICE AND METHOD

DETECTING SYSTEM

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Defect Inspection Method and Defect Inspection Device

METHOD FOR INSPECTING PANEL-BONDING SEMI-FINISHED PRODUCT

HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD