Magnetic lenses

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H01J3/20

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J3/00Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps

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H01J3/20Magnetic lenses

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle source
- Patent number 11,075,053
- Issue date Jul 27, 2021
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,468,227
- Issue date Nov 5, 2019
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,032,600
- Issue date Jul 24, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,812,283
- Issue date Nov 7, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,799,484
- Issue date Oct 24, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tubular permanent magnet used in a multi-electron beam device
- Patent number 9,418,815
- Issue date Aug 16, 2016
- Param Corporation
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-axis magnetic lens for focusing a plurality of charged partic...
- Patent number 9,202,658
- Issue date Dec 1, 2015
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Permanent magnet based high performance multi-axis immersion electr...
- Patent number 9,165,745
- Issue date Oct 20, 2015
- Maglen Pte Ltd
- Tao Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun configured to generate charged particles
- Patent number 9,093,243
- Issue date Jul 28, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-axis magnetic lens for focusing a plurality of charged partic...
- Patent number 8,835,867
- Issue date Sep 16, 2014
- Hermes-Microvision, Inc.
- Zhongwei Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-axis magnetic lens for focusing a plurality of charged partic...
- Patent number 8,791,425
- Issue date Jul 29, 2014
- Hermes-Microvision, Inc.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focused anode layer ion source with converging and charge compensat...
- Patent number 7,622,721
- Issue date Nov 24, 2009
- Michael Gutkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-axisymmetric charged-particle beam system
- Patent number 7,612,346
- Issue date Nov 3, 2009
- Massachusetts Institute of Technology
- Ronak J. Bhatt
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-axisymmetric charged-particle beam system
- Patent number 7,381,967
- Issue date Jun 3, 2008
- Massachusetts Institute of Technology
- Ronak J. Bhatt
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for magnetic focusing of off-axis electron beam
- Patent number 7,005,789
- Issue date Feb 28, 2006
- Communications and Power Industries, Inc.
- Mark J. Cattelino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for magnetic focusing of off-axis electron beam
- Patent number 6,856,081
- Issue date Feb 15, 2005
- Communications and Power Industries, Inc.
- Mark J. Cattelino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic multi-pole arrangement of the nth order
- Patent number 4,633,208
- Issue date Dec 30, 1986
- Siemens Aktiengesellschaft
- Erich Voss
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20220068589
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20200126753
- Publication date Apr 23, 2020
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20190057833
- Publication date Feb 21, 2019
- HERMES MICROVISION, INC.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20150179384
- Publication date Jun 25, 2015
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN CONFIGURED TO GENERATE CHARGED PARTICLES
- Publication number 20140346368
- Publication date Nov 27, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Permanent Magnet Based High Performance Multi-Axis Immersion Electr...
- Publication number 20140326895
- Publication date Nov 6, 2014
- Tao Luo
- Tao Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20140252245
- Publication date Sep 11, 2014
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130248730
- Publication date Sep 26, 2013
- HERMES MICROVISION, INC.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130181138
- Publication date Jul 18, 2013
- HERMES MICROVISION, INC.
- Zhongwei Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130153782
- Publication date Jun 20, 2013
- HERMES MICROVISION, INC.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON LENS AND THE ELECTRON BEAM DEVICE
- Publication number 20130134322
- Publication date May 30, 2013
- PARAM CORPORATION
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Application
Focused anode layer ion source with converging and charge compensat...
- Publication number 20080191629
- Publication date Aug 14, 2008
- Michael Gutkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-AXISYMMETRIC CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20080191144
- Publication date Aug 14, 2008
- Ronak J. Bhatt
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Non-axisymmetric charged-particle beam system
- Publication number 20060017002
- Publication date Jan 26, 2006
- Ronak J. Bhatt
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Method and apparatus for magnetic focusing of off-axis electron beam
- Publication number 20050167608
- Publication date Aug 4, 2005
- Communications and Power Industries, Inc., a Delaware Corporation
- Mark J. Cattelino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for magnetic focusing of off-axis electron beam
- Publication number 20040007959
- Publication date Jan 15, 2004
- Communications and Power Industries, Inc., a Delaware Corporation
- Mark J. Cattelino
- H01 - BASIC ELECTRIC ELEMENTS

Magnetic lenses

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle source

Charged particle source

Charged particle source

Charged particle source

Charged particle source

Tubular permanent magnet used in a multi-electron beam device

Multi-axis magnetic lens for focusing a plurality of charged partic...

Permanent magnet based high performance multi-axis immersion electr...

Gun configured to generate charged particles

Multi-axis magnetic lens for focusing a plurality of charged partic...

Multi-axis magnetic lens for focusing a plurality of charged partic...

Focused anode layer ion source with converging and charge compensat...

Non-axisymmetric charged-particle beam system

Non-axisymmetric charged-particle beam system

Method and apparatus for magnetic focusing of off-axis electron beam

Method and apparatus for magnetic focusing of off-axis electron beam

Magnetic multi-pole arrangement of the nth order

Patents Applicationslast 30 patents

CHARGED PARTICLE SOURCE

CHARGED PARTICLE SOURCE

Charged Particle Source

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

GUN CONFIGURED TO GENERATE CHARGED PARTICLES

Permanent Magnet Based High Performance Multi-Axis Immersion Electr...

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

Focused anode layer ion source with converging and charge compensat...

NON-AXISYMMETRIC CHARGED-PARTICLE BEAM SYSTEM

Non-axisymmetric charged-particle beam system

Method and apparatus for magnetic focusing of off-axis electron beam

Method and apparatus for magnetic focusing of off-axis electron beam