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Matte surfaces with reflecting particles
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G01N2021/4771
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/4771
Matte surfaces with reflecting particles
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatuses and methods for measuring spatial properties of surface...
Patent number
10,928,327
Issue date
Feb 23, 2021
Axalta Coating Systems IP Co., LLC
Larry E. Steenhoek
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for determining the orientation of pigment partic...
Patent number
10,054,535
Issue date
Aug 21, 2018
SICPA Holding S.A.
Edgar Mueller
G07 - CHECKING-DEVICES
Information
Patent Grant
Particle measuring device and particle measuring method
Patent number
9,372,072
Issue date
Jun 21, 2016
Nippon Steel & Sumitomo Metal Corporation
Nobuaki Ito
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for modelling and simulating optical propertie...
Patent number
8,271,242
Issue date
Sep 18, 2012
BASF SE
Harald Berlin
G01 - MEASURING TESTING
Information
Patent Grant
Process for generating bidirectional reflectance distribution funct...
Patent number
7,991,596
Issue date
Aug 2, 2011
E. I. Du Pont de Nemours and Company
Larry Eugene Steenhoek
G01 - MEASURING TESTING
Information
Patent Grant
Color matching and characterization of surface coatings
Patent number
5,231,472
Issue date
Jul 27, 1993
PPG Industries, Inc.
Robert T. Marcus
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating color tone of coating film and device for thi...
Patent number
5,151,751
Issue date
Sep 29, 1992
Nippon Paint Co., Ltd.
Takashi Nakajima
G01 - MEASURING TESTING
Information
Patent Grant
Portable colorimeter and method for characterization of a colored s...
Patent number
4,917,495
Issue date
Apr 17, 1990
E. I. Du Pont de Nemours and Company
Larry E. Steenhoek
G01 - MEASURING TESTING
Information
Patent Grant
Modeling properties of flake finishes using directional resolution...
Patent number
4,711,580
Issue date
Dec 8, 1987
Hunter Associates Laboratory, Inc.
William H. Venable
G01 - MEASURING TESTING
Information
Patent Grant
Three direction measurements for characterization of a surface cont...
Patent number
4,479,718
Issue date
Oct 30, 1984
E. I. Du Pont de Nemours and Company
David H. Alman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH REFLECTIVITY INTEGRATING CAVITY AND OPTICAL AMPLIFICATION DEVICE
Publication number
20160209388
Publication date
Jul 21, 2016
THE TEXAS A&M UNIVERSITY SYSTEM
Vladislav Victorovich Yakovlev
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
Publication number
20130027540
Publication date
Jan 31, 2013
NIPPON STEEL CORPORATION
Nobuaki Ito
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR GENERATING BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCT...
Publication number
20100094601
Publication date
Apr 15, 2010
E.I. du Pont de Nemours and Company
Larry Eugene Steenhoek
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MODELLING AND SIMULATING OPTICAL PROPERTIE...
Publication number
20100049484
Publication date
Feb 25, 2010
BASF SE
Harald Berlin
G01 - MEASURING TESTING
Information
Patent Application
Method and Device for Measuring Coarseness of a Paint Film
Publication number
20070273890
Publication date
Nov 29, 2007
Swie Lan Njo
G01 - MEASURING TESTING