CPC
G01C1/00
Information
Patent Grant
AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Grant
INSTITUTE OF SCIENCE TOKYO
Mikio Kozuma
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
MAGPIE TECH INC.
Ung Chul Shin
G01 - MEASURING TESTING
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Patent Grant
Caterpillar Inc.
Andrew J. Massey
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
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Patent Grant
Kabushiki Kaisha Toshiba
Ryunosuke Gando
G01 - MEASURING TESTING
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Patent Grant
Drone Deploy, Inc.
Jonathan James Millin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
NEC Corporation
Tsuyoshi Yamamoto
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Kabushiki Kaisha Toshiba
Daiki Ono
G01 - MEASURING TESTING
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Patent Grant
Japan Aviation Electronics Industry, Limited
Kento Taniguchi
G01 - MEASURING TESTING
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Patent Grant
STMicroelectronics S.r.l.
Federico Rizzardini
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Leica Geosystems AG
Markus Steiner
G01 - MEASURING TESTING
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Patent Grant
LIGHTYX SYSTEMS LTD.
Uri Yehuday
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
MAXELL, LTD.
Yasunobu Hashimoto
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Stanley Black & Decker Inc.
Dustin M. Lee
G01 - MEASURING TESTING
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Patent Grant
Japan Aviation Electronics Industry, Limited
Aritaka Ohno
G01 - MEASURING TESTING
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Patent Grant
Leica Geosystems AG
Burkhard Böckem
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Vamshi Gangumalla
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mine Vision Systems, Inc.
L. Douglas Baker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
ALTUM GREEN ENERGY LIMITED
Jarrod James Sinclair
G01 - MEASURING TESTING
Information
Patent Grant
Magic Leap, Inc.
Yu-Hsiang Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
EVIDENT CORPORATION
Naoki Yamamoto
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Keller North America, Inc.
Andrew Woods
G01 - MEASURING TESTING
Information
Patent Grant
Wistron Corporation
Zhu-Xuan Xie
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
OSCPS MOTION SENSING INC.
Kazem Zandi
G02 - OPTICS
Information
Patent Grant
The Regents of the University of Colorado, a Body Corporate
Jeffrey P. Thayer
G01 - MEASURING TESTING
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Patent Grant
Seiko Epson Corporation
Fumikazu Otani
G01 - MEASURING TESTING
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Patent Grant
CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
Alexander Igorevich Sergeev
B60 - VEHICLES IN GENERAL
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Patent Grant
Trevor Schneider
G01 - MEASURING TESTING
Information
Patent Grant
QRISQ ANALYTICS, LLC
Thomas Lee Koger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Honeywell International Inc.
Tiequn Qiu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Shenzhen University
Lin MU
G01 - MEASURING TESTING
Information
Patent Application
NXP USA, Inc.
Raghavendra N. Sridhar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VERTIV CORPORATION
Bosko Mrkovic
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Application
MAXAR INTERNATIONAL SWEDEN AB
Folke ISAKSSON
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Nearmap Australia Pty Ltd
Kitty Ka Yi LO
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
STANLEY BLACK & DECKER INC.
Oleksiy P. SERGYEYENKO
G01 - MEASURING TESTING
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Patent Application
EXAIL
Eric DUCLOUX
G01 - MEASURING TESTING
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Patent Application
Analog Devices, Inc.
Jeff Yan
G01 - MEASURING TESTING
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Patent Application
The Charles Stark Draper Laboratory, Inc.
Andrew Cunningham
G01 - MEASURING TESTING
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Patent Application
Honeywell International Inc.
Matthew Wade Puckett
G01 - MEASURING TESTING
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Patent Application
Honeywell International Inc.
Jianfeng Wu
G01 - MEASURING TESTING
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Patent Application
TOPCON CORPORATION
Takeshi SASAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Honeywell International Inc.
Steven C. Albers
G01 - MEASURING TESTING
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Patent Application
Milwaukee Electric Tool Corporation
Dennis Y. Wong
G01 - MEASURING TESTING
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Patent Application
DONGHAI LABORATORY
Qian LI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
ROBERT BOSCH GmbH
Filippo David
G01 - MEASURING TESTING
Information
Patent Application
XYZ REALITY LIMITED
Umar AHMED
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Hewlett-Packard Development Company, L.P.
Xavier OLIVA VENTAYOL
G01 - MEASURING TESTING
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Patent Application
Caterpillar Inc.
Martin TEINER
E21 - EARTH DRILLING MINING
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Patent Application
Zhejiang Institute of Hydraulics & Estuary (Zhejiang Institute of Marine Plan...
Junbao HUANG
G01 - MEASURING TESTING
Information
Patent Application
Kabushiki Kaisha Toshiba
Daiki ONO
G01 - MEASURING TESTING
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Patent Application
STMicroelectronics International N.V.
Alessandro MAGNANI
G01 - MEASURING TESTING
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Patent Application
THALES
Benjamin WIRTSCHAFTER
G01 - MEASURING TESTING
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Patent Application
Soil and Water Conservation Monitoring Center of Pearl River Basin, Pearl Riv...
Hao Li
G01 - MEASURING TESTING
Information
Patent Application
Kabushiki Kaisha Toshiba
Fumito MIYAZAKI
G01 - MEASURING TESTING
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Patent Application
ROBERT BOSCH GmbH
Andrea Opreni
G01 - MEASURING TESTING
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Patent Application
Kabushiki Kaisha Toshiba
Fumito MIYAZAKI
G01 - MEASURING TESTING
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Patent Application
Daimler Truck AG
Fridtjof STEIN
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
STANLEY BLACK & DECKER INC.
Dominic Maurice LEONE
G01 - MEASURING TESTING
