Measuring cross-section

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CPC
G01T1/34

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Parent Industries

GPHYSICS G01Measuring instruments G01TMEASUREMENT OF NUCLEAR OR X-RADIATION G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation

Current Industry

G01T1/34Measuring cross-section

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Patents Grantslast 30 patents

Information Patent Grant
Multi-maximum x-ray spectrum systems and multi-layer imaging systems
- Patent number 12,213,819
- Issue date Feb 4, 2025
- Varex Imaging Corporation
- Arundhuti Ganguly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Characterization of an electron beam
- Patent number 11,892,576
- Issue date Feb 6, 2024
- Excillum AB
- Per Takman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-maximum x-ray spectrum systems and multi-layer imaging systems
- Patent number 11,819,348
- Issue date Nov 21, 2023
- Varex Imaging Corporation
- Arundhuti Ganguly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Characterization of an electron beam
- Patent number 11,579,318
- Issue date Feb 14, 2023
- Excillum AB
- Per Takman
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining photonuclear reaction cross section and tran...
- Patent number 5,859,436
- Issue date Jan 12, 1999
- Doryokuro Kakunenryo Kaithatsu Jigyodan
- Hideo Harada
- G01 - MEASURING TESTING
Information Patent Grant
Germanium detector
- Patent number 5,712,484
- Issue date Jan 27, 1998
- Doryokuro Dakunenryo Kaihatsu Jigyodan
- Hideo Harada
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the absorption cross section of small fluid...
- Patent number 4,264,812
- Issue date Apr 28, 1981
- Dresser Industries, Inc.
- Russel R. Randall
- G01 - MEASURING TESTING
Information Patent Grant
2908822
- Patent number 2,908,822
- Issue date Oct 13, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2895051
- Patent number 2,895,051
- Issue date Jul 14, 1959
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MAXIMUM X-RAY SPECTRUM SYSTEMS AND MULTI-LAYER IMAGING SYSTEMS
- Publication number 20240057953
- Publication date Feb 22, 2024
- VAREX IMAGING CORPORATION
- Arundhuti Ganguly
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF AN ELECTRON BEAM
- Publication number 20230176239
- Publication date Jun 8, 2023
- Excillum AB
- Per TAKMAN
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF AN ELECTRON BEAM
- Publication number 20220404514
- Publication date Dec 22, 2022
- Excillum AB
- Per TAKMAN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MAXIMUM X-RAY SPECTRUM SYSTEMS AND MULTI-LAYER IMAGING SYSTEMS
- Publication number 20210255340
- Publication date Aug 19, 2021
- VAREX IMAGING CORPORATION
- Arundhuti Ganguly
- G01 - MEASURING TESTING
Information Patent Application
MASKS THAT SELECTIVELY ATTENTUATE RADIATION FOR INSPECTION OF PRINT...
- Publication number 20150212217
- Publication date Jul 30, 2015
- Cisco Technology, Inc.
- ShiJie WEN
- G01 - MEASURING TESTING
Information Patent Application
SIGMA MEASUREMENT DOWNHOLE
- Publication number 20100187412
- Publication date Jul 29, 2010
- Jeffrey Grant
- G01 - MEASURING TESTING

Measuring cross-section

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-maximum x-ray spectrum systems and multi-layer imaging systems

Characterization of an electron beam

Multi-maximum x-ray spectrum systems and multi-layer imaging systems

Characterization of an electron beam

Method for determining photonuclear reaction cross section and tran...

Germanium detector

Method for determining the absorption cross section of small fluid...

2908822

2895051

Patents Applicationslast 30 patents

MULTI-MAXIMUM X-RAY SPECTRUM SYSTEMS AND MULTI-LAYER IMAGING SYSTEMS

CHARACTERIZATION OF AN ELECTRON BEAM

CHARACTERIZATION OF AN ELECTRON BEAM

MULTI-MAXIMUM X-RAY SPECTRUM SYSTEMS AND MULTI-LAYER IMAGING SYSTEMS

MASKS THAT SELECTIVELY ATTENTUATE RADIATION FOR INSPECTION OF PRINT...

SIGMA MEASUREMENT DOWNHOLE