Measuring cross-section

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Patents Grantslast 30 patents

Information Patent Grant
Characterization of an electron beam
- Patent number 11,892,576
- Issue date Feb 6, 2024
- Excillum AB
- Per Takman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-maximum x-ray spectrum systems and multi-layer imaging systems
- Patent number 11,819,348
- Issue date Nov 21, 2023
- Varex Imaging Corporation
- Arundhuti Ganguly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Characterization of an electron beam
- Patent number 11,579,318
- Issue date Feb 14, 2023
- Excillum AB
- Per Takman
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining photonuclear reaction cross section and tran...
- Patent number 5,859,436
- Issue date Jan 12, 1999
- Doryokuro Kakunenryo Kaithatsu Jigyodan
- Hideo Harada
- G01 - MEASURING TESTING
Information Patent Grant
Germanium detector
- Patent number 5,712,484
- Issue date Jan 27, 1998
- Doryokuro Dakunenryo Kaihatsu Jigyodan
- Hideo Harada
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the absorption cross section of small fluid...
- Patent number 4,264,812
- Issue date Apr 28, 1981
- Dresser Industries, Inc.
- Russel R. Randall
- G01 - MEASURING TESTING
Information Patent Grant
2908822
- Patent number 2,908,822
- Issue date Oct 13, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2895051
- Patent number 2,895,051
- Issue date Jul 14, 1959
- G01 - MEASURING TESTING