CPC
G01H9/00
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Patent Grant
Network Integrity Systems, Inc.
Cary R. Murphy
G08 - SIGNALLING
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Patent Grant
Network Integrity Systems, Inc.
Cary R. Murphy
G08 - SIGNALLING
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Patent Grant
OTN INTELLIGENT TECHNOLOGY (SUZHOU) CO., LTD
Xiaohai Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
Board of Trustees of Michigan State University
Ming Han
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
NEC Corporation
Tadayuki Iwano
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Ming-Fang Huang
G01 - MEASURING TESTING
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Patent Grant
ConcurrentData, Inc.
Karl Slama
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Yutaka Yano
G08 - SIGNALLING
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Patent Grant
NEC Corporation
Yuheng Chen
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Yutaka Yano
G08 - SIGNALLING
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Patent Grant
Polytec GmbH
Matthias Schüssler
G01 - MEASURING TESTING
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Patent Grant
Rockley Photonics Limited
Guomin Yu
G01 - MEASURING TESTING
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Patent Grant
Chevron U.S.A. Inc.
John B. Weirich
E21 - EARTH DRILLING MINING
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Patent Grant
Apple Inc.
Eran Tal
G10 - MUSICAL INSTRUMENTS ACOUSTICS
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Patent Grant
President and Fellows of Harvard College
Qimin Quan
B82 - NANO-TECHNOLOGY
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Patent Grant
TECHNION RESEARCH DEVELOPMENT FOUNDATION LIMITED
Amir Rozental
G01 - MEASURING TESTING
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Patent Grant
Halliburton Energy Services, Inc.
John Paul Bir Singh
E21 - EARTH DRILLING MINING
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Patent Grant
Hawk Measurement Systems Pty. Ltd.
Les Richards
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
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Patent Grant
Nippon Telegraph and Telephone Corporation
Yoshifumi Wakisaka
G01 - MEASURING TESTING
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Patent Grant
Seiko Epson Corporation
Kohei Yamada
G01 - MEASURING TESTING
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Patent Grant
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Maurits Sebastiaan Van Der Heiden
G01 - MEASURING TESTING
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Patent Grant
Nanjing University
Feng Wang
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Yutaka Yano
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Fluke Corporation
Michael D. Stuart
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
MTU Aero Engines AG
Harald Schönenborn
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
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Patent Grant
NEC Corporation
Yukihide Yoda
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Yue-Kai Huang
G01 - MEASURING TESTING
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Patent Grant
Silixa Ltd.
Mahmoud Farhadiroushan
E21 - EARTH DRILLING MINING
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Patent Grant
General Electric Company
Daniel Bivolaru
G01 - MEASURING TESTING
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Patent Application
VIAVI SOLUTIONS INC.
Vincent LECOEUCHE
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
VIAVI SOLUTIONS INC.
Vincent HANDEREK
G01 - MEASURING TESTING
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Patent Application
University of Pittsburgh of the Commonwealth System of Higher Education
Paul R. Ohodnicki
G01 - MEASURING TESTING
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Patent Application
Exciting Technology LLC
Matthew P. Dierking
G01 - MEASURING TESTING
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Patent Application
X Development LLC
Alex S. Miller
G02 - OPTICS
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Patent Application
NEXANS
Roberto GASPARI
G01 - MEASURING TESTING
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Patent Application
Saudi Arabian Oil Company
Abderrahim Fakiri
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
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Patent Application
NANJING UNIVERSITY
Daoyuan TAN
G01 - MEASURING TESTING
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Patent Application
Mitsubishi Heavy Industries, Ltd.
Akihisa IWASAKI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Halliburton Energy Services, Inc.
Ira Bush
G01 - MEASURING TESTING
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Patent Application
NEC Corporation
Hemant Shivsagar PRASAD
G08 - SIGNALLING
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Patent Application
EXFO INC.
Michel LECLERC
G01 - MEASURING TESTING
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Patent Application
SINTELA LIMITED
Stuart Russell
G01 - MEASURING TESTING
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Patent Application
VERIZON PATENT AND LICENSING INC.
Jun Shan WEY
G01 - MEASURING TESTING
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Patent Application
PRYSMIAN S.P.A.
Riccardo VERONESE
G01 - MEASURING TESTING
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Patent Application
Government of the United States of America, as Represented by the Secretary o...
William Alexander Osborn
G01 - MEASURING TESTING
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Patent Application
KOREA PHOTONICS TECHNOLOGY INSTITUTE
Myoung Jin KIM
G01 - MEASURING TESTING
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Patent Application
Nippon Telegraph and Telephone Corporation
Yoshifumi WAKISAKA
G01 - MEASURING TESTING
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Patent Application
NEC Laboratories America, Inc.
Yangmin DING
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
NEC Laboratories America, Inc.
Yuheng Chen
G01 - MEASURING TESTING
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Patent Application
University of Maryland, Baltimore County
Weidong ZHU
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
NEC Laboratories America, Inc.
Jian Fang
G01 - MEASURING TESTING
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Patent Application
NEC Laboratories America, Inc.
Ming-Fang HUANG
G01 - MEASURING TESTING
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Patent Application
NEC Laboratories America, Inc.
Philip Ji
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
NEC Laboratories America, Inc.
Zhuocheng JIANG
G01 - MEASURING TESTING
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Patent Application
NEC Laboratories America, Inc.
Ming-Fang Huang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
NEC Corporation
Daisuke IKEFUJI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
SubCom, LLC
Jin-Xing CAI
G01 - MEASURING TESTING
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Patent Application
SubCom, LLC
Jin-Xing CAI
G01 - MEASURING TESTING
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Patent Application
Nokia Solutions and Networks Oy
Mijail Szczerban Gonzalez
G01 - MEASURING TESTING
