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Measuring separately scattering and specular
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G01N2021/556
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/556
Measuring separately scattering and specular
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Patents Grants
last 30 patents
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Patent Grant
Method for extracting spectral information of a substance under test
Patent number
12,106,543
Issue date
Oct 1, 2024
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Min Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for liquid dispense and coverage control
Patent number
11,883,837
Issue date
Jan 30, 2024
Tokyo Electron Limited
Mirko Vukovic
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Information processing apparatus, image forming apparatus, informat...
Patent number
10,732,103
Issue date
Aug 4, 2020
Canon Kabushiki Kaisha
Takahiro Suzuki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for pumping laser sustained plasma and enhancing...
Patent number
10,714,327
Issue date
Jul 14, 2020
KLA-Tencor Corporation
Ilya Bezel
G01 - MEASURING TESTING
Information
Patent Grant
Optical characteristic measuring apparatus
Patent number
10,697,887
Issue date
Jun 30, 2020
Canon Kabushiki Kaisha
Yusuke Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Display apparatus, scanner, and non-transitory computer readable me...
Patent number
10,606,545
Issue date
Mar 31, 2020
Fuji Xerox Co., Ltd.
Yoshitaka Kuwada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Illumination system for recognizing material and method of recogniz...
Patent number
10,451,547
Issue date
Oct 22, 2019
DEEDIIM SENSORS INC.
Jang-Il Ser
G01 - MEASURING TESTING
Information
Patent Grant
Lighting device, and apparatus and system incorporating the lightin...
Patent number
10,401,287
Issue date
Sep 3, 2019
Ricoh Company, Ltd.
Hitoshi Itoh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measuring a size distribution of nucleic acid molecules in a sample
Patent number
10,379,038
Issue date
Aug 13, 2019
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Samuel Martin Stavis
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Apparatus for measuring light scattering
Patent number
10,302,560
Issue date
May 28, 2019
Fundacio Institute de Ciencies Fotoniques
Valerio Pruneri
G01 - MEASURING TESTING
Information
Patent Grant
Gloss evaluation method and gloss evaluation device
Patent number
10,302,562
Issue date
May 28, 2019
Konica Minolta, Inc.
Toshio Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Device for processing a surface
Patent number
10,247,669
Issue date
Apr 2, 2019
Vorwerk & Co. Interholding GmbH
Harald Windorfer
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor and image forming apparatus
Patent number
10,228,647
Issue date
Mar 12, 2019
Canon Kabushiki Kaisha
Kazushi Ino
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Sheet discriminator, image forming apparatus incorporating same, an...
Patent number
10,212,298
Issue date
Feb 19, 2019
Ricoh Company, Ltd.
Tohru Matsumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sheet discriminator and image forming apparatus incorporating the s...
Patent number
10,203,641
Issue date
Feb 12, 2019
Ricoh Company, Ltd.
Noriaki Takenaga
G01 - MEASURING TESTING
Information
Patent Grant
Front quartersphere scattered light analysis
Patent number
10,018,572
Issue date
Jul 10, 2018
KLA-Tencor Corporation
Richard E. Bills
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical sensor and image forming apparatus
Patent number
9,927,752
Issue date
Mar 27, 2018
Canon Kabushiki Kaisha
Kazushi Ino
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Medium identification device, image forming apparatus, method of id...
Patent number
9,744,785
Issue date
Aug 29, 2017
Ricoh Company, Ltd.
Suguru Yokozawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Sheet discriminator and image forming apparatus incorporating the s...
Patent number
9,551,967
Issue date
Jan 24, 2017
Ricoh Company, Ltd.
Noriaki Takenaga
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Reflection characteristic measuring apparatus
Patent number
9,528,934
Issue date
Dec 27, 2016
Canon Kabushiki Kaisha
Shigeki Kato
G01 - MEASURING TESTING
Information
Patent Grant
Front quartersphere scattered light analysis
Patent number
9,528,942
Issue date
Dec 27, 2016
KLA-Tencor Corporation
Richard E. Bills
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scattered light measurement system
Patent number
9,518,930
Issue date
Dec 13, 2016
KLA-Tencor Corporation
Neil Judell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical sensor and image forming device incorporating the same
Patent number
9,513,218
Issue date
Dec 6, 2016
Ricoh Company, Ltd.
Yoshihiro Ohba
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Front quartersphere scattered light analysis
Patent number
9,488,591
Issue date
Nov 8, 2016
Uster Technologies AG
Richard E. Bills
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Road surface reflectivity detection by lidar sensor
Patent number
9,453,941
Issue date
Sep 27, 2016
GM Global Technology Operations LLC
Inna Stainvas Olshansky
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Optical detection device and image forming apparatus including the...
Patent number
9,304,083
Issue date
Apr 5, 2016
Canon Kabushiki Kaisha
Keisuke Ishizumi
G01 - MEASURING TESTING
Information
Patent Grant
Recording medium determining device and recording medium determinat...
Patent number
9,285,313
Issue date
Mar 15, 2016
Seiko Epson Corporation
Tsunenobu Endo
G07 - CHECKING-DEVICES
Information
Patent Grant
Dynamically adjustable semiconductor metrology system
Patent number
9,228,943
Issue date
Jan 5, 2016
KLA-Tencor Corporation
David Y. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Sensor and image-forming apparatus
Patent number
9,188,530
Issue date
Nov 17, 2015
Ricoh Company, Ltd.
Fumikazu Hoshi
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Front quartersphere scattered light analysis
Patent number
9,110,033
Issue date
Aug 18, 2015
KLA-Tencor Corporation
Richard E. Bills
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and Method for Liquid Dispense and Coverage Control
Publication number
20240042472
Publication date
Feb 8, 2024
TOKYO ELECTRON LIMITED
Mirko VUKOVIC
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
METHODS AND RELATED ASPECTS FOR ANALYZING EXOSOMES
Publication number
20230408409
Publication date
Dec 21, 2023
Arizona Board of Regents on behalf of Arizona State University
Shaopeng WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR BACTERIAL ANALYSIS
Publication number
20210088513
Publication date
Mar 25, 2021
The University of Bristol
Massimo Antognozzi
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Pumping Laser Sustained Plasma and Enhancing...
Publication number
20190287785
Publication date
Sep 19, 2019
KLA-Tencor Corporation
Ilya Bezel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...
Publication number
20190120759
Publication date
Apr 25, 2019
DeeDiim Sensors Inc.
Jang-Il SER
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, IMAGE FORMING APPARATUS, INFORMAT...
Publication number
20190094141
Publication date
Mar 28, 2019
Canon Kabushiki Kaisha
Takahiro Suzuki
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
OPTICAL SENSOR AND IMAGE FORMING APPARATUS
Publication number
20180173144
Publication date
Jun 21, 2018
Canon Kabushiki Kaisha
Kazushi Ino
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DEVICE FOR PROCESSING A SURFACE
Publication number
20180164213
Publication date
Jun 14, 2018
Vorwerk & Co. lnterholding GmbH
Harald WINDORFER
A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information
Patent Application
Gloss Evaluation Method And Gloss Evaluation Device
Publication number
20160258865
Publication date
Sep 8, 2016
KONICA MINOLTA, INC.
Toshio KAWANO
G01 - MEASURING TESTING
Information
Patent Application
ROAD SURFACE REFLECTIVITY DETECTION BY LIDAR SENSOR
Publication number
20160178802
Publication date
Jun 23, 2016
GM GLOBAL TECHNOLOGY OPERATIONS LLC
INNA STAINVAS OLSHANSKY
G01 - MEASURING TESTING
Information
Patent Application
RECORDING MEDIUM DETERMINING DEVICE AND RECORDING MEDIUM DETERMINAT...
Publication number
20150185146
Publication date
Jul 2, 2015
SEIKO EPSON CORPORATION
Tsunenobu ENDO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR AND IMAGE FORMING DEVICE INCORPORATING THE SAME
Publication number
20140268151
Publication date
Sep 18, 2014
RICOH COMPANY, LTD.
Yoshihiro Ohba
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND IMAGE-FORMING APPARATUS
Publication number
20140241742
Publication date
Aug 28, 2014
RICOH COMPANY, LTD.
Fumikazu Hoshi
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
RECORDING MEDIUM DETERMINING DEVICE AND RECORDING MEDIUM DETERMINAT...
Publication number
20140192361
Publication date
Jul 10, 2014
Tsunenobu ENDO
G01 - MEASURING TESTING
Information
Patent Application
REFLECTION CHARACTERISTIC MEASURING APPARATUS
Publication number
20140176953
Publication date
Jun 26, 2014
Canon Kabushiki Kaisha
Shigeki Kato
G01 - MEASURING TESTING
Information
Patent Application
System With Polarized Scattered Light
Publication number
20130342833
Publication date
Dec 26, 2013
KLA-Tencor Corporation
Neil Judell
G01 - MEASURING TESTING
Information
Patent Application
System With Multiple Scattered Light Collectors
Publication number
20130335733
Publication date
Dec 19, 2013
KLA-Tencor Corporation
Richard E. Bills
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR AND IMAGE FORMING APPARATUS
Publication number
20130272740
Publication date
Oct 17, 2013
Ken Nakagawa
G01 - MEASURING TESTING
Information
Patent Application
HALOGEN GAS SENSOR COMPRISING COBALT
Publication number
20130258347
Publication date
Oct 3, 2013
TEXAS INSTRUMENTS INCORPORATED
MICHAEL JAMES SATTERFIELD
G01 - MEASURING TESTING
Information
Patent Application
TONER-DENSITY CALCULATING METHOD, REFLECTIVE OPTICAL SENSOR, AND IM...
Publication number
20130251389
Publication date
Sep 26, 2013
Hidemasa Suzuki
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR AND IMAGE FORMING APPARATUS
Publication number
20130228674
Publication date
Sep 5, 2013
RICOH COMPANY, LTD.
Yoshihiro Oba
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Adjustable Semiconductor Metrology System
Publication number
20130114085
Publication date
May 9, 2013
KLA-Tencor Corporation
David Y. Wang
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OF LIQUID FRACTION DROPOUT USING MICROPATTERNED SURFACES
Publication number
20130100453
Publication date
Apr 25, 2013
Christopher Harrison
G01 - MEASURING TESTING
Information
Patent Application
Back Quartersphere Scattered Light Analysis
Publication number
20130094023
Publication date
Apr 18, 2013
KLA-Tencor Corporation
Richard E. Bills
G01 - MEASURING TESTING
Information
Patent Application
BRONZING INDEX VALUE CALCULATION METHOD, BRONZING INDEX VALUE CALCU...
Publication number
20120249633
Publication date
Oct 4, 2012
SEIKO EPSON CORPORATION
Katsuyuki TANAKA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE
Publication number
20120081701
Publication date
Apr 5, 2012
Hitachi High-Technologies Corporation
Hideaki SASAZAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DISCRIMINATING BETWEEN OBJECTS
Publication number
20120057162
Publication date
Mar 8, 2012
Vitaly Burkatovsky
G01 - MEASURING TESTING
Information
Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
Publication number
20120013898
Publication date
Jan 19, 2012
KLA-Tencor Corporation
Neil Judell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FRICTION-COEFFICIENT ESTIMATING DEVICE AND FRICTION-COEFFICIENT EST...
Publication number
20110310398
Publication date
Dec 22, 2011
PFU Limited
Shigeharu OKANO
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic Scatterometer System
Publication number
20110125458
Publication date
May 26, 2011
KLA-Tencor Corporation
YIPING XU
G01 - MEASURING TESTING