Measuring several points at the same time

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CPC
G05B2219/37201

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/37201Measuring several points at the same time

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for numerically controlled pattern determination
- Patent number 5,898,590
- Issue date Apr 27, 1999
- The Boeing Company
- Robert R. Wampler
- G06 - COMPUTING CALCULATING COUNTING