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Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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G01T1/36
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PHYSICS
G01
Measuring instruments
G01T
MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/00
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
Current Industry
G01T1/36
Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Hybrid radiation detector
Patent number
11,927,704
Issue date
Mar 12, 2024
Kromek Limited
Ian Radley
G01 - MEASURING TESTING
Information
Patent Grant
Response function of a scintillator
Patent number
11,914,087
Issue date
Feb 27, 2024
Soletanche Freyssinet
Ludmila Konecná
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for identifying anomalous nuclear radioactive s...
Patent number
11,880,756
Issue date
Jan 23, 2024
The Regents of the University of California
Shiva Abbaszadeh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for correcting a spectral image
Patent number
11,872,071
Issue date
Jan 16, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Odran Pivot
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Methods for calibrating a spectral X-ray imaging system to perform...
Patent number
11,864,942
Issue date
Jan 9, 2024
Jay S. Schildkraut
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Radiation source localization systems and methods
Patent number
11,852,761
Issue date
Dec 26, 2023
Teledyne FLIR Detection, Inc.
Felix J. Liang
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Data processing apparatus, data processing method, and non-transito...
Patent number
11,846,737
Issue date
Dec 19, 2023
Canon Medical Systems Corporation
Go Kawata
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Devices, systems, and methods for detecting radiation with Schottky...
Patent number
11,841,469
Issue date
Dec 12, 2023
Westinghouse Electric Company LLC
Michael D. Heibel
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Radioactivity measurement method and radioactivity measurement system
Patent number
11,828,887
Issue date
Nov 28, 2023
Korea Hydro & Nuclear Power Co., Ltd.
Seung Chan Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the quantification of radionuclides in liquid...
Patent number
11,796,690
Issue date
Oct 24, 2023
UMWELT- UND INGENIEURTECHNIK GMBH DRESDEN
Gottfried Horst Maerten
G01 - MEASURING TESTING
Information
Patent Grant
Method for assessing the concentration of uranium in a sample by ga...
Patent number
11,782,045
Issue date
Oct 10, 2023
ORANO MINING
Thomas Marchais
G01 - MEASURING TESTING
Information
Patent Grant
Radiation imaging apparatus, method for controlling same, and stora...
Patent number
11,782,171
Issue date
Oct 10, 2023
Canon Kabushiki Kaisha
Sota Torii
G01 - MEASURING TESTING
Information
Patent Grant
Thin film transistor array substrate for digital x-ray detector dev...
Patent number
11,757,046
Issue date
Sep 12, 2023
LG Display Co., Ltd.
Jaeho Yoon
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric conversion element, measuring method of the same, sol...
Patent number
11,711,931
Issue date
Jul 25, 2023
Sony Group Corporation
Yukio Kaneda
G01 - MEASURING TESTING
Information
Patent Grant
System and method for directional detection of radiation
Patent number
11,693,134
Issue date
Jul 4, 2023
Technion Research & Development Foundation Limited
Ehud Behar
G01 - MEASURING TESTING
Information
Patent Grant
Rare earth halide scintillation material
Patent number
11,685,860
Issue date
Jun 27, 2023
Grirem Advanced Materials Co., Ltd.
Jinqiu Yu
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Grant
Neutral atom imaging unit, neutral atom imager, neutral atom imagin...
Patent number
11,662,484
Issue date
May 30, 2023
Peking University
Qiugang Zong
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Spectroscopic sensor for alpha and beta particles
Patent number
11,650,339
Issue date
May 16, 2023
United States of America as represented by the Secretary of the Navy
Kyle Alan Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Compressive imaging method and system comprising a detector, a mask...
Patent number
11,555,935
Issue date
Jan 17, 2023
Australian Nuclear Science and Technology Organisation
David Boardman
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Apparatus and process for optimizing radiation detection counting t...
Patent number
11,531,121
Issue date
Dec 20, 2022
Oregon State University
Ophir Frieder
G01 - MEASURING TESTING
Information
Patent Grant
Multifaceted radiation detection and classification system
Patent number
11,513,253
Issue date
Nov 29, 2022
Lawrence Livermore National Security, LLC
Simon E. Labov
G01 - MEASURING TESTING
Information
Patent Grant
Rare-earth halide scintillating material and application thereof
Patent number
11,512,251
Issue date
Nov 29, 2022
Grirem Advanced Materials Co., Ltd.
Jinqiu Yu
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Multi-piece mono-layer radiation detector
Patent number
11,506,802
Issue date
Nov 22, 2022
Koninklijke Philips N.V.
Johannes Wilhelmus Maria Jacobs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for processing nuclear energy spectrum
Patent number
11,506,803
Issue date
Nov 22, 2022
BEIJING POWER-RESOLUTION TECHNOLOGY CO. LTD.
Weiping Liang
G01 - MEASURING TESTING
Information
Patent Grant
Ultrahigh surface area materials and methods of making same
Patent number
11,480,696
Issue date
Oct 25, 2022
University of South Florida
Jay A. Bieber
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
XRF analyzer with improved resolution by using micro-reset
Patent number
11,415,710
Issue date
Aug 16, 2022
Olympus America Inc.
Marc Battyani
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating a signal filter and radiation detection system
Patent number
11,397,270
Issue date
Jul 26, 2022
Ketek GmbH
Florian Rettenmeier
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for compton scatter and/or pulse pileup detection
Patent number
11,397,269
Issue date
Jul 26, 2022
Rapiscan Systems, Inc.
Willem Gerhardus Johannes Langeveld
G01 - MEASURING TESTING
Information
Patent Grant
System and method for evaluating elution efficiency and radiopurity...
Patent number
11,391,853
Issue date
Jul 19, 2022
BWXT Isotope Technology Group, Inc.
Christopher Sean Fewox
G01 - MEASURING TESTING
Information
Patent Grant
Sealed radiation detector module systems and methods
Patent number
11,391,851
Issue date
Jul 19, 2022
Teledyne FLIR Detection, Inc.
Hartmut Brands
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Devices, Systems, and Methods for Detecting Radiation with Schottky...
Publication number
20240125950
Publication date
Apr 18, 2024
Westinghouse Electric Company LLC
Michael D. HEIBEL
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
FRONT-END ELECTRONIC CIRCUITRY FOR AN ELECTROMAGNETIC RADIATION SEN...
Publication number
20240073550
Publication date
Feb 29, 2024
ams International AG
Charalambos ANDREOU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING ALPHA-RAY SPECTRUM OBTAINED FROM RADIATION SOURCE
Publication number
20240053498
Publication date
Feb 15, 2024
KOREA INSTITUTE OF RADIOLOGICAL & MEDICAL SCIENCES
Gun A KIM
G01 - MEASURING TESTING
Information
Patent Application
Improved Timing and Trilateration System for Space Applications and...
Publication number
20230417557
Publication date
Dec 28, 2023
Impulse Space, Inc.
Barry Matsumori
G01 - MEASURING TESTING
Information
Patent Application
RADIATION ANALYSIS METHOD, RADIATION ANALYSIS DEVICE, AND RADIATION...
Publication number
20230375732
Publication date
Nov 23, 2023
JAPAN ATOMIC ENERGY AGENCY
Masaaki KABURAGI
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND RADIATION IMAGING DEVICE INCLUDING SAME
Publication number
20230341571
Publication date
Oct 26, 2023
NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
Toru AOKI
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION ELEMENT, MEASURING METHOD OF THE SAME, SOL...
Publication number
20230329016
Publication date
Oct 12, 2023
SONY GROUP CORPORATION
YUKIO KANEDA
G01 - MEASURING TESTING
Information
Patent Application
ENERGY BIN EVENT COUNTING SYSTEM
Publication number
20230314639
Publication date
Oct 5, 2023
Analog Devices, Inc.
Gregory T. KOKER
G01 - MEASURING TESTING
Information
Patent Application
RADIONUCLIDE ANALYSIS APPARATUS, RADIONUCLIDE ANALYSIS METHOD, AND...
Publication number
20230288585
Publication date
Sep 14, 2023
Nihon Medi-Physics Co., Ltd.
Takahisa HANADA
G01 - MEASURING TESTING
Information
Patent Application
IMAGING APPARATUS
Publication number
20230280483
Publication date
Sep 7, 2023
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Yurun LIU
G01 - MEASURING TESTING
Information
Patent Application
CASCADED IMPULSE CONVOLUTION SHAPING METHOD AND APPARATUS FOR NUCLE...
Publication number
20230281266
Publication date
Sep 7, 2023
Sichuan X-STAR Technology of M&C Co., Ltd
Jianbin Zhou
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR CORRELATING ALPHA AND GAMMA SPECTROMETRY MEASUREMENTS FO...
Publication number
20230280484
Publication date
Sep 7, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Julien VENARA
G01 - MEASURING TESTING
Information
Patent Application
IMAGING METHOD
Publication number
20230280485
Publication date
Sep 7, 2023
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Yurun LIU
G01 - MEASURING TESTING
Information
Patent Application
MULTIFACETED RADIATION DETECTION AND CLASSIFICATION SYSTEM
Publication number
20230221458
Publication date
Jul 13, 2023
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Simon E. Labov
G01 - MEASURING TESTING
Information
Patent Application
A FIXED IN-CORE DETECTOR DESIGN USING SIC SCHOTTKY DIODES CONFIGURE...
Publication number
20230168398
Publication date
Jun 1, 2023
Westinghouse Electric Company LLC
MICHAEL D. HEIBEL
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING METHOD, LEARNING MODEL GENERATION METHOD, SIGNAL...
Publication number
20230152251
Publication date
May 18, 2023
HORIBA LTD.
Shunsuke MURATA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR NANOPARTICLE-BASED DETECTION
Publication number
20230145015
Publication date
May 11, 2023
The Regents of the University of Michigan
Mark Hammig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Radiation Detection Apparatus and Sample Analysis Apparatus
Publication number
20230112252
Publication date
Apr 13, 2023
JEOL Ltd.
Genki Kinugasa
G01 - MEASURING TESTING
Information
Patent Application
ULTRAHIGH SURFACE AREA MATERIALS AND METHODS OF MAKING THE SAME
Publication number
20220390629
Publication date
Dec 8, 2022
University of South Florida
Jay A. Bieber
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
RARE EARTH HALIDE SCINTILLATION MATERIAL
Publication number
20220372368
Publication date
Nov 24, 2022
GRIREM ADVANCED MATERIALS CO., LTD
Jinqiu YU
C30 - CRYSTAL GROWTH
Information
Patent Application
METHOD AND DEVICE FOR THE QUANTIFICATION OF RADIONUCLIDES IN LIQUID...
Publication number
20220365226
Publication date
Nov 17, 2022
UMWELT- UND INGENIEURTECHNIK GMBH DRESDEN
Gottfried Horst MAERTEN
G01 - MEASURING TESTING
Information
Patent Application
RESPONSE FUNCTION OF A SCINTILLATOR
Publication number
20220357472
Publication date
Nov 10, 2022
SOLETANCHE FREYSSINET
Ludmila KONECNÁ
G01 - MEASURING TESTING
Information
Patent Application
MEAN RANDOMS ESTIMATION FROM LIST MODE DATA
Publication number
20220350037
Publication date
Nov 3, 2022
Siemens Medical Solutions USA, Inc.
Vladimir Panin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICES, SYSTEMS, AND METHODS FOR DETECTING RADIATION WITH SCHOTTKY...
Publication number
20220342093
Publication date
Oct 27, 2022
Westinghouse Electric Company LLC
Michael D. HEIBEL
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
XRF ANALYZER WITH IMPROVED RESOLUTION BY USING MICRO-RESET
Publication number
20220342090
Publication date
Oct 27, 2022
OLYMPUS AMERICA INC.
Marc Battyani
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT ARRANGEMENT AND METHOD FOR CHARGE INTEGRATION
Publication number
20220321130
Publication date
Oct 6, 2022
ams International AG
Andreas FITZI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
GAMMA SPECTRAL ANALYSIS
Publication number
20220317330
Publication date
Oct 6, 2022
Halliburton Energy Services, Inc.
Mayir Mamtimin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY PHOTON-COUNTING DATA CORRECTION THROUGH DEEP LEARNING
Publication number
20220308242
Publication date
Sep 29, 2022
Rensselaer Polytechnic Institute
Ge Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIATION SOURCE LOCALIZATION SYSTEMS AND METHODS
Publication number
20220268952
Publication date
Aug 25, 2022
Teledyne FLIR Detection, Inc.
Felix J. Liang
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
SYSTEM AND METHOD FOR DIRECTIONAL DETECTION OF RADIATION
Publication number
20220268953
Publication date
Aug 25, 2022
Technion Research & Development Foundation Limited
Ehud BEHAR
G01 - MEASURING TESTING