Micro-channel plates [MCP]

Industry

CPC
H01J43/246

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J43/00Secondary-emission tubes Electron-multiplier tubes

Current Industry

H01J43/246Micro-channel plates [MCP]

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Global shutter for transmission mode secondary electron intensifier...
- Patent number 12,183,562
- Issue date Dec 31, 2024
- Elbit Systems of America, LLC
- Arlynn Walter Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Barrier coatings
- Patent number 11,901,169
- Issue date Feb 13, 2024
- UChicago Argonne, LLC
- Jeffrey W. Elam
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion-to-electron conversion dynode for ion imaging applications
- Patent number 11,854,777
- Issue date Dec 26, 2023
- Thermo Finnigan LLC.
- Oleg Silivra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Elementary particle detector
- Patent number 11,823,881
- Issue date Nov 21, 2023
- Universite Claude Bernard Lyon 1
- Imad Laktineh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device with gated integrator
- Patent number 11,531,011
- Issue date Dec 20, 2022
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Daniel J. Gershman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector having electron impact-type diode configuration
- Patent number 11,521,841
- Issue date Dec 6, 2022
- Hamamatsu Photonics K.K.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,476,104
- Issue date Oct 18, 2022
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ALD reactor for coating porous substrates
- Patent number 11,326,255
- Issue date May 10, 2022
- UChicago Argonne, LLC
- Anil U. Mane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MCP assembly and charged particle detector
- Patent number 11,315,772
- Issue date Apr 26, 2022
- Hamamatsu Photonics K.K.
- Masahiro Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier that suppresses and stabilizes a variation of a...
- Patent number 11,170,983
- Issue date Nov 9, 2021
- Hamamatsu Photonics K.K.
- Daichi Masuko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MCP assembly and charged particle detector
- Patent number 11,139,153
- Issue date Oct 5, 2021
- Hamamatsu Photonics K.K.
- Masahiro Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and time-of-flight mass spectromet...
- Patent number 11,120,979
- Issue date Sep 14, 2021
- Kioxia Corporation
- Jun Asakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,031,220
- Issue date Jun 8, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier having resistance value variation suppression a...
- Patent number 11,011,358
- Issue date May 18, 2021
- Hamamatsu Photonics K.K.
- Daichi Masuko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier production method and electron multiplier
- Patent number 10,957,522
- Issue date Mar 23, 2021
- Hamamatsu Photonics K.K.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phosphor screen for MEMS image intensifiers
- Patent number 10,923,244
- Issue date Feb 16, 2021
- Elbit Systems of America, LLC
- Arlynn W. Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Image intensifier for night vision device
- Patent number 10,886,095
- Issue date Jan 5, 2021
- Photonis Netherlands B.V.
- Gert Otto Nützel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced electron amplifier structure and method of fabricating the...
- Patent number 10,867,768
- Issue date Dec 15, 2020
- UChicago Argonne, LLC
- Anil U. Mane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microchannel plate and electron multiplier tube with improved gain...
- Patent number 10,818,484
- Issue date Oct 27, 2020
- Hamamatsu Photonics K.K.
- Takaaki Nagata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monocrystal-based microchannel plate image intensifier
- Patent number 10,809,393
- Issue date Oct 20, 2020
- Fermi Research Alliance, LLC
- Alex H. Lumpkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier
- Patent number 10,727,035
- Issue date Jul 28, 2020
- Hamamatsu Photonics K.K.
- Daichi Masuko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multiplier production method and electron multiplier
- Patent number 10,522,334
- Issue date Dec 31, 2019
- Hamamatsu Photonics K.K.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer using a cold electron beam as an i...
- Patent number 10,388,506
- Issue date Aug 20, 2019
- Kora Basic Science Institute
- Mo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microchannel plate and electron multiplier
- Patent number 10,340,129
- Issue date Jul 2, 2019
- Hamamatsu Photonics K.K.
- Takaaki Nagata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metamaterial photocathode for detection and imaging of infrared rad...
- Patent number 10,236,165
- Issue date Mar 19, 2019
- The United States of America, as represented by the Secretary of the Navy
- Benjamin R. Conley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital electron amplifier with anode readout devices and methods o...
- Patent number 10,121,642
- Issue date Nov 6, 2018
- UChicago Argonne, LLC
- Anil U. Mane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital electron amplifier with anode readout devices and methods o...
- Patent number 10,062,555
- Issue date Aug 28, 2018
- UChicago Argonne, LLC
- Anil U. Mane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle detector and method of controlling the same
- Patent number 9,934,952
- Issue date Apr 3, 2018
- Hamamatsu Photonics K.K.
- Masahiro Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 9,640,378
- Issue date May 2, 2017
- Hamamatsu Photonics K.K.
- Masahiro Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nano granular materials (NGM) material, methods and arrangements fo...
- Patent number 9,583,298
- Issue date Feb 28, 2017
- HAWILKO GMBH
- Hans W. P. Koops
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SINGLE ELECTRON AND PHOTON RADIO FREQUENCY TIMER
- Publication number 20240274422
- Publication date Aug 15, 2024
- Amur Margaryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...
- Publication number 20240242948
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION-TO-ELECTRON CONVERSION DYNODE FOR ION IMAGING APPLICATIONS
- Publication number 20240087862
- Publication date Mar 14, 2024
- Thermo Finnigan LLC
- Oleg SILIVRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BARRIER COATINGS
- Publication number 20230260736
- Publication date Aug 17, 2023
- UChicago Argonne, LLC
- Jeffrey W. Elam
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MICROCHANNEL SENSOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230152473
- Publication date May 18, 2023
- Robert BLICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON TUBE, IMAGING DEVICE AND ELECTROMAGNETIC WAVE DETECTION DE...
- Publication number 20230071586
- Publication date Mar 9, 2023
- Hamamatsu Photonics K.K.
- Yasuhide MIYAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR
- Publication number 20210391159
- Publication date Dec 16, 2021
- HAMAMATSU PHOTONICS K. K.
- Hiroshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GLOBAL SHUTTER FOR TRANSMISSION MODE SECONDARY ELECTRON INTENSIFIER...
- Publication number 20210335587
- Publication date Oct 28, 2021
- ELBIT SYSTEMS OF AMERICA, LLC
- Arlynn Walter Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20210327697
- Publication date Oct 21, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MCP ASSEMBLY AND CHARGED PARTICLE DETECTOR
- Publication number 20210272786
- Publication date Sep 2, 2021
- Hamamatsu Photonics K.K.
- Masahiro HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MCP ASSEMBLY AND CHARGED PARTICLE DETECTOR
- Publication number 20210193445
- Publication date Jun 24, 2021
- Hamamatsu Photonics K.K.
- Masahiro HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER
- Publication number 20210134572
- Publication date May 6, 2021
- Hamamatsu Photonics K.K.
- Daichi MASUKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER
- Publication number 20210118655
- Publication date Apr 22, 2021
- Hamamatsu Photonics K.K.
- Daichi MASUKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION-TO-ELECTRON CONVERSION DYNODE FOR ION IMAGING APPLICATIONS
- Publication number 20210035789
- Publication date Feb 4, 2021
- Thermo Finnigan LLC
- Oleg SILIVRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER
- Publication number 20200176236
- Publication date Jun 4, 2020
- Hamamatsu Photonics K.K.
- Daichi MASUKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER PRODUCTION METHOD AND ELECTRON MULTIPLIER
- Publication number 20200058477
- Publication date Feb 20, 2020
- HAMAMATSU PHOTONICS K. K.
- Hiroshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCHANNEL PLATE AND ELECTRON MULTIPLIER TUBE
- Publication number 20200027709
- Publication date Jan 23, 2020
- Hamamatsu Photonics K.K.
- Takaaki NAGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20190287777
- Publication date Sep 19, 2019
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER PRODUCTION METHOD AND ELECTRON MULTIPLIER
- Publication number 20190164734
- Publication date May 30, 2019
- Hamamatsu Photonics K.K.
- Hiroshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE INTENSIFIER FOR NIGHT VISION DEVICE
- Publication number 20190019646
- Publication date Jan 17, 2019
- PHOTONIS NETHERLANDS B.V.
- Gert Otto NÜTZEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCHANNEL PLATE AND ELECTRON MULTIPLIER
- Publication number 20180247802
- Publication date Aug 30, 2018
- Hamamatsu Photonics K.K.
- Takaaki NAGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL ELECTRON AMPLIFIER WITH ANODE READOUT DEVICES AND METHODS O...
- Publication number 20180233339
- Publication date Aug 16, 2018
- UChicago Argonne, LLC
- Anil U. Mane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONOCRYSTAL-BASED MICROCHANNEL PLATE IMAGE INTENSIFIER
- Publication number 20180120452
- Publication date May 3, 2018
- FERMI RESEARCH ALLIANCE, LLC
- Alex H. Lumpkin
- G02 - OPTICS
Information Patent Application
MICRO-CHANNEL PLATE, METHOD FOR MANUFACTURING MICRO-CHANNEL PLATE,...
- Publication number 20150279639
- Publication date Oct 1, 2015
- Hamamatsu Photonics K.K.
- Kimitsugu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANO GRANULAR MATERIALS (NGM) MATERIAL, METHODS AND ARRANGEMENTS FO...
- Publication number 20150255239
- Publication date Sep 10, 2015
- HAWILKO GMBH
- Hans W.P. Koops
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ANION GENERATING AND ELECTRON CAPTURE DISSOCIATION APPARATUS USING...
- Publication number 20140367568
- Publication date Dec 18, 2014
- Hyun Sik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Suppression of Ion Feedback in a Microchannel Plate P...
- Publication number 20140361683
- Publication date Dec 11, 2014
- Jeffrey DeFazio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BRIGHT SOURCE PROTECTION FOR LOW LIGHT IMAGING SENSORS
- Publication number 20140239157
- Publication date Aug 28, 2014
- Christopher David Burgess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MULTIPLIER
- Publication number 20140152168
- Publication date Jun 5, 2014
- Hamamatsu Photonics K.K.
- Akio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MCP UNIT, MCP DETECTOR, AND TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20140097340
- Publication date Apr 10, 2014
- HAMAMATSU PHOTONICS K. K.
- Akio SUZUKI
- G01 - MEASURING TESTING

Micro-channel plates [MCP]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Global shutter for transmission mode secondary electron intensifier...

Barrier coatings

Ion-to-electron conversion dynode for ion imaging applications

Elementary particle detector

Imaging device with gated integrator

Ion detector having electron impact-type diode configuration

Ion detection system

ALD reactor for coating porous substrates

MCP assembly and charged particle detector

Electron multiplier that suppresses and stabilizes a variation of a...

MCP assembly and charged particle detector

Time-of-flight mass spectrometer and time-of-flight mass spectromet...

Ion detection system

Electron multiplier having resistance value variation suppression a...

Electron multiplier production method and electron multiplier

Phosphor screen for MEMS image intensifiers

Image intensifier for night vision device

Enhanced electron amplifier structure and method of fabricating the...

Microchannel plate and electron multiplier tube with improved gain...

Monocrystal-based microchannel plate image intensifier

Electron multiplier

Electron multiplier production method and electron multiplier

Time-of-flight mass spectrometer using a cold electron beam as an i...

Microchannel plate and electron multiplier

Metamaterial photocathode for detection and imaging of infrared rad...

Digital electron amplifier with anode readout devices and methods o...

Digital electron amplifier with anode readout devices and methods o...

Charged-particle detector and method of controlling the same

Time-of-flight mass spectrometer

Nano granular materials (NGM) material, methods and arrangements fo...

Patents Applicationslast 30 patents

SINGLE ELECTRON AND PHOTON RADIO FREQUENCY TIMER

Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...

ION-TO-ELECTRON CONVERSION DYNODE FOR ION IMAGING APPLICATIONS

BARRIER COATINGS

MICROCHANNEL SENSOR AND METHOD OF MANUFACTURING THE SAME

ELECTRON TUBE, IMAGING DEVICE AND ELECTROMAGNETIC WAVE DETECTION DE...

ION DETECTOR

GLOBAL SHUTTER FOR TRANSMISSION MODE SECONDARY ELECTRON INTENSIFIER...

ION DETECTION SYSTEM

MCP ASSEMBLY AND CHARGED PARTICLE DETECTOR

MCP ASSEMBLY AND CHARGED PARTICLE DETECTOR

ELECTRON MULTIPLIER

ELECTRON MULTIPLIER

ION-TO-ELECTRON CONVERSION DYNODE FOR ION IMAGING APPLICATIONS

ELECTRON MULTIPLIER

ELECTRON MULTIPLIER PRODUCTION METHOD AND ELECTRON MULTIPLIER

MICROCHANNEL PLATE AND ELECTRON MULTIPLIER TUBE

ION DETECTION SYSTEM

ELECTRON MULTIPLIER PRODUCTION METHOD AND ELECTRON MULTIPLIER

IMAGE INTENSIFIER FOR NIGHT VISION DEVICE

MICROCHANNEL PLATE AND ELECTRON MULTIPLIER

DIGITAL ELECTRON AMPLIFIER WITH ANODE READOUT DEVICES AND METHODS O...

MONOCRYSTAL-BASED MICROCHANNEL PLATE IMAGE INTENSIFIER

MICRO-CHANNEL PLATE, METHOD FOR MANUFACTURING MICRO-CHANNEL PLATE,...

NANO GRANULAR MATERIALS (NGM) MATERIAL, METHODS AND ARRANGEMENTS FO...

ANION GENERATING AND ELECTRON CAPTURE DISSOCIATION APPARATUS USING...

Electrostatic Suppression of Ion Feedback in a Microchannel Plate P...

BRIGHT SOURCE PROTECTION FOR LOW LIGHT IMAGING SENSORS

ELECTRON MULTIPLIER

MCP UNIT, MCP DETECTOR, AND TIME-OF-FLIGHT MASS SPECTROMETER