Moire deflectometry

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CPC
G01N2021/456

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/456Moire deflectometry

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Patents Grantslast 30 patents

Information Patent Grant
Deflectometry measurement system
- Patent number 12,000,752
- Issue date Jun 4, 2024
- LAMBDA-X OPHTHALMICS
- Philippe Antoine
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for laser scanning structured illumination mi...
- Patent number 9,360,660
- Issue date Jun 7, 2016
- Northwestern University
- Ji Yi
- G01 - MEASURING TESTING
Information Patent Grant
Packaging or container with optical indicator
- Patent number 7,999,931
- Issue date Aug 16, 2011
- Virtue Sense Ltd.
- Livne Gan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MOIRÉ PROFILIMETRY USING SIMULTANEOUS DUAL FR...
- Publication number 20230091424
- Publication date Mar 23, 2023
- SAN DIEGO STATE UNIVERSITY (SDSU) FOUNDATION, DBA SAN DIEGO STATE UNIVERSITY
- Sungbum KANG
- G01 - MEASURING TESTING
Information Patent Application
PORE MEASUREMENT DEVICE
- Publication number 20220404276
- Publication date Dec 22, 2022
- The Regents of the University of California
- Niall O'Dowd
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR LASER SCANNING STRUCTURED ILLUMINATION MI...
- Publication number 20130314717
- Publication date Nov 28, 2013
- Ji Yi
- G02 - OPTICS
Information Patent Application
PACKAGING OR CONTAINER WITH OPTICAL INDICATOR
- Publication number 20090128803
- Publication date May 21, 2009
- QUALISENSE TECHNOLOGIES LTD.
- Livne Gan
- G01 - MEASURING TESTING