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Monitoring Testing
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CPC
H04B17/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H04
Electric communication
H04B
TRANSMISSION
Current Industry
H04B17/00
Monitoring Testing
Sub Industries
H04B17/0082
using service channels; using auxiliary channels
H04B17/0085
using test signal generators
H04B17/0087
using auxiliary channels or channel simulators
H04B17/10
of transmitters
H04B17/101
for measurement of parameters
H04B17/102
of radiated power at antenna port
H04B17/103
of reflected power
H04B17/104
of other parameters
H04B17/11
for calibration
H04B17/12
of transmit antennas
H04B17/13
of power amplifiers
H04B17/14
of the whole transmission and reception path
H04B17/15
Performance testing
H04B17/16
Test equipment located at the transmitter
H04B17/17
Detection of non-compliance or faulty performance
H04B17/18
Monitoring during normal operation
H04B17/19
Self-testing arrangements
H04B17/20
of receivers
H04B17/21
for calibration for correcting measurements
H04B17/23
Indication means
H04B17/24
with feedback of measurements to the transmitter
H04B17/26
using historical data, averaging values or statistics
H04B17/27
for locating or positioning the transmitter
H04B17/29
Performance testing
H04B17/30
of propagation channels
H04B17/309
Measuring or estimating channel quality parameters
H04B17/318
Received signal strength
H04B17/327
Received signal code power [RSCP]
H04B17/336
Signal-to-interference ratio [SIR] or carrier-to-interference ratio [CIR]
H04B17/345
Interference values
H04B17/354
Adjacent channel leakage power
H04B17/364
Delay profiles
H04B17/373
Predicting channel quality parameters
H04B17/382
for resource allocation, admission control or handover
H04B17/391
Modelling the propagation channel
H04B17/3911
Fading models or fading generators
H04B17/3912
Simulation models
H04B17/3913
Predictive models
H04B17/40
of relay systems
H04B17/401
with selective localization
H04B17/402
using different frequencies
H04B17/403
generated by local oscillators
H04B17/404
selected by local filters
H04B17/405
generated by local multipliers, dividers, modulators
H04B17/406
using coded addresses
H04B17/407
without selective localization
H04B17/408
using successive loop-backs
H04B17/409
by means of resistance, voltage or current measurement
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