Multi-element AAS arrangements

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CPC
G01N2021/3114

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/3114Multi-element AAS arrangements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for simultaneously measuring mercury, cadmium, zi...
- Patent number 11,754,494
- Issue date Sep 12, 2023
- CHANGSHA KAIYUAN HONGSHENG TECHNOLOGY CO., LTD
- Li Feng
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element simultaneous analysis atomic absorption spectroscopy...
- Patent number 5,283,624
- Issue date Feb 1, 1994
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Optical compositional analyzer apparatus and method for detection o...
- Patent number 5,258,825
- Issue date Nov 2, 1993
- Perten Instruments North America, Inc.
- David S. Reed
- G01 - MEASURING TESTING
Information Patent Grant
Spectroanalytical system
- Patent number 5,095,205
- Issue date Mar 10, 1992
- Thermo Jarrell Ash Corporation
- Robert G. Schleicher
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer for simultaneous multi-element...
- Patent number 5,066,124
- Issue date Nov 19, 1991
- Bodenseewerk Perkin-Elmer GmbH
- Jurgen Wulf
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectroscopy photometer
- Patent number 5,035,505
- Issue date Jul 30, 1991
- Hitachi, Ltd.
- Masamichi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Correlational gas analyzer
- Patent number 4,964,725
- Issue date Oct 23, 1990
- Viktor L. Goldovsky
- G01 - MEASURING TESTING
Information Patent Grant
Correlational gas analyzer
- Patent number 4,963,023
- Issue date Oct 16, 1990
- Viktor L. Goldovsky
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,867,562
- Issue date Sep 19, 1989
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Device for the individual adjustment of the intensity of several sp...
- Patent number 4,815,848
- Issue date Mar 28, 1989
- Gruen Optik Wetzlar GmbH
- Tetsuo Hadeishi
- G01 - MEASURING TESTING
Information Patent Grant
Atomic resonance line source lamps and spectrophotometers for use w...
- Patent number 4,645,343
- Issue date Feb 24, 1987
- U.S. Philips Corporation
- Trevor J. Stockdale
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR SIMULTANEOUSLY MEASURING MERCURY, CADMIUM, ZI...
- Publication number 20230160813
- Publication date May 25, 2023
- CHANGSHA KAIYUAN HONGSHENG TECHNOLOGY CO., LTD
- Li FENG
- G01 - MEASURING TESTING

Multi-element AAS arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for simultaneously measuring mercury, cadmium, zi...

Multi-element simultaneous analysis atomic absorption spectroscopy...

Optical compositional analyzer apparatus and method for detection o...

Spectroanalytical system

Atomic absorption spectrophotometer for simultaneous multi-element...

Atomic absorption spectroscopy photometer

Correlational gas analyzer

Correlational gas analyzer

Atomic absorption spectrophotometer

Device for the individual adjustment of the intensity of several sp...

Atomic resonance line source lamps and spectrophotometers for use w...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR SIMULTANEOUSLY MEASURING MERCURY, CADMIUM, ZI...