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G01N2021/6406

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/6406multi-element

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Patents Grantslast 30 patents

Information Patent Grant
Radioactive anomaly detector
- Patent number 9,869,637
- Issue date Jan 16, 2018
- Raytheon Company
- Eric J. Griffin
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Coding and authentication by phase measurement modulation response...
- Patent number 6,441,380
- Issue date Aug 27, 2002
- Spectra Systems Corporation
- Nabil M. Lawandy
- G07 - CHECKING-DEVICES
Information Patent Grant
Spectroscope apparatus and reaction apparatus using the same
- Patent number 4,973,159
- Issue date Nov 27, 1990
- Hitachi, Ltd.
- Kenichi Sohma
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope apparatus and reaction apparatus using the same
- Patent number 4,820,046
- Issue date Apr 11, 1989
- Hitachi, Ltd.
- Kenichi Sohma
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 4,591,267
- Issue date May 27, 1986
- Baird Corporation
- Donald R. Demers
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 4,575,241
- Issue date Mar 11, 1986
- Baird Corporation
- Donald R. Demers
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 4,432,644
- Issue date Feb 21, 1984
- Baird Corporation
- Donald R. Demers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROWAVE PLASMA ATOMIC FLUORESCENCE MERCURY ANALYSIS SYSTEM
- Publication number 20120224175
- Publication date Sep 6, 2012
- Philippe Minghetti
- G01 - MEASURING TESTING