Multiangle measurement

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CPC
G01N2021/4711

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4711Multiangle measurement

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, system and method for measuring properties of a sample
- Patent number 12,203,848
- Issue date Jan 21, 2025
- ODX INNOVATIONS LIMITED
- Nicholas Wooder
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for identification of effect pigments in a target...
- Patent number 12,174,073
- Issue date Dec 24, 2024
- BASF Coatings GmbH
- Guido Bischoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for detecting the presence of pollen in the air, and corresp...
- Patent number 12,105,001
- Issue date Oct 1, 2024
- LIFY AIR
- Jérôme Richard
- G01 - MEASURING TESTING
Information Patent Grant
Purifying a sample solution via real-time multi-angle light scattering
- Patent number 12,038,376
- Issue date Jul 16, 2024
- Wyatt Technology, LLC
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Grant
Optical property measurement method and optical property calculatio...
- Patent number 12,025,556
- Issue date Jul 2, 2024
- Olympus Corporation
- Tomoko Sato
- G01 - MEASURING TESTING
Information Patent Grant
Device and methods for simultaneous determination of intrinsic visc...
- Patent number 12,013,411
- Issue date Jun 18, 2024
- Yokogawa Fluence Analytics, Inc.
- Wayne Frederick Reed
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for reference switching
- Patent number 12,007,275
- Issue date Jun 11, 2024
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device, measurement system, measurement program, and me...
- Patent number 11,874,225
- Issue date Jan 16, 2024
- THE UNIVERSITY OF TOKYO
- Yoshihiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Complex spatially-resolved reflectometry/refractometry
- Patent number 11,867,626
- Issue date Jan 9, 2024
- Regents of the Univ of Colorado, a body corporate
- Christina Porter
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method including accounting for varia...
- Patent number 11,726,036
- Issue date Aug 15, 2023
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Modulus-enforced probe
- Patent number 11,709,132
- Issue date Jul 25, 2023
- Regents of the University of Colorado, a body corporate
- Michael Tanksalvala
- G01 - MEASURING TESTING
Information Patent Grant
Optical flow cell assembly incorporating a replaceable transparent...
- Patent number 11,686,678
- Issue date Jun 27, 2023
- WYATT TECHNOLOGY CORPORATION
- David Rahmlow
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 11,619,591
- Issue date Apr 4, 2023
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Resolve path optical sampling architectures
- Patent number 11,579,080
- Issue date Feb 14, 2023
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting particles on the surface of an object, wafer,...
- Patent number 11,555,783
- Issue date Jan 17, 2023
- Carl Zeiss SMT GmbH
- Oliver Beyer
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection apparatus and image inspection method
- Patent number 11,536,667
- Issue date Dec 27, 2022
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Multi-angle dynamic light scattering
- Patent number 11,441,991
- Issue date Sep 13, 2022
- Malvern Panalytical Limited
- Douglas Hamilton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to measure multiple signals from a liquid sample
- Patent number 11,408,803
- Issue date Aug 9, 2022
- WYATT TECHNOLOGY CORPORATION
- Philip J. Wyatt
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical system for reference switching
- Patent number 11,243,115
- Issue date Feb 8, 2022
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Rapid and non-destructive detection of infection
- Patent number 11,137,384
- Issue date Oct 5, 2021
- Arizona Board of Regents on behalf of the University of Arizona
- Jeong-Yeol Yoon
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Fuel contamination monitor
- Patent number 11,131,627
- Issue date Sep 28, 2021
- Artium Technologies, Inc.
- William D. Bachalo
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Optical inspection system and method including accounting for varia...
- Patent number 11,035,793
- Issue date Jun 15, 2021
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Ballast water analysis system
- Patent number 11,016,031
- Issue date May 25, 2021
- Ballast Water Monitoring A/S
- Ole Olsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining detection angle of optical particle sizer
- Patent number 10,928,297
- Issue date Feb 23, 2021
- University of Washington
- Igor V. Novosselov
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to measure multiple signals from a liquid sample
- Patent number 10,908,054
- Issue date Feb 2, 2021
- WYATT TECHNOLOGY CORPORATION
- Philip J. Wyatt
- G01 - MEASURING TESTING
Information Patent Grant
Optical flow cell assembly incorporating a replaceable transparent...
- Patent number 10,895,531
- Issue date Jan 19, 2021
- WYATT TECHNOLOGY CORPORATION
- David Rahmlow
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an object with circular-arc-shap...
- Patent number 10,880,538
- Issue date Dec 29, 2020
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Reimar Tausch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor for a virtually simultaneous measurement of a transmission a...
- Patent number 10,837,898
- Issue date Nov 17, 2020
- BASF Coatings GmbH
- Andreas Joch
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for reference switching
- Patent number 10,788,366
- Issue date Sep 29, 2020
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,775,704
- Issue date Sep 15, 2020
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COLUMN FLOW DAMPENER FOR MALS NOISE REDUCTION DURING SEC-MALS ANALYSIS
- Publication number 20240416259
- Publication date Dec 19, 2024
- WATERS TECHNOLOGIES CORPORATION
- Lavelay Kizekai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...
- Publication number 20240319078
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHODS FOR SIMULTANEOUS DETERMINATION OF INTRINSIC VISC...
- Publication number 20240302402
- Publication date Sep 12, 2024
- YOKOGAWA FLUENCE ANALYTICS, INC.
- Wayne Frederick REED
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR REFERENCE SWITCHING
- Publication number 20240288306
- Publication date Aug 29, 2024
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR MEASURING OPTICAL CHARACTERISTICS AND DEVICE FOR...
- Publication number 20230288330
- Publication date Sep 14, 2023
- Konica Minolta, Inc.
- TAKASHI KAWASAKI
- G01 - MEASURING TESTING
Information Patent Application
Resolve Path Optical Sampling Architectures
- Publication number 20230266243
- Publication date Aug 24, 2023
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Application
Optical System for Reference Switching
- Publication number 20220136899
- Publication date May 5, 2022
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
PURIFYING A SAMPLE SOLUTION VIA REAL-TIME MULTI-ANGLE LIGHT SCATTERING
- Publication number 20220120678
- Publication date Apr 21, 2022
- WYATT TECHNOLOGY CORPORATION
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROPERTY MEASUREMENT METHOD AND OPTICAL PROPERTY CALCULATIO...
- Publication number 20220091034
- Publication date Mar 24, 2022
- OLYMPUS CORPORATION
- Tomoko SATO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT PROGRAM, AND ME...
- Publication number 20210262934
- Publication date Aug 26, 2021
- THE UNIVERSITY OF TOKYO
- Yoshihiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Resolve Path Optical Sampling Architectures
- Publication number 20210199576
- Publication date Jul 1, 2021
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Application
Apparatus to measure multiple signals from a liquid sample
- Publication number 20210172841
- Publication date Jun 10, 2021
- WYATT TECHNOLOGY CORPORATION
- Philip J. Wyatt
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MULTI-ANGLE DYNAMIC LIGHT SCATTERING
- Publication number 20210063295
- Publication date Mar 4, 2021
- MALVERN PANALYTICAL LIMITED
- Douglas HAMILTON
- G01 - MEASURING TESTING
Information Patent Application
Optical System for Reference Switching
- Publication number 20210010860
- Publication date Jan 14, 2021
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SCATTERING DETECTION DEVICE AND LIGHT SCATTERING DETECTION ME...
- Publication number 20200408683
- Publication date Dec 31, 2020
- Shimadzu Corporation
- Toru YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING MEASURED FILL-LEVEL OF A CONTAINER BASED ON MEASUREMENT...
- Publication number 20200284641
- Publication date Sep 10, 2020
- Chevron U.S.A. Inc.
- Jerry Kieth Nobles
- G01 - MEASURING TESTING
Information Patent Application
Embedded Particle Depth Binning Based on Multiple Scattering Signals
- Publication number 20190383754
- Publication date Dec 19, 2019
- KLA-Tencor Corporation
- Haiping Zhang
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20190346771
- Publication date Nov 14, 2019
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G02 - OPTICS
Information Patent Application
PORTABLE DEVICE FOR MEASURING THE GEOMETRY OF AN OBJECT AND ITS SPA...
- Publication number 20190342478
- Publication date Nov 7, 2019
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Vlastimil HAVRAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE INSPECTION APPARATUS AND IMAGE INSPECTION METHOD
- Publication number 20190265170
- Publication date Aug 29, 2019
- Omron Corporation
- Yutaka KATO
- G01 - MEASURING TESTING
Information Patent Application
IMAGE INSPECTION APPARATUS AND IMAGE INSPECTION METHOD
- Publication number 20190265171
- Publication date Aug 29, 2019
- Omron Corporation
- Yutaka KATO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20190242751
- Publication date Aug 8, 2019
- MKS Technology (d/b/a Snowy Range Instruments)
- Keith T. Carron
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIA...
- Publication number 20190204221
- Publication date Jul 4, 2019
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR REFERENCE SWITCHING
- Publication number 20190128734
- Publication date May 2, 2019
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
Overlay Metrology Using Multiple Parameter Configurations
- Publication number 20190041329
- Publication date Feb 7, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CUSTOMIZED HAIR-COLORING
- Publication number 20180321146
- Publication date Nov 8, 2018
- Coloright Ltd.
- Efraim MIKLATZKY
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
ENDOTOXIN DETECTION SYSTEMS AND DETECTION METHODS THEREOF
- Publication number 20180224426
- Publication date Aug 9, 2018
- NANJING TUOZHU PHARMACEUTICAL & TECH CO., LTD
- Guoping Peng
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING THE MOLECULAR WEIGHT DISTRIBUTION OF GLATIRAM...
- Publication number 20180164275
- Publication date Jun 14, 2018
- Teva Pharmaceutical Industries Ltd.
- Avraham Arthur KOMILOSH
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
A BALLAST WATER ANALYSIS SYSTEM
- Publication number 20170350824
- Publication date Dec 7, 2017
- Ballast Water Monitoring A/S
- Ole Olsen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
- Publication number 20170261440
- Publication date Sep 14, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING

Multiangle measurement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus, system and method for measuring properties of a sample

Method and device for identification of effect pigments in a target...

Device for detecting the presence of pollen in the air, and corresp...

Purifying a sample solution via real-time multi-angle light scattering

Optical property measurement method and optical property calculatio...

Device and methods for simultaneous determination of intrinsic visc...

Optical system for reference switching

Measurement device, measurement system, measurement program, and me...

Complex spatially-resolved reflectometry/refractometry

Optical inspection system and method including accounting for varia...

Modulus-enforced probe

Optical flow cell assembly incorporating a replaceable transparent...

Image inspection apparatus and image inspection method

Resolve path optical sampling architectures

Method for detecting particles on the surface of an object, wafer,...

Image inspection apparatus and image inspection method

Multi-angle dynamic light scattering

Apparatus to measure multiple signals from a liquid sample

Optical system for reference switching

Rapid and non-destructive detection of infection

Fuel contamination monitor

Optical inspection system and method including accounting for varia...

Ballast water analysis system

Method for determining detection angle of optical particle sizer

Apparatus to measure multiple signals from a liquid sample

Optical flow cell assembly incorporating a replaceable transparent...

Method and apparatus for detecting an object with circular-arc-shap...

Sensor for a virtually simultaneous measurement of a transmission a...

Optical system for reference switching

Method of measuring a structure, inspection apparatus, lithographic...

Patents Applicationslast 30 patents

COLUMN FLOW DAMPENER FOR MALS NOISE REDUCTION DURING SEC-MALS ANALYSIS

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...

DEVICE AND METHODS FOR SIMULTANEOUS DETERMINATION OF INTRINSIC VISC...

OPTICAL SYSTEM FOR REFERENCE SWITCHING

OPTICAL SYSTEM FOR MEASURING OPTICAL CHARACTERISTICS AND DEVICE FOR...

Resolve Path Optical Sampling Architectures

Optical System for Reference Switching

PURIFYING A SAMPLE SOLUTION VIA REAL-TIME MULTI-ANGLE LIGHT SCATTERING

OPTICAL PROPERTY MEASUREMENT METHOD AND OPTICAL PROPERTY CALCULATIO...

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT PROGRAM, AND ME...

Resolve Path Optical Sampling Architectures

Apparatus to measure multiple signals from a liquid sample

MULTI-ANGLE DYNAMIC LIGHT SCATTERING

Optical System for Reference Switching

LIGHT SCATTERING DETECTION DEVICE AND LIGHT SCATTERING DETECTION ME...

CALIBRATING MEASURED FILL-LEVEL OF A CONTAINER BASED ON MEASUREMENT...

Embedded Particle Depth Binning Based on Multiple Scattering Signals

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

PORTABLE DEVICE FOR MEASURING THE GEOMETRY OF AN OBJECT AND ITS SPA...

IMAGE INSPECTION APPARATUS AND IMAGE INSPECTION METHOD

IMAGE INSPECTION APPARATUS AND IMAGE INSPECTION METHOD

SPECTROMETER

OPTICAL INSPECTION SYSTEM AND METHOD INCLUDING ACCOUNTING FOR VARIA...

OPTICAL SYSTEM FOR REFERENCE SWITCHING

Overlay Metrology Using Multiple Parameter Configurations

APPARATUS AND METHOD FOR CUSTOMIZED HAIR-COLORING

ENDOTOXIN DETECTION SYSTEMS AND DETECTION METHODS THEREOF

METHOD OF DETERMINING THE MOLECULAR WEIGHT DISTRIBUTION OF GLATIRAM...

A BALLAST WATER ANALYSIS SYSTEM

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS