Multiple excitation of scattering medium

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CPC
G01N2021/516

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/516Multiple excitation of scattering medium

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis apparatus, automatic analysis method, and storag...
- Patent number 10,859,483
- Issue date Dec 8, 2020
- Canon Kabushiki Kaisha
- Takahiro Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing apparatus for eliminating object reflection noise...
- Patent number 10,209,177
- Issue date Feb 19, 2019
- Sony Corporation
- Masaaki Hara
- G01 - MEASURING TESTING
Information Patent Grant
Systems for fluid analysis using electromagnetic energy that is ref...
- Patent number 9,664,610
- Issue date May 30, 2017
- Visualant, Inc.
- Richard Ian Mander
- G01 - MEASURING TESTING
Information Patent Grant
Time-reversal of variance-encoded light (TROVE)
- Patent number 9,354,166
- Issue date May 31, 2016
- California Institute of Technology
- Benjamin Judkewitz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method for using an LED to identify a presenc...
- Patent number 9,182,342
- Issue date Nov 10, 2015
- Motion Controls, L.L.C.
- Bradley W. Engstrand
- G01 - MEASURING TESTING
Information Patent Grant
Exhaust gas analyzer and exhaust gas analyzing method
- Patent number 7,926,332
- Issue date Apr 19, 2011
- Toyota Jidosha Kabushiki Kaisha
- Masahiro Yamakage
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing emission of excited radiation in an analytical sample sub...
- Patent number 5,317,378
- Issue date May 31, 1994
- Perkin-Elmer Ltd.
- Henry M. Mould
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectrical particle detection apparatus
- Patent number 5,094,533
- Issue date Mar 10, 1992
- Fujitsu Limited
- Shigetomo Sawada
- G01 - MEASURING TESTING
Information Patent Grant
Particle contamination detection in fluids through the external sec...
- Patent number 5,061,065
- Issue date Oct 29, 1991
- Pacific Scientific Company
- Holger T. Sommer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument for determining the scattering and absorption...
- Patent number 5,024,526
- Issue date Jun 18, 1991
- Deutsche Forschungs- und Versuchsanstalt fur Luft- und Raumfahrt e.V.
- Heribert von Redwitz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing high sensitivity fluorescence m...
- Patent number 5,018,866
- Issue date May 28, 1991
- Packard Instrument Company
- Donald E. Osten
- G01 - MEASURING TESTING
Information Patent Grant
Gas species monitor system
- Patent number 4,953,976
- Issue date Sep 4, 1990
- Spectral Sciences, Inc.
- Steven Adler-Golden
- G01 - MEASURING TESTING
Information Patent Grant
Collecting hemispherical attachment for spectrophotometry
- Patent number 4,853,542
- Issue date Aug 1, 1989
- Harrick; Nicolas J.
- Milan Milosevic
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for in situ determination of quantity of turbid matter...
- Patent number 4,839,529
- Issue date Jun 13, 1989
- Impulsphysik GmbH
- Frank Fruengel
- G01 - MEASURING TESTING
Information Patent Grant
Light scattering particle detector for wafer processing equipment
- Patent number 4,739,177
- Issue date Apr 19, 1988
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced fluorescent emission
- Patent number 4,345,837
- Issue date Aug 24, 1982
- Farrand Optical Co., Inc.
- Eli A. Kallet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR WATER EXAMINATION
- Publication number 20220326132
- Publication date Oct 13, 2022
- The Wave Talk, Inc.
- Young Dug KIM
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS APPARATUS, AUTOMATIC ANALYSIS METHOD, AND STORAG...
- Publication number 20200049606
- Publication date Feb 13, 2020
- Canon Kabushiki Kaisha
- Takahiro Masumura
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS, OPTICAL TOMOGRAPHIC MEASUREMENT APPARA...
- Publication number 20180073978
- Publication date Mar 15, 2018
- SONY CORPORATION
- MASAAKI HARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR FLUID ANALYSIS USING ELECTROMAGNETIC ENERGY
- Publication number 20140333920
- Publication date Nov 13, 2014
- VISUALANT, INC.
- Richard Ian Mander
- G01 - MEASURING TESTING
Information Patent Application
TIME-REVERSAL OF VARIANCE-ENCODED LIGHT (TROVE)
- Publication number 20140118739
- Publication date May 1, 2014
- Benjamin Judkewitz
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, system and method for using an LED to identify a presenc...
- Publication number 20130077097
- Publication date Mar 28, 2013
- Phaedrus, LLC
- Bradley W. Engstrand
- G01 - MEASURING TESTING
Information Patent Application
OFFSET PROBE
- Publication number 20110149278
- Publication date Jun 23, 2011
- Tony Maddison
- G01 - MEASURING TESTING
Information Patent Application
EXHAUST GAS ANALYZER AND EXHAUST GAS ANALYZING METHOD
- Publication number 20090229250
- Publication date Sep 17, 2009
- Masahiro Yamakage
- G01 - MEASURING TESTING

Multiple excitation of scattering medium

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automatic analysis apparatus, automatic analysis method, and storag...

Signal processing apparatus for eliminating object reflection noise...

Systems for fluid analysis using electromagnetic energy that is ref...

Time-reversal of variance-encoded light (TROVE)

Apparatus, system and method for using an LED to identify a presenc...

Exhaust gas analyzer and exhaust gas analyzing method

Enhancing emission of excited radiation in an analytical sample sub...

Optoelectrical particle detection apparatus

Particle contamination detection in fluids through the external sec...

Measuring instrument for determining the scattering and absorption...

Method and apparatus for performing high sensitivity fluorescence m...

Gas species monitor system

Collecting hemispherical attachment for spectrophotometry

Arrangement for in situ determination of quantity of turbid matter...

Light scattering particle detector for wafer processing equipment

Enhanced fluorescent emission

Patents Applicationslast 30 patents

DEVICE FOR WATER EXAMINATION

AUTOMATIC ANALYSIS APPARATUS, AUTOMATIC ANALYSIS METHOD, AND STORAG...

SIGNAL PROCESSING APPARATUS, OPTICAL TOMOGRAPHIC MEASUREMENT APPARA...

SYSTEMS AND METHODS FOR FLUID ANALYSIS USING ELECTROMAGNETIC ENERGY

TIME-REVERSAL OF VARIANCE-ENCODED LIGHT (TROVE)

Apparatus, system and method for using an LED to identify a presenc...

OFFSET PROBE

EXHAUST GAS ANALYZER AND EXHAUST GAS ANALYZING METHOD