Membership
Tour
Register
Log in
Multiple wavelengths of illumination or detection
Follow
Industry
CPC
G01N2021/8845
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/8845
Multiple wavelengths of illumination or detection
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Learning device, inspection device, learning method, and inspection...
Patent number
11,977,033
Issue date
May 7, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yuya Sugasawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and arrangement for determining a position of an object
Patent number
11,948,293
Issue date
Apr 2, 2024
Carl Zeiss Industrielle Messtechnik GmbH
Wolfgang Hoegele
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for identifying raw meat and high-quality fake meat based on...
Patent number
11,940,435
Issue date
Mar 26, 2024
JIANGSU UNIVERSITY
Jiyong Shi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical detection device, optical detection method, method for desi...
Patent number
11,933,735
Issue date
Mar 19, 2024
Osaka University
Tsuyoshi Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Evaluating surfaces
Patent number
11,926,160
Issue date
Mar 12, 2024
Hewlett-Packard Development Company, L.P.
Ana Cristina Garcia Alvarez
G01 - MEASURING TESTING
Information
Patent Grant
Composite structures with damage detection capability
Patent number
11,890,852
Issue date
Feb 6, 2024
Hamilton Sundstrand Corporation
Mark R. Gurvich
G01 - MEASURING TESTING
Information
Patent Grant
Time domain multiplexed defect scanner
Patent number
11,852,592
Issue date
Dec 26, 2023
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting containers using multiple radiatio...
Patent number
11,828,712
Issue date
Nov 28, 2023
Industrial Dynamic Company, Ltd
Christian Beck
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for characterizing a specimen container and s...
Patent number
11,815,446
Issue date
Nov 14, 2023
Siemens Healthcare Diagnostics Inc.
Patrick Wissmann
G01 - MEASURING TESTING
Information
Patent Grant
Device for recognizing defects remaining in finished surface of pro...
Patent number
11,798,155
Issue date
Oct 24, 2023
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical imaging apparatus, optical inspection apparatus, and optica...
Patent number
11,774,369
Issue date
Oct 3, 2023
Kabushiki Kaisha Toshiba
Hiroshi Ohno
G01 - MEASURING TESTING
Information
Patent Grant
Time domain multiplexed defect scanner
Patent number
11,733,173
Issue date
Aug 22, 2023
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system, inspection method, program, and storage medium
Patent number
11,727,554
Issue date
Aug 15, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takanobu Ojima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for producing a prophylactic article
Patent number
11,697,717
Issue date
Jul 11, 2023
Semperit Aktiengesellschaft Holding
Armin Holzner
A41 - WEARING APPAREL
Information
Patent Grant
Measurement cycle determination device, measurement cycle determina...
Patent number
11,635,390
Issue date
Apr 25, 2023
3M Innovative Properties Company
Tasuku Nakayama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting surface of wafer, device for inspecting surfa...
Patent number
11,561,186
Issue date
Jan 24, 2023
Sumitomo Electric Device Innovations, Inc.
Hiroyuki Oguri
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
Patent number
11,538,723
Issue date
Dec 27, 2022
Tokyo Electron Limited
Yan Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect identification using machine learning in an additive manufac...
Patent number
11,536,671
Issue date
Dec 27, 2022
SIGMA LABS, INC.
Darren Beckett
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
Patent number
11,538,722
Issue date
Dec 27, 2022
Tokyo Electron Limited
Yan Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for providing sorted stopper elements
Patent number
11,498,820
Issue date
Nov 15, 2022
SIDEL ENGINEERING & CONVEYING SOLUTIONS
Emmanuel Roth
B67 - OPENING, CLOSING OR CLEANING BOTTLES, JARS OR SIMILAR CONTAINERS LIQUID...
Information
Patent Grant
System for detecting crack growth of asphalt pavement based on bino...
Patent number
11,486,548
Issue date
Nov 1, 2022
Yuchuan Du
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Grant
Tubular body inner surface inspection apparatus and tubular body in...
Patent number
11,428,647
Issue date
Aug 30, 2022
Nippon Steel Corporation
Toshio Akagi
G01 - MEASURING TESTING
Information
Patent Grant
Portable organic molecular sensing device and related systems and m...
Patent number
11,408,826
Issue date
Aug 9, 2022
Aterica Inc.
Heinz Wolter
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Optical system, and imaging apparatus and imaging system including...
Patent number
11,385,102
Issue date
Jul 12, 2022
Canon Kabushiki Kaisha
Genichiro Kudo
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system, inspection method, program, and storage medium
Patent number
11,379,968
Issue date
Jul 5, 2022
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takanobu Ojima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detecting device and defect detecting method
Patent number
11,293,877
Issue date
Apr 5, 2022
Seiko Epson Corporation
Ryohei Kuri
G01 - MEASURING TESTING
Information
Patent Grant
SiC substrate evaluation method and method for manufacturing SiC ep...
Patent number
11,249,027
Issue date
Feb 15, 2022
Showa Denko K.K.
Yoshitaka Nishihara
G01 - MEASURING TESTING
Information
Patent Grant
Method for leakage detection of underground pipeline corridor based...
Patent number
11,221,107
Issue date
Jan 11, 2022
Yuchuan Du
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Inspection apparatus, inspection system, and inspection method
Patent number
11,209,313
Issue date
Dec 28, 2021
Seiko Epson Corporation
Satoshi Oguchi
G01 - MEASURING TESTING
Information
Patent Grant
Defect investigation device simultaneously detecting photoluminesce...
Patent number
11,009,461
Issue date
May 18, 2021
ETAMAX CO., LTD
Huyndon Jung
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
Publication number
20240133819
Publication date
Apr 25, 2024
SIEMENS AKTIENGESELLSCHAFT
Sascha Schulte
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20240125709
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Donggun Lee
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102939
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G01 - MEASURING TESTING
Information
Patent Application
Method for Monitoring the Compliance of a Container and Apparatus T...
Publication number
20240068953
Publication date
Feb 29, 2024
SOFFIERIA BERTOLINI S.P.A.
Luca Merandino
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...
Publication number
20240068956
Publication date
Feb 29, 2024
Unity Semiconductor
Mayeul Durand de Gevigney
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
Publication number
20240035983
Publication date
Feb 1, 2024
WITRINS S.R.O.
Pavel Linhart
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...
Publication number
20240027359
Publication date
Jan 25, 2024
Resonac Corporation
Katsuhisa YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AND MANUFACTU...
Publication number
20230349836
Publication date
Nov 2, 2023
JFE STEEL CORPORATION
Keisuke YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
TIME DOMAIN MULTIPLEXED DEFECT SCANNER
Publication number
20230341332
Publication date
Oct 26, 2023
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
Publication number
20230314335
Publication date
Oct 5, 2023
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
Publication number
20230304933
Publication date
Sep 28, 2023
FUJIFILM CORPORATION
Yoshinobu Miura
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR TRANSMISSION INSPECTION OF CONTAINERS HAVING...
Publication number
20230288343
Publication date
Sep 14, 2023
TIAMA
Laurent COSNEAU
G01 - MEASURING TESTING
Information
Patent Application
DEFECT IDENTIFICATION USING MACHINE LEARNING IN AN ADDITIVE MANUFAC...
Publication number
20230258575
Publication date
Aug 17, 2023
Sigma Labs, Inc.
Darren Beckett
B22 - CASTING POWDER METALLURGY
Information
Patent Application
PHYSICAL BODY INSPECTION SYSTEM AND DISPLAY CONTROL METHOD
Publication number
20230262341
Publication date
Aug 17, 2023
TOYOTA PRODUCTION ENGINEERING
Haruki KABASHIMA
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Targeted Monitoring Of Semiconductor Measur...
Publication number
20230228692
Publication date
Jul 20, 2023
KLA Corporation
Antonio Arion Gellineau
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...
Publication number
20230221262
Publication date
Jul 13, 2023
TOKYO ELECTRON LIMITED
Takahiro Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
Publication number
20230077793
Publication date
Mar 16, 2023
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR INSPECTING SUBSTRATE AND METHOD FOR FABRICATING SEMIC...
Publication number
20230028347
Publication date
Jan 26, 2023
Samsung Electronics Co., Ltd.
Jang Ryul PARK
G01 - MEASURING TESTING
Information
Patent Application
MANUAL INSPECTION WORKSTATION
Publication number
20230018237
Publication date
Jan 19, 2023
G. Scott Smith
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR RECOGNIZING DEFECTS REMAINING IN FINISHED SURFACE OF PRO...
Publication number
20220375061
Publication date
Nov 24, 2022
FU TAI HUA INDUSTRY (SHENZHEN) CO., LTD.
LIU-BIN HU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL SORTER
Publication number
20220373472
Publication date
Nov 24, 2022
SATAKE CORPORATION
Tomoyuki MIYAMOTO
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
TEST DEVICE AND METHOD FOR TESTING THE RETROREFLECTION AND/OR FLUOR...
Publication number
20220349822
Publication date
Nov 3, 2022
DIEMIETWAESCHE.DE GMBH + CO. KG
Michael WEUTHEN
G01 - MEASURING TESTING
Information
Patent Application
ILLUMINATION SYSTEM, AN IMAGING SYSTEM, AND A METHOD FOR ILLUMINATI...
Publication number
20220341853
Publication date
Oct 27, 2022
IMEC vzw
Ziduo LIN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR OPTICALLY INSPECTING CONTAINERS
Publication number
20220317054
Publication date
Oct 6, 2022
KRONES AG
Anton Niedermeier
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR OPTICALLY INSPECTING CONTAINERS
Publication number
20220307987
Publication date
Sep 29, 2022
KRONES AG
Anton Niedermeier
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING GLASS-CERAMIC MATERIAL
Publication number
20220187217
Publication date
Jun 16, 2022
SAINT-GOBAIN ISOVER
Hugues CHENNEVIERE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE IDENTIFICATION OF DEFECTS IN TRANSPARENT SLABS AND R...
Publication number
20220163458
Publication date
May 26, 2022
DELTAMAX AUTOMAZIONE S.R.L.
Chiara CORRIDORI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DETECTION DEVICE, OPTICAL DETECTION METHOD, METHOD FOR DESI...
Publication number
20220155237
Publication date
May 19, 2022
OSAKA UNIVERSITY
Tsuyoshi KONISHI
G01 - MEASURING TESTING
Information
Patent Application
Electronic Device Valuation System
Publication number
20220136977
Publication date
May 5, 2022
Mintit Co., Ltd.
Sung Lack CHO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EVALUATING SURFACES
Publication number
20220080734
Publication date
Mar 17, 2022
Hewlett-Packard Development Company, L.P.
Ana Cristina Garcia Alvarez
G01 - MEASURING TESTING