Multiple wavelengths of illumination or detection

Industry

CPC
G01N2021/8845

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8845Multiple wavelengths of illumination or detection

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 12,188,876
- Issue date Jan 7, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting substrate and method for fabricating semic...
- Patent number 12,105,027
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Jang Ryul Park
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus comprising a first imager imaging fluorescence...
- Patent number 12,072,289
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Method for the identification of defects in transparent slabs and r...
- Patent number 12,038,387
- Issue date Jul 16, 2024
- DELTAMAX AUTOMAZIONE S.R.L.
- Chiara Corridori
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system, an imaging system, and a method for illuminati...
- Patent number 12,025,567
- Issue date Jul 2, 2024
- Imec VZW
- Ziduo Lin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
- Patent number 12,019,030
- Issue date Jun 25, 2024
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Product inspection method and product inspection apparatus
- Patent number 12,013,347
- Issue date Jun 18, 2024
- Ushio Denki Kabushiki Kaisha
- Go Yamada
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting glass-ceramic material
- Patent number 12,007,337
- Issue date Jun 11, 2024
- Saint-Gobain Isover
- Hugues Chenneviere
- G01 - MEASURING TESTING
Information Patent Grant
Learning device, inspection device, learning method, and inspection...
- Patent number 11,977,033
- Issue date May 7, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuya Sugasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for determining a position of an object
- Patent number 11,948,293
- Issue date Apr 2, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Wolfgang Hoegele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying raw meat and high-quality fake meat based on...
- Patent number 11,940,435
- Issue date Mar 26, 2024
- JIANGSU UNIVERSITY
- Jiyong Shi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical detection device, optical detection method, method for desi...
- Patent number 11,933,735
- Issue date Mar 19, 2024
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating surfaces
- Patent number 11,926,160
- Issue date Mar 12, 2024
- Hewlett-Packard Development Company, L.P.
- Ana Cristina Garcia Alvarez
- G01 - MEASURING TESTING
Information Patent Grant
Composite structures with damage detection capability
- Patent number 11,890,852
- Issue date Feb 6, 2024
- Hamilton Sundstrand Corporation
- Mark R. Gurvich
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,852,592
- Issue date Dec 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting containers using multiple radiatio...
- Patent number 11,828,712
- Issue date Nov 28, 2023
- Industrial Dynamic Company, Ltd
- Christian Beck
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing a specimen container and s...
- Patent number 11,815,446
- Issue date Nov 14, 2023
- Siemens Healthcare Diagnostics Inc.
- Patrick Wissmann
- G01 - MEASURING TESTING
Information Patent Grant
Device for recognizing defects remaining in finished surface of pro...
- Patent number 11,798,155
- Issue date Oct 24, 2023
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Liu-Bin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical imaging apparatus, optical inspection apparatus, and optica...
- Patent number 11,774,369
- Issue date Oct 3, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,733,173
- Issue date Aug 22, 2023
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection method, program, and storage medium
- Patent number 11,727,554
- Issue date Aug 15, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Takanobu Ojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a prophylactic article
- Patent number 11,697,717
- Issue date Jul 11, 2023
- Semperit Aktiengesellschaft Holding
- Armin Holzner
- A41 - WEARING APPAREL
Information Patent Grant
Measurement cycle determination device, measurement cycle determina...
- Patent number 11,635,390
- Issue date Apr 25, 2023
- 3M Innovative Properties Company
- Tasuku Nakayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting surface of wafer, device for inspecting surfa...
- Patent number 11,561,186
- Issue date Jan 24, 2023
- Sumitomo Electric Device Innovations, Inc.
- Hiroyuki Oguri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 11,538,723
- Issue date Dec 27, 2022
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect identification using machine learning in an additive manufac...
- Patent number 11,536,671
- Issue date Dec 27, 2022
- SIGMA LABS, INC.
- Darren Beckett
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 11,538,722
- Issue date Dec 27, 2022
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for providing sorted stopper elements
- Patent number 11,498,820
- Issue date Nov 15, 2022
- SIDEL ENGINEERING & CONVEYING SOLUTIONS
- Emmanuel Roth
- B67 - OPENING, CLOSING OR CLEANING BOTTLES, JARS OR SIMILAR CONTAINERS LIQUID...

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240361244
- Publication date Oct 31, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTIVE BEVERAGE CANS
- Publication number 20240344999
- Publication date Oct 17, 2024
- CANPACK S.A.
- René Eve
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
- Publication number 20240319104
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20240302267
- Publication date Sep 12, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Taku OTANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS
- Publication number 20240280504
- Publication date Aug 22, 2024
- Heuft Systemtechnik GmbH
- Bernhard HEUFT
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS...
- Publication number 20240264088
- Publication date Aug 8, 2024
- SHWETA GUPTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240230546
- Publication date Jul 11, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE...
- Publication number 20240210359
- Publication date Jun 27, 2024
- QUALCOMM Incorporated
- Sumit AGRAWAL
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
- Publication number 20240183655
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Alexander VON FINCK
- G01 - MEASURING TESTING
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240133819
- Publication date Apr 25, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240125709
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Donggun Lee
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
- Publication number 20240102939
- Publication date Mar 28, 2024
- Apple Inc.
- Mikael B. MANNBERG
- G01 - MEASURING TESTING
Information Patent Application
Method for Monitoring the Compliance of a Container and Apparatus T...
- Publication number 20240068953
- Publication date Feb 29, 2024
- SOFFIERIA BERTOLINI S.P.A.
- Luca Merandino
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...
- Publication number 20240068956
- Publication date Feb 29, 2024
- Unity Semiconductor
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
- Publication number 20240035983
- Publication date Feb 1, 2024
- WITRINS S.R.O.
- Pavel Linhart
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...
- Publication number 20240027359
- Publication date Jan 25, 2024
- Resonac Corporation
- Katsuhisa YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AND MANUFACTU...
- Publication number 20230349836
- Publication date Nov 2, 2023
- JFE STEEL CORPORATION
- Keisuke YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN MULTIPLEXED DEFECT SCANNER
- Publication number 20230341332
- Publication date Oct 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230314335
- Publication date Oct 5, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20230304933
- Publication date Sep 28, 2023
- FUJIFILM CORPORATION
- Yoshinobu Miura
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TRANSMISSION INSPECTION OF CONTAINERS HAVING...
- Publication number 20230288343
- Publication date Sep 14, 2023
- TIAMA
- Laurent COSNEAU
- G01 - MEASURING TESTING
Information Patent Application
DEFECT IDENTIFICATION USING MACHINE LEARNING IN AN ADDITIVE MANUFAC...
- Publication number 20230258575
- Publication date Aug 17, 2023
- Sigma Labs, Inc.
- Darren Beckett
- B22 - CASTING POWDER METALLURGY
Information Patent Application
PHYSICAL BODY INSPECTION SYSTEM AND DISPLAY CONTROL METHOD
- Publication number 20230262341
- Publication date Aug 17, 2023
- TOYOTA PRODUCTION ENGINEERING
- Haruki KABASHIMA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Targeted Monitoring Of Semiconductor Measur...
- Publication number 20230228692
- Publication date Jul 20, 2023
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...
- Publication number 20230221262
- Publication date Jul 13, 2023
- TOKYO ELECTRON LIMITED
- Takahiro Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230077793
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SUBSTRATE AND METHOD FOR FABRICATING SEMIC...
- Publication number 20230028347
- Publication date Jan 26, 2023
- Samsung Electronics Co., Ltd.
- Jang Ryul PARK
- G01 - MEASURING TESTING

Multiple wavelengths of illumination or detection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical inspection method, non-transitory storage medium storing op...

Optical diagnostics of semiconductor process using hyperspectral im...

System for optical inspection of a substrate using same or differen...

Apparatus for inspecting substrate and method for fabricating semic...

Inspection apparatus comprising a first imager imaging fluorescence...

Method for the identification of defects in transparent slabs and r...

Illumination system, an imaging system, and a method for illuminati...

Methods and systems for targeted monitoring of semiconductor measur...

Product inspection method and product inspection apparatus

System and method for detecting glass-ceramic material

Learning device, inspection device, learning method, and inspection...

Method and arrangement for determining a position of an object

Method for identifying raw meat and high-quality fake meat based on...

Optical detection device, optical detection method, method for desi...

Evaluating surfaces

Composite structures with damage detection capability

Time domain multiplexed defect scanner

System and method for inspecting containers using multiple radiatio...

Methods and apparatus for characterizing a specimen container and s...

Device for recognizing defects remaining in finished surface of pro...

Optical imaging apparatus, optical inspection apparatus, and optica...

Time domain multiplexed defect scanner

Inspection system, inspection method, program, and storage medium

Method for producing a prophylactic article

Measurement cycle determination device, measurement cycle determina...

Method for inspecting surface of wafer, device for inspecting surfa...

Optical diagnostics of semiconductor process using hyperspectral im...

Defect identification using machine learning in an additive manufac...

Optical diagnostics of semiconductor process using hyperspectral im...

Device and method for providing sorted stopper elements

Patents Applicationslast 30 patents

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION METHOD FOR ELECTRONIC DEVICES

INSPECTION APPARATUS AND INSPECTION METHOD

SYSTEMS AND METHODS FOR DETECTING DEFECTIVE BEVERAGE CANS

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...

OPTICAL DEVICE

METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS

HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE...

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

SEMICONDUCTOR MEASUREMENT APPARATUS

LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS

Method for Monitoring the Compliance of a Container and Apparatus T...

SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...

INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS

INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AND MANUFACTU...

TIME DOMAIN MULTIPLEXED DEFECT SCANNER

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

ANALYSIS DEVICE AND ANALYSIS METHOD

DEVICE AND METHOD FOR TRANSMISSION INSPECTION OF CONTAINERS HAVING...

DEFECT IDENTIFICATION USING MACHINE LEARNING IN AN ADDITIVE MANUFAC...

PHYSICAL BODY INSPECTION SYSTEM AND DISPLAY CONTROL METHOD

Methods And Systems For Targeted Monitoring Of Semiconductor Measur...

SUBSTRATE INSPECTION APPARATUS, SUBSTRATE INSPECTION METHOD, AND RE...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

APPARATUS FOR INSPECTING SUBSTRATE AND METHOD FOR FABRICATING SEMIC...