Mutilayers

Industry

CPC
G01N2021/8438

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8438Mutilayers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Web edge metrology
- Patent number 12,080,869
- Issue date Sep 3, 2024
- Applied Materials, Inc.
- David Masayuki Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive method for measuring thickness of three-layered rei...
- Patent number 11,913,773
- Issue date Feb 27, 2024
- LG Chem, Ltd.
- Sung-Hyun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for metrology with layer-specific illumination...
- Patent number 11,852,590
- Issue date Dec 26, 2023
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Part quality monitoring in a stereolithographic additive manufactur...
- Patent number 11,794,411
- Issue date Oct 24, 2023
- Stratasys, Inc.
- J. Samuel Batchelder
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Measuring deflection to determine a characteristic of a cantilever
- Patent number 11,754,505
- Issue date Sep 12, 2023
- UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY
- Rebekah C Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects in thin film layers
- Patent number 11,740,185
- Issue date Aug 29, 2023
- MEMSSTAR LIMITED
- Anthony O'Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to determine properties of a coating on a transparent film,...
- Patent number 11,703,319
- Issue date Jul 18, 2023
- TDK ELECTRONICS AG
- Ramón García Rojo
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of bonding quality of transparent materials using optica...
- Patent number 11,499,814
- Issue date Nov 15, 2022
- Carl Zeiss AG
- Michael Totzeck
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measuring deflection to determine a characteristic of a cantilever
- Patent number 11,209,369
- Issue date Dec 28, 2021
- UNITED STATES of AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- Rebekah C Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 11,119,050
- Issue date Sep 14, 2021
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing process for integrated computational elements
- Patent number 11,090,685
- Issue date Aug 17, 2021
- Halliburton Energy Services, Inc.
- David L. Perkins
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method of forming enhanced super-resolution image
- Patent number 10,994,993
- Issue date May 4, 2021
- National Central University
- Fan-Ching Chien
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-material scanning for additive fabrication
- Patent number 10,926,473
- Issue date Feb 23, 2021
- Inkbit, LLC
- Wojciech Matusik
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging for semiconductor wafer inspection
- Patent number 10,887,580
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measurement of multilayer structures
- Patent number 10,761,021
- Issue date Sep 1, 2020
- Lumetrics, Inc
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
3D printer with hovering printing head or printing bed
- Patent number 10,714,249
- Issue date Jul 14, 2020
- Airbus Operations GmbH
- Matthias Hegenbart
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection device, and inspecting method
- Patent number 10,697,897
- Issue date Jun 30, 2020
- Mitsubishi Heavy Industries, Ltd.
- Hirofumi Ienaga
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measurement of thick films and high aspect...
- Patent number 10,690,602
- Issue date Jun 23, 2020
- KLA-Tencor Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical element, article, and method of producing optical element
- Patent number 10,649,120
- Issue date May 12, 2020
- Toppan Printing Co., Ltd.
- Naoki Minamikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Growth-rate measuring apparatus and growth-rate detection method
- Patent number 10,488,334
- Issue date Nov 26, 2019
- NUFLARE TECHNOLOGY, INC.
- Yasushi Iyechika
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Arrangement for spatially resolved determination of the specific el...
- Patent number 10,466,274
- Issue date Nov 5, 2019
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Philipp Wollmann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology with layer-specific illumination...
- Patent number 10,444,161
- Issue date Oct 15, 2019
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detection system for a multilayer film and method thereof using dua...
- Patent number 10,429,318
- Issue date Oct 1, 2019
- Industrial Technology Research Institute
- Ding-Kun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for probing a material as a function of depth...
- Patent number 10,371,668
- Issue date Aug 6, 2019
- Vanderbilt University
- Joy Garnett
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for quality control of a periodic structure
- Patent number 10,241,058
- Issue date Mar 26, 2019
- Massachusetts Institute of Technology
- Alexei Maznev
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Arrangement for determining properties and/or parameters of a sampl...
- Patent number 10,228,329
- Issue date Mar 12, 2019
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG ANGEWANDETEN FORSCHUNG B.V.
- Wulf Graehlert
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting bonding failure part and inspection system
- Patent number 10,199,280
- Issue date Feb 5, 2019
- Shin-Etsu Handotai Co., Ltd.
- Kei Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multilayer ceramic electronic component
- Patent number 10,060,852
- Issue date Aug 28, 2018
- Murata Manufacturing Co., Ltd.
- Kohei Shimada
- G01 - MEASURING TESTING
Information Patent Grant
Sensor system and method for characterizing a stack of wet paint la...
- Patent number 10,041,785
- Issue date Aug 7, 2018
- ABB Schweiz AG
- Jacobus Lodevicus Martinus Van Mechelen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WEB EDGE METROLOGY
- Publication number 20240387792
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM
- Publication number 20240151642
- Publication date May 9, 2024
- Industrial Technology Research Institute
- Yu-Tai LI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING ADHESION RELIABILITY AND HEAT RADIATION PERFO...
- Publication number 20230366829
- Publication date Nov 16, 2023
- Denka Company Limited
- Yusuke WAKUDA
- G01 - MEASURING TESTING
Information Patent Application
WEB EDGE METROLOGY
- Publication number 20220190306
- Publication date Jun 16, 2022
- Applied Materials, Inc.
- David Masayuki ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEFLECTION TO DETERMINE A CHARACTERISTIC OF A CANTILEVER
- Publication number 20220018786
- Publication date Jan 20, 2022
- United States of America as Represented by The Secretary of The Army
- Rebekah C Wilson
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR DETECTING DEFECTS IN THIN FILM LAYERS
- Publication number 20210341393
- Publication date Nov 4, 2021
- MEMSSTAR LIMITED
- Anthony O'HARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEFLECTION TO DETERMINE A CHARACTERISTIC OF A CANTILEVER
- Publication number 20210096084
- Publication date Apr 1, 2021
- United States of America as Represented by The Secretary of The Army
- Rebekah C Wilson
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING ENHANCED SUPER-RESOLUTION IMAGE
- Publication number 20210053824
- Publication date Feb 25, 2021
- National Central University
- Fan-Ching CHIEN
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method to Determine Properties of a Coating on a Transparent Film,...
- Publication number 20200326177
- Publication date Oct 15, 2020
- TDK Electronics AG
- Ramon Garcia Rojo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
- Publication number 20200284733
- Publication date Sep 10, 2020
- KLA Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR TIME-RESOLVED CAPTURE OF PULSED ELECTROMAG...
- Publication number 20190265349
- Publication date Aug 29, 2019
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Georg VON FREYMANN
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR A MULTILAYER FILM AND METHOD THEREOF
- Publication number 20190187067
- Publication date Jun 20, 2019
- Industrial Technology Research Institute
- Ding-Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MANUFACTORING PROCESS FOR INTEGRATED COMPUTATIONAL ELEMENTS
- Publication number 20190076878
- Publication date Mar 14, 2019
- Halliburton Energy Services, Inc.
- David L. Perkins
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Methods And Systems For Measurement Of Thick Films And High Aspect...
- Publication number 20180238814
- Publication date Aug 23, 2018
- KLA-Tencor Corporation
- Noam Sapiens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZATION OF MULTILAYER STRUCTURES
- Publication number 20180156728
- Publication date Jun 7, 2018
- Vrije Universiteit Brussel
- Ali POURKAZEMI
- G01 - MEASURING TESTING
Information Patent Application
Sensor System And Method For Characterizing A Stack Of Wet Paint La...
- Publication number 20180038681
- Publication date Feb 8, 2018
- ABB Schweiz AG
- Jacobus Lodevicus Martinus VAN MECHELEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT, ARTICLE, AND METHOD OF PRODUCING OPTICAL ELEMENT
- Publication number 20170315277
- Publication date Nov 2, 2017
- Toppan Printing Co., Ltd.
- Naoki MINAMIKAWA
- G02 - OPTICS
Information Patent Application
ARRANGEMENT FOR DETERMINING PROPERTIES AND/OR PARAMETERS OF A SAMPL...
- Publication number 20170212056
- Publication date Jul 27, 2017
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG ANGEWANDTEN FORSCHUNG E.V.
- Wulf GRAEHLERT
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods to Reduce Delamination In Integrated Computatio...
- Publication number 20160299084
- Publication date Oct 13, 2016
- Halliburton Energy Services, Inc.
- James M. Price
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TEMPERATURE-DEPENDENT FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS
- Publication number 20160230270
- Publication date Aug 11, 2016
- Halliburton Energy Services, Inc.
- David L. PERKINS
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MULTILAYER CERAMIC ELECTRONIC COMPONENT
- Publication number 20160003737
- Publication date Jan 7, 2016
- Murata Manufacturing Co., Ltd.
- Kohei SHIMADA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTION OF COMPOSITE IRREGULARITIES
- Publication number 20140333758
- Publication date Nov 13, 2014
- THE BOEING COMPANY
- Yuan-Jye Wu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DAMAGE TO AN ORGANIC LAYER OF A...
- Publication number 20140320853
- Publication date Oct 30, 2014
- Ki-Young Yeon
- G01 - MEASURING TESTING
Information Patent Application
FILM MEASUREMENT APPARATUS AND METHOD OF MEASURING FILM
- Publication number 20140240707
- Publication date Aug 28, 2014
- KABUSHIKI KAISHA TOSHIBA
- Toru KOIKE
- G01 - MEASURING TESTING
Information Patent Application
RESIN ARTICLE
- Publication number 20140087157
- Publication date Mar 27, 2014
- LG CHEM, LTD.
- Houng Sik YOO
- B32 - LAYERED PRODUCTS
Information Patent Application
PHOTON DOPPLER VELOCIMETRY FOR LASER BOND INSPECTION
- Publication number 20140049773
- Publication date Feb 20, 2014
- David F. Lahrman
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING VOLATILE ORGANIC COMPOUNDS
- Publication number 20140021967
- Publication date Jan 23, 2014
- Myungchan Kang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MORPHOLOGICAL ANALYSIS
- Publication number 20130253884
- Publication date Sep 26, 2013
- G & D INNOVATIVE ANALYSIS, LTD.
- Gustavo Aizenberg
- G01 - MEASURING TESTING
Information Patent Application
Method For Evaluating Birefringence Of Adhesive, Method For Designi...
- Publication number 20130215362
- Publication date Aug 22, 2013
- Yasuhiro Koike
- B32 - LAYERED PRODUCTS
Information Patent Application
RESIN ARTICLE
- Publication number 20130164512
- Publication date Jun 27, 2013
- LG CHEM, LTD.
- Houng Sik YOO
- B32 - LAYERED PRODUCTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for determining characteristics of semiconducto...

Web edge metrology

Non-destructive method for measuring thickness of three-layered rei...

Systems and methods for metrology with layer-specific illumination...

Part quality monitoring in a stereolithographic additive manufactur...

Measuring deflection to determine a characteristic of a cantilever

Method for detecting defects in thin film layers

Method to determine properties of a coating on a transparent film,...

Inspection of bonding quality of transparent materials using optica...

Measuring deflection to determine a characteristic of a cantilever

Methods and systems for measurement of thick films and high aspect...

Manufacturing process for integrated computational elements

Method of forming enhanced super-resolution image

Multi-material scanning for additive fabrication

Three-dimensional imaging for semiconductor wafer inspection

Apparatus and method for measurement of multilayer structures

3D printer with hovering printing head or printing bed

Inspection system, inspection device, and inspecting method

Methods and systems for measurement of thick films and high aspect...

Optical element, article, and method of producing optical element

Growth-rate measuring apparatus and growth-rate detection method

Arrangement for spatially resolved determination of the specific el...

Systems and methods for metrology with layer-specific illumination...

Detection system for a multilayer film and method thereof using dua...

Apparatus and methods for probing a material as a function of depth...

Systems and methods for quality control of a periodic structure

Arrangement for determining properties and/or parameters of a sampl...

Method for detecting bonding failure part and inspection system

Multilayer ceramic electronic component

Sensor system and method for characterizing a stack of wet paint la...

Patents Applicationslast 30 patents

WEB EDGE METROLOGY

TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM

METHOD FOR EVALUATING ADHESION RELIABILITY AND HEAT RADIATION PERFO...

WEB EDGE METROLOGY

MEASURING DEFLECTION TO DETERMINE A CHARACTERISTIC OF A CANTILEVER

A METHOD FOR DETECTING DEFECTS IN THIN FILM LAYERS

MEASURING DEFLECTION TO DETERMINE A CHARACTERISTIC OF A CANTILEVER

METHOD OF FORMING ENHANCED SUPER-RESOLUTION IMAGE

Method to Determine Properties of a Coating on a Transparent Film,...

Methods And Systems For Measurement Of Thick Films And High Aspect...

APPARATUS AND METHOD FOR TIME-RESOLVED CAPTURE OF PULSED ELECTROMAG...

DETECTION SYSTEM FOR A MULTILAYER FILM AND METHOD THEREOF

MANUFACTORING PROCESS FOR INTEGRATED COMPUTATIONAL ELEMENTS

Methods And Systems For Measurement Of Thick Films And High Aspect...

CHARACTERIZATION OF MULTILAYER STRUCTURES

Sensor System And Method For Characterizing A Stack Of Wet Paint La...

OPTICAL ELEMENT, ARTICLE, AND METHOD OF PRODUCING OPTICAL ELEMENT

ARRANGEMENT FOR DETERMINING PROPERTIES AND/OR PARAMETERS OF A SAMPL...

Systems and Methods to Reduce Delamination In Integrated Computatio...

TEMPERATURE-DEPENDENT FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS

MULTILAYER CERAMIC ELECTRONIC COMPONENT

METHODS AND SYSTEMS FOR INSPECTION OF COMPOSITE IRREGULARITIES

METHOD AND APPARATUS FOR MEASURING DAMAGE TO AN ORGANIC LAYER OF A...

FILM MEASUREMENT APPARATUS AND METHOD OF MEASURING FILM

RESIN ARTICLE

PHOTON DOPPLER VELOCIMETRY FOR LASER BOND INSPECTION

METHOD OF DETECTING VOLATILE ORGANIC COMPOUNDS

METHOD AND APPARATUS FOR MORPHOLOGICAL ANALYSIS

Method For Evaluating Birefringence Of Adhesive, Method For Designi...

RESIN ARTICLE