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G01M5/0008
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PHYSICS
G01
Measuring instruments
G01M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
G01M5/00
Investigating the elasticity of structures
Current Industry
G01M5/0008
of bridges
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Patents Grants
last 30 patents
Information
Patent Grant
Determining abnormalities in the superstructure of a bridge based o...
Patent number
11,982,595
Issue date
May 14, 2024
Seiko Epson Corporation
Yoshihiro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Abnormality determination for bridge superstructure based on accele...
Patent number
11,921,012
Issue date
Mar 5, 2024
Seiko Epson Corporation
Yoshihiro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Stress distribution measurement method and stress distribution meas...
Patent number
11,906,370
Issue date
Feb 20, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yousuke Irie
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Time point acquisition method, time point acquisition device, time...
Patent number
11,892,377
Issue date
Feb 6, 2024
Seiko Epson Corporation
Yoshihiro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Non-contact non-destructive inspection system, signal processing de...
Patent number
11,879,815
Issue date
Jan 23, 2024
Kabushiki Kaisha Toshiba
Takashi Usui
G01 - MEASURING TESTING
Information
Patent Grant
Structure displacement amount measurement apparatus
Patent number
11,867,592
Issue date
Jan 9, 2024
NEC Corporation
Jun Takada
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measurement apparatus for structure
Patent number
11,821,815
Issue date
Nov 21, 2023
NEC Corporation
Gaku Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Stress distribution image processing device
Patent number
11,808,657
Issue date
Nov 7, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yousuke Irie
G01 - MEASURING TESTING
Information
Patent Grant
Automatic test system for actual stress of a bridge based on DIC te...
Patent number
11,802,808
Issue date
Oct 31, 2023
JSTI GROUP CO. LTD
Duo Liu
G01 - MEASURING TESTING
Information
Patent Grant
Stress measurement device, stress measurement system, and stress me...
Patent number
11,761,833
Issue date
Sep 19, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yousuke Irie
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining the risk of failure of a structure
Patent number
11,761,847
Issue date
Sep 19, 2023
Thomas Arthur Winant
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system and method for measuring the displacement of at le...
Patent number
11,719,597
Issue date
Aug 8, 2023
MOVE S.R.L.
Ferdinando Frediani
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Vision-based fatigue crack detection using feature tracking
Patent number
11,714,024
Issue date
Aug 1, 2023
University of Kansas
Jian Li
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method, measurement device, measurement system, and mea...
Patent number
11,714,021
Issue date
Aug 1, 2023
Seiko Epson Corporation
Yoshihiro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Movable system for automatically monitoring the correlated wind and...
Patent number
11,668,623
Issue date
Jun 6, 2023
Southwest Jiaotong University
Jin Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Integrated rapid infrastructure monitoring systems and methods of u...
Patent number
11,644,380
Issue date
May 9, 2023
Board of Regents, The University of Texas System
Suyun Ham
G01 - MEASURING TESTING
Information
Patent Grant
Structure evaluation system and structure evaluation method
Patent number
11,639,880
Issue date
May 2, 2023
Kabushiki Kaisha Toshiba
Tomoki Shiotani
G01 - MEASURING TESTING
Information
Patent Grant
State estimation apparatus, state estimation method, and computer-r...
Patent number
11,609,149
Issue date
Mar 21, 2023
NEC Corporation
Yu Kiyokawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Structural vibration monitoring method based on computer vision and...
Patent number
11,593,952
Issue date
Feb 28, 2023
Zhejiang University
Xiaowei Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for calculating temperature-dependent mid-span vertical disp...
Patent number
11,579,038
Issue date
Feb 14, 2023
University of Science and Technology Beijing
Yi Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for determining the amplitude of oscillatory inst...
Patent number
11,573,151
Issue date
Feb 7, 2023
INDIAN INSTITUTE OF TECHNOLOGY MADRAS (IITM)
Induja Pavithran
G05 - CONTROLLING REGULATING
Information
Patent Grant
Automatic wall climbing type radar photoelectric robot system for n...
Patent number
11,555,912
Issue date
Jan 17, 2023
Shandong University
Bin Liu
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
Patent number
11,519,883
Issue date
Dec 6, 2022
Kabushiki Kaisha Toshiba
Sanae Iida
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for controlling the integrated health of a mechan...
Patent number
11,460,450
Issue date
Oct 4, 2022
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Tom Druet
G01 - MEASURING TESTING
Information
Patent Grant
Method and systems relating to construction material assessment
Patent number
11,454,606
Issue date
Sep 27, 2022
GIATEC SCIENTIFIC
Pouria Ghods
G01 - MEASURING TESTING
Information
Patent Grant
Vibration measurement apparatus, vibration measurement method, and...
Patent number
11,391,621
Issue date
Jul 19, 2022
NEC Corporation
Masahiko Ohta
G01 - MEASURING TESTING
Information
Patent Grant
State determination apparatus, state determination method, and comp...
Patent number
11,365,963
Issue date
Jun 21, 2022
NEC Corporation
Subhajit Chaudhury
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bridge detecting vehicle with two foldable arms
Patent number
11,320,338
Issue date
May 3, 2022
Changsha University of Science & Technology
Minhui Chen
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method for determining the structural integrity of an infrastructur...
Patent number
11,274,989
Issue date
Mar 15, 2022
HEIJMANS N.V.
Albert David Reitsema
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring system
Patent number
11,199,469
Issue date
Dec 14, 2021
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Hiroya Kusaka
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Patents Applications
last 30 patents
Information
Patent Application
Intelligent detection method and unmanned surface vehicle for multi...
Publication number
20230351573
Publication date
Nov 2, 2023
SOUTHEAST UNIVERSITY
JIAN ZHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Non...
Publication number
20230341289
Publication date
Oct 26, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Non...
Publication number
20230341255
Publication date
Oct 26, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REAL-TIME IDENTIFICATION, MONITORING, AND EARLY WARNING...
Publication number
20230314272
Publication date
Oct 5, 2023
Tongji University
Danhui DAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
Publication number
20230228647
Publication date
Jul 20, 2023
Canon Kabushiki Kaisha
Atsushi Nogami
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
Publication number
20230194382
Publication date
Jun 22, 2023
Kabushiki Kaisha Toshiba
Yousuke HISAKUNI
G01 - MEASURING TESTING
Information
Patent Application
EVENT DETECTION APPARATUS, METHOD AND PROGRAM
Publication number
20230184621
Publication date
Jun 15, 2023
NEC Corporation
Murtuza PETLADWALA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20230175918
Publication date
Jun 8, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20230175919
Publication date
Jun 8, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
MOVABLE SYSTEM FOR AUTOMATICALLY MONITORING THE CORRELATED WIND AND...
Publication number
20230141064
Publication date
May 11, 2023
Southwest Jiaotong University
Jin ZHU
G01 - MEASURING TESTING
Information
Patent Application
A METHOD OF ESTIMATING DISPLACEMENT OF A BRIDGE AND AN ELECTRONIC D...
Publication number
20230105833
Publication date
Apr 6, 2023
Korea Advanced Institute of Science and Technology
Hoon SOHN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MONITORING HEALTH STATUS OF BRIDGES IN NORMAL TRAFFIC CON...
Publication number
20230083004
Publication date
Mar 16, 2023
Sensima Inspection Sàrl
Marc LANY
G08 - SIGNALLING
Information
Patent Application
ABNORMALITY ESTIMATION APPARATUS, ABNORMALITY ESTIMATION METHOD, AN...
Publication number
20230054215
Publication date
Feb 23, 2023
NEC Corporation
Sakiko Mishima
G01 - MEASURING TESTING
Information
Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
Publication number
20230003608
Publication date
Jan 5, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
Publication number
20230003609
Publication date
Jan 5, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Derivation Method, Derivation Device, Derivation System, And Program
Publication number
20230003610
Publication date
Jan 5, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
Time Point Acquisition Method, Time Point Acquisition Device, Time...
Publication number
20230003611
Publication date
Jan 5, 2023
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC TEST SYSTEM FOR ACTUAL STRESS OF A BRIDGE BASED ON DIC TE...
Publication number
20220357235
Publication date
Nov 10, 2022
JSTI GROUP CO.LTD.
Duo LIU
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20220291078
Publication date
Sep 15, 2022
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
DAMAGE DETECTION APPARATUS, DAMAGE DETECTION METHOD, AND COMPUTER-R...
Publication number
20220291077
Publication date
Sep 15, 2022
NEC Corporation
Shohei KINOSHITA
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20220276118
Publication date
Sep 1, 2022
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20220276119
Publication date
Sep 1, 2022
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Measurement Method, Measurement Device, Measurement System, And Mea...
Publication number
20220276120
Publication date
Sep 1, 2022
SEIKO EPSON CORPORATION
Yoshihiro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
STRESS DISTRIBUTION IMAGE PROCESSING DEVICE
Publication number
20220187162
Publication date
Jun 16, 2022
Panasonic Intellectual Property Management Co., Ltd.
Yousuke IRIE
G01 - MEASURING TESTING
Information
Patent Application
NON-CONTACT NON-DESTRUCTIVE INSPECTION SYSTEM, SIGNAL PROCESSING DE...
Publication number
20220170813
Publication date
Jun 2, 2022
Kabushiki Kaisha Toshiba
Takashi USUI
G01 - MEASURING TESTING
Information
Patent Application
STATE ESTIMATION APPARATUS, STATE ESTIMATION METHOD, AND COMPUTER-R...
Publication number
20220163422
Publication date
May 26, 2022
NEC Corporation
Yu KIYOKAWA
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASUREMENT APPARATUS FOR STRUCTURE
Publication number
20220146366
Publication date
May 12, 2022
NEC Corporation
Gaku Nakano
G01 - MEASURING TESTING
Information
Patent Application
Structural vibration monitoring method based on computer vision and...
Publication number
20220138970
Publication date
May 5, 2022
Zhejiang University
Xiaowei YE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STRUCTURE DISPLACEMENT AMOUNT MEASUREMENT APPARATUS
Publication number
20220136927
Publication date
May 5, 2022
NEC Corporation
Jun TAKADA
G01 - MEASURING TESTING
Information
Patent Application
IMAGING PARAMETER OUTPUT METHOD AND IMAGING PARAMETER OUTPUT DEVICE
Publication number
20220128433
Publication date
Apr 28, 2022
Panasonic Intellectual Property Management Co., Ltd.
Taro IMAGAWA
G01 - MEASURING TESTING