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Material detection system
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Patent number 10,156,515
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Issue date Dec 18, 2018
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GED Integrated Solutions, Inc.
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William A. Briese
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G01 - MEASURING TESTING
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Infrared ray moisture meter
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Patent number 5,087,817
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Issue date Feb 11, 1992
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Yokogawa Electric Corporation
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Ryuji Chiba
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G01 - MEASURING TESTING
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Infrared reflectance densitometer
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Patent number 4,553,033
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Issue date Nov 12, 1985
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Xerox Corporation
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Fred F. Hubble
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G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY