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Particle discrimination and measurement of relative mass

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  • G01T1/38
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Parent Industries

GPHYSICS G01Measuring instruments G01TMEASUREMENT OF NUCLEAR OR X-RADIATION G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation

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G01T1/38Particle discrimination and measurement of relative mass
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Patents Grantslast 30 patents

  • Information Patent Grant

    Response function of a scintillator
    • Patent number 11,914,087
    • Issue date Feb 27, 2024
    • Soletanche Freyssinet
    • Ludmila Konecná
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Neutrino detector device, neutrino detector system and method of de...
    • Patent number 10,935,674
    • Issue date Mar 2, 2021
    • Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
    • Raimund Strauss
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radiation detector
    • Patent number 10,408,953
    • Issue date Sep 10, 2019
    • Kabushiki Kaisha Toshiba
    • Rei Hasegawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radioactive isotope identification
    • Patent number 8,374,993
    • Issue date Feb 12, 2013
    • Symetrica Limited
    • David Ramsden
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scintillator-based low energy particle imaging spectrometer
    • Patent number 7,365,336
    • Issue date Apr 29, 2008
    • United States of America as represented by the Secretary of the Air Force
    • Gary E. Galica
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Charged particle measuring apparatus
    • Patent number 6,710,352
    • Issue date Mar 23, 2004
    • National Space Development Agency of Japan
    • Jun Kikuchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for measuring radioactive decay
    • Patent number 4,528,450
    • Issue date Jul 9, 1985
    • Packard Instrument Company, Inc.
    • Robert J. Valenta
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Apparatus for measuring neutrons and gamma rays
    • Patent number 4,482,808
    • Issue date Nov 13, 1984
    • Hitachi, Ltd.
    • Hiroshi Tominaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and circuit arrangement for discriminating between pulses ge...
    • Patent number 4,454,587
    • Issue date Jun 12, 1984
    • Kernforschungszentrum Karlsruhe Gesellschaft mit beschrankter Haftung
    • Hans Kiefer
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Detector device
    • Patent number 4,400,621
    • Issue date Aug 23, 1983
    • Kernforschungszentrum Karlsruhe GmbH
    • Hans Kiefer
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Alpha particle monitor
    • Patent number 4,262,203
    • Issue date Apr 14, 1981
    • Mario W. Overhoff
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Focal-surface detector for heavy ions
    • Patent number 4,150,290
    • Issue date Apr 17, 1979
    • The United States of America as represented by the United States Department o...
    • John R. Erskine
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement of the mass and charge of charged particles
    • Patent number 4,010,366
    • Issue date Mar 1, 1977
    • Xerox Corporation
    • Armand P. Neukermans
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3858047
    • Patent number 3,858,047
    • Issue date Dec 31, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3818356
    • Patent number 3,818,356
    • Issue date Jun 18, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3676783
    • Patent number 3,676,783
    • Issue date Jul 11, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3603888
    • Patent number 3,603,888
    • Issue date Sep 7, 1971
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3518429
    • Patent number 3,518,429
    • Issue date Jun 30, 1970
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3423627
    • Patent number 3,423,627
    • Issue date Jan 21, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2574632
    • Patent number 2,574,632
    • Issue date Nov 13, 1951
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents