Particular pulse shapes

Industry

CPC
G01D5/366

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Parent Industries

GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D5/00Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable

Current Industry

G01D5/366Particular pulse shapes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical encoder with alignment photodiodes
- Patent number 11,874,147
- Issue date Jan 16, 2024
- Chung-Min Thor
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder with alignable relative positions between elements...
- Patent number 11,566,922
- Issue date Jan 31, 2023
- PixArt Imaging Inc.
- Chung-Min Thor
- G01 - MEASURING TESTING
Information Patent Grant
Encoder scale, manufacturing method for encoder scale, and encoder
- Patent number 10,955,265
- Issue date Mar 23, 2021
- Seiko Epson Corporation
- Akio Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement encoder
- Patent number 10,823,587
- Issue date Nov 3, 2020
- Renishaw plc
- Simon Eliot McAdam
- G01 - MEASURING TESTING
Information Patent Grant
Optical element
- Patent number 10,768,026
- Issue date Sep 8, 2020
- Renishaw plc
- Jason Kempton Slack
- G01 - MEASURING TESTING
Information Patent Grant
Reference mark detector arrangement
- Patent number 10,281,301
- Issue date May 7, 2019
- Renishaw plc
- Jason Kempton Slack
- G01 - MEASURING TESTING
Information Patent Grant
Camera, posture change detection and posture restoration thereof
- Patent number 10,197,421
- Issue date Feb 5, 2019
- ZheJiang Uniview Technologies CO., Ltd
- Yong Tao
- G02 - OPTICS
Information Patent Grant
Optical encoder comprising an origin point detection scale having a...
- Patent number 10,024,695
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Optical element
- Patent number 9,952,068
- Issue date Apr 24, 2018
- Renishaw plc
- Jason Kempton Slack
- G01 - MEASURING TESTING
Information Patent Grant
Robust index correction of an angular encoder based on read head ru...
- Patent number 9,689,986
- Issue date Jun 27, 2017
- Faro Technologies, Inc.
- Alexander Kramer
- G02 - OPTICS
Information Patent Grant
Reference signal generation apparatus and reference signal generati...
- Patent number 9,534,936
- Issue date Jan 3, 2017
- Mitutoyo Corporation
- Akihide Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal generation apparatus and reference signal generati...
- Patent number 9,157,769
- Issue date Oct 13, 2015
- Mitutoyo Corporation
- Akihide Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical position-measuring device
- Patent number 8,890,057
- Issue date Nov 18, 2014
- Dr. Johannes Heidenhain GmbH
- Michael Hermann
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder
- Patent number 8,666,261
- Issue date Mar 4, 2014
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder
- Patent number 8,395,535
- Issue date Mar 12, 2013
- Mitutoyo Corporation
- Hiroaki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder for detecting relative rotation angle for two members
- Patent number 8,148,674
- Issue date Apr 3, 2012
- Kabushiki Kaisha Yaskawa Denki
- Yasushi Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating origin signal of encoder
- Patent number 8,130,427
- Issue date Mar 6, 2012
- Mitutoyo Corporation
- Kouichi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal generating configuration for an interferometric mi...
- Patent number 7,973,941
- Issue date Jul 5, 2011
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal generating configuration for an interferometric mi...
- Patent number 7,965,393
- Issue date Jun 21, 2011
- Mitutoyo Corporation
- Avron Zwilling
- G01 - MEASURING TESTING
Information Patent Grant
Encoder home position sensing method and system
- Patent number 7,934,657
- Issue date May 3, 2011
- Xerox Corporation
- David Douglas Martenson
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring arrangement
- Patent number 7,903,262
- Issue date Mar 8, 2011
- Dr. Johannes Heidenhain GmbH
- Johannes Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor, method for detecting the optimal reference pos...
- Patent number 7,825,369
- Issue date Nov 2, 2010
- Olympus Corporation
- Jun Hane
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device
- Patent number 7,714,273
- Issue date May 11, 2010
- Dr. Johannes Heidenhain GmbH
- Karsten Saendig
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit for scanning a measuring standard
- Patent number 7,690,567
- Issue date Apr 6, 2010
- Dr. Johannes Heidenhain GmbH
- Herbert Mauerberger
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device including a scale having an integrated re...
- Patent number 7,667,188
- Issue date Feb 23, 2010
- Dr. Johannes Heidenhain GmbH
- Heinz Tovar
- G01 - MEASURING TESTING
Information Patent Grant
Scale reading apparatus
- Patent number 7,659,992
- Issue date Feb 9, 2010
- Renishaw plc
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device for determining the position of two objec...
- Patent number 7,639,366
- Issue date Dec 29, 2009
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Scale and readhead system
- Patent number 7,624,513
- Issue date Dec 1, 2009
- Renishaw plc
- Colin Keith Howley
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder having reference position detection
- Patent number 7,449,678
- Issue date Nov 11, 2008
- Olympus Corporation
- Takeshi Ito
- G01 - MEASURING TESTING
Information Patent Grant
Coding element with integrated limit switch
- Patent number 7,400,269
- Issue date Jul 15, 2008
- Avago Technologies ECBU IP Pte Ltd
- Weng Fei Wong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ENCODER WITH ALIGNMENT PHOTODIODES AT TWO SIDES OF DETECTIO...
- Publication number 20240125629
- Publication date Apr 18, 2024
- PIXART IMAGING INC.
- Chung-Min THOR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER WITH ALIGNMENT PHOTODIODES
- Publication number 20230122480
- Publication date Apr 20, 2023
- PIXART IMAGING INC.
- Chung-Min THOR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ARBITRARY OPTICAL WAVEFORM GENERATION
- Publication number 20220341760
- Publication date Oct 27, 2022
- Institut National de la Recherche Scientifique
- Bennet FISCHER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL ENCODER WITH ALIGNABLE RELATIVE POSITIONS BETWEEN ELEMENTS...
- Publication number 20210364329
- Publication date Nov 25, 2021
- PIXART IMAGING INC.
- Chung-Min THOR
- G01 - MEASURING TESTING
Information Patent Application
ENCODER SCALE, MANUFACTURING METHOD FOR ENCODER SCALE, AND ENCODER
- Publication number 20190128706
- Publication date May 2, 2019
- SEIKO EPSON CORPORATION
- Akio KONISHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT
- Publication number 20180209824
- Publication date Jul 26, 2018
- RENISHAW PLC
- Jason Kempton SLACK
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATI...
- Publication number 20140339405
- Publication date Nov 20, 2014
- MITUTOYO CORPORATION
- Akihide KIMURA
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATI...
- Publication number 20140339404
- Publication date Nov 20, 2014
- MITUTOYO CORPORATION
- Akihide KIMURA
- G01 - MEASURING TESTING
Information Patent Application
Optical Position-Measuring Device
- Publication number 20120292493
- Publication date Nov 22, 2012
- Michael Hermann
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC ENCODER
- Publication number 20110272564
- Publication date Nov 10, 2011
- Mitutoyo Corporation
- Hiroaki Kawada
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC ENCODER
- Publication number 20110229151
- Publication date Sep 22, 2011
- Mitutoyo Corporation
- Tomotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MICROFLUIDIC DEVICE, MICROFLUIDIC SYSTEM INCLUDING THE SAME, AND ME...
- Publication number 20110017905
- Publication date Jan 27, 2011
- Samsung Electronics Co., Ltd.
- Yeong Bae YEO
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
- Publication number 20100097617
- Publication date Apr 22, 2010
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER
- Publication number 20090321621
- Publication date Dec 31, 2009
- KABUSHIKI KAISHA YASKAWA DENKI
- Yasushi Yoshida
- G01 - MEASURING TESTING
Information Patent Application
ENCODER HOME POSITION SENSING METHOD AND SYSTEM
- Publication number 20090321520
- Publication date Dec 31, 2009
- Xerox Corporation.
- David Douglas Martenson
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring arrangement
- Publication number 20090135436
- Publication date May 28, 2009
- Dr. Johannes Heidenhain GmbH
- Johannes Wagner
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
- Publication number 20090135435
- Publication date May 28, 2009
- Mitutoyo Corporation
- Avron Zwilling
- G01 - MEASURING TESTING
Information Patent Application
Scale and Readhead System
- Publication number 20090064524
- Publication date Mar 12, 2009
- RENISHAW PLC
- Colin Keith Howley
- G01 - MEASURING TESTING
Information Patent Application
REFLECTION TYPE ENCODER
- Publication number 20090057406
- Publication date Mar 5, 2009
- Mitutoyo Corporation
- Toru Yaku
- G01 - MEASURING TESTING
Information Patent Application
SCALE FOR A POSITION-MEASURING DEVICE AND POSITION-MEASURING DEVICE
- Publication number 20080290262
- Publication date Nov 27, 2008
- Heinz Tovar
- G01 - MEASURING TESTING
Information Patent Application
POSITION-MEASURING DEVICE
- Publication number 20080117440
- Publication date May 22, 2008
- Karsten Saendig
- G01 - MEASURING TESTING
Information Patent Application
Coding element with integrated limit switch
- Publication number 20080111062
- Publication date May 15, 2008
- Weng Fei Wong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISPLACEMENT SENSOR, METHOD FOR DETECTING THE OPTIMAL REFERENCE POS...
- Publication number 20080035837
- Publication date Feb 14, 2008
- OLYMPUS CORPORATION
- Jun Hane
- G01 - MEASURING TESTING
Information Patent Application
Scale Reading Apparatus
- Publication number 20080013105
- Publication date Jan 17, 2008
- RENISHAW PLC
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
Scale assembly for optical encoder having affixed optical reference...
- Publication number 20070144026
- Publication date Jun 28, 2007
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Angle-measuring system
- Publication number 20070019183
- Publication date Jan 25, 2007
- Georg Feurer
- G01 - MEASURING TESTING
Information Patent Application
Reader for a scale marking
- Publication number 20060283035
- Publication date Dec 21, 2006
- RENISHAW PLC
- Iain Robert Gordon-Ingram
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING ORIGIN SIGNAL OF ENCODER
- Publication number 20060268379
- Publication date Nov 30, 2006
- MITUTOYO CORPORATION
- Kouichi Arai
- G01 - MEASURING TESTING
Information Patent Application
Optical encoder
- Publication number 20060267822
- Publication date Nov 30, 2006
- OLYMPUS CORPORATION
- Takeshi Ito
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Position-measuring device for determining the position of two objec...
- Publication number 20060262315
- Publication date Nov 23, 2006
- Erwin Spanner
- G01 - MEASURING TESTING

Particular pulse shapes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical encoder with alignment photodiodes

Optical encoder with alignable relative positions between elements...

Encoder scale, manufacturing method for encoder scale, and encoder

Measurement encoder

Optical element

Reference mark detector arrangement

Camera, posture change detection and posture restoration thereof

Optical encoder comprising an origin point detection scale having a...

Optical element

Robust index correction of an angular encoder based on read head ru...

Reference signal generation apparatus and reference signal generati...

Reference signal generation apparatus and reference signal generati...

Optical position-measuring device

Photoelectric encoder

Photoelectric encoder

Optical encoder for detecting relative rotation angle for two members

Method and apparatus for generating origin signal of encoder

Reference signal generating configuration for an interferometric mi...

Reference signal generating configuration for an interferometric mi...

Encoder home position sensing method and system

Optical position measuring arrangement

Displacement sensor, method for detecting the optimal reference pos...

Position-measuring device

Scanning unit for scanning a measuring standard

Position measuring device including a scale having an integrated re...

Scale reading apparatus

Position-measuring device for determining the position of two objec...

Scale and readhead system

Optical encoder having reference position detection

Coding element with integrated limit switch

Patents Applicationslast 30 patents

OPTICAL ENCODER WITH ALIGNMENT PHOTODIODES AT TWO SIDES OF DETECTIO...

OPTICAL ENCODER WITH ALIGNMENT PHOTODIODES

SYSTEM AND METHOD FOR ARBITRARY OPTICAL WAVEFORM GENERATION

OPTICAL ENCODER WITH ALIGNABLE RELATIVE POSITIONS BETWEEN ELEMENTS...

ENCODER SCALE, MANUFACTURING METHOD FOR ENCODER SCALE, AND ENCODER

OPTICAL ELEMENT

REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATI...

REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATI...

Optical Position-Measuring Device

PHOTOELECTRIC ENCODER

PHOTOELECTRIC ENCODER

MICROFLUIDIC DEVICE, MICROFLUIDIC SYSTEM INCLUDING THE SAME, AND ME...

REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...

OPTICAL ENCODER

ENCODER HOME POSITION SENSING METHOD AND SYSTEM

Optical position measuring arrangement

REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...

Scale and Readhead System

REFLECTION TYPE ENCODER

SCALE FOR A POSITION-MEASURING DEVICE AND POSITION-MEASURING DEVICE

POSITION-MEASURING DEVICE

Coding element with integrated limit switch

DISPLACEMENT SENSOR, METHOD FOR DETECTING THE OPTIMAL REFERENCE POS...

Scale Reading Apparatus

Scale assembly for optical encoder having affixed optical reference...

Angle-measuring system

Reader for a scale marking

METHOD AND APPARATUS FOR GENERATING ORIGIN SIGNAL OF ENCODER

Optical encoder

Position-measuring device for determining the position of two objec...