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G01N30/8637
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N30/00
Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange
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G01N30/8637
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Patents Grants
last 30 patents
Information
Patent Grant
Method of control of a spectrometer
Patent number
11,982,656
Issue date
May 14, 2024
Thermo Fisher Scientific (Bremen) GmbH
Holger Jeglinski
G01 - MEASURING TESTING
Information
Patent Grant
Peak analyzing method and waveform processing device
Patent number
11,965,865
Issue date
Apr 23, 2024
Shimadzu Corporation
Shin Fujita
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for intelligent source tracing of organic polluti...
Patent number
11,965,871
Issue date
Apr 23, 2024
Nanjing University
Jichun Wu
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for targeted mass spectral proteomic analyses
Patent number
11,933,770
Issue date
Mar 19, 2024
Thermo Finnigan LLC.
Philip M. Remes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for the evaluation of system inertness
Patent number
11,874,256
Issue date
Jan 16, 2024
Waters Technologies Corporation
Amit Patel
G01 - MEASURING TESTING
Information
Patent Grant
Analytical data analysis system
Patent number
11,630,093
Issue date
Apr 18, 2023
Shimadzu Corporation
Yoshihiro Kunimura
G01 - MEASURING TESTING
Information
Patent Grant
Chromatograph having operation controller that causes automatic pur...
Patent number
11,619,617
Issue date
Apr 4, 2023
Hitachi High-Tech Science Corporation
Masahito Ito
G01 - MEASURING TESTING
Information
Patent Grant
Chromatographic data system processing apparatus
Patent number
11,567,047
Issue date
Jan 31, 2023
Hitachi High-Tech Science Corporation
Masahito Ito
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring glycated hemoglobin and device for measuring g...
Patent number
11,555,807
Issue date
Jan 17, 2023
Tosoh Corporation
Sachiyuki Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for screening of tobacco nicotine converters
Patent number
11,525,814
Issue date
Dec 13, 2022
Yunnan Academy of Tobacco Agricultural Sciences
Yong Li
G01 - MEASURING TESTING
Information
Patent Grant
Peak detection method and data processing device
Patent number
11,499,950
Issue date
Nov 15, 2022
Shimadzu Corporation
Shinji Kanazawa
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for targeted mass spectral proteomic analyses
Patent number
11,493,487
Issue date
Nov 8, 2022
Thermo Finnigan LLC.
Philip M. Remes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for simultaneously determining fat-soluble vitamins and caro...
Patent number
11,460,451
Issue date
Oct 4, 2022
Xi'an Jiaotong University
Liyun Kong
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining food-product quality and food-product qualit...
Patent number
11,460,453
Issue date
Oct 4, 2022
Shimadzu Corporation
Takero Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrum data acquisition and analysis method
Patent number
11,378,560
Issue date
Jul 5, 2022
Shimadzu Corporation
Yunqing Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Techniques for checking state of analyzers
Patent number
11,249,059
Issue date
Feb 15, 2022
Roche Diagnostics Operations, Inc.
Stefan Quint
G01 - MEASURING TESTING
Information
Patent Grant
Method for finding species peaks in mass spectrometry
Patent number
11,244,818
Issue date
Feb 8, 2022
Agilent Technologies, Inc.
Daniel Y. Abramovitch
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging mass spectrometry data processing device
Patent number
11,211,235
Issue date
Dec 28, 2021
Shimadzu Corporation
Shinichi Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging mass spectrometry data processing device
Patent number
11,201,042
Issue date
Dec 14, 2021
Shimadzu Corporation
Shinichi Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Data processing method for chromatograph mass spectrometry, chromat...
Patent number
10,976,290
Issue date
Apr 13, 2021
Shimadzu Corporation
Kirsten Hobby
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-trace quantitation
Patent number
10,732,156
Issue date
Aug 4, 2020
DH Technologies Development Pte. Ltd.
Gordana Ivosev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spatial temperature gradients in liquid chromatography
Patent number
10,705,060
Issue date
Jul 7, 2020
Waters Technologies Corporation
Michael O. Fogwill
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Chromatogram data processing device and program
Patent number
10,684,263
Issue date
Jun 16, 2020
Shimadzu Corporation
Momoyo Yamakawa
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods and devices for width-based analysis of peak traces
Patent number
10,634,653
Issue date
Apr 28, 2020
DIONEX CORPORATION
Purnendu K. Dasgupta
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Mass spectrometer
Patent number
10,613,062
Issue date
Apr 7, 2020
Shimadzu Corporation
Yoshitake Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Waveform data processing device and waveform data processing program
Patent number
10,371,676
Issue date
Aug 6, 2019
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Methods for optimizing mass spectrometer parameters
Patent number
10,139,379
Issue date
Nov 27, 2018
Thermo Finnigan LLC.
Philip M. Remes
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chromatography/mass spectrometry data processing device
Patent number
10,121,643
Issue date
Nov 6, 2018
Shimadzu Corporation
Katsuyuki Taneda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of improving the resolution of compounds eluted from a chrom...
Patent number
9,395,341
Issue date
Jul 19, 2016
Thermo Fisher Scientific (Bremen) GmbH
Hans Pfaff
G01 - MEASURING TESTING
Information
Patent Grant
Method for improving a chromatographic detection limit for an analyte
Patent number
9,201,050
Issue date
Dec 1, 2015
Siemens Aktiengesellschaft
Udo Gellert
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DATA ANALYSIS SYSTEM AND COMPUTER PROGRAM
Publication number
20250044265
Publication date
Feb 6, 2025
Shimadzu Corporation
Tomohiro KAWASE
G01 - MEASURING TESTING
Information
Patent Application
HYBRID MASS SPECTROMETER AND DATA ACQUISITION METHODS
Publication number
20250046593
Publication date
Feb 6, 2025
Thermo Fisher Scientific (Bremen) GmbH
Hamish STEWART
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAVEFORM-ANALYZING METHOD, WAVEFORM-ANALYZING DEVICE, AND ANALYZING...
Publication number
20240345046
Publication date
Oct 17, 2024
Shimadzu Corporation
Hitomi YOSHIYAMA-KITAJIMA
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE SPECTRAL LIBRARY SEARCH
Publication number
20240302337
Publication date
Sep 12, 2024
CERNO BIOSCIENCE LLC
Yondong Wang
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM SHAPE LEARNING DEVICE, WAVEFORM SHAPE LEARNING METHOD, NON...
Publication number
20240264132
Publication date
Aug 8, 2024
Shimadzu Corporation
Akira NODA
G01 - MEASURING TESTING
Information
Patent Application
SUPPRESSOR DIAGNOSTIC TOOL
Publication number
20240175851
Publication date
May 30, 2024
Dionex Corporation
Akinde F. Kadjo
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHY SYSTEM AND METHOD
Publication number
20240159720
Publication date
May 16, 2024
Agilent Technologies, Inc.
Stefan Mittrich
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE AND RETROSPECTIVE ENDPOINT DETECTION FOR AUTOMATED DELAYER...
Publication number
20240094142
Publication date
Mar 21, 2024
FEI Company
Sophia E. Weeks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR INTELLIGENT SOURCE TRACING OF ORGANIC POLLUTI...
Publication number
20240027419
Publication date
Jan 25, 2024
Nanjing University
Jichun WU
G01 - MEASURING TESTING
Information
Patent Application
Data Processing Device, Data Processing Method, Data Processing Pro...
Publication number
20230417714
Publication date
Dec 28, 2023
Shimadzu Corporation
Yusuke TAMAI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR TARGETED MASS SPECTRAL PROTEOMIC ANALYSES
Publication number
20230408463
Publication date
Dec 21, 2023
Thermo Finnigan LLC
Philip M. REMES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PEAK SHAPE ESTIMATION DEVICE AND PEAK SHAPE ESTIMATION METHOD
Publication number
20230304975
Publication date
Sep 28, 2023
Shimadzu Corporation
Yusuke TAMAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR ESTIMATING RENAL FUNCTION
Publication number
20230037869
Publication date
Feb 9, 2023
Kagami Inc.
Masashi MITA
G01 - MEASURING TESTING
Information
Patent Application
ANOMALY DETECTION AND DIAGNOSIS IN CHROMATOGRAPHY APPLICATIONS
Publication number
20230012349
Publication date
Jan 12, 2023
SPIRA INNOVATION INC.
Yves GAMACHE
G01 - MEASURING TESTING
Information
Patent Application
Waveform Analytical Method and Waveform Analytical Device
Publication number
20220373522
Publication date
Nov 24, 2022
SHIMADZU CORPORATION
Shinji KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL DATA PROCESSING FOR CHEMICAL ANALYSIS
Publication number
20220198326
Publication date
Jun 23, 2022
Virtual Control Limited
Tamas Ross Taldon King
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR AUTOMATIC PEAK INTEGRATION
Publication number
20220155269
Publication date
May 19, 2022
Roche Diagnostics Operations, Inc.
Galina Babitzki
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM PROCESSING ASSISTANCE DEVICE AND WAVEFORM PROCESSING ASSIS...
Publication number
20220146471
Publication date
May 12, 2022
Shimadzu Corporation
Yuki ISHIKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR ANALYZING DIFFERENTIATION OF METABOLITES IN URINE SAMPLE...
Publication number
20220137012
Publication date
May 5, 2022
Korea University Research and Business Foundation
Kyoung Heon KIM
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR THE EVALUATION OF SYSTEM INERTNESS
Publication number
20220082532
Publication date
Mar 17, 2022
WATERS TECHNOLOGIES CORPORATION
Amit Patel
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CONTROL OF A SPECTROMETER
Publication number
20220082539
Publication date
Mar 17, 2022
Thermo Fisher Scientific (Bremen) GmbH
Holger Jeglinski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Peak Profile for Identifying an Analyte in a Chromatogram
Publication number
20220042957
Publication date
Feb 10, 2022
Dionex Corporation
Akinde F. Kadjo
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS ASSISTANCE DEVICE, ANALYSIS ASSISTANCE METHOD AND NON-TRAN...
Publication number
20210356446
Publication date
Nov 18, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SCREENING OF TOBACCO NICOTINE CONVERTERS
Publication number
20210349063
Publication date
Nov 11, 2021
Yunnan Academy of Tobacco Agricultural Sciences
Yong LI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR TARGETED MASS SPECTRAL PROTEOMIC ANALYSES
Publication number
20210333249
Publication date
Oct 28, 2021
Thermo Finnigan LLC
Philip M. REMES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PEAK ANALYZING METHOD AND WAVEFORM PROCESSING DEVICE
Publication number
20210293763
Publication date
Sep 23, 2021
Shimadzu Corporation
Shin FUJITA
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATING UNKNOWN PROPORTIONS OF A PLURALITY OF END-MEMBERS IN AN...
Publication number
20210215651
Publication date
Jul 15, 2021
Chevron U.S.A. Inc.
Lingbo XING
E21 - EARTH DRILLING MINING
Information
Patent Application
METHOD FOR SIMULTANEOUSLY DETERMINING FAT-SOLUBLE VITAMINS AND CARO...
Publication number
20210190733
Publication date
Jun 24, 2021
XI'AN JIAOTONG UNIVERSITY
Liyun KONG
G01 - MEASURING TESTING
Information
Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
Publication number
20200378933
Publication date
Dec 3, 2020
SHIMADZU CORPORATION
Shinji KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
ANALYTICAL DATA ANALYSIS SYSTEM
Publication number
20200340961
Publication date
Oct 29, 2020
Shimadzu Corporation
Yoshihiro KUNIMURA
G01 - MEASURING TESTING