Phase distribution

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CPC
G01N2021/4173

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4173Phase distribution

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Estimating phase fraction/distribution with dielectric contrast ana...
- Patent number 12,117,323
- Issue date Oct 15, 2024
- ExxonMobil Technology and Engineering Company
- Lang Feng
- G01 - MEASURING TESTING
Information Patent Grant
Estimating phase fraction/distribution with dielectric contrast ana...
- Patent number 11,668,593
- Issue date Jun 6, 2023
- ExxonMobil Technology and Engineering Company
- Lang Feng
- G01 - MEASURING TESTING
Information Patent Grant
Wave front reconstruction for dielectric coatings at arbitrary wave...
- Patent number 11,592,392
- Issue date Feb 28, 2023
- European Space Agency
- Luis Miguel Gaspar Venancio
- G02 - OPTICS
Information Patent Grant
Deformometer for determining deformation of an optical cavity optic
- Patent number 10,942,089
- Issue date Mar 9, 2021
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Kevin O. Douglass
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor for phase determination
- Patent number 10,837,902
- Issue date Nov 17, 2020
- Tokyo Electron Limited
- Ivan Maleev
- G01 - MEASURING TESTING
Information Patent Grant
Cell image evaluation device, method, and program
- Patent number 10,504,223
- Issue date Dec 10, 2019
- FUJIFILM Corporation
- Kenta Matsubara
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for analyzing material properties and detecting...
- Patent number 8,527,242
- Issue date Sep 3, 2013
- Ariel—The University Company for Research and Development, Ltd.
- Er'el Granot
- G01 - MEASURING TESTING
Information Patent Grant
Reconstruction of nonlinear wave propagation
- Patent number 8,427,650
- Issue date Apr 23, 2013
- Opteryx, LLC
- Jason W. Fleischer
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Optical inspection apparatus and optical inspection method
- Patent number 7,423,745
- Issue date Sep 9, 2008
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantifying errors in an alternating phase sh...
- Patent number 7,016,027
- Issue date Mar 21, 2006
- Infineon Technologies AG
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Grant
Multidimensional imaging using a single point detector for a phase...
- Patent number 5,309,912
- Issue date May 10, 1994
- The United States of America as represented by the Secretary of the Departmen...
- Alexander Knuttel
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a radiation signal
- Patent number 5,292,483
- Issue date Mar 8, 1994
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging a physical parameter in turbid med...
- Patent number 5,203,339
- Issue date Apr 20, 1993
- The Government of the United States of America as represented by the Secretar...
- Alexander Knuttel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPE, OBSERVATION METHOD, AND PROGRAM
- Publication number 20240019677
- Publication date Jan 18, 2024
- Nikon Corporation
- Yamato NIITANI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE AND METHOD FOR IMAGING AN OBJECT USING A MICROSCOPE
- Publication number 20210096349
- Publication date Apr 1, 2021
- Leica Microsystems CMS GmbH
- Benjamin DEISSLER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WAVE FRONT RECONSTRUCTION FOR DIELECTRIC COATINGS AT ARBITRARY WAVE...
- Publication number 20200348228
- Publication date Nov 5, 2020
- EUROPEAN SPACE AGENCY
- Luis Miguel Gaspar Venancio
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR PHASE DETERMINATION
- Publication number 20190056320
- Publication date Feb 21, 2019
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- G01 - MEASURING TESTING
Information Patent Application
RECONSTRUCTION OF NONLINEAR WAVE PROPAGATION
- Publication number 20140016183
- Publication date Jan 16, 2014
- OPTERYX LLC
- Jason W. Fleischer
- G02 - OPTICS
Information Patent Application
Methods And Devices For Analyzing Material Properties And Detecting...
- Publication number 20110022328
- Publication date Jan 27, 2011
- Ariel-University Research and Development Company Ltd.
- Er'el Granot
- G01 - MEASURING TESTING
Information Patent Application
RECONSTRUCTION OF NONLINEAR WAVE PROPAGATION
- Publication number 20100165348
- Publication date Jul 1, 2010
- OPTERYX LLC
- Jason W. Fleischer
- G02 - OPTICS
Information Patent Application
Optical inspection apparatus and optical inspection method
- Publication number 20060066844
- Publication date Mar 30, 2006
- NEC Corporation
- Hideyuki Moribe
- G01 - MEASURING TESTING
Information Patent Application
System and method for quantifying errors in an alternating phase sh...
- Publication number 20040223145
- Publication date Nov 11, 2004
- Shahid Butt
- G01 - MEASURING TESTING

Phase distribution

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Estimating phase fraction/distribution with dielectric contrast ana...

Estimating phase fraction/distribution with dielectric contrast ana...

Wave front reconstruction for dielectric coatings at arbitrary wave...

Deformometer for determining deformation of an optical cavity optic

Optical sensor for phase determination

Cell image evaluation device, method, and program

Methods and devices for analyzing material properties and detecting...

Reconstruction of nonlinear wave propagation

Optical inspection apparatus and optical inspection method

System and method for quantifying errors in an alternating phase sh...

Multidimensional imaging using a single point detector for a phase...

Detecting a radiation signal

Method and apparatus for imaging a physical parameter in turbid med...

Patents Applicationslast 30 patents

MICROSCOPE, OBSERVATION METHOD, AND PROGRAM

IMAGING DEVICE AND METHOD FOR IMAGING AN OBJECT USING A MICROSCOPE

WAVE FRONT RECONSTRUCTION FOR DIELECTRIC COATINGS AT ARBITRARY WAVE...

OPTICAL SENSOR FOR PHASE DETERMINATION

RECONSTRUCTION OF NONLINEAR WAVE PROPAGATION

Methods And Devices For Analyzing Material Properties And Detecting...

RECONSTRUCTION OF NONLINEAR WAVE PROPAGATION

Optical inspection apparatus and optical inspection method

System and method for quantifying errors in an alternating phase sh...