Polarisation of light

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CPC
G01N2021/8848

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8848Polarisation of light

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating semiconductor wafer
- Patent number 12,247,927
- Issue date Mar 11, 2025
- Sumco Corporation
- Motoi Kurokami
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting a defect on a semi-reflective film...
- Patent number 12,241,844
- Issue date Mar 4, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
FinFET device and method of forming and monitoring quality of the same
- Patent number 12,237,417
- Issue date Feb 25, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chang-Yin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Container visual inspection assembly and method
- Patent number 12,169,177
- Issue date Dec 17, 2024
- Amgen Inc.
- Graham F. Milne
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical analysis of a component of an aerosol...
- Patent number 12,121,051
- Issue date Oct 22, 2024
- Philip Morris Products S.A.
- Ricardo Cali
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Grant
Carder, web guiding element, spinning mill preparation installation...
- Patent number 12,104,289
- Issue date Oct 1, 2024
- Trützschler Group SE
- Guido Engels
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Grant
Optical inspection device for optical performance test of display d...
- Patent number 12,025,571
- Issue date Jul 2, 2024
- Samsung Display Co., Ltd.
- Gil Yeong Park
- G02 - OPTICS
Information Patent Grant
Methods and systems for targeted monitoring of semiconductor measur...
- Patent number 12,019,030
- Issue date Jun 25, 2024
- KLA Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 12,017,278
- Issue date Jun 25, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,852,592
- Issue date Dec 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging apparatus, optical inspection apparatus, and optica...
- Patent number 11,774,369
- Issue date Oct 3, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,733,173
- Issue date Aug 22, 2023
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of additive man...
- Patent number 11,668,658
- Issue date Jun 6, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Inspection and metrology using broadband infrared radiation
- Patent number 11,662,646
- Issue date May 30, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,639,901
- Issue date May 2, 2023
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
FinFET device and method of forming and monitoring quality of the same
- Patent number 11,522,084
- Issue date Dec 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chang-Yin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection systems for additive manufacturing systems
- Patent number 11,513,080
- Issue date Nov 29, 2022
- Hamilton Sundstrand Corporation
- Eric Karlen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
System and method for detecting defects on a specular surface with...
- Patent number 11,493,454
- Issue date Nov 8, 2022
- Cognex Corporation
- Fariborz Rostami
- G01 - MEASURING TESTING
Information Patent Grant
Super resolution for magneto-optical microscopy
- Patent number 11,474,283
- Issue date Oct 18, 2022
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Increasing signal-to-noise ratio in optical imaging of defects on u...
- Patent number 11,474,437
- Issue date Oct 18, 2022
- Applied Materials Israel Ltd.
- Yechiel Kapoano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detector
- Patent number 11,467,088
- Issue date Oct 11, 2022
- SEOUL VIOSYS CO., LTD.
- Jong Man Kim
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for polarization control
- Patent number 11,415,725
- Issue date Aug 16, 2022
- KLA Corporation
- Ivan Maleev
- G02 - OPTICS
Information Patent Grant
Simultaneous multi-directional laser wafer inspection
- Patent number 11,366,069
- Issue date Jun 21, 2022
- KLA-Tencor Corporation
- Guoheng Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection apparatus
- Patent number 11,264,256
- Issue date Mar 1, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect measuring apparatus and method by microscopic scatte...
- Patent number 11,175,220
- Issue date Nov 16, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G01 - MEASURING TESTING
Information Patent Grant
Sample surface polarization modification in interferometric defect...
- Patent number 11,150,195
- Issue date Oct 19, 2021
- Onto Innovation Inc.
- Nigel P. Smith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250076204
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Min Hwan SEO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250076209
- Publication date Mar 6, 2025
- Mitsubishi Heavy Industries, Ltd.
- Yuki YANO
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL ANGULAR METROLOGY
- Publication number 20250076208
- Publication date Mar 6, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...
- Publication number 20250067660
- Publication date Feb 27, 2025
- COGNEX CORPORATION
- Ben R. Carey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20250012732
- Publication date Jan 9, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Method and optical system for imaging optical defect
- Publication number 20240426761
- Publication date Dec 26, 2024
- John Le
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...
- Publication number 20240385123
- Publication date Nov 21, 2024
- TIAMA
- Olivier COLLE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...
- Publication number 20240329377
- Publication date Oct 3, 2024
- HARBIN INSTITUTE OF TECHNOLOGY
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE MODE FOR WORKPIECE INSPECTION
- Publication number 20240319096
- Publication date Sep 26, 2024
- KLA Corporation
- Grace H. Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20240319110
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING FOR SURFACE DEFECTS ON A CAST PART MADE OF SI...
- Publication number 20240310294
- Publication date Sep 19, 2024
- SAFRAN
- Franck MICHAUD
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20240302267
- Publication date Sep 12, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Taku OTANI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20240280483
- Publication date Aug 22, 2024
- Hitachi High-Tech Corporation
- Takeru UTSUGI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...
- Publication number 20240248046
- Publication date Jul 25, 2024
- Applied Materials, Inc.
- Keith Wells
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR QUALITY ASSESSMENT OF A FOOD PACKAGE AND A PACKAGING S...
- Publication number 20240233116
- Publication date Jul 11, 2024
- Tetra Laval Holdings & Finance S.A.
- Antonio Melandri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240230551
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
- Publication number 20240183655
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Alexander VON FINCK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SURFACE OF OBJECT
- Publication number 20240183796
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- YASUHIRO HIDAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240133824
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...
- Publication number 20240102940
- Publication date Mar 28, 2024
- ISRA VISION AG
- Josef DROSTE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING A DEFECT ON A SEMI-REFLECTIVE FILM...
- Publication number 20240077425
- Publication date Mar 7, 2024
- HUA YANG Precision Machinery Co.,Ltd
- Hsien-Te HSIAO
- G01 - MEASURING TESTING
Information Patent Application
MARKING INSPECTION DEVICE AND MARKING DEVICE FOR TRANSPARENT EDIBLE...
- Publication number 20240053277
- Publication date Feb 15, 2024
- QUALICAPS CO., LTD.
- Kousuke OOKITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...
- Publication number 20240027359
- Publication date Jan 25, 2024
- Resonac Corporation
- Katsuhisa YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...
- Publication number 20230417683
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad Eizner
- G01 - MEASURING TESTING
Information Patent Application
Foreign Substance Detection Device and Detection Method
- Publication number 20230358688
- Publication date Nov 9, 2023
- LG ENERGY SOLUTION, LTD.
- Jeong Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMMUNICATION BETWEEN AN OPTICAL MEASURING DEVICE AND TWO MEASURING...
- Publication number 20230341333
- Publication date Oct 26, 2023
- ANTON PAAR OPTOTEC GMBH
- Martin Ostermeyer
- G01 - MEASURING TESTING

Polarisation of light

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of evaluating semiconductor wafer

Method and system for detecting a defect on a semi-reflective film...

FinFET device and method of forming and monitoring quality of the same

Apparatus and method for inspecting cans

Dark-field confocal microscopic measurement apparatus and method ba...

Defect inspection apparatus and defect inspection method

Container visual inspection assembly and method

Angle independent optical surface inspector

Method and system for optical analysis of a component of an aerosol...

Carder, web guiding element, spinning mill preparation installation...

Optical inspection device for optical performance test of display d...

Methods and systems for targeted monitoring of semiconductor measur...

Multi-parameter inspection apparatus for monitoring of manufacturin...

Time domain multiplexed defect scanner

Optical imaging apparatus, optical inspection apparatus, and optica...

Time domain multiplexed defect scanner

Multi-parameter inspection apparatus for monitoring of additive man...

Inspection and metrology using broadband infrared radiation

Test structure design for metrology measurements in patterned samples

FinFET device and method of forming and monitoring quality of the same

Inspection systems for additive manufacturing systems

System and method for detecting defects on a specular surface with...

Super resolution for magneto-optical microscopy

Increasing signal-to-noise ratio in optical imaging of defects on u...

Detector

System, method and apparatus for polarization control

Simultaneous multi-directional laser wafer inspection

Wafer inspection apparatus

Surface defect measuring apparatus and method by microscopic scatte...

Sample surface polarization modification in interferometric defect...

Patents Applicationslast 30 patents

IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME

INSPECTION DEVICE AND INSPECTION METHOD

SPECTRAL ANGULAR METROLOGY

SYSTEM AND METHOD FOR USE OF POLARIZED LIGHT TO IMAGE TRANSPARENT M...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

SURFACE INSPECTION APPARATUS

Method and optical system for imaging optical defect

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

DARK-FIELD CONFOCAL MICROSCOPIC MEASUREMENT APPARATUS AND METHOD BA...

FLUORESCENCE MODE FOR WORKPIECE INSPECTION

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...

METHOD FOR INSPECTING FOR SURFACE DEFECTS ON A CAST PART MADE OF SI...

OPTICAL DEVICE

DEFECT INSPECTION DEVICE

MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...

A METHOD FOR QUALITY ASSESSMENT OF A FOOD PACKAGE AND A PACKAGING S...

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...

APPARATUS FOR INSPECTING SURFACE OF OBJECT

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORR...

METHOD AND SYSTEM FOR DETECTING A DEFECT ON A SEMI-REFLECTIVE FILM...

MARKING INSPECTION DEVICE AND MARKING DEVICE FOR TRANSPARENT EDIBLE...

INSPECTION CONDITION PRESENTATION APPARATUS, SURFACE INSPECTION APP...

OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...

Foreign Substance Detection Device and Detection Method

COMMUNICATION BETWEEN AN OPTICAL MEASURING DEVICE AND TWO MEASURING...