Polarisation of scatter light

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CPC
G01N2021/4792

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4792Polarisation of scatter light

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Patents Grantslast 30 patents

Information Patent Grant
Cooperative polarization skylight background radiation measurement...
- Patent number 12,135,277
- Issue date Nov 5, 2024
- Hefei Institutes of Physical Science, CAS
- Congming Dai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Apparatus and method for detecting smoke based on polarization
- Patent number 12,136,328
- Issue date Nov 5, 2024
- Electronics and Telecommunications Research Institute
- Hoe Sung Yang
- G08 - SIGNALLING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 12,017,278
- Issue date Jun 25, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 11,885,737
- Issue date Jan 30, 2024
- Nova Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Light source intensity control systems and methods for improved lig...
- Patent number 11,860,090
- Issue date Jan 2, 2024
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced hybrid systems and methods for characterizing stress in ch...
- Patent number 11,852,549
- Issue date Dec 26, 2023
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Display apparatus, image processing apparatus, and control method
- Patent number 11,694,659
- Issue date Jul 4, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Tatsushi Ohyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of additive man...
- Patent number 11,668,658
- Issue date Jun 6, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Chamberless smoke detector with indoor air quality detection and mo...
- Patent number 11,605,278
- Issue date Mar 14, 2023
- Carrier Corporation
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point detection system
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- Issue date Mar 7, 2023
- Carrier Corporation
- Alan Matthew Finn
- G08 - SIGNALLING
Information Patent Grant
Device for imaging 1-D nanomaterials
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- Issue date Jan 10, 2023
- Tsinghua University
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optimizing signal-to-noise ratio in optical imaging of defects on u...
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- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Yechiel Kapoano
- G02 - OPTICS
Information Patent Grant
Systems and methods for detecting thermodynamic phase of clouds wit...
- Patent number 11,499,911
- Issue date Nov 15, 2022
- Montana State University
- Joseph A. Shaw
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Information Patent Grant
Chamberless smoke detector with indoor air quality detection and mo...
- Patent number 11,295,594
- Issue date Apr 5, 2022
- Carrier Corporation
- David L. Lincoln
- G08 - SIGNALLING
Information Patent Grant
Polarization property image measurement device, and polarization pr...
- Patent number 11,268,900
- Issue date Mar 8, 2022
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- Takanori Kojima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Laser speckle micro-rheology in characterization of biomechanical p...
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- The General Hospital Corporation
- Seemantini K. Nadkarni
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Information Patent Grant
Defect inspection apparatus and defect inspection method
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- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Mid-infrared spectroscopy for measurement of high aspect ratio stru...
- Patent number 11,137,350
- Issue date Oct 5, 2021
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 11,105,754
- Issue date Aug 31, 2021
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Device for optically measuring doses of radiation absorbed by a gel...
- Patent number 11,099,278
- Issue date Aug 24, 2021
- Universite de Franche Comte
- Olivier Bleuse
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for characterizing high-scatter glass-based sam...
- Patent number 11,035,730
- Issue date Jun 15, 2021
- Corning Incorporated
- William John Furnas
- G01 - MEASURING TESTING
Information Patent Grant
Air scattering standard for light scattering based optical instrume...
- Patent number 11,016,024
- Issue date May 25, 2021
- KLA Corporation
- Frank Li
- G01 - MEASURING TESTING
Information Patent Grant
Sub-surface imaging of dielectric structures and voids via narrowba...
- Patent number 10,976,461
- Issue date Apr 13, 2021
- California Institute of Technology
- Darmindra D. Arumugam
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel coherent detection
- Patent number 10,921,247
- Issue date Feb 16, 2021
- The Johns Hopkins University
- Jeremiah J. Wathen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 10,876,959
- Issue date Dec 29, 2020
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for chamberless smoke detection and indoor air...
- Patent number 10,871,452
- Issue date Dec 22, 2020
- Kidde Technologies, Inc.
- David L. Lincoln
- G08 - SIGNALLING
Information Patent Grant
Systems and methods for chamberless smoke detection and indoor air...
- Patent number 10,852,233
- Issue date Dec 1, 2020
- Kidde Technologies, Inc.
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,830,706
- Issue date Nov 10, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having non-linear optics
- Patent number 10,809,193
- Issue date Oct 20, 2020
- ASML Netherlands B.V.
- Marinus Johannes Maria Van Dam
- G01 - MEASURING TESTING
Information Patent Grant
Integrated smoke detection device
- Patent number 10,741,035
- Issue date Aug 11, 2020
- ams AG
- Harald Etschmaier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20240337590
- Publication date Oct 10, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...
- Publication number 20240175812
- Publication date May 30, 2024
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTU...
- Publication number 20240159669
- Publication date May 16, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY
- Publication number 20240126058
- Publication date Apr 18, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Dongkyun Kang
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT AND CHARACTERIZATION METHOD
- Publication number 20230324311
- Publication date Oct 12, 2023
- University of Rochester
- Thomas G. BROWN
- G02 - OPTICS
Information Patent Application
INSPECTION DEVICE
- Publication number 20230288327
- Publication date Sep 14, 2023
- Mitsubishi Heavy Industries, Ltd.
- Syusaku Yamamoto
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Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20230258578
- Publication date Aug 17, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
COMBINATION SMOKE AND AIR QUALITY DETECTION
- Publication number 20230252872
- Publication date Aug 10, 2023
- Carrier Corporation
- Callum Bailey
- G08 - SIGNALLING
Information Patent Application
DETECTING PLANT PRODUCT PROPERTIES
- Publication number 20230236117
- Publication date Jul 27, 2023
- RUBENS IP PTY LTD
- Daniele PELLICCIA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING SMOKE BASED ON POLARIZATION
- Publication number 20230206741
- Publication date Jun 29, 2023
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Hoe Sung YANG
- G08 - SIGNALLING
Information Patent Application
LIGHT SOURCE INTENSITY CONTROL SYSTEMS AND METHODS FOR IMPROVED LIG...
- Publication number 20220317041
- Publication date Oct 6, 2022
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
CHAMBERLESS SMOKE DETECTOR WITH INDOOR AIR QUALITY DETECTION AND MO...
- Publication number 20220180721
- Publication date Jun 9, 2022
- Carrier Corporation
- David L. Lincoln
- G08 - SIGNALLING
Information Patent Application
INTERFEROMETRIC SCATTERING MICROSCOPY
- Publication number 20210381968
- Publication date Dec 9, 2021
- Korea University Research and Business Foundation
- Seok-Cheol HONG
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20210356408
- Publication date Nov 18, 2021
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
OPTIMIZING SIGNAL-TO-NOISE RATIO IN OPTICAL IMAGING OF DEFECTS ON U...
- Publication number 20210349019
- Publication date Nov 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yechiel Kapoano
- G01 - MEASURING TESTING
Information Patent Application
MULTI-POINT DETECTION SYSTEM
- Publication number 20210156800
- Publication date May 27, 2021
- Carrier Corporation
- Alan Matthew Finn
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20210116359
- Publication date Apr 22, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20210025829
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Air Scattering Standard for Light Scattering Based Optical Instrume...
- Publication number 20200264099
- Publication date Aug 20, 2020
- KLA-Tencor Corporation
- Frank Li
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20200256804
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
Mid-Infrared Spectroscopy For Measurement Of High Aspect Ratio Stru...
- Publication number 20200240907
- Publication date Jul 30, 2020
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICALLY MEASURING DOSES OF RADIATION ABSORBED BY A GEL...
- Publication number 20200233097
- Publication date Jul 23, 2020
- UNIVERSITE DE FRANCHE-COMTE
- Olivier BLEUSE
- G01 - MEASURING TESTING
Information Patent Application
CHAMBERLESS SMOKE DETECTOR WITH INDOOR AIR QUALITY DETECTION AND MO...
- Publication number 20200193790
- Publication date Jun 18, 2020
- Carrier Corporation
- David L. Lincoln
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SMOKE DETECTION DEVICE
- Publication number 20200184790
- Publication date Jun 11, 2020
- ams AG
- Harald Etschmaier
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CHARACTERIZING HIGH-SCATTER GLASS-BASED SAM...
- Publication number 20200132548
- Publication date Apr 30, 2020
- Corning Incorporated
- William John Furnas
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20200110025
- Publication date Apr 9, 2020
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Multi-Channel Coherent Detection
- Publication number 20200072746
- Publication date Mar 5, 2020
- The Johns Hopkins University
- Jeremiah J. Wathen
- G01 - MEASURING TESTING
Information Patent Application
Embedded Particle Depth Binning Based on Multiple Scattering Signals
- Publication number 20190383754
- Publication date Dec 19, 2019
- KLA-Tencor Corporation
- Haiping Zhang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING CLOUD PARAMETERS
- Publication number 20190383735
- Publication date Dec 19, 2019
- Rosemount Aerospace Inc.
- Mark Ray
- G01 - MEASURING TESTING

Polarisation of scatter light

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cooperative polarization skylight background radiation measurement...

Apparatus and method for detecting smoke based on polarization

Multi-parameter inspection apparatus for monitoring of manufacturin...

Method and system for optical characterization of patterned samples

Light source intensity control systems and methods for improved lig...

Enhanced hybrid systems and methods for characterizing stress in ch...

Display apparatus, image processing apparatus, and control method

Multi-parameter inspection apparatus for monitoring of additive man...

Chamberless smoke detector with indoor air quality detection and mo...

Multi-point detection system

Device for imaging 1-D nanomaterials

Optimizing signal-to-noise ratio in optical imaging of defects on u...

Systems and methods for detecting thermodynamic phase of clouds wit...

Chamberless smoke detector with indoor air quality detection and mo...

Polarization property image measurement device, and polarization pr...

Laser speckle micro-rheology in characterization of biomechanical p...

Defect inspection apparatus and defect inspection method

Mid-infrared spectroscopy for measurement of high aspect ratio stru...

Multi-parameter inspection apparatus for monitoring of manufacturin...

Device for optically measuring doses of radiation absorbed by a gel...

Systems and methods for characterizing high-scatter glass-based sam...

Air scattering standard for light scattering based optical instrume...

Sub-surface imaging of dielectric structures and voids via narrowba...

Multi-channel coherent detection

Method and system for optical characterization of patterned samples

Systems and methods for chamberless smoke detection and indoor air...

Systems and methods for chamberless smoke detection and indoor air...

Defect inspection apparatus and defect inspection method

Inspection apparatus having non-linear optics

Integrated smoke detection device

Patents Applicationslast 30 patents

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTU...

METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY

PHOTONIC INTEGRATED CIRCUIT AND CHARACTERIZATION METHOD

INSPECTION DEVICE

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

COMBINATION SMOKE AND AIR QUALITY DETECTION

DETECTING PLANT PRODUCT PROPERTIES

APPARATUS AND METHOD FOR DETECTING SMOKE BASED ON POLARIZATION

LIGHT SOURCE INTENSITY CONTROL SYSTEMS AND METHODS FOR IMPROVED LIG...

CHAMBERLESS SMOKE DETECTOR WITH INDOOR AIR QUALITY DETECTION AND MO...

INTERFEROMETRIC SCATTERING MICROSCOPY

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

OPTIMIZING SIGNAL-TO-NOISE RATIO IN OPTICAL IMAGING OF DEFECTS ON U...

MULTI-POINT DETECTION SYSTEM

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

Air Scattering Standard for Light Scattering Based Optical Instrume...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

Mid-Infrared Spectroscopy For Measurement Of High Aspect Ratio Stru...

DEVICE FOR OPTICALLY MEASURING DOSES OF RADIATION ABSORBED BY A GEL...

CHAMBERLESS SMOKE DETECTOR WITH INDOOR AIR QUALITY DETECTION AND MO...

INTEGRATED SMOKE DETECTION DEVICE

SYSTEMS AND METHODS FOR CHARACTERIZING HIGH-SCATTER GLASS-BASED SAM...

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

Multi-Channel Coherent Detection

Embedded Particle Depth Binning Based on Multiple Scattering Signals

SYSTEM AND METHOD FOR MEASURING CLOUD PARAMETERS