Polish

Industry

CPC
G05B2219/45199

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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/45199Polish

Industries

Patents Grantslast 30 patents

Information Patent Grant
Training spectrum generation for machine learning system for spectr...
- Patent number 12,020,159
- Issue date Jun 25, 2024
- Applied Materials, Inc.
- Benjamin Cherian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for automated mold polishing
- Patent number 11,806,834
- Issue date Nov 7, 2023
- Protolabs, Inc.
- Steven John Hauschulz
- B24 - GRINDING POLISHING
Information Patent Grant
Method for controlling the polishing of gemstones
- Patent number 11,673,228
- Issue date Jun 13, 2023
- OctoNus Finland OY
- Sergey Borisovich Sivovolenko
- B24 - GRINDING POLISHING
Information Patent Grant
Training spectrum generation for machine learning system for spectr...
- Patent number 11,651,207
- Issue date May 16, 2023
- Applied Materials, Inc.
- Benjamin Cherian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical device inspection or repair
- Patent number 11,574,182
- Issue date Feb 7, 2023
- APKUDO, INC.
- Josh Matthews
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training spectrum generation for machine learning system for spectr...
- Patent number 11,507,824
- Issue date Nov 22, 2022
- Applied Materials, Inc.
- Benjamin Cherian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of semiconductor manufacturing apparatus and non-transitory...
- Patent number 10,890,899
- Issue date Jan 12, 2021
- Ebara Corporation
- Ryuichiro Mitani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Part processing
- Patent number 10,571,891
- Issue date Feb 25, 2020
- Incodema3D, LLC
- Scott Volk
- B24 - GRINDING POLISHING
Information Patent Grant
Computer controlled work tool apparatus and method
- Patent number 10,289,096
- Issue date May 14, 2019
- Zeeko Limited
- David Walker
- B24 - GRINDING POLISHING
Information Patent Grant
Computer controlled work tool apparatus and method
- Patent number 9,952,585
- Issue date Apr 24, 2018
- Zeeko Limited
- David Walker
- B24 - GRINDING POLISHING
Information Patent Grant
Visual feedback for airfoil polishing
- Patent number 8,070,555
- Issue date Dec 6, 2011
- General Electric Company
- Douglas Carl Hofer
- B24 - GRINDING POLISHING
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,739,944
- Issue date May 25, 2004
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,488,566
- Issue date Dec 3, 2002
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,464,560
- Issue date Oct 15, 2002
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,464,561
- Issue date Oct 15, 2002
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,464,564
- Issue date Oct 15, 2002
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,338,667
- Issue date Jan 15, 2002
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,306,009
- Issue date Oct 23, 2001
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,261,151
- Issue date Jul 17, 2001
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 6,120,347
- Issue date Sep 19, 2000
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Polishing method and polishing apparatus using the same
- Patent number 6,093,081
- Issue date Jul 25, 2000
- Canon Kabushiki Kaisha
- Masaru Nyui
- G05 - CONTROLLING REGULATING
Information Patent Grant
Polishing apparatus having interlock function
- Patent number 5,904,608
- Issue date May 18, 1999
- Ebara Corporation
- Katsuhide Watanabe
- G05 - CONTROLLING REGULATING
Information Patent Grant
Polishing apparatus and polishing method
- Patent number 5,904,609
- Issue date May 18, 1999
- Fujitsu Limited
- Atsushi Fukuroda
- G05 - CONTROLLING REGULATING
Information Patent Grant
End point polishing apparatus and polishing method
- Patent number 5,876,265
- Issue date Mar 2, 1999
- Fujitsu Limited
- Tadayuki Kojima
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for real-time control of semiconductor wafer polishing
- Patent number 5,851,135
- Issue date Dec 22, 1998
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing inclu...
- Patent number 5,842,909
- Issue date Dec 1, 1998
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for real-time control of semiconductor wafer polishing inclu...
- Patent number 5,762,537
- Issue date Jun 9, 1998
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Controlling process modules using site models and monitor wafer con...
- Patent number 5,751,582
- Issue date May 12, 1998
- Texas Instruments Incorporated
- Sharad Saxena
- G05 - CONTROLLING REGULATING
Information Patent Grant
Working a natural or synthetic hard stone such as a gemstone
- Patent number 5,746,645
- Issue date May 5, 1998
- Gersan Establishment
- David William Beal
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
System for real-time control of semiconductor wafer polishing inclu...
- Patent number 5,730,642
- Issue date Mar 24, 1998
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Training Spectrum Generation for Machine Learning System for Spectr...
- Publication number 20230267329
- Publication date Aug 24, 2023
- Applied Materials, Inc.
- Benjamin Cherian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR AUTOMATED MOLD POLISHING
- Publication number 20230127208
- Publication date Apr 27, 2023
- Protolabs, Inc.
- Steven John Hauschulz
- B24 - GRINDING POLISHING
Information Patent Application
IMPROVED METHOD FOR CONTROLLING THE POLISHING OF GEMSTONES
- Publication number 20210129286
- Publication date May 6, 2021
- OctoNus Finland OY
- Sergey Borisovich SIVOVOLENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DEVICE INSPECTION OR REPAIR
- Publication number 20210019614
- Publication date Jan 21, 2021
- Apkudo LLC
- Jason HIHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Training Spectrum Generation for Machine Learning System for Spectr...
- Publication number 20200005140
- Publication date Jan 2, 2020
- Benjamin Cherian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN METHOD OF SEMICONDUCTOR MANUFACTURING APPARATUS AND NON-TRAN...
- Publication number 20190171193
- Publication date Jun 6, 2019
- EBARA CORPORATION
- Ryuichiro MITANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER CONTROLLED WORK TOOL APPARATUS AND METHOD
- Publication number 20180203432
- Publication date Jul 19, 2018
- Zeeko Limited
- David Walker
- B24 - GRINDING POLISHING
Information Patent Application
COMPUTER CONTROLLED WORK TOOL APPARATUS AND METHOD
- Publication number 20110190922
- Publication date Aug 4, 2011
- ZEEKO LIMITED
- David Walker
- G05 - CONTROLLING REGULATING
Information Patent Application
VISUAL FEEDBACK FOR AIRFOIL POLISHING
- Publication number 20100112899
- Publication date May 6, 2010
- GENERAL ELECTRIC COMPANY
- Douglas Carl Hofer
- G05 - CONTROLLING REGULATING
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20030073384
- Publication date Apr 17, 2003
- Gurtej S. Sandhu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20020034922
- Publication date Mar 21, 2002
- Gurtej S. Sandhu
- B24 - GRINDING POLISHING
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20020016131
- Publication date Feb 7, 2002
- Gurtej S. Sandhu
- B24 - GRINDING POLISHING
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20010041501
- Publication date Nov 15, 2001
- Gurtej S. Sandhu
- B24 - GRINDING POLISHING
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20010016466
- Publication date Aug 23, 2001
- Gurtej S. Sandhu
- B24 - GRINDING POLISHING
Information Patent Application
System for real-time control of semiconductor wafer polishing
- Publication number 20010001755
- Publication date May 24, 2001
- Gurtej S. Sandhu
- B24 - GRINDING POLISHING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Training spectrum generation for machine learning system for spectr...

Apparatus and method for automated mold polishing

Method for controlling the polishing of gemstones

Training spectrum generation for machine learning system for spectr...

Physical device inspection or repair

Training spectrum generation for machine learning system for spectr...

Method of semiconductor manufacturing apparatus and non-transitory...

Part processing

Computer controlled work tool apparatus and method

Computer controlled work tool apparatus and method

Visual feedback for airfoil polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

Polishing method and polishing apparatus using the same

Polishing apparatus having interlock function

Polishing apparatus and polishing method

End point polishing apparatus and polishing method

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing inclu...

System for real-time control of semiconductor wafer polishing inclu...

Controlling process modules using site models and monitor wafer con...

Working a natural or synthetic hard stone such as a gemstone

System for real-time control of semiconductor wafer polishing inclu...

Patents Applicationslast 30 patents

Training Spectrum Generation for Machine Learning System for Spectr...

APPARATUS AND METHOD FOR AUTOMATED MOLD POLISHING

IMPROVED METHOD FOR CONTROLLING THE POLISHING OF GEMSTONES

PHYSICAL DEVICE INSPECTION OR REPAIR

Training Spectrum Generation for Machine Learning System for Spectr...

DESIGN METHOD OF SEMICONDUCTOR MANUFACTURING APPARATUS AND NON-TRAN...

COMPUTER CONTROLLED WORK TOOL APPARATUS AND METHOD

COMPUTER CONTROLLED WORK TOOL APPARATUS AND METHOD

VISUAL FEEDBACK FOR AIRFOIL POLISHING

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing

System for real-time control of semiconductor wafer polishing