Polishing Etching

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CPC
G01N1/32

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N1/00Sampling Preparing specimens for investigation

Current Industry

G01N1/32Polishing Etching

Industries

Patents Grantslast 30 patents

Information Patent Grant
Photographing condition determining method for metal structure, pho...
- Patent number 12,106,466
- Issue date Oct 1, 2024
- JFE Steel Corporation
- Naoya Kiyokane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical calibration slide
- Patent number 12,085,703
- Issue date Sep 10, 2024
- Leica Biosystems Imaging, Inc.
- Yunlu Zou
- G02 - OPTICS
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH
Information Patent Grant
Perimeter trench formation and delineation etch delayering
- Patent number 12,040,196
- Issue date Jul 16, 2024
- FEI Company
- James Clarke
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for detecting coverage rate of intermetallic compound
- Patent number 12,031,920
- Issue date Jul 9, 2024
- Weifang Goertek Microelectronics Co., Ltd.
- Dingguo Zhong
- G01 - MEASURING TESTING
Information Patent Grant
Method of, and an apparatus for, rinsing materialographic samples
- Patent number 11,998,956
- Issue date Jun 4, 2024
- STRUERS APS
- Thomas Matschofsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planar grinder
- Patent number 12,000,764
- Issue date Jun 4, 2024
- Illinois Tool Works Inc.
- Kurt G. Adair
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device, analysis method, and storage medium
- Patent number 11,977,009
- Issue date May 7, 2024
- Honda Motor Co., Ltd.
- Atsushi Sakurai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for quantitatively evaluating surface roughness o...
- Patent number 11,965,734
- Issue date Apr 23, 2024
- NORTHEAST PETROLEUM UNIVERSITY
- Shansi Tian
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method of preparing and analyzing thin films
- Patent number 11,894,216
- Issue date Feb 6, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jing Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an index of quality of a weld in a formed obj...
- Patent number 11,860,082
- Issue date Jan 2, 2024
- Massachusetts Materials Technologies LLC
- Simon C. Bellemare
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent quantitative microscopic identification system and inte...
- Patent number 11,841,355
- Issue date Dec 12, 2023
- Yangtze University
- Yan Liu
- G01 - MEASURING TESTING
Information Patent Grant
Atom probe tomography specimen preparation
- Patent number 11,837,435
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring sample for evaluation of SiC single crystal
- Patent number 11,815,437
- Issue date Nov 14, 2023
- Resonac Corporation
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method, device and system for the treatment of biological cryogenic...
- Patent number 11,735,404
- Issue date Aug 22, 2023
- FEI Company
- Alex De Marco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die extraction method
- Patent number 11,686,765
- Issue date Jun 27, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for obtaining rock mechanical-geometric parameters and holog...
- Patent number 11,630,041
- Issue date Apr 18, 2023
- Tianjin University
- Gaofeng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Ion milling apparatus and sample holder
- Patent number 11,562,886
- Issue date Jan 24, 2023
- Jeol Ltd.
- Shogo Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automatic quantitative statistical distribution characte...
- Patent number 11,506,650
- Issue date Nov 22, 2022
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Dongling Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for preparing a sample for transmission electron microscopy
- Patent number 11,437,217
- Issue date Sep 6, 2022
- Imec VZW
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Classified characterization method for connectivity of organic matt...
- Patent number 11,360,037
- Issue date Jun 14, 2022
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Jianguo Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive geometry for optimal focused ion beam etching
- Patent number 11,315,754
- Issue date Apr 26, 2022
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
- Patent number 11,313,042
- Issue date Apr 26, 2022
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods and compositions for micro-electron diffraction
- Patent number 11,293,883
- Issue date Apr 5, 2022
- Howard Hughes Medical Institute
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Perimeter trench formation and delineation etch delayering
- Patent number 11,257,683
- Issue date Feb 22, 2022
- FEI Company
- James Clarke
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent system and method for preparing cryo-electron microscop...
- Patent number 11,231,349
- Issue date Jan 25, 2022
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Zhongming Du
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, ion milling apparatus, sample processing method, sam...
- Patent number 11,226,273
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Atsushi Kamino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 11,214,874
- Issue date Jan 4, 2022
- Techinsights Inc.
- Robert K. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Thin-sample-piece fabricating device and thin-sample-piece fabricat...
- Patent number 11,199,480
- Issue date Dec 14, 2021
- Hitachi High-Tech Science Corporation
- Ikuko Nakatani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR DETECTING DEFECTS IN A SINGLE CRYSTAL SILICON STRUCTURE
- Publication number 20240255438
- Publication date Aug 1, 2024
- GLOBALWAFERS CO., LTD.
- Armando Giannattasio
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE OF INVERTED LAMELLA FOR TALL ROI
- Publication number 20240249910
- Publication date Jul 25, 2024
- FEI Company
- Jaroslav Stárek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SCREENING THE OPTIMAL ZINC ION CONCENTRATION OF A PRIMAR...
- Publication number 20240183774
- Publication date Jun 6, 2024
- SANMEN NUCLEAR POWER CO., LTD.
- Tao HOU
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
- Publication number 20240183805
- Publication date Jun 6, 2024
- The Aerospace Corporation
- Rafael J. ZALDIVAR
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND ME...
- Publication number 20240085282
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Min Chul JO
- B24 - GRINDING POLISHING
Information Patent Application
COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...
- Publication number 20230420216
- Publication date Dec 28, 2023
- FEI Company
- Krishna Kanth NEELISETTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20230386783
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...
- Publication number 20230375445
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTITATIVE STATISTICAL CHARACTERIZATION METHOD OF MICRON-LEVEL SE...
- Publication number 20230184703
- Publication date Jun 15, 2023
- Central Iron & Steel Research Institute
- Dandan Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTOGRAPHING CONDITION DETERMINING METHOD FOR METAL STRUCTURE, PHO...
- Publication number 20230153976
- Publication date May 18, 2023
- JFE STEEL CORPORATION
- Naoya Kiyokane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM
- Publication number 20230067374
- Publication date Mar 2, 2023
- Honda Motor Co., Ltd.
- Atsushi Sakurai
- G01 - MEASURING TESTING
Information Patent Application
ARTIFICIAL INTELLIGENCE METHODS FOR CORRELATING LASER-INDUCED BREAK...
- Publication number 20230003655
- Publication date Jan 5, 2023
- NUTECH VENTURES
- Yongfeng Lu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING TRACE METALS IN SILICON
- Publication number 20220381761
- Publication date Dec 1, 2022
- Wacker Chemie AG
- Waltraud ASCHL
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARA...
- Publication number 20220349789
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Sascha Christian Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU MONITORING TO LABEL TRAINING SPECTRA FOR MACHINE LEARNING S...
- Publication number 20220283082
- Publication date Sep 8, 2022
- Applied Materials, Inc.
- Thomas Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING COVERAGE RATE OF INTERMETALLIC COMPOUND
- Publication number 20220236195
- Publication date Jul 28, 2022
- WEIFANG GOERTEK MICROELECTRONICS CO., LTD.
- Dingguo Zhong
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL END-POINTING FOR INTEGRATED CIRCUIT DELAYERING; SYSTEMS AND...
- Publication number 20220180505
- Publication date Jun 9, 2022
- Battelle Memorial Institute
- Jonathan Scholl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL CALIBRATION SLIDE
- Publication number 20220155578
- Publication date May 19, 2022
- Leica Biosystems Imaging, Inc.
- Yunlu Zou
- G02 - OPTICS
Information Patent Application
INTELLIGENT QUANTITATIVE MICROSCOPIC IDENTIFICATION SYSTEM AND INTE...
- Publication number 20220146487
- Publication date May 12, 2022
- Yan LIU
- G01 - MEASURING TESTING
Information Patent Application
PERIMETER TRENCH FORMATION AND DELINEATION ETCH DELAYERING
- Publication number 20220139722
- Publication date May 5, 2022
- FEI Company
- James Clarke
- G11 - INFORMATION STORAGE
Information Patent Application
DIE EXTRACTION METHOD
- Publication number 20220128627
- Publication date Apr 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Kun WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR QUANTITATIVELY EVALUATING SURFACE ROUGHNESS O...
- Publication number 20220057199
- Publication date Feb 24, 2022
- Northeast Petroleum University
- Shansi Tian
- G01 - MEASURING TESTING
Information Patent Application
Ion Milling Apparatus and Sample Holder
- Publication number 20220051870
- Publication date Feb 17, 2022
- JEOL Ltd.
- Shogo Kataoka
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING DEFECT IN MONOCLINIC GALLIUM OXIDE
- Publication number 20220050062
- Publication date Feb 17, 2022
- THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC)
- Soon-Ku HONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND ANALYZING THIN FILMS
- Publication number 20220028655
- Publication date Jan 27, 2022
- Yangtze Memory Technologies Co., Ltd.
- Jing LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...
- Publication number 20220005669
- Publication date Jan 6, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
Method for Preparing a Sample for Transmission Electron Microscopy
- Publication number 20210391144
- Publication date Dec 16, 2021
- IMEC vzw
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
- Publication number 20210335571
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INVERSION IDENTIFICATION METHOD OF CRYSTAL PLASTICITY MATERIAL PARA...
- Publication number 20210310917
- Publication date Oct 7, 2021
- DALIAN UNIVERSITY OF TECHNOLOGY
- Wei JIANG
- G01 - MEASURING TESTING
Information Patent Application
Hydrogen Analysis System
- Publication number 20210293694
- Publication date Sep 23, 2021
- Nippon Telegraph and Telephone Corporation
- Yosuke Takeuchi
- G01 - MEASURING TESTING

Polishing Etching

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Photographing condition determining method for metal structure, pho...

Physical calibration slide

Method for evaluating defect in monoclinic gallium oxide

Perimeter trench formation and delineation etch delayering

Method for detecting coverage rate of intermetallic compound

Method of, and an apparatus for, rinsing materialographic samples

Planar grinder

Analysis device, analysis method, and storage medium

Method and system for quantitatively evaluating surface roughness o...

Method of preparing and analyzing thin films

Method of determining an index of quality of a weld in a formed obj...

Intelligent quantitative microscopic identification system and inte...

Atom probe tomography specimen preparation

Method of acquiring sample for evaluation of SiC single crystal

Method of material deposition

Method, device and system for the treatment of biological cryogenic...

Die extraction method

Method for obtaining rock mechanical-geometric parameters and holog...

Ion milling apparatus and sample holder

Method for automatic quantitative statistical distribution characte...

Method for preparing a sample for transmission electron microscopy

Classified characterization method for connectivity of organic matt...

Adaptive geometry for optimal focused ion beam etching

Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...

Methods and compositions for micro-electron diffraction

Perimeter trench formation and delineation etch delayering

Intelligent system and method for preparing cryo-electron microscop...

Sample holder, ion milling apparatus, sample processing method, sam...

Method and system for ion beam delayering of a sample and control t...

Thin-sample-piece fabricating device and thin-sample-piece fabricat...

Patents Applicationslast 30 patents

METHODS FOR DETECTING DEFECTS IN A SINGLE CRYSTAL SILICON STRUCTURE

SUPPORT STRUCTURE OF INVERTED LAMELLA FOR TALL ROI

METHOD FOR SCREENING THE OPTIMAL ZINC ION CONCENTRATION OF A PRIMAR...

QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...

APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND ME...

COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...

QUANTITATIVE STATISTICAL CHARACTERIZATION METHOD OF MICRON-LEVEL SE...

PHOTOGRAPHING CONDITION DETERMINING METHOD FOR METAL STRUCTURE, PHO...

ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM

ARTIFICIAL INTELLIGENCE METHODS FOR CORRELATING LASER-INDUCED BREAK...

METHOD FOR DETERMINING TRACE METALS IN SILICON

METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARA...

IN-SITU MONITORING TO LABEL TRAINING SPECTRA FOR MACHINE LEARNING S...

METHOD FOR DETECTING COVERAGE RATE OF INTERMETALLIC COMPOUND

OPTICAL END-POINTING FOR INTEGRATED CIRCUIT DELAYERING; SYSTEMS AND...

PHYSICAL CALIBRATION SLIDE

INTELLIGENT QUANTITATIVE MICROSCOPIC IDENTIFICATION SYSTEM AND INTE...

PERIMETER TRENCH FORMATION AND DELINEATION ETCH DELAYERING

DIE EXTRACTION METHOD

METHOD AND SYSTEM FOR QUANTITATIVELY EVALUATING SURFACE ROUGHNESS O...

Ion Milling Apparatus and Sample Holder

METHOD FOR EVALUATING DEFECT IN MONOCLINIC GALLIUM OXIDE

METHOD OF PREPARING AND ANALYZING THIN FILMS

ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...

Method for Preparing a Sample for Transmission Electron Microscopy

ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING

INVERSION IDENTIFICATION METHOD OF CRYSTAL PLASTICITY MATERIAL PARA...

Hydrogen Analysis System