Predict workpiece measurements from measurements of previous workpieces

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CPC
G05B2219/32075

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32075Predict workpiece measurements from measurements of previous workpieces

Industries

Patents Grantslast 30 patents

Information Patent Grant
Data management and mining to correlate wafer alignment, design, de...
- Patent number 11,088,039
- Issue date Aug 10, 2021
- Applied Materials, Inc.
- Raman K. Nurani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Product quality prediction method for mass customization
- Patent number 10,345,794
- Issue date Jul 9, 2019
- National Cheng Kung University
- Chun-Fang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Continuous prediction of expected chip performance throughout the p...
- Patent number 8,793,106
- Issue date Jul 29, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated model building and batch model building for a manufacturi...
- Patent number 8,494,798
- Issue date Jul 23, 2013
- MKS Instruments, Inc.
- Nouna Kettaneh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Management system of semiconductor fabrication apparatus, abnormali...
- Patent number 7,742,834
- Issue date Jun 22, 2010
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for performing process visualization
- Patent number 7,738,978
- Issue date Jun 15, 2010
- The MathWorks, Inc.
- Rajiv Singh
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Data representation relating to a non-sampled workpiece
- Patent number 7,236,848
- Issue date Jun 26, 2007
- Advanced Micro Devices, Inc.
- Steven P. Reeves
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for performing process visualization
- Patent number 7,010,364
- Issue date Mar 7, 2006
- The MathWorks, Inc.
- Rajiv Singh
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Process control based upon a metrology delay
- Patent number 6,834,213
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
PRODUCT QUALITY PREDICTION METHOD FOR MASS CUSTOMIZATION
- Publication number 20180188717
- Publication date Jul 5, 2018
- National Cheng Kung University
- Chun-Fang CHEN
- G05 - CONTROLLING REGULATING
Information Patent Application
CONTINUOUS PREDICTION OF EXPECTED CHIP PERFORMANCE THROUHOUT THE PR...
- Publication number 20130080125
- Publication date Mar 28, 2013
- International Business Machines Corporation
- Robert J. Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED MODEL BUILDING AND BATCH MODEL BUILDING FOR A MANUFACTURI...
- Publication number 20100057237
- Publication date Mar 4, 2010
- MKS Instruments, Inc.
- Nouna KETTANEH
- G05 - CONTROLLING REGULATING
Information Patent Application
Management system of semiconductor fabrication apparatus, abnormali...
- Publication number 20070276528
- Publication date Nov 29, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Data representation relating to a non-sampled workpiece
- Publication number 20070061032
- Publication date Mar 15, 2007
- Steven P. Reeves
- G05 - CONTROLLING REGULATING
Information Patent Application
System and method for performing process visualization
- Publication number 20060212145
- Publication date Sep 21, 2006
- The MathWorks, Inc.
- Rajiv Singh
- G05 - CONTROLLING REGULATING

Predict workpiece measurements from measurements of previous workpieces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Data management and mining to correlate wafer alignment, design, de...

Product quality prediction method for mass customization

Continuous prediction of expected chip performance throughout the p...

Automated model building and batch model building for a manufacturi...

Management system of semiconductor fabrication apparatus, abnormali...

System and method for performing process visualization

Data representation relating to a non-sampled workpiece

System and method for performing process visualization

Process control based upon a metrology delay

Patents Applicationslast 30 patents

PRODUCT QUALITY PREDICTION METHOD FOR MASS CUSTOMIZATION

CONTINUOUS PREDICTION OF EXPECTED CHIP PERFORMANCE THROUHOUT THE PR...

AUTOMATED MODEL BUILDING AND BATCH MODEL BUILDING FOR A MANUFACTURI...

Management system of semiconductor fabrication apparatus, abnormali...

Data representation relating to a non-sampled workpiece

System and method for performing process visualization