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CPC
G05B2219/35199
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Parent Industries
G
PHYSICS
G05
Controlling systems
G05B
CONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
G05B2219/00
Program-control systems
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G05B2219/35199
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic manufacturing evaluation method and system
Patent number
6,223,092
Issue date
Apr 24, 2001
Hitachi, Ltd.
Seii Miyakawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of evaluating easiness of works and processings performed on...
Patent number
5,907,488
Issue date
May 25, 1999
Hitachi, Ltd.
Syoji Arimoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic manufacturability evaluation method and system
Patent number
5,717,598
Issue date
Feb 10, 1998
Hitachi, Ltd.
Seii Miyakawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of evaluating easiness of works and processings performed on...
Patent number
5,586,022
Issue date
Dec 17, 1996
Hitachi, Ltd.
Syoji Arimoto
G06 - COMPUTING CALCULATING COUNTING