Processing using lane subdivision

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G01N2021/8912

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/8912Processing using lane subdivision

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Patents Grantslast 30 patents

Information Patent Grant
Area scan camera system for detecting streaks and scratches
- Patent number 5,118,195
- Issue date Jun 2, 1992
- RKB Opto-Electrics, Inc.
- William Dobbie
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring the period of surface defects
- Patent number 4,982,600
- Issue date Jan 8, 1991
- Fuji Photo Film Co., Ltd.
- Takeshi Kiso
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspecting apparatus with strip width dividing means
- Patent number 4,982,105
- Issue date Jan 1, 1991
- Fuji Photo Film Co., Ltd.
- Ippei Takahashi
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Surface inspecting apparatus
- Patent number 4,868,403
- Issue date Sep 19, 1989
- Fuji Photo Film Co., Ltd.
- Ippei Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning a web material in the direction o...
- Patent number 4,791,304
- Issue date Dec 13, 1988
- Fuji Photo Film Co., Ltd.
- Akihisa Iida
- G01 - MEASURING TESTING
Information Patent Grant
Data compression interface having parallel memory architecture
- Patent number 4,546,444
- Issue date Oct 8, 1985
- E. I. Du Pont de Nemours and Company
- David C. Bullis
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents