Proximity analysis, local statistics

Industry

CPC
G01N2021/8877

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8877Proximity analysis, local statistics

Industries

Patents Grantslast 30 patents

Information Patent Grant
Processing method and processing device
- Patent number 12,085,512
- Issue date Sep 10, 2024
- Lenovo (Beijing) Limited
- Wei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identification of defect types in liquid pipelines for classificati...
- Patent number 11,790,518
- Issue date Oct 17, 2023
- TATA Consultancy Services Limited
- Jayavardhana Rama Gubbi Lakshminarasimha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing condition determination system and processing condition...
- Patent number 11,609,188
- Issue date Mar 21, 2023
- Hitachi, Ltd.
- Hyakka Nakada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Baffles for three-dimensional sensors having spherical fields of view
- Patent number 11,475,584
- Issue date Oct 18, 2022
- MAGIK EYE INC.
- Akiteru Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent defect identification system
- Patent number 11,320,385
- Issue date May 3, 2022
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Strain measurement method and strain measurement apparatus
- Patent number 11,204,240
- Issue date Dec 21, 2021
- Industrial Technology Research Institute
- I-Hung Chiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interactive semi-automated borescope video analysis and damage asse...
- Patent number 10,878,556
- Issue date Dec 29, 2020
- United Technologies Corporation
- Paul D. Hestand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 10,018,572
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for self-performing a cosmetic evaluation of an e...
- Patent number 10,007,934
- Issue date Jun 26, 2018
- Greystone Data Technology, Inc.
- Tu Nguyen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and arrangement for analyzing a semiconductor element and me...
- Patent number 9,991,177
- Issue date Jun 5, 2018
- AMS AG
- Helene Gehles
- G02 - OPTICS
Information Patent Grant
Method and arrangement for analyzing a semiconductor element and me...
- Patent number 9,852,955
- Issue date Dec 26, 2017
- AMS AG
- Helene Gehles
- G02 - OPTICS
Information Patent Grant
Systems and methods for statistical measurement control of spectrop...
- Patent number 9,606,055
- Issue date Mar 28, 2017
- PPG Industries Ohio, Inc.
- Alison M. Norris
- G01 - MEASURING TESTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,528,942
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scattered light measurement system
- Patent number 9,518,930
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,488,591
- Issue date Nov 8, 2016
- Uster Technologies AG
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,110,033
- Issue date Aug 18, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
System with multiple scattered light collectors
- Patent number 9,103,800
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Back quartersphere scattered light analysis
- Patent number 8,553,215
- Issue date Oct 8, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using scattered light
- Patent number 8,537,350
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a workpiece surface using multi...
- Patent number 8,497,984
- Issue date Jul 30, 2013
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Back quartersphere scattered light analysis
- Patent number 8,330,947
- Issue date Dec 11, 2012
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Automatic identification of systematic repeating defects in semicon...
- Patent number 8,312,395
- Issue date Nov 13, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Paul Kuang Chi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using polarization of scattered light
- Patent number 8,059,268
- Issue date Nov 15, 2011
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling a beam source in a workpiece surf...
- Patent number 7,839,495
- Issue date Nov 23, 2010
- KLA-Tencor Corporation
- Bruce Baran
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling light scattered from a workpiece...
- Patent number 7,659,974
- Issue date Feb 9, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a workpiece surface using polariza...
- Patent number 7,623,227
- Issue date Nov 24, 2009
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a workpiece surface by analyzing s...
- Patent number 7,605,913
- Issue date Oct 20, 2009
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling a beam source in a workpiece surf...
- Patent number 7,557,910
- Issue date Jul 7, 2009
- KLA-Tencor Corporation
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for signal processing for a workpiece surface ins...
- Patent number 7,505,125
- Issue date Mar 17, 2009
- KLA-Tencor Corporation
- Scott Andrews
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...
- Publication number 20240219311
- Publication date Jul 4, 2024
- TSINGHUA UNIVERSITY
- Songling Huang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
- Publication number 20240183793
- Publication date Jun 6, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Jeffry NAINGGOLAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
- Publication number 20240110878
- Publication date Apr 4, 2024
- Chevron U.S.A. Inc.
- Nikolaos Ioannis Salmatanis
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD AND PROCESSING DEVICE
- Publication number 20230093531
- Publication date Mar 23, 2023
- Lenovo (Beijing) Limited
- Wei LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...
- Publication number 20230081098
- Publication date Mar 16, 2023
- NEC Corporation
- Chisato SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT MONITORING SYSTEM
- Publication number 20220373473
- Publication date Nov 24, 2022
- NOVI LLC
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
- Publication number 20220283099
- Publication date Sep 8, 2022
- TOP TECHNOLOGY PLATFORM CO., LTD.
- Chyuan-Ruey LIN
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION OF DEFECT TYPES IN LIQUID PIPELINES FOR CLASSIFICATI...
- Publication number 20220036541
- Publication date Feb 3, 2022
- TATA CONSULTANCY SERVICES LIMITED
- Jayavardhana Rama Gubbi Lakshminarasimha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING CONDITION DETERMINATION SYSTEM AND PROCESSING CONDITION...
- Publication number 20210372943
- Publication date Dec 2, 2021
- Hitachi, Ltd
- Hyakka Nakada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRAIN MEASUREMENT METHOD AND STRAIN MEASUREMENT APPARATUS
- Publication number 20210356403
- Publication date Nov 18, 2021
- Industrial Technology Research Institute
- I-Hung Chiang
- G01 - MEASURING TESTING
Information Patent Application
INTELLIGENT DEFECT IDENTIFICATION SYSTEM
- Publication number 20200116650
- Publication date Apr 16, 2020
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERACTIVE SEMI-AUTOMATED BORESCOPE VIDEO ANALYSIS AND DAMAGE ASSE...
- Publication number 20190228514
- Publication date Jul 25, 2019
- United Technologies Corporation
- Paul D. Hestand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ARRANGEMENT FOR ANALYZING A SEMICONDUCTOR ELEMENT AND ME...
- Publication number 20180090393
- Publication date Mar 29, 2018
- ams AG
- Helene GEHLES
- G02 - OPTICS
Information Patent Application
System and Method for Self-Performing a Cosmetic Evaluation of an E...
- Publication number 20160225036
- Publication date Aug 4, 2016
- GDT, INC.
- Tu Nguyen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR STATISTICAL MEASUREMENT CONTROL OF SPECTROP...
- Publication number 20140195189
- Publication date Jul 10, 2014
- PPG INDUSTRIES OHIO, INC.
- Alison M. Norris
- G01 - MEASURING TESTING
Information Patent Application
System With Polarized Scattered Light
- Publication number 20130342833
- Publication date Dec 26, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
System With Multiple Scattered Light Collectors
- Publication number 20130335733
- Publication date Dec 19, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20130094023
- Publication date Apr 18, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC IDENTIFICATION OF SYSTEMATIC REPEATING DEFECTS IN SEMICON...
- Publication number 20120023464
- Publication date Jan 26, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Paul Kuang Chi Lin
- G01 - MEASURING TESTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20120013898
- Publication date Jan 19, 2012
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20100265518
- Publication date Oct 21, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Controlling a Beam Source in a Workpiece Surf...
- Publication number 20100149527
- Publication date Jun 17, 2010
- KLA-Tencor Corporation
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Front Quartersphere Scattered Light Analysis
- Publication number 20100110419
- Publication date May 6, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20100110420
- Publication date May 6, 2010
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING LIGHT SCATTERED FROM A WORKPIECE...
- Publication number 20080304057
- Publication date Dec 11, 2008
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for controlling a beam source in a workpiece surf...
- Publication number 20070252977
- Publication date Nov 1, 2007
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS, LAMINATION APPARATUS, AND INSPECTION METHOD
- Publication number 20070223802
- Publication date Sep 27, 2007
- FUJITSU LIMITED
- Hayato Tateda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
System and method for inspecting a workpiece surface by analyzing s...
- Publication number 20070024998
- Publication date Feb 1, 2007
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspection of a workpiece surface using multi...
- Publication number 20060256326
- Publication date Nov 16, 2006
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface using surface...
- Publication number 20060197945
- Publication date Sep 7, 2006
- Thimothy R. Tiemeyer
- G06 - COMPUTING CALCULATING COUNTING

Proximity analysis, local statistics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Processing method and processing device

Data processing method and system for detection of deterioration of...

Identification of defect types in liquid pipelines for classificati...

Processing condition determination system and processing condition...

Baffles for three-dimensional sensors having spherical fields of view

Intelligent defect identification system

Strain measurement method and strain measurement apparatus

Interactive semi-automated borescope video analysis and damage asse...

Front quartersphere scattered light analysis

System and method for self-performing a cosmetic evaluation of an e...

Method and arrangement for analyzing a semiconductor element and me...

Method and arrangement for analyzing a semiconductor element and me...

Systems and methods for statistical measurement control of spectrop...

Front quartersphere scattered light analysis

Scattered light measurement system

Front quartersphere scattered light analysis

Front quartersphere scattered light analysis

System with multiple scattered light collectors

Back quartersphere scattered light analysis

Inspecting a workpiece using scattered light

System and method for inspection of a workpiece surface using multi...

Back quartersphere scattered light analysis

Automatic identification of systematic repeating defects in semicon...

Inspecting a workpiece using polarization of scattered light

System and method for controlling a beam source in a workpiece surf...

System and method for controlling light scattered from a workpiece...

System and method for inspecting a workpiece surface using polariza...

System and method for inspecting a workpiece surface by analyzing s...

System and method for controlling a beam source in a workpiece surf...

System and method for signal processing for a workpiece surface ins...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...

INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM

INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS

PROCESSING METHOD AND PROCESSING DEVICE

DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...

SURFACE DEFECT MONITORING SYSTEM

DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...

IDENTIFICATION OF DEFECT TYPES IN LIQUID PIPELINES FOR CLASSIFICATI...

PROCESSING CONDITION DETERMINATION SYSTEM AND PROCESSING CONDITION...

STRAIN MEASUREMENT METHOD AND STRAIN MEASUREMENT APPARATUS

INTELLIGENT DEFECT IDENTIFICATION SYSTEM

INTERACTIVE SEMI-AUTOMATED BORESCOPE VIDEO ANALYSIS AND DAMAGE ASSE...

METHOD AND ARRANGEMENT FOR ANALYZING A SEMICONDUCTOR ELEMENT AND ME...

System and Method for Self-Performing a Cosmetic Evaluation of an E...

SYSTEMS AND METHODS FOR STATISTICAL MEASUREMENT CONTROL OF SPECTROP...

System With Polarized Scattered Light

System With Multiple Scattered Light Collectors

Back Quartersphere Scattered Light Analysis

AUTOMATIC IDENTIFICATION OF SYSTEMATIC REPEATING DEFECTS IN SEMICON...

Inspecting a Workpiece Using Polarization of Scattered Light

Back Quartersphere Scattered Light Analysis

System and Method for Controlling a Beam Source in a Workpiece Surf...

Front Quartersphere Scattered Light Analysis

Inspecting a Workpiece Using Polarization of Scattered Light

SYSTEM AND METHOD FOR CONTROLLING LIGHT SCATTERED FROM A WORKPIECE...

System and method for controlling a beam source in a workpiece surf...

INSPECTION APPARATUS, LAMINATION APPARATUS, AND INSPECTION METHOD

System and method for inspecting a workpiece surface by analyzing s...

System and method for inspection of a workpiece surface using multi...

System and method for inspecting a workpiece surface using surface...