Quality control, monitor production tool with multiple sensors

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CPC
G05B2219/32179

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32179Quality control, monitor production tool with multiple sensors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Wafer-like sensor
- Patent number 12,074,044
- Issue date Aug 27, 2024
- CyberOptics Corporation
- Felix J. Schuda
- B32 - LAYERED PRODUCTS
Information Patent Grant
Anomaly detection method and system for manufacturing processes
- Patent number 11,984,334
- Issue date May 14, 2024
- Accenture Global Solutions Limited
- Makoto Murai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Part, sensor, and metrology data integration
- Patent number 11,853,042
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Industrial monitoring system device dislodgement detection
- Patent number 11,656,605
- Issue date May 23, 2023
- Amazon Technologies, Inc.
- David Manley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device, production facility monitoring metho...
- Patent number 11,650,579
- Issue date May 16, 2023
- Fujitsu Limited
- Kazunori Maruyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device for at least one industrial automated process
- Patent number 11,618,634
- Issue date Apr 4, 2023
- Windmöller & Hölscher KG
- Torsten Schmitz
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Real-time anomaly detection and classification during semiconductor...
- Patent number 11,556,117
- Issue date Jan 17, 2023
- Applied Materials, Inc.
- Shahab Arabshahi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Production management system, production management apparatus and p...
- Patent number 11,386,363
- Issue date Jul 12, 2022
- I SMART TECHNOLOGIES CORPORATION
- Tetsuya Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for eliminating process anomalies
- Patent number 11,307,557
- Issue date Apr 19, 2022
- CELONIS SE
- Alexander Rinke
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and devices and system for winding and unwinding a reel
- Patent number 11,148,894
- Issue date Oct 19, 2021
- Windmöller & Hölscher KG
- Uwe Köhn
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Motor drive, production system and method thereof with quality meas...
- Patent number 11,054,803
- Issue date Jul 6, 2021
- Delta Electronics, Inc.
- Ching-Hsiung Tsai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Can production tool, process for controlling can weight, cost, and...
- Patent number 11,007,562
- Issue date May 18, 2021
- INTEGRATED PACKAGING SOLUTIONS, LLC
- Kevin Michael Gillest
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for monitoring a manufacturing plant
- Patent number 10,962,954
- Issue date Mar 30, 2021
- Robert Bosch GmbH
- Ruobing Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method, computer program product and system for detecting manufactu...
- Patent number 10,957,567
- Issue date Mar 23, 2021
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extracting overall equipment effectiveness by analysis of a vibro-a...
- Patent number 10,916,259
- Issue date Feb 9, 2021
- 3D SIGNALS LTD.
- Gideon Genadi Kogan
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Facility state determination device, facility state determination m...
- Patent number 10,908,595
- Issue date Feb 2, 2021
- Hitachi, Ltd.
- Yuichi Sakurai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Production process analysis method
- Patent number 10,902,530
- Issue date Jan 26, 2021
- Mitsubishi Chemical Engineering Corp.
- Kouji Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing process analysis method
- Patent number 10,901,405
- Issue date Jan 26, 2021
- Mitsubishi Chemical Engineering Corp.
- Kouji Kawano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic apparatus, diagnostic system, diagnostic method, and rec...
- Patent number 10,739,764
- Issue date Aug 11, 2020
- Ricoh Company, Ltd.
- Yasunobu Shirata
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent processing modulation system and method
- Patent number 10,691,116
- Issue date Jun 23, 2020
- Chi-Hung Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Production management system, production management apparatus and p...
- Patent number 10,528,898
- Issue date Jan 7, 2020
- i Smart Technologies Corporation
- Tetsuya Kimura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Operation support system, operation support device, and operation s...
- Patent number 10,514,686
- Issue date Dec 24, 2019
- Yokogawa Electric Corporation
- Yoshio Uomori
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for assuring and improving process quality
- Patent number 10,372,117
- Issue date Aug 6, 2019
- Toyota Motor Europe NV/SA
- Andrew Willett
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for controlling the quality of a tyre production and plant f...
- Patent number 10,369,758
- Issue date Aug 6, 2019
- Pirelli Tyre S.p.A.
- Vincenzo Boffa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Information processing apparatus, control method thereof, informati...
- Patent number 10,234,844
- Issue date Mar 19, 2019
- Canon Kabushiki Kaisha
- Keisuke Tateno
- G05 - CONTROLLING REGULATING
Information Patent Grant
Modular system for real-time evaluation and monitoring of a machini...
- Patent number 10,101,735
- Issue date Oct 16, 2018
- Matitiahu Tiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of controlling a manufacturing process for a mi...
- Patent number 9,995,692
- Issue date Jun 12, 2018
- GLOBALFOUNDRIES, INC.
- Givantha Iddawela
- G05 - CONTROLLING REGULATING
Information Patent Grant
Part inspection system and method
- Patent number 9,983,566
- Issue date May 29, 2018
- The Boeing Company
- Brenda C. Gross
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for equipment monitoring using a group candidate...
- Patent number 9,915,932
- Issue date Mar 13, 2018
- Applied Materials, Inc.
- Paul Alexander Llanos
- G05 - CONTROLLING REGULATING
Information Patent Grant
Bi-directional association and graphical acquisition of time-based...
- Patent number 9,915,940
- Issue date Mar 13, 2018
- Applied Materials, LLC
- Brad Schulze
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
A FOOD PROCESSING LINE AND METHOD FOR CONTROLLING A FOOD PROCESSING...
- Publication number 20240122216
- Publication date Apr 18, 2024
- MAREL FURTHER PROCESSING B.V.
- Hendrikus Cornelis Koos VAN DOORN
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Application
ABNORMALITY SYMPTOM ANALYZING DEVICE
- Publication number 20230185289
- Publication date Jun 15, 2023
- MITSUBISHI ELECTRIC CORPORATION
- Kotaro SANAI
- G05 - CONTROLLING REGULATING
Information Patent Application
PART, SENSOR, AND METROLOGY DATA INTEGRATION
- Publication number 20220260978
- Publication date Aug 18, 2022
- Applied Materials, Inc.
- Garrett Ho-Yee Sin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RTU ADDON
- Publication number 20210232117
- Publication date Jul 29, 2021
- Maarten Van Laere
- G05 - CONTROLLING REGULATING
Information Patent Application
QUALITY MONITORING OF INDUSTRIAL PROCESSES
- Publication number 20210232126
- Publication date Jul 29, 2021
- GESTAMP SERVICIOS, S.A.
- Bernhard FEYO GEBHARD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RISK-BASED REGULATORY PROCESS MONITORING AND CONTROL
- Publication number 20210096552
- Publication date Apr 1, 2021
- HONEYWELL INTERNATIONAL INC.
- Sivanarayana Onteddu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR ELIMINATING PROCESS ANOMALIES
- Publication number 20210041849
- Publication date Feb 11, 2021
- Celonis SE
- Alexander RINKE
- G05 - CONTROLLING REGULATING
Information Patent Application
WAFER-LIKE SENSOR
- Publication number 20200152494
- Publication date May 14, 2020
- CyberOptics Corporation
- Felix J. Schuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING A PRODUCTION PROCESS, METHOD FOR INDIRECTLY D...
- Publication number 20200047391
- Publication date Feb 13, 2020
- Reifenhauser GmbH & Co. KG Maschinenfabrik
- Christoph Lettowsky
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
PRODUCTION SYSTEM WITH QUALITY MEASURING FUNCTION AND MECHANISM DIA...
- Publication number 20200019137
- Publication date Jan 16, 2020
- Delta Electronics, Inc.
- Ching-Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...
- Publication number 20190384268
- Publication date Dec 19, 2019
- Hitachi, Ltd.
- Yuichi SAKURAI
- G05 - CONTROLLING REGULATING
Information Patent Application
PRODUCTION PROCESS ANALYSIS METHOD
- Publication number 20190304037
- Publication date Oct 3, 2019
- Mitsubishi Chemical Engineering Corporation
- Kouji KAWANO
- G05 - CONTROLLING REGULATING
Information Patent Application
System and Method for Monitoring a Manufacturing Plant
- Publication number 20190227520
- Publication date Jul 25, 2019
- ROBERT BOSCH GmbH
- Ruobing Chen
- G05 - CONTROLLING REGULATING
Information Patent Application
MANUFACTURING PROCESS ANALYSIS METHOD
- Publication number 20190129402
- Publication date May 2, 2019
- Mitsubishi Chemical Engineering Corporation
- Kouji KAWANO
- G05 - CONTROLLING REGULATING
Information Patent Application
Device for at Least One Industrial Automated Process
- Publication number 20190100381
- Publication date Apr 4, 2019
- WINDMOLLER & HOLSCHER KG
- Torsten Schmitz
- G05 - CONTROLLING REGULATING
Information Patent Application
PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT APPARATUS AND P...
- Publication number 20180053124
- Publication date Feb 22, 2018
- i Smart Technologies Corporation
- Tetsuya Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSTIC APPARATUS, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND REC...
- Publication number 20180017960
- Publication date Jan 18, 2018
- RICOH COMPANY, LTD.
- Yasunobu Shirata
- G01 - MEASURING TESTING
Information Patent Application
Part Inspection System and Method
- Publication number 20170160719
- Publication date Jun 8, 2017
- The Boeing Company
- Brenda C. Gross
- G05 - CONTROLLING REGULATING
Information Patent Application
OPERATION SUPPORT SYSTEM, OPERATION SUPPORT DEVICE, AND OPERATION S...
- Publication number 20170090466
- Publication date Mar 30, 2017
- YOKOGAWA ELECTRIC CORPORATION
- Yoshio UOMORI
- G05 - CONTROLLING REGULATING
Information Patent Application
Continuous improvement procedure aimed to signal, monitor and termi...
- Publication number 20160231736
- Publication date Aug 11, 2016
- Raul Olalla
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR ASSURING AND IMPROVING PROCESS QUALITY
- Publication number 20160139593
- Publication date May 19, 2016
- TOYOTA MOTOR EUROPE NV/SA
- Andrew WILLETT
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR MONITORING AND/OR DIAGNOSING OPERATION OF A P...
- Publication number 20150277429
- Publication date Oct 1, 2015
- ABB TECHNOLOGY AG
- Rainer DRATH
- G05 - CONTROLLING REGULATING
Information Patent Application
INFORMATION PROCESSING APPARATUS, CONTROL METHOD THEREOF, INFORMATI...
- Publication number 20150160651
- Publication date Jun 11, 2015
- Canon Kabushiki Kaisha
- Keisuke Tateno
- G05 - CONTROLLING REGULATING
Information Patent Application
CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...
- Publication number 20140236515
- Publication date Aug 21, 2014
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SEARCHING, ANALYZING, AND OPTIMIZING PROCESS PARAMETERS...
- Publication number 20140222376
- Publication date Aug 7, 2014
- National Cheng Kung University
- Chi-An KAO
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
MANUFACTURING CONTROL APPARATUS, MANUFACTURING CONTROL SYSTEM, AND...
- Publication number 20130338810
- Publication date Dec 19, 2013
- Kabushiki Kaisha Toshiba
- Linting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BI-DIRECTIONAL ASSOCIATION AND GRAPHICAL ACQUISITION OF TIME-BASED...
- Publication number 20130110263
- Publication date May 2, 2013
- Applied Materials, Inc.
- Brad Schulze
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...
- Publication number 20130030760
- Publication date Jan 31, 2013
- Tom Thuy Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for managing semiconductor manufacturing device
- Publication number 20110245956
- Publication date Oct 6, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Instrumental Support for Monitoring the Color Imprint in the Manufa...
- Publication number 20110206242
- Publication date Aug 25, 2011
- BAUMER INSPECTION GMBH
- Robert Massen
- G06 - COMPUTING CALCULATING COUNTING

Quality control, monitor production tool with multiple sensors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer-like sensor

Anomaly detection method and system for manufacturing processes

Part, sensor, and metrology data integration

Industrial monitoring system device dislodgement detection

Information processing device, production facility monitoring metho...

Device for at least one industrial automated process

Real-time anomaly detection and classification during semiconductor...

Production management system, production management apparatus and p...

Method for eliminating process anomalies

Method and devices and system for winding and unwinding a reel

Motor drive, production system and method thereof with quality meas...

Can production tool, process for controlling can weight, cost, and...

System and method for monitoring a manufacturing plant

Method, computer program product and system for detecting manufactu...

Extracting overall equipment effectiveness by analysis of a vibro-a...

Facility state determination device, facility state determination m...

Production process analysis method

Manufacturing process analysis method

Diagnostic apparatus, diagnostic system, diagnostic method, and rec...

Intelligent processing modulation system and method

Production management system, production management apparatus and p...

Operation support system, operation support device, and operation s...

Systems and methods for assuring and improving process quality

Method for controlling the quality of a tyre production and plant f...

Information processing apparatus, control method thereof, informati...

Modular system for real-time evaluation and monitoring of a machini...

Systems and methods of controlling a manufacturing process for a mi...

Part inspection system and method

System and method for equipment monitoring using a group candidate...

Bi-directional association and graphical acquisition of time-based...

Patents Applicationslast 30 patents

A FOOD PROCESSING LINE AND METHOD FOR CONTROLLING A FOOD PROCESSING...

ABNORMALITY SYMPTOM ANALYZING DEVICE

PART, SENSOR, AND METROLOGY DATA INTEGRATION

RTU ADDON

QUALITY MONITORING OF INDUSTRIAL PROCESSES

RISK-BASED REGULATORY PROCESS MONITORING AND CONTROL

METHOD FOR ELIMINATING PROCESS ANOMALIES

WAFER-LIKE SENSOR

METHOD FOR MONITORING A PRODUCTION PROCESS, METHOD FOR INDIRECTLY D...

PRODUCTION SYSTEM WITH QUALITY MEASURING FUNCTION AND MECHANISM DIA...

FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...

PRODUCTION PROCESS ANALYSIS METHOD

System and Method for Monitoring a Manufacturing Plant

MANUFACTURING PROCESS ANALYSIS METHOD

Device for at Least One Industrial Automated Process

PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT APPARATUS AND P...

DIAGNOSTIC APPARATUS, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND REC...

Part Inspection System and Method

OPERATION SUPPORT SYSTEM, OPERATION SUPPORT DEVICE, AND OPERATION S...

Continuous improvement procedure aimed to signal, monitor and termi...

SYSTEMS AND METHODS FOR ASSURING AND IMPROVING PROCESS QUALITY

SYSTEM AND METHOD FOR MONITORING AND/OR DIAGNOSING OPERATION OF A P...

INFORMATION PROCESSING APPARATUS, CONTROL METHOD THEREOF, INFORMATI...

CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED...

METHOD FOR SEARCHING, ANALYZING, AND OPTIMIZING PROCESS PARAMETERS...

MANUFACTURING CONTROL APPARATUS, MANUFACTURING CONTROL SYSTEM, AND...

BI-DIRECTIONAL ASSOCIATION AND GRAPHICAL ACQUISITION OF TIME-BASED...

ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED...

Method and system for managing semiconductor manufacturing device

Instrumental Support for Monitoring the Color Imprint in the Manufa...