Quality control

Industry

CPC
G05B2219/32368

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Parent Industries

GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32368Quality control

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Method and computer programme for discovering possible errors in a...
- Patent number 12,182,750
- Issue date Dec 31, 2024
- SMS group GMBH
- Katja Windt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Production and measurement of workpieces
- Patent number 12,174,607
- Issue date Dec 24, 2024
- Renishaw plc
- Kevyn Barry Jonas
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated monitoring using image analysis
- Patent number 12,165,302
- Issue date Dec 10, 2024
- Rockwell Automation Technologies, Inc.
- Bijan SayyarRodsari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring a quality of an object of a 3D-...
- Patent number 12,145,318
- Issue date Nov 19, 2024
- Siemens Aktiengesellschaft
- Felix Buggenthin
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Implementation of deep neural networks for testing and quality cont...
- Patent number 12,124,247
- Issue date Oct 22, 2024
- SanDisk Technologies LLC
- Fei Zhou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for processing accelerated test data based on...
- Patent number 12,124,248
- Issue date Oct 22, 2024
- CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTI...
- Guangze Pan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Creping process performance tracking and control
- Patent number 12,111,644
- Issue date Oct 8, 2024
- Ecolab USA Inc.
- William A. Von Drasek
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection system, terminal device, inspection method, and non-tran...
- Patent number 12,111,643
- Issue date Oct 8, 2024
- Kabushiki Kaisha Yaskawa Denki
- Ryo Masumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Online monitoring of additive manufacturing using acoustic emission...
- Patent number 12,105,505
- Issue date Oct 1, 2024
- Mistras Group, Inc.
- Mostafa Hasanian
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Accelerating preventative maintenance recovery and recipe optimizin...
- Patent number 12,106,984
- Issue date Oct 1, 2024
- Applied Materials, Inc.
- Pengyu Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for performing quality control on a diagnostic an...
- Patent number 12,072,690
- Issue date Aug 27, 2024
- Sysmex Corporation
- Scott Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for manufacturing industrial goods using influenc...
- Patent number 12,066,817
- Issue date Aug 20, 2024
- Siemens Aktiengesellschaft
- Kai Höfig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis system and analysis method
- Patent number 12,055,922
- Issue date Aug 6, 2024
- JFE Steel Corporation
- Shinji Koseki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Weld monitoring systems with unknown downtime disabling
- Patent number 12,042,887
- Issue date Jul 23, 2024
- Illinois Tool Works Inc.
- Leland D. Falde
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Manufacturing process qualification system and method
- Patent number 12,038,735
- Issue date Jul 16, 2024
- Pratt & Whitney Canada Corp.
- Changsheng Guo
- G05 - CONTROLLING REGULATING
Information Patent Grant
NPU capable of testing component including memory during runtime
- Patent number 12,040,040
- Issue date Jul 16, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NPU capable of testing component therein during runtime, the testin...
- Patent number 12,033,713
- Issue date Jul 9, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metal additive manufacturing qualification test artifact
- Patent number 12,019,430
- Issue date Jun 25, 2024
- Board of Regents, The University of Texas System
- Hunter Taylor
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Systems and methods for improved manufacturing diagnostics
- Patent number 12,001,189
- Issue date Jun 4, 2024
- Steering Solutions IP Holding Corporation
- John F. Pressler
- G01 - MEASURING TESTING
Information Patent Grant
Neural processing unit capable of testing component therein during...
- Patent number 11,990,203
- Issue date May 21, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display system, display method, and non-transitory computer-readabl...
- Patent number 11,989,011
- Issue date May 21, 2024
- Omron Corporation
- Toshifumi Minemoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Weld spot analytics
- Patent number 11,980,973
- Issue date May 14, 2024
- Robert Bosch GmbH
- Matteo Dariol
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for controlling process
- Patent number 11,967,514
- Issue date Apr 23, 2024
- Semes Co., Ltd.
- Sung Min Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Industrial internet of things systems for inspection operation mana...
- Patent number 11,953,874
- Issue date Apr 9, 2024
- Chengdu Qinchuan IoT Technology Co., Ltd.
- Zehua Shao
- G05 - CONTROLLING REGULATING
Information Patent Grant
Temperature detecting material, temperature detecting ink using sam...
- Patent number 11,933,677
- Issue date Mar 19, 2024
- Hitachi Industrial Equipment Systems Co., Ltd.
- Kohhei Aida
- G01 - MEASURING TESTING
Information Patent Grant
Methods, (measuring) devices, and components thereof, for identifyi...
- Patent number 11,931,842
- Issue date Mar 19, 2024
- QASS GMBH
- Ulrich Seuthe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Product inspection method and device, producing system and computer...
- Patent number 11,922,673
- Issue date Mar 5, 2024
- BOE Technology Group Co., Ltd.
- Tong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated material welding
- Patent number 11,904,417
- Issue date Feb 20, 2024
- International Business Machines Corporation
- Michael Benosa Monjardin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for assembling optical module
- Patent number 11,899,221
- Issue date Feb 13, 2024
- GOER OPTICAL TECHNOLOGY CO., LTD.
- Nanjing Dong
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FINDING POSSIBLE TECHNICAL CAUSES OF OR SOLUTIONS FOR MALFUNCTIONS...
- Publication number 20250044777
- Publication date Feb 6, 2025
- ENGEL AUSTRIA GMBH
- Karlheinz MAYR
- G05 - CONTROLLING REGULATING
Information Patent Application
CREPING PROCESS PERFORMANCE TRACKING AND CONTROL
- Publication number 20250044776
- Publication date Feb 6, 2025
- ECOLAB USA INC.
- William A. Von Drasek
- G05 - CONTROLLING REGULATING
Information Patent Application
ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...
- Publication number 20250022733
- Publication date Jan 16, 2025
- Applied Materials, Inc.
- Pengyu Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTER-IMPLEMENTED METHOD AND TOOL FOR OPTICAL QUALITY CONTROL OF...
- Publication number 20250005740
- Publication date Jan 2, 2025
- SIEMENS AKTIENGESELLSCHAFT
- Vincent Dietrich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR THE DETECTION AND CLASSIFICATION OF...
- Publication number 20240411296
- Publication date Dec 12, 2024
- Carl Zeiss SMT GMBH
- Thomas Korb
- G05 - CONTROLLING REGULATING
Information Patent Application
MULTI-TARGET DESIGN FOR IN-SITU ANALYSIS OF SEMICONDUCTOR FABRICATI...
- Publication number 20240404851
- Publication date Dec 5, 2024
- Applied Materials, Inc.
- Yudong Hao
- G05 - CONTROLLING REGULATING
Information Patent Application
PROGNOSTICS ACCELERATION FOR MACHINE LEARNING ANOMALY DETECTION
- Publication number 20240402689
- Publication date Dec 5, 2024
- ORACLE INTERNATIONAL CORPORATION
- Dmitriy ITKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20240370148
- Publication date Nov 7, 2024
- FUJIFILM CORPORATION
- Mitsutoshi TAIRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP-LEARNING-BASED SLM ONLINE QUALITY MONITORING AND REPAIRING MET...
- Publication number 20240370002
- Publication date Nov 7, 2024
- Hunan Luojia Intelligent technology Co., Ltd.
- Fang Dong
- B22 - CASTING POWDER METALLURGY
Information Patent Application
APPARATUS, METHOD, AND COMPUTER PROGRAM PRODUCT FOR QUALITY REPORT...
- Publication number 20240353823
- Publication date Oct 24, 2024
- Honeywell International Inc.
- Ankit Singh
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING ACCELERATED TEST DATA BASED ON...
- Publication number 20240338016
- Publication date Oct 10, 2024
- China Electronic Product Reliability and Environmental Testing Research Insti...
- Guangze PAN
- G05 - CONTROLLING REGULATING
Information Patent Application
WELD MONITORING SYSTEMS WITH UNKNOWN DOWNTIME DISABLING
- Publication number 20240335897
- Publication date Oct 10, 2024
- ILLINOIS TOOL WORKS
- Leland D. Falde
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Molding Management System
- Publication number 20240319720
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Kosuke ATSUTA
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS, METHODS, AND COMPUTER PROGRAM PRODUCTS FOR QUALITY CONTROL
- Publication number 20240319705
- Publication date Sep 26, 2024
- Honeywell International Inc.
- Sunil Golani
- G05 - CONTROLLING REGULATING
Information Patent Application
NPU WITH CAPABILITY OF BUILT-IN SELF-TEST
- Publication number 20240321384
- Publication date Sep 26, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Production Process Management System
- Publication number 20240310810
- Publication date Sep 19, 2024
- SEIKO EPSON CORPORATION
- Kosuke ATSUTA
- G05 - CONTROLLING REGULATING
Information Patent Application
QUALITY ABNORMALITY ANALYSIS METHOD, METHOD OF MANUFACTURING METAL...
- Publication number 20240295874
- Publication date Sep 5, 2024
- JFE STEEL CORPORATION
- Hiroyasu SHIGEMORI
- G05 - CONTROLLING REGULATING
Information Patent Application
AUTOMATED ARTIFICIAL INTELLIGENCE (AI) INSPECTION OF CUSTOMIZED PAR...
- Publication number 20240280975
- Publication date Aug 22, 2024
- Kyndryl, Inc.
- Sheela SIDDAPPA
- G05 - CONTROLLING REGULATING
Information Patent Application
NPU CAPABLE OF PERFORMING RUNTIME TEST
- Publication number 20240274224
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...
- Publication number 20240274225
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL PROCESSING OPTIMIZATION
- Publication number 20240272629
- Publication date Aug 15, 2024
- Andritz Inc.
- Neeraj Nagpal
- G05 - CONTROLLING REGULATING
Information Patent Application
AN APPARATUS, SYSTEM AND METHOD FOR FUNCTIONAL TEST FAILURE PREDICTION
- Publication number 20240255931
- Publication date Aug 1, 2024
- Jabil Inc.
- Ragai Khalil
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING AND CONTROLLING INDUSTRIAL PROCE...
- Publication number 20240255932
- Publication date Aug 1, 2024
- Industrial Video Solutions Inc.
- Slawek Frackowiak
- G05 - CONTROLLING REGULATING
Information Patent Application
Device for Clustering-based Labeling, Device for Anomaly Detection,...
- Publication number 20240255933
- Publication date Aug 1, 2024
- SK PLANET CO., LTD.
- Yeonghyeon PARK
- G05 - CONTROLLING REGULATING
Information Patent Application
MODULE FOR PREDICTING SEMICONDUCTOR PHYSICAL DEFECTS AND METHOD THE...
- Publication number 20240241498
- Publication date Jul 18, 2024
- United Microelectronics Corp.
- Pin-Yen TSAI
- G05 - CONTROLLING REGULATING
Information Patent Application
DATA PROCESSING METHODS AND SYSTEMS, AND COMPUTER-READABLE STORAGE...
- Publication number 20240210928
- Publication date Jun 27, 2024
- MIANYANG BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Jianfeng ZENG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND DEVICE FOR QUALITY ASSURANCE OF A CONTAINER PROCESSING P...
- Publication number 20240210929
- Publication date Jun 27, 2024
- KRONES AG
- Benedikt BOETTCHER
- G05 - CONTROLLING REGULATING
Information Patent Application
SHARED DATA INDUCED QUALITY CONTROL SYSTEM FOR MATERIALS
- Publication number 20240184277
- Publication date Jun 6, 2024
- VERSUM MATERIALS US, LLC
- Safa Kutup KURT
- G05 - CONTROLLING REGULATING
Information Patent Application
INDUSTRIAL QUALITY MONITORING SYSTEM WITH PRE-TRAINED FEATURE EXTRA...
- Publication number 20240176337
- Publication date May 30, 2024
- ROBERT BOSCH GmbH
- Felipe CONDESSA
- G05 - CONTROLLING REGULATING
Information Patent Application
CHAMBER MATCHING BY EQUIPMENT CONSTANT UPDATES
- Publication number 20240176336
- Publication date May 30, 2024
- Applied Materials, Inc.
- Sidharth Bhatia
- G05 - CONTROLLING REGULATING

Quality control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for the additive manufacture of a workpiece

Method and computer programme for discovering possible errors in a...

Production and measurement of workpieces

Automated monitoring using image analysis

Method and apparatus for monitoring a quality of an object of a 3D-...

Implementation of deep neural networks for testing and quality cont...

Method and apparatus for processing accelerated test data based on...

Creping process performance tracking and control

Inspection system, terminal device, inspection method, and non-tran...

Online monitoring of additive manufacturing using acoustic emission...

Accelerating preventative maintenance recovery and recipe optimizin...

Method and system for performing quality control on a diagnostic an...

Method and system for manufacturing industrial goods using influenc...

Analysis system and analysis method

Weld monitoring systems with unknown downtime disabling

Manufacturing process qualification system and method

NPU capable of testing component including memory during runtime

NPU capable of testing component therein during runtime, the testin...

Metal additive manufacturing qualification test artifact

Systems and methods for improved manufacturing diagnostics

Neural processing unit capable of testing component therein during...

Display system, display method, and non-transitory computer-readabl...

Weld spot analytics

Apparatus and method for controlling process

Industrial internet of things systems for inspection operation mana...

Temperature detecting material, temperature detecting ink using sam...

Methods, (measuring) devices, and components thereof, for identifyi...

Product inspection method and device, producing system and computer...

Automated material welding

Apparatus and method for assembling optical module

Patents Applicationslast 30 patents

FINDING POSSIBLE TECHNICAL CAUSES OF OR SOLUTIONS FOR MALFUNCTIONS...

CREPING PROCESS PERFORMANCE TRACKING AND CONTROL

ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...

COMPUTER-IMPLEMENTED METHOD AND TOOL FOR OPTICAL QUALITY CONTROL OF...

COMPUTER IMPLEMENTED METHOD FOR THE DETECTION AND CLASSIFICATION OF...

MULTI-TARGET DESIGN FOR IN-SITU ANALYSIS OF SEMICONDUCTOR FABRICATI...

PROGNOSTICS ACCELERATION FOR MACHINE LEARNING ANOMALY DETECTION

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

DEEP-LEARNING-BASED SLM ONLINE QUALITY MONITORING AND REPAIRING MET...

APPARATUS, METHOD, AND COMPUTER PROGRAM PRODUCT FOR QUALITY REPORT...

METHOD AND APPARATUS FOR PROCESSING ACCELERATED TEST DATA BASED ON...

WELD MONITORING SYSTEMS WITH UNKNOWN DOWNTIME DISABLING

Molding Management System

SYSTEMS, METHODS, AND COMPUTER PROGRAM PRODUCTS FOR QUALITY CONTROL

NPU WITH CAPABILITY OF BUILT-IN SELF-TEST

Production Process Management System

QUALITY ABNORMALITY ANALYSIS METHOD, METHOD OF MANUFACTURING METAL...

AUTOMATED ARTIFICIAL INTELLIGENCE (AI) INSPECTION OF CUSTOMIZED PAR...

NPU CAPABLE OF PERFORMING RUNTIME TEST

METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...

MATERIAL PROCESSING OPTIMIZATION

AN APPARATUS, SYSTEM AND METHOD FOR FUNCTIONAL TEST FAILURE PREDICTION

SYSTEMS AND METHODS FOR MONITORING AND CONTROLLING INDUSTRIAL PROCE...

Device for Clustering-based Labeling, Device for Anomaly Detection,...

MODULE FOR PREDICTING SEMICONDUCTOR PHYSICAL DEFECTS AND METHOD THE...

DATA PROCESSING METHODS AND SYSTEMS, AND COMPUTER-READABLE STORAGE...

METHOD AND DEVICE FOR QUALITY ASSURANCE OF A CONTAINER PROCESSING P...

SHARED DATA INDUCED QUALITY CONTROL SYSTEM FOR MATERIALS

INDUSTRIAL QUALITY MONITORING SYSTEM WITH PRE-TRAINED FEATURE EXTRA...

CHAMBER MATCHING BY EQUIPMENT CONSTANT UPDATES