Radiant energy

Industry

US Classification
250

US Patent Classification (USPC) is no longer used by USPTO since June 2015. Please refer to similar CPC classifications / industries.

Current Industry

250Radiant energy

Industries

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Patents Grantslast 30 patents

Information Patent Grant
External cavity laser source
- Patent number 9,042,414
- Issue date May 26, 2015
- Spectral Sciences, Inc.
- Pajo Vukovic-Cvijin
- G01 - MEASURING TESTING
Information Patent Grant
Ink jet printing apparatus and method for estimating moisture conte...
- Patent number 9,038,444
- Issue date May 26, 2015
- Canon Kabushiki Kaisha
- Riichi Saito
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Photoelectric conversion apparatus and imaging system using the same
- Patent number 9,040,895
- Issue date May 26, 2015
- Canon Kabushiki Kaisha
- Yasuhiro Kawabata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Precursor selection using an artificial intelligence algorithm incr...
- Patent number 9,040,903
- Issue date May 26, 2015
- Wisconsin Alumni Research Foundation
- Joshua J. Coon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Terahertz wave detection device and method
- Patent number 9,040,918
- Issue date May 26, 2015
- Riken
- Kouji Nawata
- G01 - MEASURING TESTING
Information Patent Grant
Eye tracking system and related methods
- Patent number 9,040,923
- Issue date May 26, 2015
- Innovega, Inc.
- Randall B. Sprague
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rugged scintillation crystal assembly
- Patent number 9,040,926
- Issue date May 26, 2015
- CBG Corporation
- Paul L. Sinclair
- G01 - MEASURING TESTING
Information Patent Grant
Detection of ionising radiation
- Patent number 9,040,928
- Issue date May 26, 2015
- BAE Systems PLC
- Michael Dunleavy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying CVD diamond
- Patent number 9,040,931
- Issue date May 26, 2015
- Chih-Chung Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional detection system for neutron radiation in the field...
- Patent number 9,040,934
- Issue date May 26, 2015
- Centre National de la Recherche Scientifique (CRNS)
- Patrick Francois Baroni
- G01 - MEASURING TESTING
Information Patent Grant
Cassette for containing accumulative fluorescent sheet
- Patent number 9,040,941
- Issue date May 26, 2015
- FUJIFILM Corporation
- Hiromi Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam lithography with linear column array and rotary stage
- Patent number 9,040,942
- Issue date May 26, 2015
- KLA-Tencor Corporation
- Keith Standiford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactless coupling and method for use with an electrical appliance
- Patent number 9,040,947
- Issue date May 26, 2015
- 300K Enterprises Pty Ltd
- Christopher Scott Trewin
- F21 - LIGHTING
Information Patent Grant
Acquisition method and apparatus for mass spectrometer data
- Patent number 9,043,162
- Issue date May 26, 2015
- Micromass UK Limited
- Peter Gerard Spreadbury
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Solid state image sensor with protection against certain incident l...
- Patent number 9,040,888
- Issue date May 26, 2015
- Canon Kabushiki Kaisha
- Aihiko Numata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High dynamic range image sensor having symmetric interleaved long a...
- Patent number 9,040,892
- Issue date May 26, 2015
- Apple Inc.
- Scott T. Smith
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Plan view sample preparation
- Patent number 9,040,908
- Issue date May 26, 2015
- FEI Company
- Richard J. Young
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical module for simultaneously focusing on two fields of view
- Patent number 9,040,915
- Issue date May 26, 2015
- Conti Temic microelectronic GmbH
- Konrad Rothenhaeusler
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Efficient data extraction method for high-temporal-and-spatial-reso...
- Patent number 9,040,917
- Issue date May 26, 2015
- Korea Advanced Institute of Science and Technology
- Hyeon Min Bae
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
THz frequency range antenna
- Patent number 9,040,922
- Issue date May 26, 2015
- Koninklijke Philips N.V.
- Jaime Gomez Rivas
- G01 - MEASURING TESTING
Information Patent Grant
Spatially-aware radiation probe system and method
- Patent number 9,040,925
- Issue date May 26, 2015
- Canberra Industries, Inc.
- Olivier Gaëtan Giarmana
- G01 - MEASURING TESTING
Information Patent Grant
Controlling electromagnetic radiation in a data center
- Patent number 9,040,933
- Issue date May 26, 2015
- Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Milton Cobo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scintillator panel and production method thereof, flat panel detect...
- Patent number 9,040,940
- Issue date May 26, 2015
- Konica Minolta Medical & Graphic, Inc.
- Keiko Itaya
- G01 - MEASURING TESTING
Information Patent Grant
Method of mechanically controlling the amount of energy to reach a...
- Patent number 9,040,945
- Issue date May 26, 2015
- Jonathan S. Hayman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Imager with column readout
- Patent number 9,040,894
- Issue date May 26, 2015
- Harvest Imaging bvba
- Albert Theuwissen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device having a plurality of photosensitive microcells arranged in...
- Patent number 9,040,898
- Issue date May 26, 2015
- Siemens Medical Solutions USA, Inc.
- Debora Henseler
- G01 - MEASURING TESTING
Information Patent Grant
Tool setting or analysis device with backup or repeated trigger sig...
- Patent number 9,040,899
- Issue date May 26, 2015
- Renishaw plc
- Edward Benjamin Egglestone
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Two-dimensional absolute encoder and scale therefor
- Patent number 9,040,900
- Issue date May 26, 2015
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Process for analyzing gas emitted during drilling of a borehole
- Patent number 9,040,901
- Issue date May 26, 2015
- HRH LIMITED
- Christopher John Harlow
- G01 - MEASURING TESTING
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 9,040,902
- Issue date May 26, 2015
- Shimadzu Corporation
- Manabu Ueda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
- Publication number 20150146193
- Publication date May 28, 2015
- Nanometrics Incorporated
- Andrzej Buczkowski
- G01 - MEASURING TESTING
Information Patent Application
DETECTION UNIT AND CONFOCAL LASER MICROSCOPE
- Publication number 20150146272
- Publication date May 28, 2015
- OLYMPUS CORPORATION
- Yusuke AMANO
- G02 - OPTICS
Information Patent Application
NIR-INERT SUBSTRATES COMPRISING BIS-OXODIHYDROINDOLYLEN-BENZODIFURA...
- Publication number 20150147493
- Publication date May 28, 2015
- BASF SE
- Thomas Ruch
- B32 - LAYERED PRODUCTS
Information Patent Application
Method of MS/MS Mass Spectrometry
- Publication number 20150144780
- Publication date May 28, 2015
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR CONNECTING A CHROMATOGRAPHY SYSTE...
- Publication number 20150144782
- Publication date May 28, 2015
- WATERS TECHNOLOGIES CORPORATION
- Michael O. Fogwill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Asymmetric Electrostatic Quadrupole Deflector for Improved Field Un...
- Publication number 20150144785
- Publication date May 28, 2015
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CHAMBER WITH BASE PLATE
- Publication number 20150144789
- Publication date May 28, 2015
- MAPPER LITHOGRAPHY IP BV
- Jerry Johannes Martinus Peijster
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE PULSE SHAPING OF SOLID STATE PHOTOMULTIPLIER SIGNALS
- Publication number 20150144797
- Publication date May 28, 2015
- GENERAL ELECTRIC COMPANY
- Sergei Ivanovich Dolinsky
- G01 - MEASURING TESTING
Information Patent Application
TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPAR...
- Publication number 20150144809
- Publication date May 28, 2015
- Gigaphoton Inc.
- Shinji OKAZAKI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTIPLE SOLID PHASE MICRO-EXTRACTION THERMAL DESORPTION IONIZATION...
- Publication number 20150144777
- Publication date May 28, 2015
- National Sun Yat-Sen University
- Jen-taie SHIEA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Impact Ion Source With Fast Response
- Publication number 20150144779
- Publication date May 28, 2015
- Leco Corporation
- Anatoly N. Verenchikov
- G01 - MEASURING TESTING
Information Patent Application
ANALYTE MASS SPECTROMETRY QUANTITATION USING A UNIVERSAL REPORTER
- Publication number 20150148260
- Publication date May 28, 2015
- Joel Louette
- G01 - MEASURING TESTING
Information Patent Application
Substrate Processing Apparatus, Method of Manufacturing Semiconduct...
- Publication number 20150147894
- Publication date May 28, 2015
- Hitachi Kokusai Electric Inc.
- Katsuyoshi HAMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDICAL PRODUCT EMITTING NEAR-INFRARED FLUORESCENCE AND MEDICAL PRO...
- Publication number 20150148665
- Publication date May 28, 2015
- NATIONAL UNIVERSITY CORPORATION KOCHI UNIVERSITY
- Takayuki Sato
- G01 - MEASURING TESTING
Information Patent Application
SPECIFIC BIOMARKERS FOR HEPATOCELLULAR CARCINOMA (HCC)
- Publication number 20150147761
- Publication date May 28, 2015
- Helmut E. Meyer
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR MODULE, RADIATION DETECTOR AND RADIATION IMAGING...
- Publication number 20150146842
- Publication date May 28, 2015
- GENERAL ELECTRIC COMPANY
- Haruo Kurochi
- G01 - MEASURING TESTING
Information Patent Application
RADIATION SOURCE
- Publication number 20150146182
- Publication date May 28, 2015
- ASML NETHERLANDS B.V.
- Jan Bernard Plechelmus Van Schoot
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
UVA GERMICIDAL DEVICE
- Publication number 20150144575
- Publication date May 28, 2015
- UVCleaning Systems, Inc.
- R. Thomas Hawkins
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE SUPPLY OF IONS
- Publication number 20150144781
- Publication date May 28, 2015
- Micromass UK Limited
- Kevin R. Howes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GLYCOPEPTIDE ANALYZER
- Publication number 20150144783
- Publication date May 28, 2015
- Shimadzu Corporation
- Masaki MURASE
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC DETECTOR ARRAYS INCLUDING SCINTILLATORS AND METHODS FO...
- Publication number 20150144796
- Publication date May 28, 2015
- Timothy J. Tredwell
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COUPLER DEVICE AND CONFOCAL OBSERVATION SYSTEM
- Publication number 20150144805
- Publication date May 28, 2015
- HOYA CORPORATION
- Toshiaki Yamabe
- G02 - OPTICS
Information Patent Application
SCANNING OPTICAL SYSTEM, OPTICAL SCANNING APPARATUS, AND RADIATION...
- Publication number 20150144812
- Publication date May 28, 2015
- FUJIFILM CORPORATION
- Hiromi ISHIKAWA
- G02 - OPTICS
Information Patent Application
MULTISPECTRAL IMAGER WITH HYBRID DOUBLE LAYER FILTER ARRAY
- Publication number 20150144770
- Publication date May 28, 2015
- nanoLambda Korea
- Byung Il CHOI
- G01 - MEASURING TESTING
Information Patent Application
Method for compensation of fiber optic measurement systems and fibe...
- Publication number 20150144773
- Publication date May 28, 2015
- TECHNISCHE UNIVERSITÄT MÜNCHEN
- Thorbjörn Buck
- G01 - MEASURING TESTING
Information Patent Application
Data Independent Acquisition of Product Ion Spectra and Reference S...
- Publication number 20150144778
- Publication date May 28, 2015
- Ronald F. Bonner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Exponential Scan Mode for Quadrupole Mass Spectrometers to Generate...
- Publication number 20150144784
- Publication date May 28, 2015
- Thermo Finnigan LLC
- Robert A. GROTHE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20150144787
- Publication date May 28, 2015
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOSE MEASUREMENT SYSTEM AND METHOD
- Publication number 20150144793
- Publication date May 28, 2015
- Common Sensing, Inc.
- Richard WHALLEY
- G01 - MEASURING TESTING
Information Patent Application
AIR PURIFICATION SYSTEM
- Publication number 20150144803
- Publication date May 28, 2015
- John Robert Berry
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Radiant energy

Industry

Current Industry

Patents Grantslast 30 patents

External cavity laser source

Ink jet printing apparatus and method for estimating moisture conte...

Photoelectric conversion apparatus and imaging system using the same

Precursor selection using an artificial intelligence algorithm incr...

Terahertz wave detection device and method

Eye tracking system and related methods

Rugged scintillation crystal assembly

Detection of ionising radiation

Method and apparatus for identifying CVD diamond

Two-dimensional detection system for neutron radiation in the field...

Cassette for containing accumulative fluorescent sheet

Electron beam lithography with linear column array and rotary stage

Contactless coupling and method for use with an electrical appliance

Acquisition method and apparatus for mass spectrometer data

Solid state image sensor with protection against certain incident l...

High dynamic range image sensor having symmetric interleaved long a...

Plan view sample preparation

Optical module for simultaneously focusing on two fields of view

Efficient data extraction method for high-temporal-and-spatial-reso...

THz frequency range antenna

Spatially-aware radiation probe system and method

Controlling electromagnetic radiation in a data center

Scintillator panel and production method thereof, flat panel detect...

Method of mechanically controlling the amount of energy to reach a...

Imager with column readout

Device having a plurality of photosensitive microcells arranged in...

Tool setting or analysis device with backup or repeated trigger sig...

Two-dimensional absolute encoder and scale therefor

Process for analyzing gas emitted during drilling of a borehole

Atmospheric pressure ionization mass spectrometer

Patents Applicationslast 30 patents

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

DETECTION UNIT AND CONFOCAL LASER MICROSCOPE

NIR-INERT SUBSTRATES COMPRISING BIS-OXODIHYDROINDOLYLEN-BENZODIFURA...

Method of MS/MS Mass Spectrometry

SYSTEMS, DEVICES, AND METHODS FOR CONNECTING A CHROMATOGRAPHY SYSTE...

Asymmetric Electrostatic Quadrupole Deflector for Improved Field Un...

VACUUM CHAMBER WITH BASE PLATE

ACTIVE PULSE SHAPING OF SOLID STATE PHOTOMULTIPLIER SIGNALS

TARGET SUPPLY DEVICE AND EXTREME ULTRAVIOLET LIGHT GENERATION APPAR...

MULTIPLE SOLID PHASE MICRO-EXTRACTION THERMAL DESORPTION IONIZATION...

Electron Impact Ion Source With Fast Response

ANALYTE MASS SPECTROMETRY QUANTITATION USING A UNIVERSAL REPORTER

Substrate Processing Apparatus, Method of Manufacturing Semiconduct...

MEDICAL PRODUCT EMITTING NEAR-INFRARED FLUORESCENCE AND MEDICAL PRO...

SPECIFIC BIOMARKERS FOR HEPATOCELLULAR CARCINOMA (HCC)

RADIATION DETECTOR MODULE, RADIATION DETECTOR AND RADIATION IMAGING...

RADIATION SOURCE

UVA GERMICIDAL DEVICE

METHOD AND APPARATUS FOR CONTROLLING THE SUPPLY OF IONS

GLYCOPEPTIDE ANALYZER

RADIOGRAPHIC DETECTOR ARRAYS INCLUDING SCINTILLATORS AND METHODS FO...

OPTICAL COUPLER DEVICE AND CONFOCAL OBSERVATION SYSTEM

SCANNING OPTICAL SYSTEM, OPTICAL SCANNING APPARATUS, AND RADIATION...

MULTISPECTRAL IMAGER WITH HYBRID DOUBLE LAYER FILTER ARRAY

Method for compensation of fiber optic measurement systems and fibe...

Data Independent Acquisition of Product Ion Spectra and Reference S...

Exponential Scan Mode for Quadrupole Mass Spectrometers to Generate...

ELECTRON MICROSCOPE

DOSE MEASUREMENT SYSTEM AND METHOD

AIR PURIFICATION SYSTEM