Randomize workpiece treatment order within lot to improve lot-to-lot comparisons

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CPC
G05B2219/32225

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32225Randomize workpiece treatment order within lot to improve lot-to-lot comparisons

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods, systems, and computer program products for product randomi...
- Patent number 8,015,040
- Issue date Sep 6, 2011
- International Business Machines Corporation
- Susan M. Cianfrani
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for randomizing wafers in a complex process line
- Patent number 7,831,324
- Issue date Nov 9, 2010
- GLOBALFOUNDRIES Inc.
- James Broc Stirton
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for managing wafer processing
- Patent number 7,801,636
- Issue date Sep 21, 2010
- Samsung Electronics Co., Ltd.
- Nam-young Lee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for scheduling metrology based on a jeopardy c...
- Patent number 7,299,106
- Issue date Nov 20, 2007
- Advanced Micro Devices, Inc.
- Cabe W. Nicksic
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,975,920
- Issue date Dec 13, 2005
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,862,495
- Issue date Mar 1, 2005
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,684,125
- Issue date Jan 27, 2004
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR PRODUCT RANDOMI...
- Publication number 20080183321
- Publication date Jul 31, 2008
- International Business Machines Corporation
- Susan M. Cianfrani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR RANDOMIZING WAFERS IN A COMPLEX PROCESS LINE
- Publication number 20080103618
- Publication date May 1, 2008
- James Broc Stirton
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR MANAGING WAFER PROCESSING
- Publication number 20080077269
- Publication date Mar 27, 2008
- Nam-young Lee
- G05 - CONTROLLING REGULATING
Information Patent Application
In-situ randomization and recording of wafer processing order at pr...
- Publication number 20040111176
- Publication date Jun 10, 2004
- Randolph W. Kahn
- G05 - CONTROLLING REGULATING
Information Patent Application
In-situ randomization and recording of wafer processing order at pr...
- Publication number 20040111180
- Publication date Jun 10, 2004
- Randolph W. Kahn
- G05 - CONTROLLING REGULATING
Information Patent Application
In-situ randomization and recording of wafer processing order at pr...
- Publication number 20020087230
- Publication date Jul 4, 2002
- Randolph W. Kahn
- G05 - CONTROLLING REGULATING

Randomize workpiece treatment order within lot to improve lot-to-lot comparisons

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods, systems, and computer program products for product randomi...

Method and system for randomizing wafers in a complex process line

Method and system for managing wafer processing

Method and apparatus for scheduling metrology based on a jeopardy c...

In-situ randomization and recording of wafer processing order at pr...

In-situ randomization and recording of wafer processing order at pr...

In-situ randomization and recording of wafer processing order at pr...

Patents Applicationslast 30 patents

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR PRODUCT RANDOMI...

METHOD AND SYSTEM FOR RANDOMIZING WAFERS IN A COMPLEX PROCESS LINE

METHOD AND SYSTEM FOR MANAGING WAFER PROCESSING

In-situ randomization and recording of wafer processing order at pr...

In-situ randomization and recording of wafer processing order at pr...

In-situ randomization and recording of wafer processing order at pr...