Real time processing of data acquisition, monitoring

Industry

CPC
G05B2219/37533

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/37533Real time processing of data acquisition, monitoring

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Patents Grantslast 30 patents

Information Patent Grant
Self-monitoring manufacturing system
- Patent number 10,877,468
- Issue date Dec 29, 2020
- Hexagon Technology Center GmbH
- Claudio Iseli
- G01 - MEASURING TESTING
Information Patent Grant
Method for judging key moments in whole process of machining step f...
- Patent number 10,719,061
- Issue date Jul 21, 2020
- Chongqing University
- Fei Liu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Numerical controller for data request with variable data size
- Patent number 10,409,262
- Issue date Sep 10, 2019
- FANUC CORPORATION
- Arito Hashimoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
NC machine tool
- Patent number 10,268,179
- Issue date Apr 23, 2019
- FUJI CORPORATION
- Masaharu Ito
- G05 - CONTROLLING REGULATING
Information Patent Grant
Industrial monitoring system
- Patent number 10,235,385
- Issue date Mar 19, 2019
- Siemens Aktiengesellschaft
- Quan Bin Liu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Data collection apparatus and data collection program
- Patent number 10,055,477
- Issue date Aug 21, 2018
- Toshiba Mitsubishi-Electric Industrial Systems Corporation
- Akira Nojima
- G05 - CONTROLLING REGULATING
Information Patent Grant
Digital measurement input for an electric automation device, electr...
- Patent number 9,917,662
- Issue date Mar 13, 2018
- Siemens Aktiengesellschaft
- Andreas Jurisch
- G05 - CONTROLLING REGULATING
Information Patent Grant
Data collection system and data collection system program
- Patent number 9,710,537
- Issue date Jul 18, 2017
- Toshiba Mitsubishi-Electric Industrial Systems Corporation
- Akira Nojima
- G05 - CONTROLLING REGULATING
Information Patent Grant
Data management apparatus, data management method and data manageme...
- Patent number 9,460,133
- Issue date Oct 4, 2016
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Akira Nojima
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for data collection and analysis using robotic de...
- Patent number 8,396,591
- Issue date Mar 12, 2013
- Valbrea Technologies, Inc.
- Jeffrey L. Hooper
- G05 - CONTROLLING REGULATING
Information Patent Grant
Closed-loop CNC machine system and method
- Patent number 8,365,642
- Issue date Feb 5, 2013
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Closed-loop CNC machine system and method
- Patent number 8,136,432
- Issue date Mar 20, 2012
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Closed-loop CNC machine system and method
- Patent number 7,930,957
- Issue date Apr 26, 2011
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for filtering of networked, synchronized measurem...
- Patent number 7,912,885
- Issue date Mar 22, 2011
- Agilent Technologies, Inc.
- Lee A. Barford
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for creating a built-in self test (BIST) table for monitorin...
- Patent number 7,526,699
- Issue date Apr 28, 2009
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring a monolayer deposition (MLD) system using a built-in sel...
- Patent number 7,519,885
- Issue date Apr 14, 2009
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring a single-wafer processing system
- Patent number 7,340,377
- Issue date Mar 4, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring a system during low-pressure processes
- Patent number 7,302,363
- Issue date Nov 27, 2007
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for run-time data reduction
- Patent number 7,200,580
- Issue date Apr 3, 2007
- Rockwell Automation Technologies, Inc.
- Barrie Kovish
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for data retrieval
- Patent number 6,427,099
- Issue date Jul 30, 2002
- Siemens Aktiengesellschaft
- Gerhard Heinemann
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CONTINUOUS MACHINE MONITORING AT A KHZ-SCALE
- Publication number 20220179392
- Publication date Jun 9, 2022
- MACHINEMETRICS, INC.
- BROCK TWEEDIE
- G01 - MEASURING TESTING
Information Patent Application
SMART FACTORY MONITORING SYSTEM
- Publication number 20220083032
- Publication date Mar 17, 2022
- Sun Kak KIM
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS MANAGEMENT DEVICE, PROCESS MANAGEMENT METHOD, AND PROCESS M...
- Publication number 20220011738
- Publication date Jan 13, 2022
- NEC Corporation
- Kenji ODA
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for Judging Key Moments in Whole Process of Machining Step f...
- Publication number 20190278253
- Publication date Sep 12, 2019
- CHONGQING UNIVERSITY
- Fei LIU
- G05 - CONTROLLING REGULATING
Information Patent Application
SELF-MONITORING MANUFACTURING SYSTEM
- Publication number 20180173209
- Publication date Jun 21, 2018
- HEXAGON TECHNOLOGY CENTER GMBH
- Claudio Iseli
- G05 - CONTROLLING REGULATING
Information Patent Application
NUMERICAL CONTROLLER
- Publication number 20180067472
- Publication date Mar 8, 2018
- FANUC CORPORATION
- Arito Hashimoto
- G05 - CONTROLLING REGULATING
Information Patent Application
NC MACHINE TOOL
- Publication number 20170038764
- Publication date Feb 9, 2017
- FUJI MACHINE MFG, CO., LTD.
- Masaharu ITO
- G05 - CONTROLLING REGULATING
Information Patent Application
DATA MANAGEMENT APPARATUS, DATA MANAGEMENT METHOD AND DATA MANAGEME...
- Publication number 20140297638
- Publication date Oct 2, 2014
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Akira Nojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA COLLECTION APPARATUS AND DATA COLLECTION PROGRAM
- Publication number 20140289250
- Publication date Sep 25, 2014
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Akira Nojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA COLLECTION SYSTEM, DATA COLLECTION APPARATUS, DATA COLLECTION...
- Publication number 20140288671
- Publication date Sep 25, 2014
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Akira Nojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA COLLECTION SYSTEM AND DATA COLLECTION SYSTEM PROGRAM
- Publication number 20140289251
- Publication date Sep 25, 2014
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Akira Nojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL CLOSED LOOP CONTROL FOR RELIABILITY
- Publication number 20130226327
- Publication date Aug 29, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Wen-Cheng Yang
- G05 - CONTROLLING REGULATING
Information Patent Application
CLOSED-LOOP CNC MACHINE SYSTEM AND METHOD
- Publication number 20120143368
- Publication date Jun 7, 2012
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CLOSED-LOOP CNC MACHINE SYSTEM AND METHOD
- Publication number 20110264257
- Publication date Oct 27, 2011
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method And Device For Monitoring Measurement Data In Semiconductor...
- Publication number 20110161030
- Publication date Jun 30, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Haijun Niu
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR DATA COLLECTION AND ANALYSIS USING ROBOTIC DE...
- Publication number 20090326709
- Publication date Dec 31, 2009
- Valbrea Technologies, Inc.
- Jeffrey L. Hooper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Filtering of Networked, Synchronized Measurem...
- Publication number 20080270504
- Publication date Oct 30, 2008
- Lee A. Barford
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR CREATING A BUILT-IN SELF TEST (BIST) TABLE FOR MONITORIN...
- Publication number 20070259285
- Publication date Nov 8, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A SYSTEM DURING LOW-PRESSURE PROCESSES
- Publication number 20070239375
- Publication date Oct 11, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A MONOLAYER DEPOSITION (MLD) SYSTEM USING A BUILT-IN SEL...
- Publication number 20070234953
- Publication date Oct 11, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A SINGLE-WAFER PROCESSING SYSTEM
- Publication number 20070233427
- Publication date Oct 4, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Closed-loop CNC machine system and method
- Publication number 20070067059
- Publication date Mar 22, 2007
- Prototype Productions, Inc.
- Joe V. Travez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Real time processing of data acquisition, monitoring

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-monitoring manufacturing system

Method for judging key moments in whole process of machining step f...

Numerical controller for data request with variable data size

NC machine tool

Industrial monitoring system

Data collection apparatus and data collection program

Digital measurement input for an electric automation device, electr...

Data collection system and data collection system program

Data management apparatus, data management method and data manageme...

System and method for data collection and analysis using robotic de...

Closed-loop CNC machine system and method

Closed-loop CNC machine system and method

Closed-loop CNC machine system and method

Method and system for filtering of networked, synchronized measurem...

Method for creating a built-in self test (BIST) table for monitorin...

Monitoring a monolayer deposition (MLD) system using a built-in sel...

Monitoring a single-wafer processing system

Monitoring a system during low-pressure processes

System and method for run-time data reduction

Method and system for data retrieval

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR CONTINUOUS MACHINE MONITORING AT A KHZ-SCALE

SMART FACTORY MONITORING SYSTEM

PROCESS MANAGEMENT DEVICE, PROCESS MANAGEMENT METHOD, AND PROCESS M...

Method for Judging Key Moments in Whole Process of Machining Step f...

SELF-MONITORING MANUFACTURING SYSTEM

NUMERICAL CONTROLLER

NC MACHINE TOOL

DATA MANAGEMENT APPARATUS, DATA MANAGEMENT METHOD AND DATA MANAGEME...

DATA COLLECTION APPARATUS AND DATA COLLECTION PROGRAM

DATA COLLECTION SYSTEM, DATA COLLECTION APPARATUS, DATA COLLECTION...

DATA COLLECTION SYSTEM AND DATA COLLECTION SYSTEM PROGRAM

NOVEL CLOSED LOOP CONTROL FOR RELIABILITY

CLOSED-LOOP CNC MACHINE SYSTEM AND METHOD

CLOSED-LOOP CNC MACHINE SYSTEM AND METHOD

Method And Device For Monitoring Measurement Data In Semiconductor...

SYSTEM AND METHOD FOR DATA COLLECTION AND ANALYSIS USING ROBOTIC DE...

Method and System for Filtering of Networked, Synchronized Measurem...

METHOD FOR CREATING A BUILT-IN SELF TEST (BIST) TABLE FOR MONITORIN...

MONITORING A SYSTEM DURING LOW-PRESSURE PROCESSES

MONITORING A MONOLAYER DEPOSITION (MLD) SYSTEM USING A BUILT-IN SEL...

MONITORING A SINGLE-WAFER PROCESSING SYSTEM

Closed-loop CNC machine system and method