Reconfiguring circuits for testing

Industry

CPC
G06F11/267

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Parent Industries

GPHYSICS G06Computing G06FELECTRICAL DIGITAL DATA PROCESSING G06F11/00Error detection Error correction Monitoring

Current Industry

G06F11/267Reconfiguring circuits for testing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Selectable JTAG or trace access with data store and output
- Patent number 12,146,909
- Issue date Nov 19, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging low power states for fault testing of processing cores a...
- Patent number 12,124,346
- Issue date Oct 22, 2024
- NVIDIA Corporation
- Jonah Alben
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selectable JTAG or trace access with data store and output
- Patent number 12,092,687
- Issue date Sep 17, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In system test of chips in functional systems
- Patent number 12,078,678
- Issue date Sep 3, 2024
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for scan chain stitching
- Patent number 12,007,440
- Issue date Jun 11, 2024
- Cadence Design Systems, Inc.
- Puneet Arora
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test methods, tester, load board and test system
- Patent number 11,988,710
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chia-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,982,597
- Issue date May 14, 2024
- Myung Ki Kim
- G01 - MEASURING TESTING
Information Patent Grant
Machine learning for taps to accelerate TDECQ and other measurements
- Patent number 11,907,090
- Issue date Feb 20, 2024
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduced signaling interface method and apparatus
- Patent number 11,867,756
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronizing a device that has been power cycled to an already ope...
- Patent number 11,867,759
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Gary L. Swoboda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selectable JTAG or trace access with data store and output
- Patent number 11,835,578
- Issue date Dec 5, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan testing in a processor
- Patent number 11,802,911
- Issue date Oct 31, 2023
- Graphcore Limited
- Natalie Narkonski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic prediction of system resource requirement of network softwa...
- Patent number 11,797,408
- Issue date Oct 24, 2023
- Juniper Networks, Inc.
- Sanjeev Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,796,423
- Issue date Oct 24, 2023
- Myung Ki Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit with reduced signaling interface
- Patent number 11,768,238
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid synchronous and asynchronous control for scan-based testing
- Patent number 11,755,804
- Issue date Sep 12, 2023
- Xilinx, Inc.
- Albert Shih-Huai Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan synchronous-write-through testing architectures for a memory d...
- Patent number 11,734,142
- Issue date Aug 22, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-system test of chips in functional systems
- Patent number 11,726,139
- Issue date Aug 15, 2023
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,709,114
- Issue date Jul 25, 2023
- Myung Ki Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring driving model coverage by microscope driving model knowledge
- Patent number 11,693,752
- Issue date Jul 4, 2023
- International Business Machines Corporation
- Zhanhong Yan
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Redundant segment for efficient in-service testing
- Patent number 11,681,596
- Issue date Jun 20, 2023
- Ethernovia Inc.
- Darren S. Engelkemier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for non-destructive testing online stores
- Patent number 11,601,332
- Issue date Mar 7, 2023
- Baker Hughes, a GE company, LLC
- Jason Howard Messinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging low power states for fault testing of processing cores a...
- Patent number 11,573,872
- Issue date Feb 7, 2023
- NVIDIA Corporation
- Jonah Alben
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronizing a device that has been power cycled to an already ope...
- Patent number 11,567,129
- Issue date Jan 31, 2023
- Texas Instruments Incorporated
- Gary L. Swoboda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG bus communication method and apparatus
- Patent number 11,549,982
- Issue date Jan 10, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,543,328
- Issue date Jan 3, 2023
- Myung Ki Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,530,962
- Issue date Dec 20, 2022
- Myung Ki Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parallel processing system runtime state reload
- Patent number 11,526,409
- Issue date Dec 13, 2022
- Tesla, Inc.
- Daniel William Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduced signaling interface circuit
- Patent number 11,519,959
- Issue date Dec 6, 2022
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pipeline flattener with conditional triggers
- Patent number 11,513,804
- Issue date Nov 29, 2022
- Texas Instruments Incorporated
- Markus Koesler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING AUDIT RECORDS FOR DISTRIBUTED COMPUTING SYSTEM-BASED MOT...
- Publication number 20240104211
- Publication date Mar 28, 2024
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Sebastian Kaiser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN...
- Publication number 20240061757
- Publication date Feb 22, 2024
- Erik Stuart Hons
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
- Publication number 20240019489
- Publication date Jan 18, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS
- Publication number 20230349970
- Publication date Nov 2, 2023
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20230342272
- Publication date Oct 26, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20230296481
- Publication date Sep 21, 2023
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC PREDICTION OF SYSTEM RESOURCE REQUIREMENT OF NETWORK SOFTWA...
- Publication number 20230214304
- Publication date Jul 6, 2023
- Juniper Networks, Inc.
- Sanjeev Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20230175930
- Publication date Jun 8, 2023
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPE...
- Publication number 20230176121
- Publication date Jun 8, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Gary L. SWOBODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20230123956
- Publication date Apr 20, 2023
- NVIDIA Corporation
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARALLEL PROCESSING SYSTEM RUNTIME STATE RELOAD
- Publication number 20230102197
- Publication date Mar 30, 2023
- Tesla, Inc.
- Daniel William Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCED SIGNALING INTERFACE METHOD & APPARATUS
- Publication number 20230058458
- Publication date Feb 23, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS
- Publication number 20230050162
- Publication date Feb 16, 2023
- Tektronix, Inc.
- Kan TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IN-SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS
- Publication number 20220382659
- Publication date Dec 1, 2022
- NVIDIA Corporation
- Shantanu Sarangi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20220357240
- Publication date Nov 10, 2022
- Myung Ki KIM
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...
- Publication number 20220171688
- Publication date Jun 2, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Hung CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
- Publication number 20220146574
- Publication date May 12, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20220114069
- Publication date Apr 14, 2022
- NVIDIA Corporation
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES AND METHODS FOR MANAGING ERROR REGIONS
- Publication number 20220027236
- Publication date Jan 27, 2022
- Micron Technology, Inc.
- Joe M. Jeddeloh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20210379755
- Publication date Dec 9, 2021
- CVE Technology Group, Inc.
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCED SIGNALING INTERFACE METHOD & APPARATUS
- Publication number 20210325456
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20210286693
- Publication date Sep 16, 2021
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARALLEL PROCESSING SYSTEM RUNTIME STATE RELOAD
- Publication number 20210263811
- Publication date Aug 26, 2021
- Tesla, Inc.
- Daniel William Bailey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPE...
- Publication number 20210231733
- Publication date Jul 29, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Gary L. SWOBODA
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20210215759
- Publication date Jul 15, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST METHODS, TESTER, LOAD BOARD AND TEST SYSTEM
- Publication number 20210173008
- Publication date Jun 10, 2021
- Changxin Memory Technologies, Inc.
- Chia-Chi HSU
- G01 - MEASURING TESTING
Information Patent Application
REDUCED SIGNALING INTERFACE METHOD & APPARATUS
- Publication number 20210072310
- Publication date Mar 11, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PIPELINE FLATTENER WITH CONDITIONAL TRIGGERS
- Publication number 20210004236
- Publication date Jan 7, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Markus Koesler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
- Publication number 20200386810
- Publication date Dec 10, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER DEVICE AND TESTING METHOD FOR BASIC INPUT/OUTPUT SYSTEM
- Publication number 20200379859
- Publication date Dec 3, 2020
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Tzu-Pin WANG
- G06 - COMPUTING CALCULATING COUNTING

Reconfiguring circuits for testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Selectable JTAG or trace access with data store and output

Leveraging low power states for fault testing of processing cores a...

Selectable JTAG or trace access with data store and output

In system test of chips in functional systems

Systems and methods for scan chain stitching

Test methods, tester, load board and test system

Automated functional testing systems and methods of making and usin...

Machine learning for taps to accelerate TDECQ and other measurements

Reduced signaling interface method and apparatus

Synchronizing a device that has been power cycled to an already ope...

Selectable JTAG or trace access with data store and output

Scan testing in a processor

Dynamic prediction of system resource requirement of network softwa...

Automated functional testing systems and methods of making and usin...

Integrated circuit with reduced signaling interface

Hybrid synchronous and asynchronous control for scan-based testing

Scan synchronous-write-through testing architectures for a memory d...

In-system test of chips in functional systems

Automated functional testing systems and methods of making and usin...

Measuring driving model coverage by microscope driving model knowledge

Redundant segment for efficient in-service testing

Systems and methods for non-destructive testing online stores

Leveraging low power states for fault testing of processing cores a...

Synchronizing a device that has been power cycled to an already ope...

JTAG bus communication method and apparatus

Automated functional testing systems and methods of making and usin...

Automated functional testing systems and methods of making and usin...

Parallel processing system runtime state reload

Reduced signaling interface circuit

Pipeline flattener with conditional triggers

Patents Applicationslast 30 patents

GENERATING AUDIT RECORDS FOR DISTRIBUTED COMPUTING SYSTEM-BASED MOT...

METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN...

SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT

IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

DYNAMIC PREDICTION OF SYSTEM RESOURCE REQUIREMENT OF NETWORK SOFTWA...

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPE...

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

PARALLEL PROCESSING SYSTEM RUNTIME STATE RELOAD

REDUCED SIGNALING INTERFACE METHOD & APPARATUS

MACHINE LEARNING FOR TAPS TO ACCELERATE TDECQ AND OTHER MEASUREMENTS

IN-SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

SCAN SYNCHRONOUS-WRITE-THROUGH TESTING ARCHITECTURES FOR A MEMORY D...

SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

MEMORY DEVICES AND METHODS FOR MANAGING ERROR REGIONS

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

REDUCED SIGNALING INTERFACE METHOD & APPARATUS

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

PARALLEL PROCESSING SYSTEM RUNTIME STATE RELOAD

SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPE...

JTAG BUS COMMUNICATION METHOD AND APPARATUS

TEST METHODS, TESTER, LOAD BOARD AND TEST SYSTEM

REDUCED SIGNALING INTERFACE METHOD & APPARATUS

PIPELINE FLATTENER WITH CONDITIONAL TRIGGERS

SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT

COMPUTER DEVICE AND TESTING METHOD FOR BASIC INPUT/OUTPUT SYSTEM