-
-
-
-
-
Multistylus recording system
-
Patent number 4,403,225
-
Issue date Sep 6, 1983
-
Honeywell, Inc.
-
Edward R. Bade
-
G06 - COMPUTING CALCULATING COUNTING
-
-
-
-
-
-
3845491
-
Patent number 3,845,491
-
Issue date Oct 29, 1974
-
G01 - MEASURING TESTING
-
3798658
-
Patent number 3,798,658
-
Issue date Mar 19, 1974
-
G01 - MEASURING TESTING
-
3588907
-
Patent number 3,588,907
-
Issue date Jun 28, 1971
-
G01 - MEASURING TESTING
-
3355742
-
Patent number 3,355,742
-
Issue date Nov 28, 1967
-
G07 - CHECKING-DEVICES
-
3303509
-
Patent number 3,303,509
-
Issue date Feb 7, 1967
-
G01 - MEASURING TESTING
-
3281862
-
Patent number 3,281,862
-
Issue date Oct 25, 1966
-
G01 - MEASURING TESTING
-
3181164
-
Patent number 3,181,164
-
Issue date Apr 27, 1965
-
G01 - MEASURING TESTING
-
3175161
-
Patent number 3,175,161
-
Issue date Mar 23, 1965
-
G01 - MEASURING TESTING
-
3160465
-
Patent number 3,160,465
-
Issue date Dec 8, 1964
-
G01 - MEASURING TESTING
-
2972103
-
Patent number 2,972,103
-
Issue date Feb 14, 1961
-
G01 - MEASURING TESTING
-
2835549
-
Patent number 2,835,549
-
Issue date May 20, 1958
-
G01 - MEASURING TESTING
-
2610311
-
Patent number 2,610,311
-
Issue date Sep 9, 1952
-
G01 - MEASURING TESTING
-
2606092
-
Patent number 2,606,092
-
Issue date Aug 5, 1952
-
G01 - MEASURING TESTING
-
2606093
-
Patent number 2,606,093
-
Issue date Aug 5, 1952
-
G01 - MEASURING TESTING
-
2603096
-
Patent number 2,603,096
-
Issue date Jul 15, 1952
-
G01 - MEASURING TESTING
-
2593351
-
Patent number 2,593,351
-
Issue date Apr 15, 1952
-
G01 - MEASURING TESTING
-
2573950
-
Patent number 2,573,950
-
Issue date Nov 6, 1951
-
G01 - MEASURING TESTING
-
2534569
-
Patent number 2,534,569
-
Issue date Dec 19, 1950
-
G01 - MEASURING TESTING
-
2528015
-
Patent number 2,528,015
-
Issue date Oct 31, 1950
-
G01 - MEASURING TESTING
-
2396187
-
Patent number 2,396,187
-
Issue date Mar 5, 1946
-
G01 - MEASURING TESTING