Membership
Tour
Register
Log in
Scale reading or illumination devices
Follow
Industry
CPC
G01D5/34715
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
G01D5/00
Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable
Current Industry
G01D5/34715
Scale reading or illumination devices
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Optical encoder with comparator hysteresis changed with rotating sp...
Patent number
12,203,956
Issue date
Jan 21, 2025
PixArt Imaging Inc.
Chung-Min Thor
G01 - MEASURING TESTING
Information
Patent Grant
Light control circuit of optical encoder and operating method thereof
Patent number
12,181,313
Issue date
Dec 31, 2024
PixArt Imaging Inc.
Kuan-Choong Shim
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder and control apparatus for receiving light that form...
Patent number
12,163,813
Issue date
Dec 10, 2024
Canon Kabushiki Kaisha
Takanori Uemura
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder capable of regulating gain of index output
Patent number
12,117,318
Issue date
Oct 15, 2024
Chung-Min Thor
G01 - MEASURING TESTING
Information
Patent Grant
Cylindrical retroreflector array for rotation tracking
Patent number
12,104,934
Issue date
Oct 1, 2024
Apple Inc.
Xin Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Encoder including moving plate, irradiator, light receiver and dete...
Patent number
12,078,517
Issue date
Sep 3, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Masaru Shiraishi
G01 - MEASURING TESTING
Information
Patent Grant
Encoder apparatus and readhead
Patent number
12,072,216
Issue date
Aug 27, 2024
Renishaw plc
Jason Kempton Slack
G01 - MEASURING TESTING
Information
Patent Grant
Encoder apparatus with readhead having circuit board and a folded s...
Patent number
12,038,310
Issue date
Jul 16, 2024
Renishaw plc
Josh Alexander Dyson
G01 - MEASURING TESTING
Information
Patent Grant
Encoder using rotatable plate, light source and light receiver
Patent number
11,982,551
Issue date
May 14, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Shuichi Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Optical position-measuring device for suppressing disturbing higher...
Patent number
11,946,782
Issue date
Apr 2, 2024
Dr. Johannes Heidenhain GmbH
Thomas Kaelberer
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device having four scanning units and two measur...
Patent number
11,940,304
Issue date
Mar 26, 2024
Dr. Johannes Heidenhain GmbH
Josef Mitterleitner
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder with changeable comparator hysteresis and operating...
Patent number
11,885,828
Issue date
Jan 30, 2024
PixArt Imaging Inc.
Chung-Min Thor
G01 - MEASURING TESTING
Information
Patent Grant
Encoder, servo motor, and servo system
Patent number
11,860,007
Issue date
Jan 2, 2024
Kabushiki Kaisha Yaskawa Denki
Hiroshi Takada
G01 - MEASURING TESTING
Information
Patent Grant
Encoder unit, drive device, and robot
Patent number
11,845,182
Issue date
Dec 19, 2023
Seiko Epson Corporation
Mitsuru Toyama
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Optical encoder with reduced comparators
Patent number
11,831,320
Issue date
Nov 28, 2023
Swee-Lin Thor
G01 - MEASURING TESTING
Information
Patent Grant
Light control circuit and frequency detector of optical encoder sys...
Patent number
11,774,269
Issue date
Oct 3, 2023
PixArt Imaging Inc.
Kuan-Choong Shim
G01 - MEASURING TESTING
Information
Patent Grant
Encoder
Patent number
11,774,270
Issue date
Oct 3, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Grant
Assembly for position measurement
Patent number
11,733,019
Issue date
Aug 22, 2023
DR. JOHANNES HEIDENHAIN GMBH
Kilian Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Cylindrical retroreflector array for rotation tracking
Patent number
11,674,825
Issue date
Jun 13, 2023
Apple Inc.
Xin Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical encoder capable of regulating gain of index output
Patent number
11,644,345
Issue date
May 9, 2023
PixArt Imaging Inc.
Chung-Min Thor
G01 - MEASURING TESTING
Information
Patent Grant
Optical position measuring device
Patent number
11,644,348
Issue date
May 9, 2023
DR. JOHANNES HEIDENHAIN GMBH
Thomas Kaelberer
G01 - MEASURING TESTING
Information
Patent Grant
Position measurement encoder and method of operation
Patent number
11,619,521
Issue date
Apr 4, 2023
Renishaw plc
Andrew Paul Gribble
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder with interpolation circuit
Patent number
11,616,503
Issue date
Mar 28, 2023
PixArt Imaging Inc.
Swee-Lin Thor
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Reflective optical encoder comprising a hub with an adhesive surfac...
Patent number
11,609,106
Issue date
Mar 21, 2023
Mitsubishi Electric Corporation
Yoshitomo Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Encoder, servo motor, and servo system
Patent number
11,566,920
Issue date
Jan 31, 2023
Kabushiki Kaisha Yaskawa Denki
Hiroshi Takada
G01 - MEASURING TESTING
Information
Patent Grant
Encoder
Patent number
11,549,828
Issue date
Jan 10, 2023
Renishaw plc
Finlay Jonathan Evans
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device
Patent number
11,543,270
Issue date
Jan 3, 2023
Renishaw plc
Jason Lee Stinchcombe
G01 - MEASURING TESTING
Information
Patent Grant
Index grating of optical encoder
Patent number
11,402,554
Issue date
Aug 2, 2022
Hiwin Mikrosystem Corp.
Ting-Wei Huang
G01 - MEASURING TESTING
Information
Patent Grant
Encoder apparatus, drive apparatus, stage apparatus, and robot appa...
Patent number
11,385,081
Issue date
Jul 12, 2022
Nikon Corporation
Masahiko Goto
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for improved performance in encoder systems by...
Patent number
11,378,422
Issue date
Jul 5, 2022
TT ELECTRONICS PLC
James P. Cusey
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL ENCODER CAPABLE OF REGULATING GAIN OF INDEX OUTPUT
Publication number
20240426639
Publication date
Dec 26, 2024
PIXART IMAGING INC.
Chung-Min THOR
G01 - MEASURING TESTING
Information
Patent Application
POSITION MEASUREMENT DEVICE
Publication number
20240377228
Publication date
Nov 14, 2024
RENISHAW PLC
Jason Kempton SLACK
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY TRACKING
Publication number
20240377647
Publication date
Nov 14, 2024
Apple Inc.
Matin SEADAT BEHESHTI
G01 - MEASURING TESTING
Information
Patent Application
POSITION ENCODER APPARATUS
Publication number
20240369385
Publication date
Nov 7, 2024
RENISHAW PLC
Harrison Clinton FISHER
G01 - MEASURING TESTING
Information
Patent Application
PRINTING APPARATUS, CONTROL METHOD FOR PRINTING APPARATUS, AND COMP...
Publication number
20240247957
Publication date
Jul 25, 2024
BROTHER KOGYO KABUSHIKI KAISHA
Masaru SOMEYA
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
METHOD FOR APPLYING A MEASUREMENT SCALE TO A SURFACE OF A GUIDE CAR...
Publication number
20240118114
Publication date
Apr 11, 2024
Schneeberger Holding AG
Roger INFANGER
G01 - MEASURING TESTING
Information
Patent Application
DISC SCALE MEMBER OFFSET DETERMINATION
Publication number
20240085220
Publication date
Mar 14, 2024
RENISHAW PLC
James Reynolds HENSHAW
G01 - MEASURING TESTING
Information
Patent Application
LIGHT CONTROL CIRCUIT OF OPTICAL ENCODER AND OPERATING METHOD THEREOF
Publication number
20230408304
Publication date
Dec 21, 2023
PIXART IMAGING INC.
Kuan-Choong SHIM
G01 - MEASURING TESTING
Information
Patent Application
ENCODER AND INFORMATION PROCESSING METHOD
Publication number
20230375373
Publication date
Nov 23, 2023
Panasonic Intellectual Property Management Co., Ltd.
MASARU SHIRAISHI
G01 - MEASURING TESTING
Information
Patent Application
DRIVING APPARATUS AND LENS APPARATUS HAVING THE SAME
Publication number
20230367094
Publication date
Nov 16, 2023
Canon Kabushiki Kaisha
TOSHIMUNE NAGANO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING AN OPTICAL POSITION ENCODER
Publication number
20230296412
Publication date
Sep 21, 2023
IC-HAUS GMBH
Monir GALLOUCH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Cylindrical Retroreflector Array for Rotation Tracking
Publication number
20230258479
Publication date
Aug 17, 2023
Apple Inc.
Xin Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL ENCODER CAPABLE OF REGULATING GAIN OF INDEX OUTPUT
Publication number
20230236042
Publication date
Jul 27, 2023
PIXART IMAGING INC.
Chung-Min THOR
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER WITH REDUCED COMPARATORS
Publication number
20230208412
Publication date
Jun 29, 2023
PIXART IMAGING INC.
Swee-Lin THOR
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ENCODER
Publication number
20230160725
Publication date
May 25, 2023
Panasonic Intellectual Property Management Co., Ltd.
Shuichi NAGAI
G01 - MEASURING TESTING
Information
Patent Application
ENCODER, SERVO MOTOR, AND SERVO SYSTEM
Publication number
20230129497
Publication date
Apr 27, 2023
KABUSHIKI KAISHA YASKAWA DENKI
Hiroshi TAKADA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL POSITION-MEASURING DEVICE
Publication number
20230120787
Publication date
Apr 20, 2023
Dr. Johannes Heidenhain Gmbh
Thomas Kaelberer
G01 - MEASURING TESTING
Information
Patent Application
Cylindrical Retroreflector Array for Rotation Tracking
Publication number
20230086536
Publication date
Mar 23, 2023
Apple Inc.
Xin Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ENCODER
Publication number
20230059800
Publication date
Feb 23, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IMPROVED PERFORMANCE IN ENCODER SYSTEMS
Publication number
20220404179
Publication date
Dec 22, 2022
TT Electronics Plc
James P. Cusey
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POSITION MEASUREMENT DEVICE
Publication number
20220397430
Publication date
Dec 15, 2022
RENISHAW PLC
Jason Kempton SLACK
G01 - MEASURING TESTING
Information
Patent Application
ENCODER APPARATUS
Publication number
20220373364
Publication date
Nov 24, 2022
RENISHAW PLC
Josh Alexander DYSON
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER CAPABLE OF REGULATING GAIN OF INDEX OUTPUT
Publication number
20220341762
Publication date
Oct 27, 2022
PIXART IMAGING INC.
Chung-Min THOR
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER WITH INTERPOLATION CIRCUIT
Publication number
20220276075
Publication date
Sep 1, 2022
PixArt Imaging Inc.
Swee-Lin THOR
G01 - MEASURING TESTING
Information
Patent Application
LIGHT CONTROL CIRCUIT AND FREQUENCY DETECTOR OF OPTICAL ENCODER SYS...
Publication number
20220221312
Publication date
Jul 14, 2022
PIXART IMAGING INC.
Kuan-Choong SHIM
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER
Publication number
20220178722
Publication date
Jun 9, 2022
Vishay Semiconductor GmbH
Daniel BURGER
G01 - MEASURING TESTING
Information
Patent Application
INDEX GRATING OF OPTICAL ENCODER
Publication number
20220050233
Publication date
Feb 17, 2022
HIWIN MIKROSYSTEM CORP.
Ting-Wei HUANG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER AND CONTROL APPARATUS
Publication number
20210348954
Publication date
Nov 11, 2021
Canon Kabushiki Kaisha
Takanori Uemura
G01 - MEASURING TESTING
Information
Patent Application
ASSEMBLY FOR POSITION MEASUREMENT
Publication number
20210318109
Publication date
Oct 14, 2021
Dr. Johannes Heidenhain Gmbh
Kilian Bauer
G01 - MEASURING TESTING
Information
Patent Application
INTERPOLATION CIRCUIT OF OPTICAL ENCODER
Publication number
20210318146
Publication date
Oct 14, 2021
PIXART IMAGING INC.
Swee-Lin THOR
H03 - BASIC ELECTRONIC CIRCUITRY