TREA

Scales; Discs

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  • CPC
  • G01D5/34707
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Parent Industries

GPHYSICS G01Measuring instruments G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS TARIFF METERING APPARATUS MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR G01D5/00Mechanical means for transferring the output of a sensing member Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting Transducers not specially adapted for a specific variable

Current Industry

G01D5/34707Scales; Discs
Industries

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Device and Method for Determining a Reference Curve for the Rotatio...
    • Publication number 20240035861
    • Publication date Feb 1, 2024
    • HILTI AKTIENGESELLSCHAFT
    • Sasha LUKIC
    • G01 - MEASURING TESTING
  • Information Patent Application

    MULTI-TRACK OPTICAL ENCODER
    • Publication number 20240003714
    • Publication date Jan 4, 2024
    • PIXART IMAGING (PENANG) SDN. BHD.
    • Sai-Mun LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER WITH TWO INDEX PHOTODIODES
    • Publication number 20230314187
    • Publication date Oct 5, 2023
    • PIXART IMAGING INC.
    • Kuan-Choong SHIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETECTING MEMBER
    • Publication number 20230175873
    • Publication date Jun 8, 2023
    • KYOCERA CORPORATION
    • Hiroshi HAMASHIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    REFLECTION-TYPE OPTICAL ENCODER SCALE AND REFLECTION-TYPE OPTICAL E...
    • Publication number 20230126475
    • Publication date Apr 27, 2023
    • DAI NIPPON PRINTING CO., LTD.
    • Shinsuke NAKAZAWA
    • G02 - OPTICS
  • Information Patent Application

    MARKER PRODUCT AND RELATED OPTICAL DETECTION SYSTEM
    • Publication number 20230023912
    • Publication date Jan 26, 2023
    • PixArt Imaging Inc.
    • Ching-Lin Chung
    • G01 - MEASURING TESTING
  • Information Patent Application

    MULTI-TRACK OPTICAL ENCODER
    • Publication number 20220381588
    • Publication date Dec 1, 2022
    • PIXART IMAGING (PENANG) SDN. BHD.
    • Sai-Mun LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT MEASURING APPARATUS
    • Publication number 20220252436
    • Publication date Aug 11, 2022
    • Mitutoyo Corporation
    • Masataka Yamamuro
    • G01 - MEASURING TESTING
  • Information Patent Application

    Linear Encoder
    • Publication number 20220187104
    • Publication date Jun 16, 2022
    • PARPAS S.P.A.
    • Vladi Parpajola
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ROTARY ENCODER
    • Publication number 20220170764
    • Publication date Jun 2, 2022
    • Mitutoyo Corporation
    • Yoshiaki Kato
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER WITH COVERED PHOTO DIODE
    • Publication number 20220099464
    • Publication date Mar 31, 2022
    • PIXART IMAGING INC.
    • Kuan-Choong SHIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION-MEASURING DEVICE
    • Publication number 20220065668
    • Publication date Mar 3, 2022
    • Dr. Johannes Heidenhain Gmbh
    • Josef Mitterleitner
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCALE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20210381859
    • Publication date Dec 9, 2021
    • Mitutoyo Corporation
    • Toshihiko AOKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    DETECTION METHOD, DETECTION DEVICE, AND LIDAR
    • Publication number 20210333399
    • Publication date Oct 28, 2021
    • SZ DJI Technology Co., Ltd.
    • Jin ZHAO
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION ENCODER CONTROLLER
    • Publication number 20210325209
    • Publication date Oct 21, 2021
    • e1ectr0n, Inc.
    • Scott L. Baker
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCALE
    • Publication number 20210262833
    • Publication date Aug 26, 2021
    • MITUTOYO CORPORATION
    • Kosaku MIYAKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCALE AND MANUFACTURING METHOD OF THE SAME
    • Publication number 20210247547
    • Publication date Aug 12, 2021
    • Mitutoyo Corporation
    • Toshihiko Aoki
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER, SERVO MOTOR, AND SERVO SYSTEM
    • Publication number 20210072721
    • Publication date Mar 11, 2021
    • KABUSHIKI KAISHA YASKAWA DENKI
    • Hiroshi TAKADA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL REFLECTIVE COMPONENT AND OPTICAL ENCODER USING SAME
    • Publication number 20210063207
    • Publication date Mar 4, 2021
    • Delta Electronics, Inc.
    • Horng-Jou Wang
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTARY MOTION DETECTING DEVICE
    • Publication number 20210033429
    • Publication date Feb 4, 2021
    • FANUC CORPORATION
    • Miaomiao WANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION ENCODER WITH LIMITS
    • Publication number 20210018341
    • Publication date Jan 21, 2021
    • e1ectr0n, Inc.
    • Scott L. Baker
    • G01 - MEASURING TESTING
  • Information Patent Application

    Detection Device
    • Publication number 20200408571
    • Publication date Dec 31, 2020
    • DMG MORI CO., LTD.
    • Masayuki Niiya
    • G01 - MEASURING TESTING
  • Information Patent Application

    GRATING DISC AND FEEDBACK SYSTEM
    • Publication number 20200378804
    • Publication date Dec 3, 2020
    • HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD.
    • BING DING
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER SYSTEM AND METHOD
    • Publication number 20200363240
    • Publication date Nov 19, 2020
    • Michael NAOR
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER AND CONTROL METHOD THEREOF
    • Publication number 20200271484
    • Publication date Aug 27, 2020
    • HIWIN MIKROSYSTEM CORP.
    • TSAN-LIN CHEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIFE DETECTION DEVICE FOR ENCODER
    • Publication number 20200240816
    • Publication date Jul 30, 2020
    • Mitutoyo Corporation
    • Miyako Mizutani
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER SYSTEM WITH SHAPED LIGHT SOURCE
    • Publication number 20200166382
    • Publication date May 28, 2020
    • TT Electronics Plc
    • Brent Hans Larson
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURED SENSOR DISTANCE CORRECTION
    • Publication number 20200147953
    • Publication date May 14, 2020
    • HP INDIGO B.V.
    • Nimrod Lucas
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    POSITION DETECTION DEVICE
    • Publication number 20200132430
    • Publication date Apr 30, 2020
    • DENSO CORPORATION
    • Norio GOKO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER WITH COVERED PHOTO DIODE
    • Publication number 20200109968
    • Publication date Apr 9, 2020
    • PIXART IMAGING INC.
    • Kuan-Choong SHIM
    • G01 - MEASURING TESTING